IEC 61636-1:2016
(Main)Software interface for maintenance information collection and analysis (SIMICA): Exchanging test results and session information via the extensible markup language (XML)
Software interface for maintenance information collection and analysis (SIMICA): Exchanging test results and session information via the extensible markup language (XML)
IEC 61636-1:2016(E) is the definition of an exchange format, utilizing XML, for exchanging data resulting from executing tests of a unit under test (UUT) via a test program in an automatic test environment. This standard is published as a double logo IEC-IEEE standard.
General Information
Standards Content (sample)
IEC 61636-1
Edition 1.0 2016-11
IEEE Std 1636.1
INTERNATIONAL
STANDARD
Software interface for maintenance information collection and analysis (SIMICA):
Exchanging test results and session information via the extensible markup
language (XML)
IEC 61636-1:2016-11(en) IEEE Std 1636.1-2013
---------------------- Page: 1 ----------------------
THIS PUBLICATION IS COPYRIGHT PROTECTED
Copyright © 2013 IEEE
All rights reserved. IEEE is a registered trademark in the U.S. Patent & Trademark Office, owned by the Institute of
Electrical and Electronics Engineers, Inc. Unless otherwise specified, no part of this publication may be reproduced
or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without
permission in writing from the IEC Central Office. Any questions about IEEE copyright should be addressed to the
IEEE. Enquiries about obtaining additional rights to this publication and other information requests should be
addressed to the IEC or your local IEC member National Committee.IEC Central Office Institute of Electrical and Electronics Engineers, Inc.
3, rue de Varembé 3 Park Avenue
CH-1211 Geneva 20 New York, NY 10016-5997
Switzerland United States of America
Tel.: +41 22 919 02 11 stds.info@ieee.org
Fax: +41 22 919 03 00 www.ieee.org
info@iec.ch
www.iec.ch
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigenda or an amendment might have been published.IEC Catalogue - webstore.iec.ch/catalogue Electropedia - www.electropedia.org
The stand-alone application for consulting the entire The world's leading online dictionary of electronic and
bibliographical information on IEC International Standards, electrical terms containing 20 000 terms and definitions in
Technical Specifications, Technical Reports and other English and French, with equivalent terms in 15 additional
documents. Available for PC, Mac OS, Android Tablets and languages. Also known as the International Electrotechnical
iPad. Vocabulary (IEV) online.IEC publications search - www.iec.ch/searchpub IEC Glossary - std.iec.ch/glossary
The advanced search enables to find IEC publications by a 65 000 electrotechnical terminology entries in English and
variety of criteria (reference number, text, technical French extracted from the Terms and Definitions clause of
committee,…). It also gives information on projects, replaced IEC publications issued since 2002. Some entries have been
and withdrawn publications. collected from earlier publications of IEC TC 37, 77, 86 and
CISPR.IEC Just Published - webstore.iec.ch/justpublished
Stay up to date on all new IEC publications. Just Published IEC Customer Service Centre - webstore.iec.ch/csc
details all new publications released. Available online and If you wish to give us your feedback on this publication or
also once a month by email. need further assistance, please contact the Customer Service
Centre: csc@iec.ch.---------------------- Page: 2 ----------------------
IEC 61636-1
Edition 1.0 2016-11
IEEE Std 1636.1™
INTERNATIONAL
STANDARD
Software interface for maintenance information collection and analysis (SIMICA):
Exchanging test results and session information via the extensible markup
language (XML)
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 25.040.01; 35.060 ISBN 978-2-8322-3684-0
Warning! Make sure that you obtained this publication from an authorized distributor.
® Registered trademark of the International Electrotechnical Commission---------------------- Page: 3 ----------------------
IEC 61636-1:2016
– i – IEEE Std 1636.1-2013
Contents
1. Overview .................................................................................................................................................... 1
1.1 Scope ................................................................................................................................................... 2
1.2 Purpose ................................................................................................................................................ 2
1.3 Application .......................................................................................................................................... 2
1.4 Precedence........................................................................................................................................... 3
1.5 Conventions used in this document ..................................................................................................... 3
2. Normative references.................................................................................................................................. 4
3. Definitions, acronyms, and abbreviations .................................................................................................. 4
3.1 Definitions ........................................................................................................................................... 4
3.2 Acronyms and abbreviations ............................................................................................................... 5
4. Test results and session information........................................................................................................... 6
4.1 Background.......................................................................................................................................... 6
4.2 Introduction ......................................................................................................................................... 6
4.3 Applicability ........................................................................................................................................ 6
4.4 Usage ................................................................................................................................................... 7
4.5 Relationships to other automatic test system (ATS) architectural elements........................................ 7
5. EXPRESS model, EXPRESS-G diagram, and XML schema names and locations ................................... 9
6. Conformance ............................................................................................................................................ 10
7. Extensibility.............................................................................................................................................. 11
Annex A (normative) XML schemas ........................................................................................................... 12
A.1 TestResults.xsd ................................................................................................................................. 12
A.2 TestResultsCollection.xsd................................................................................................................. 59
Annex B (normative) EXPRESS models ..................................................................................................... 60
B.1 TEST_RESULTS_MODEL.............................................................................................................. 60
B.2 TestResults model EXPRESS-G diagrams ....................................................................................... 76
Annex C (informative) Bibliography............................................................................................................ 83
Annex D (informative) IEEE list of participants...........................................................................................85
viiiCopyright © 2013 IEEE. All rights reserved.
---------------------- Page: 4 ----------------------
IEC 61636-1:2016
IEEE Std 1636.1-2013 – ii –
SOFTWARE INTERFACE
FOR MAINTENANCE INFORMATION COLLECTION
AND ANALYSIS (SIMICA):
EXCHANGING TEST RESULTS AND SESSION
INFORMATION VIA THE EXTENSIBLE MARKUP
LANGUAGE (XML)
)25(:25'
7KH,QWHUQDWLRQDO(OHFWURWHFKQLFDO&RPPLVVLRQ,(&LVDZRUOGZLGHRUJDQL]DWLRQIRUVWDQGDUGL]DWLRQFRPSULVLQJ
DOO QDWLRQDO HOHFWURWHFKQLFDO FRPPLWWHHV ,(& 1DWLRQDO &RPPLWWHHV7KHREMHFWRI,(&LVWRSURPRWH
LQWHUQDWLRQDOFRRSHUDWLRQRQDOOTXHVWLRQVFRQFHUQLQJVWDQGDUGL]DWLRQLQWKHHOHFWULFDODQGHOHFWURQLFILHOGV7R
WKLVHQGDQGLQDGGLWLRQWRRWKHUDFWLYLWLHV,(&SXEOLVKHV,QWHUQDWLRQDO6WDQGDUGV7HFKQLFDO6SHFLILFDWLRQV
7HFKQLFDO 5HSRUWV 3XEOLFO\ $YDLODEOH 6SHFLILFDWLRQV 3$6 DQG *XLGHV KHUHDIWHU UHIHUUHG WR DV ³,(&
3XEOLFDWLRQV´7KHLUSUHSDUDWLRQLVHQWUXVWHGWRWHFKQLFDOFRPPLWWHHVDQ\,(&1DWLRQDO&RPPLWWHHLQWHUHVWHG
LQ WKH VXEMHFW GHDOW ZLWK PD\ SDUWLFLSDWH LQ WKLV SUHSDUDWRU\ ZRUN ,QWHUQDWLRQDO JRYHUQPHQWDO DQG QRQ
JRYHUQPHQWDORUJDQL]DWLRQVOLDLVLQJZLWKWKH,(&DOVRSDUWLFLSDWHLQWKLVSUHSDUDWLRQ
,(((6WDQGDUGVGRFXPHQWVDUHGHYHORSHGZLWKLQ,(((6RFLHWLHVDQG6WDQGDUGV&RRUGLQDWLQJ&RPPLWWHHVRIWKH
,(((6WDQGDUGV$VVRFLDWLRQ,(((6$6WDQGDUGV%RDUG,(((GHYHORSVLWVVWDQGDUGVWKURXJKDFRQVHQVXV
GHYHORSPHQWSURFHVVZKLFKEULQJVWRJHWKHUYROXQWHHUVUHSUHVHQWLQJYDULHGYLHZSRLQWVDQGLQWHUHVWVWRDFKLHYH
WKHILQDOSURGXFW9ROXQWHHUVDUHQRWQHFHVVDULO\PHPEHUVRI,(((DQGVHUYHZLWKRXWFRPSHQVDWLRQ:KLOH,(((
DGPLQLVWHUVWKHSURFHVVDQGHVWDEOLVKHVUXOHVWRSURPRWHIDLUQHVVLQWKHFRQVHQVXVGHYHORSPHQWSURFHVV,(((
GRHV QRW LQGHSHQGHQWO\ HYDOXDWH WHVW RU YHULI\ WKH DFFXUDF\ RI DQ\ RI WKH LQIRUPDWLRQ FRQWDLQHG LQ LWV
VWDQGDUGV8VHRI,(((6WDQGDUGVGRFXPHQWVLVZKROO\YROXQWDU\,(((GRFXPHQWVDUHPDGHDYDLODEOHIRUXVH
VXEMHFWWRLPSRUWDQWQRWLFHVDQGOHJDOGLVFODLPHUVVHHKWWSVWDQGDUGVLHHHRUJ,35GLVFODLPHUVKWPOIRUPRUH
LQIRUPDWLRQ,(&FROODERUDWHVFORVHO\ZLWK,(((LQDFFRUGDQFHZLWKFRQGLWLRQVGHWHUPLQHGE\DJUHHPHQWEHWZHHQWKHWZR
RUJDQL]DWLRQV7KHIRUPDOGHFLVLRQVRI,(&RQWHFKQLFDOPDWWHUVH[SUHVVDVQHDUO\DVSRVVLEOHDQLQWHUQDWLRQDOFRQVHQVXVRI
RSLQLRQRQWKHUHOHYDQWVXEMHFWVVLQFHHDFKWHFKQLFDOFRPPLWWHHKDVUHSUHVHQWDWLRQIURPDOOLQWHUHVWHG,(&
1DWLRQDO&RPPLWWHHV7KHIRUPDOGHFLVLRQVRI,(((RQWHFKQLFDOPDWWHUVRQFHFRQVHQVXVZLWKLQ,(((6RFLHWLHV
DQG6WDQGDUGV&RRUGLQDWLQJ&RPPLWWHHVKDVEHHQUHDFKHGLVGHWHUPLQHGE\DEDODQFHGEDOORWRIPDWHULDOO\
LQWHUHVWHG SDUWLHV ZKR LQGLFDWH LQWHUHVW LQ UHYLHZLQJ WKH SURSRVHG VWDQGDUG )LQDO DSSURYDO RI WKH ,(((
VWDQGDUGVGRFXPHQWLVJLYHQE\WKH,(((6WDQGDUGV$VVRFLDWLRQ,(((6$6WDQGDUGV%RDUG
,(&,((( 3XEOLFDWLRQV KDYH WKH IRUP RI UHFRPPHQGDWLRQV IRU LQWHUQDWLRQDO XVH DQG DUH DFFHSWHG E\ ,(&
1DWLRQDO&RPPLWWHHV,(((6RFLHWLHVLQWKDWVHQVH:KLOHDOOUHDVRQDEOHHIIRUWVDUHPDGHWRHQVXUHWKDWWKH
WHFKQLFDOFRQWHQWRI,(&,(((3XEOLFDWLRQVLVDFFXUDWH,(&RU,(((FDQQRWEHKHOGUHVSRQVLEOHIRUWKHZD\LQ
ZKLFKWKH\DUHXVHGRUIRUDQ\PLVLQWHUSUHWDWLRQE\DQ\HQGXVHU,QRUGHUWRSURPRWHLQWHUQDWLRQDOXQLIRUPLW\,(&1DWLRQDO&RPPLWWHHVXQGHUWDNHWRDSSO\,(&3XEOLFDWLRQV
LQFOXGLQJ,(&,(((3XEOLFDWLRQVWUDQVSDUHQWO\WRWKHPD[LPXPH[WHQWSRVVLEOHLQWKHLUQDWLRQDODQGUHJLRQDO
SXEOLFDWLRQV$Q\GLYHUJHQFHEHWZHHQDQ\,(&,(((3XEOLFDWLRQDQGWKHFRUUHVSRQGLQJQDWLRQDORUUHJLRQDO
SXEOLFDWLRQVKDOOEHFOHDUO\LQGLFDWHGLQWKHODWWHU,(&DQG,(((GRQRWSURYLGHDQ\DWWHVWDWLRQRIFRQIRUPLW\,QGHSHQGHQWFHUWLILFDWLRQERGLHVSURYLGHFRQIRUPLW\
DVVHVVPHQWVHUYLFHVDQGLQVRPHDUHDVDFFHVVWR,(&PDUNVRIFRQIRUPLW\,(&DQG,(((DUHQRWUHVSRQVLEOH
IRUDQ\VHUYLFHVFDUULHGRXWE\LQGHSHQGHQWFHUWLILFDWLRQERGLHV$OOXVHUVVKRXOGHQVXUHWKDWWKH\KDYHWKHODWHVWHGLWLRQRIWKLVSXEOLFDWLRQ
1ROLDELOLW\VKDOODWWDFKWR,(&RU,(((RUWKHLUGLUHFWRUVHPSOR\HHVVHUYDQWVRUDJHQWVLQFOXGLQJLQGLYLGXDO
H[SHUWVDQGPHPEHUVRIWHFKQLFDOFRPPLWWHHVDQG,(&1DWLRQDO&RPPLWWHHVRUYROXQWHHUVRI,(((6RFLHWLHV
DQGWKH6WDQGDUGV&RRUGLQDWLQJ&RPPLWWHHVRIWKH,(((6WDQGDUGV$VVRFLDWLRQ,(((6$6WDQGDUGV%RDUG
IRUDQ\SHUVRQDOLQMXU\SURSHUW\GDPDJHRURWKHUGDPDJHRIDQ\QDWXUHZKDWVRHYHUZKHWKHUGLUHFWRULQGLUHFW
RUIRUFRVWVLQFOXGLQJOHJDOIHHVDQGH[SHQVHVDULVLQJRXWRIWKHSXEOLFDWLRQXVHRIRUUHOLDQFHXSRQWKLV
,(&,(((3XEOLFDWLRQRUDQ\RWKHU,(&RU,(((3XEOLFDWLRQV$WWHQWLRQLVGUDZQWRWKHQRUPDWLYHUHIHUHQFHVFLWHGLQWKLVSXEOLFDWLRQ8VHRIWKHUHIHUHQFHGSXEOLFDWLRQVLV
LQGLVSHQVDEOHIRUWKHFRUUHFWDSSOLFDWLRQRIWKLVSXEOLFDWLRQ$WWHQWLRQ LV GUDZQ WR WKH SRVVLELOLW\ WKDW LPSOHPHQWDWLRQ RI WKLV ,(&,((( 3XEOLFDWLRQ PD\ UHTXLUH XVH RI
PDWHULDOFRYHUHGE\SDWHQWULJKWV%\SXEOLFDWLRQRIWKLVVWDQGDUGQRSRVLWLRQLVWDNHQZLWKUHVSHFWWRWKH
H[LVWHQFHRUYDOLGLW\RIDQ\SDWHQWULJKWVLQFRQQHFWLRQWKHUHZLWK,(&RU,(((VKDOOQRWEHKHOGUHVSRQVLEOHIRU
LGHQWLI\LQJ(VVHQWLDO3DWHQW&ODLPVIRUZKLFKDOLFHQVHPD\EHUHTXLUHGIRUFRQGXFWLQJLQTXLULHVLQWRWKHOHJDO
YDOLGLW\ RU VFRSH RI 3DWHQW &ODLPV RU GHWHUPLQLQJ ZKHWKHU DQ\ OLFHQVLQJ WHUPV RU FRQGLWLRQV SURYLGHG LQ
FRQQHFWLRQZLWKVXEPLVVLRQRID/HWWHURI$VVXUDQFHLIDQ\RULQDQ\OLFHQVLQJDJUHHPHQWVDUHUHDVRQDEOHRU
QRQGLVFULPLQDWRU\8VHUVRIWKLVVWDQGDUGDUHH[SUHVVO\DGYLVHGWKDWGHWHUPLQDWLRQRIWKHYDOLGLW\RIDQ\SDWHQW
ULJKWVDQGWKHULVNRILQIULQJHPHQWRIVXFKULJKWVLVHQWLUHO\WKHLURZQUHVSRQVLELOLW\
---------------------- Page: 5 ----------------------IEC 61636-1:2016
– iii – IEEE Std 1636.1-2013
,QWHUQDWLRQDO 6WDQGDUG ,(& ,((( 6WG KDV EHHQ SURFHVVHG WKURXJK ,(&
WHFKQLFDOFRPPLWWHH(OHFWURQLFVDVVHPEO\WHFKQRORJ\XQGHUWKH,(&,((('XDO/RJR
$JUHHPHQW7KHWH[WRIWKLVVWDQGDUGLVEDVHGRQWKHIROORZLQJGRFXPHQWV
,(((6WG )',6 5HSRUWRQYRWLQJ
)',6 59'
)XOOLQIRUPDWLRQRQWKHYRWLQJIRUWKHDSSURYDORIWKLVVWDQGDUGFDQEHIRXQGLQWKHUHSRUWRQ
YRWLQJLQGLFDWHGLQWKHDERYHWDEOH7KH,(&7HFKQLFDO&RPPLWWHHDQG,(((7HFKQLFDO&RPPLWWHHKDYHGHFLGHGWKDWWKHFRQWHQWV
RIWKLVSXEOLFDWLRQZLOOUHPDLQXQFKDQJHGXQWLOWKHVWDELOLW\GDWHLQGLFDWHGRQWKH,(&ZHEVLWH
XQGHUKWWSZHEVWRUHLHFFKLQWKHGDWDUHODWHGWRWKHVSHFLILFSXEOLFDWLRQ$WWKLVGDWHWKH
SXEOLFDWLRQZLOOEH‡ UHFRQILUPHG
‡ ZLWKGUDZQ
‡ UHSODFHGE\DUHYLVHGHGLWLRQRU
‡ DPHQGHG
---------------------- Page: 6 ----------------------
IEC 61636-1:2016
IEEE Std 1636.1-2013 – iv –
IEEE Standard for Software Interface
for Maintenance Information Collection
and Analysis (SIMICA):
Exchanging Test Results and Session
Information via the eXtensible Markup
Language (XML)
Sponsor
IEEE Standards Coordinating Committees on
Test and Diagnosis for Electronic Systems (SCC20)
Approved 23 August 2013
IEEE-SA Standards Board
---------------------- Page: 7 ----------------------
IEC 61636-1:2016
– v – IEEE Std 1636.1-2013
Abstract: This standard is intended to promote and facilitate interoperability between
components of automatic test systems where test results need to be shared. The standard thus
facilitates the capture of test results data in storage devices and databases, facilitating online and
offline analysis. The test results schema becomes a class of information that can be used within
the SIMICA family of standards. The exchange format utilizes the XML formats.Keywords: automated test system (ATS), eXtensible markup language (XML), IEEE 1636.1™,
session information, Software Interface for Maintenance Information Collection and Analysis
(SIMICA), test results, XML schema---------------------- Page: 8 ----------------------
IEC 61636-1:2016
IEEE Std 1636.1-2013 – vi –
IEEE Introduction
This introduction is not part of IEEE Std 1636.1™-2013, IEEE Standard for Software Interface for Maintenance
Information Collection and Analysis (SIMICA): Exchanging Test Results and Session Information via the eXtensible
Markup Language (XML).Maintainers of complex systems require the ability to capture and share test result information in a way that
supports such activities as performance analysis, post-production product improvement, maintenance
process improvement, and diagnostic maturation. Principal stakeholders of this project include but are not
limited to maintenance organizations within various Departments/Ministries of Defense, the commercial
airlines, the automotive industry, and the telecommunications industry. This standard is being developed as
a component of the IEEE 1636™ Software Interface for Maintenance Information Collection and Analysis
(SIMICA) project. SIMICA’s purpose is to specify a software interface for access, exchange, and analysis
of product diagnostic and maintenance information. Clause 4, Test results and session information,
provides a subset of the data needed to satisfy SIMICA requirements.The use of formal information models will facilitate exchanging historical test results between information
systems and analysis tools. The models will facilitate creating open system software architectures for
maturing system diagnostics.The XML schema described in this standard where appropriate utilizes and references components of the
IEEE Std 1671™ schema set.It is anticipated that these schemas will be used throughout industries that utilize diagnostic and
maintenance data as an exchange format that can be understood by humans or machines. In order to ensure
wide acceptance throughout the user community, the schemas have been designed to encompass a broad
range of use cases. To accommodate use cases beyond the released design, the schemas provide means for
user extensibility.It is anticipated that the IEEE Std 1636.1 schema will be used throughout the automatic test equipment
(ATE) industry as an exchange format that can be understood by humans or machines. In order to ensure
wide acceptance throughout the user community, the schemas have been designed to encompass a broad
range of use cases.vii
Copyright © 2013 IEEE. All rights reserved.
---------------------- Page: 9 ----------------------
IEC 61636-1:2016
– vii – IEEE Std 1636.1-2013
---------------------- Page: 10 ----------------------
IEC 61636-1:2016
IEEE Std 1636.1-2013 – 1 –
Software Interface
for Maintenance Information Collection
and Analysis (SIMICA):
Exchanging Test Results and Session
Information via the eXtensible Markup
Language (XML)
IMPORTANT NOTICE: IEEE Standards documents are not intended to ensure safety, security, health,
or environmental protection, or ensure against interference with or from other devices or networks.
Implementers of IEEE Standards documents are responsible for determining and complying with all
appropriate safety, security, environmental, health, and interference protection practices and all
applicable laws and regulations.This IEEE document is made available for use subject to important notices and legal disclaimers.
These notices and disclaimers appear in all publications containing this document and may
be found under the heading “Important Notice” or “Important Notices and Disclaimers
Concerning IEEE Documents.” They can also be obtained on request from IEEE or viewed at
http://standards.ieee.org/IPR/disclaimers.html.1. Overview
The XML schema and EXPRESS model described in this document are intended for the recording of the
history of the execution and observations from a test or test session. This information includes results data
directly generated by test equipment or by the test equipment operating software. The combination of this
information will aid in the improvement of the test process.The XML schema associated with this standard is based on World Wide Web Consortium (W3C) XML
eXtensible Markup Language (XML) 1.0 Proposed Edited Recommendation [B1].The EXPRESS model associated with this standard is based on ISO 10303-11:1994 [B9].
W3C is a registered trademark of the World Wide Web Consortium.Information on references can be found in Annex C.
Copyright © 2013 IEEE. All rights reserved.
---------------------- Page: 11 ----------------------
IEC 61636-1:2016
– 2 – IEEE Std 1636.1-2013
IEEE Std 1636.1-2013
IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA):
Exchanging Test Results and Session Information via the eXtensible Markup Language (XML)
1.1 ScopeThe scope of this standard is the definition of an exchange format, utilizing XML, for exchanging data
resulting from executing tests of a unit under test (UUT) via a test program in an automatic test
environment. The standard uses the information models of IEEE Std 1636™-2009 as a foundation.
1.2 PurposeThe purpose of this standard is to specify a software interface for access, exchange, and analysis of test
result information. The standard enables the capture of test results data, facilitating data analysis to assess
the effectiveness of test and diagnostic processes applied to complex systems. The test results information
model and XML schema define the semantics and exchange format for information to be used among
applications implementing the SIMICA family of standards.1.3 Application
1.3.1 Of this document
This document provides formal specifications of the information required for the development of shared
maintenance data and the results of testing. These are applicable to both the SIMICA family of standards
and the ATML family of standards.Anticipated users of this standard include the following:
a) System developers
b) System maintainers
c) Test program set (TPS) developers
d) TPS maintainers
e) Automatic test equipment (ATE) system developers
f) ATE system maintainers
g) Test instrument developers
1.3.2 Of this document’s annexes
This document includes three annexes. Of these three, two are normative (Annex A and Annex B).
Annex A contains the description of each of the XML schema elements and types.Annex B contains the description of the EXPRESS and EXPRESS-G model elements.
Annex C is informative, and thus are provided strictly as information, for both users and maintainers of this
document.Information on references can be found in Clause 2.
Copyright © 2013 IEEE. All rights reserved.
---------------------- Page: 12 ----------------------
IEC 61636-1:2016
IEEE Std 1636.1-2013 – 3 –
IEEE Std 1636.1-2013
IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA):
Exchanging Test Results and Session Information via the eXtensible Markup Language (XML)
1.4 PrecedenceIn the event of conflict between this document and an SIMICA family component standard, this document
shall take precedence.In the event of conflict between this document and a normatively referenced standard (See Clause 2), the
normatively referenced standard, as it applies to the information being produced, shall take precedence.
In the event of conflict between this document’s EXPRESS model definition and/or annotations and this
document’s XML schema definition and/or annotations, this document’s EXPRESS model definition
and/or annotations, as it applies to the information being produced, shall take precedence.
In the event of conflict between this document’s EXPRESS model definition and/or annotations and an
SIMICA family component standard and/or EXPRESS model, this document’s EXPRESS model definition
and/or annotations, as it applies to the information being produced, shall take precedence.
In the event of conflict between this document’s XML schema definition and/or annotations and an
SIMICA family component standard and/or XML schemas, this document’s XML schema definition and/or
annotations, as it applies to the information being produced, shall take precedence.
In the event of conflict between this document’s XML schema definition and/or annotations and the ATML
Common XML schema, this document’s XML schema definition and/or annotations, as it applies to the
information being produced, shall take precedence.1.5 Conventions used in this document
1.5.1 General
All simple, complex types attribute groups and elements will be listed; explanatory information will be
provided, along with examples if additional clarification is needed. The explanatory information shall
include information on the intended use of the elements and/or attributes where the name of the entity does
not clearly indicate its intended use. For elements derived from another source type (e.g., an abstract type),
only attributes which extend the source type shall be listed; details regarding the base type shall be listed
along with the base type.The namespace prefix “c:” identifies that the type or attribute group is contained in Annex B of IEEE Std
1671 (Schema-Common.xsd).When referring to an attribute of an XML element, the convention of [element]@[attribute] shall be used.
In cases where an attribute name is referred to with no associated element, the attribute name shall be
enclosed in single quotes.In tables that describe XML elements, the column “Use” indicates the occurrence constraints for each
element.a) “Required” indicates that the element shall appear exactly once.
b) “Optional” indicates that the element may appear once or not at all.
c) “1..’” indicates that the element shall appear at least once and may appear multiple times.
d) “0..’” indicates that the element may appear multiple times, once, or not at all.
Copyright © 2013 IEEE. All rights reserved.---------------------- Page: 13 ----------------------
IEC 61636-1:2016
– 4 – IEEE Std 1636.1-2013
IEEE Std 1636.1-2013
IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA):
Exchanging Test Results and Session Information via the eXtensible Markup Language (XML)
All specifications for the EXPRESS language are given in the Courier type font which includes
references to entity and attribute names in the supporting text.1.5.2 Word usage
In this document, the word shall is used to indicate a mandatory requirement. The word should is used to
indicate a recommendation. The word may is used to indicate a permissible action. The word can is used
for statements of possibility and capability.2. Normative references
The following referenced documents are indispensable for the application of this document (i.e., they must
be understood and used, so each referenced document is cited in text and its relationship to this document is
explained). For dated references, only the edition cited applies. For undated references, the latest edition of
the referenced document (including any amendments or corrigenda) applies.IEEE Std 1636™-2009, IEEE Trial-Use Standard for Software Interface for Maintenance Information
4, 5Collection and Analysis (SIMICA).
IEEE 1636.99™-2013, IEEE Standard for Software Interface for Maintenance Information Collection and
Analysis (SIMICA): Common Information Elements.IEEE Std.1671™-2010, IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging
Automatic Test Equipment and Test Information via XML.3. Definitions, acronyms, and abbreviations
For the purposes of this document, the following terms and definitions apply. The IEEE Standards
Dictionary Online [B2] should be consulted for terms not defined in this clause.3.1 Definitions
branch: In an eXtensible Markup Language (XML) document or schema, a specified element and all
elements subordinate to that specified element.component (in eXtensible Markup Language (XML) schema): The generic term for the building blocks
that compose the abstract data model of the schema.eXtensible Markup Language (XML) attribute: Name-value pair associated with an XML element.
eXtensible Markup Language (XML) document: A (text) data object that conforms to the XML
requirements for being well-formed (as defined by W3C).IEEE publications are available from The Institute of Electrical and Electronics Engineers (http://standards.ieee.org/).
The IEEE standards or products referred to in this clause are trademarks of The Institute of Electrical and Electronics Engineers, Inc.
IEEE Standards Dictionary Online subscription is available at:http://www.ieee.org/portal/innovate/products/standard/standards_dictionary.html
Copyright © 2013 IEEE. All rights reserved.
---------------------- Page: 14 ----------------------
IEC 61636-1:2016
IEEE Std 1636.1-2013 – 5 –
IEEE Std 1636.1-2013
IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA):
Exchanging Test Results and Session Information via the eXtensible Markup Language (XML)
eXtensible Markup Language (XML) namespace: A method for distinguishing XML elements and
attributes that may have the same name but different meanings. A URL is used as a prefix to a “local
name.” This combination ensures the uniqueness of the element or attribute name. The URL is used only as
a way to create a unique prefix and does not have to resolve to a real page on the Internet.
NOTE—See Namespaces in XML 1.0 [B10] and Schenk and Wilson [B11] .eXtensible Markup Language (XML) schema: The structu
...
Questions, Comments and Discussion
Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.