Software interface for maintenance information collection and analysis (SIMICA): Exchanging test results and session information via the extensible markup language (XML)

IEC 61636-1:2016(E) is the definition of an exchange format, utilizing XML, for exchanging data resulting from executing tests of a unit under test (UUT) via a test program in an automatic test environment. This standard is published as a double logo IEC-IEEE standard.

General Information

Status
Published
Publication Date
07-Nov-2016
Current Stage
DELPUB - Deleted Publication
Completion Date
08-Jun-2021
Ref Project

Relations

Buy Standard

Standard
IEC 61636-1:2016 - Software interface for maintenance information collection and analysis (SIMICA): Exchanging test results and session information via the extensible markup language (XML)
English language
85 pages
sale 15% off
Preview
sale 15% off
Preview

Standards Content (Sample)


IEC 61636-1 ®
Edition 1.0 2016-11

IEEE Std 1636.1
INTERNATIONAL
STANDARD
Software interface for maintenance information collection and analysis (SIMICA):
Exchanging test results and session information via the extensible markup
language (XML)
All rights reserved. IEEE is a registered trademark in the U.S. Patent & Trademark Office, owned by the Institute of
Electrical and Electronics Engineers, Inc. Unless otherwise specified, no part of this publication may be reproduced
or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without
permission in writing from the IEC Central Office. Any questions about IEEE copyright should be addressed to the

IEEE. Enquiries about obtaining additional rights to this publication and other information requests should be
addressed to the IEC or your local IEC member National Committee.

IEC Central Office Institute of Electrical and Electronics Engineers, Inc.
3, rue de Varembé 3 Park Avenue
CH-1211 Geneva 20 New York, NY 10016-5997
Switzerland United States of America
Tel.: +41 22 919 02 11 stds.info@ieee.org
Fax: +41 22 919 03 00 www.ieee.org
info@iec.ch
www.iec.ch
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.

About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigenda or an amendment might have been published.

IEC Catalogue - webstore.iec.ch/catalogue Electropedia - www.electropedia.org
The stand-alone application for consulting the entire The world's leading online dictionary of electronic and
bibliographical information on IEC International Standards, electrical terms containing 20 000 terms and definitions in
Technical Specifications, Technical Reports and other English and French, with equivalent terms in 15 additional
documents. Available for PC, Mac OS, Android Tablets and languages. Also known as the International Electrotechnical
iPad. Vocabulary (IEV) online.

IEC publications search - www.iec.ch/searchpub IEC Glossary - std.iec.ch/glossary
The advanced search enables to find IEC publications by a 65 000 electrotechnical terminology entries in English and
variety of criteria (reference number, text, technical French extracted from the Terms and Definitions clause of
committee,…). It also gives information on projects, replaced IEC publications issued since 2002. Some entries have been
and withdrawn publications. collected from earlier publications of IEC TC 37, 77, 86 and

CISPR.
IEC Just Published - webstore.iec.ch/justpublished

Stay up to date on all new IEC publications. Just Published IEC Customer Service Centre - webstore.iec.ch/csc
details all new publications released. Available online and If you wish to give us your feedback on this publication or
also once a month by email. need further assistance, please contact the Customer Service
Centre: csc@iec.ch.
IEC 61636-1 ®
Edition 1.0 2016-11
IEEE Std 1636.1™
INTERNATIONAL
STANDARD
Software interface for maintenance information collection and analysis (SIMICA):

Exchanging test results and session information via the extensible markup

language (XML)
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 25.040.01; 35.060 ISBN 978-2-8322-3684-0

– i – IEEE Std 1636.1-2013
Contents
1. Overview . 1
1.1 Scope . 2
1.2 Purpose . 2
1.3 Application . 2
1.4 Precedence. 3
1.5 Conventions used in this document . 3
2. Normative references. 4
3. Definitions, acronyms, and abbreviations . 4
3.1 Definitions . 4
3.2 Acronyms and abbreviations . 5
4. Test results and session information. 6
4.1 Background. 6
4.2 Introduction . 6
4.3 Applicability . 6
4.4 Usage . 7
4.5 Relationships to other automatic test system (ATS) architectural elements. 7
5. EXPRESS model, EXPRESS-G diagram, and XML schema names and locations . 9
6. Conformance . 10
7. Extensibility. 11
Annex A (normative) XML schemas . 12
A.1 TestResults.xsd . 12
A.2 TestResultsCollection.xsd. 59
Annex B (normative) EXPRESS models . 60
B.1 TEST_RESULTS_MODEL. 60
B.2 TestResults model EXPRESS-G diagrams . 76
Annex C (informative) Bibliography. 83
Annex D (informative) IEEE list of participants.85

viii
IEEE Std 1636.1-2013 – ii –
SOFTWARE INTERFACE
FOR MAINTENANCE INFORMATION COLLECTION
AND ANALYSIS (SIMICA):
EXCHANGING TEST RESULTS AND SESSION
INFORMATION VIA THE EXTENSIBLE MARKUP
LANGUAGE (XML)
)25(:25'
  7KH,QWHUQDWLRQDO(OHFWURWHFKQLFDO&RPPLVVLRQ ,(& LVDZRUOGZLGHRUJDQL]DWLRQIRUVWDQGDUGL]DWLRQFRPSULVLQJ
DOO QDWLRQDO HOHFWURWHFKQLFDO FRPPLWWHHV ,(& 1DWLRQDO &RPPLWWHHV 7KHREMHFWRI,(&LVWRSURPRWH
LQWHUQDWLRQDOFRRSHUDWLRQRQDOOTXHVWLRQVFRQFHUQLQJVWDQGDUGL]DWLRQLQWKHHOHFWULFDODQGHOHFWURQLFILHOGV7R
WKLVHQGDQGLQDGGLWLRQWRRWKHUDFWLYLWLHV,(&SXEOLVKHV,QWHUQDWLRQDO6WDQGDUGV7HFKQLFDO6SHFLILFDWLRQV
7HFKQLFDO 5HSRUWV 3XEOLFO\ $YDLODEOH 6SHFLILFDWLRQV 3$6  DQG *XLGHV KHUHDIWHU UHIHUUHG WR DV ³,(&
3XEOLFDWLRQ V ´ 7KHLUSUHSDUDWLRQLVHQWUXVWHGWRWHFKQLFDOFRPPLWWHHVDQ\,(&1DWLRQDO&RPPLWWHHLQWHUHVWHG
LQ WKH VXEMHFW GHDOW ZLWK PD\ SDUWLFLSDWH LQ WKLV SUHSDUDWRU\ ZRUN ,QWHUQDWLRQDO JRYHUQPHQWDO DQG QRQ
JRYHUQPHQWDORUJDQL]DWLRQVOLDLVLQJZLWKWKH,(&DOVRSDUWLFLSDWHLQWKLVSUHSDUDWLRQ
,(((6WDQGDUGVGRFXPHQWVDUHGHYHORSHGZLWKLQ,(((6RFLHWLHVDQG6WDQGDUGV&RRUGLQDWLQJ&RPPLWWHHVRIWKH
,(((6WDQGDUGV$VVRFLDWLRQ ,(((6$ 6WDQGDUGV%RDUG,(((GHYHORSVLWVVWDQGDUGVWKURXJKDFRQVHQVXV
GHYHORSPHQWSURFHVVZKLFKEULQJVWRJHWKHUYROXQWHHUVUHSUHVHQWLQJYDULHGYLHZSRLQWVDQGLQWHUHVWVWRDFKLHYH
WKHILQDOSURGXFW9ROXQWHHUVDUHQRWQHFHVVDULO\PHPEHUVRI,(((DQGVHUYHZLWKRXWFRPSHQVDWLRQ:KLOH,(((
DGPLQLVWHUVWKHSURFHVVDQGHVWDEOLVKHVUXOHVWRSURPRWHIDLUQHVVLQWKHFRQVHQVXVGHYHORSPHQWSURFHVV,(((
GRHV QRW LQGHSHQGHQWO\ HYDOXDWH WHVW RU YHULI\ WKH DFFXUDF\ RI DQ\ RI WKH LQIRUPDWLRQ FRQWDLQHG LQ LWV
VWDQGDUGV8VHRI,(((6WDQGDUGVGRFXPHQWVLVZKROO\YROXQWDU\,(((GRFXPHQWVDUHPDGHDYDLODEOHIRUXVH
VXEMHFWWRLPSRUWDQWQRWLFHVDQGOHJDOGLVFODLPHUV VHHKWWSVWDQGDUGVLHHHRUJ,35GLVFODLPHUVKWPOIRUPRUH
LQIRUPDWLRQ 
,(&FROODERUDWHVFORVHO\ZLWK,(((LQDFFRUGDQFHZLWKFRQGLWLRQVGHWHUPLQHGE\DJUHHPHQWEHWZHHQWKHWZR
RUJDQL]DWLRQV
  7KHIRUPDOGHFLVLRQVRI,(&RQWHFKQLFDOPDWWHUVH[SUHVVDVQHDUO\DVSRVVLEOHDQLQWHUQDWLRQDOFRQVHQVXVRI
RSLQLRQRQWKHUHOHYDQWVXEMHFWVVLQFHHDFKWHFKQLFDOFRPPLWWHHKDVUHSUHVHQWDWLRQIURPDOOLQWHUHVWHG,(&
1DWLRQDO&RPPLWWHHV7KHIRUPDOGHFLVLRQVRI,(((RQWHFKQLFDOPDWWHUVRQFHFRQVHQVXVZLWKLQ,(((6RFLHWLHV
DQG6WDQGDUGV&RRUGLQDWLQJ&RPPLWWHHVKDVEHHQUHDFKHGLVGHWHUPLQHGE\DEDODQFHGEDOORWRIPDWHULDOO\
LQWHUHVWHG SDUWLHV ZKR LQGLFDWH LQWHUHVW LQ UHYLHZLQJ WKH SURSRVHG VWDQGDUG )LQDO DSSURYDO RI WKH ,(((
VWDQGDUGVGRFXPHQWLVJLYHQE\WKH,(((6WDQGDUGV$VVRFLDWLRQ ,(((6$ 6WDQGDUGV%RDUG
  ,(&,((( 3XEOLFDWLRQV KDYH WKH IRUP RI UHFRPPHQGDWLRQV IRU LQWHUQDWLRQDO XVH DQG DUH DFFHSWHG E\ ,(&
1DWLRQDO&RPPLWWHHV,(((6RFLHWLHVLQWKDWVHQVH:KLOHDOOUHDVRQDEOHHIIRUWVDUHPDGHWRHQVXUHWKDWWKH
WHFKQLFDOFRQWHQWRI,(&,(((3XEOLFDWLRQVLVDFFXUDWH,(&RU,(((FDQQRWEHKHOGUHVSRQVLEOHIRUWKHZD\LQ
ZKLFKWKH\DUHXVHGRUIRUDQ\PLVLQWHUSUHWDWLRQE\DQ\HQGXVHU
  ,QRUGHUWRSURPRWHLQWHUQDWLRQDOXQLIRUPLW\,(&1DWLRQDO&RPPLWWHHVXQGHUWDNHWRDSSO\,(&3XEOLFDWLRQV
LQFOXGLQJ,(&,(((3XEOLFDWLRQV WUDQVSDUHQWO\WRWKHPD[LPXPH[WHQWSRVVLEOHLQWKHLUQDWLRQDODQGUHJLRQDO
SXEOLFDWLRQV$Q\GLYHUJHQFHEHWZHHQDQ\,(&,(((3XEOLFDWLRQDQGWKHFRUUHVSRQGLQJQDWLRQDORUUHJLRQDO
SXEOLFDWLRQVKDOOEHFOHDUO\LQGLFDWHGLQWKHODWWHU
  ,(&DQG,(((GRQRWSURYLGHDQ\DWWHVWDWLRQRIFRQIRUPLW\,QGHSHQGHQWFHUWLILFDWLRQERGLHVSURYLGHFRQIRUPLW\
DVVHVVPHQWVHUYLFHVDQGLQVRPHDUHDVDFFHVVWR,(&PDUNVRIFRQIRUPLW\,(&DQG,(((DUHQRWUHVSRQVLEOH
IRUDQ\VHUYLFHVFDUULHGRXWE\LQGHSHQGHQWFHUWLILFDWLRQERGLHV
  $OOXVHUVVKRXOGHQVXUHWKDWWKH\KDYHWKHODWHVWHGLWLRQRIWKLVSXEOLFDWLRQ
  1ROLDELOLW\VKDOODWWDFKWR,(&RU,(((RUWKHLUGLUHFWRUVHPSOR\HHVVHUYDQWVRUDJHQWVLQFOXGLQJLQGLYLGXDO
H[SHUWVDQGPHPEHUVRIWHFKQLFDOFRPPLWWHHVDQG,(&1DWLRQDO&RPPLWWHHVRUYROXQWHHUVRI,(((6RFLHWLHV
DQGWKH6WDQGDUGV&RRUGLQDWLQJ&RPPLWWHHVRIWKH,(((6WDQGDUGV$VVRFLDWLRQ ,(((6$ 6WDQGDUGV%RDUG
IRUDQ\SHUVRQDOLQMXU\SURSHUW\GDPDJHRURWKHUGDPDJHRIDQ\QDWXUHZKDWVRHYHUZKHWKHUGLUHFWRULQGLUHFW
RUIRUFRVWV LQFOXGLQJOHJDOIHHV DQGH[SHQVHVDULVLQJRXWRIWKHSXEOLFDWLRQXVHRIRUUHOLDQFHXSRQWKLV
,(&,(((3XEOLFDWLRQRUDQ\RWKHU,(&RU,(((3XEOLFDWLRQV
  $WWHQWLRQLVGUDZQWRWKHQRUPDWLYHUHIHUHQFHVFLWHGLQWKLVSXEOLFDWLRQ8VHRIWKHUHIHUHQFHGSXEOLFDWLRQVLV
LQGLVSHQVDEOHIRUWKHFRUUHFWDSSOLFDWLRQRIWKLVSXEOLFDWLRQ
  $WWHQWLRQ LV GUDZQ WR WKH SRVVLELOLW\ WKDW LPSOHPHQWDWLRQ RI WKLV ,(&,((( 3XEOLFDWLRQ PD\ UHTXLUH XVH RI
PDWHULDOFRYHUHGE\SDWHQWULJKWV%\SXEOLFDWLRQRIWKLVVWDQGDUGQRSRVLWLRQLVWDNHQZLWKUHVSHFWWRWKH
H[LVWHQFHRUYDOLGLW\RIDQ\SDWHQWULJKWVLQFRQQHFWLRQWKHUHZLWK,(&RU,(((VKDOOQRWEHKHOGUHVSRQVLEOHIRU
LGHQWLI\LQJ(VVHQWLDO3DWHQW&ODLPVIRUZKLFKDOLFHQVHPD\EHUHTXLUHGIRUFRQGXFWLQJLQTXLULHVLQWRWKHOHJDO
YDOLGLW\ RU VFRSH RI 3DWHQW &ODLPV RU GHWHUPLQLQJ ZKHWKHU DQ\ OLFHQVLQJ WHUPV RU FRQGLWLRQV SURYLGHG LQ
FRQQHFWLRQZLWKVXEPLVVLRQRID/HWWHURI$VVXUDQFHLIDQ\RULQDQ\OLFHQVLQJDJUHHPHQWVDUHUHDVRQDEOHRU
QRQGLVFULPLQDWRU\8VHUVRIWKLVVWDQGDUGDUHH[SUHVVO\DGYLVHGWKDWGHWHUPLQDWLRQRIWKHYDOLGLW\RIDQ\SDWHQW
ULJKWVDQGWKHULVNRILQIULQJHPHQWRIVXFKULJKWVLVHQWLUHO\WKHLURZQUHVSRQVLELOLW\

– iii – IEEE Std 1636.1-2013
,QWHUQDWLRQDO 6WDQGDUG ,(& ,((( 6WG  KDV EHHQ SURFHVVHG WKURXJK ,(&
WHFKQLFDOFRPPLWWHH(OHFWURQLFVDVVHPEO\WHFKQRORJ\XQGHUWKH,(&,((('XDO/RJR
$JUHHPHQW
7KHWH[WRIWKLVVWDQGDUGLVEDVHGRQWKHIROORZLQJGRFXPHQWV
,(((6WG )',6 5HSRUWRQYRWLQJ
   )',6 59'
)XOOLQIRUPDWLRQRQWKHYRWLQJIRUWKHDSSURYDORIWKLVVWDQGDUGFDQEHIRXQGLQWKHUHSRUWRQ
YRWLQJLQGLFDWHGLQWKHDERYHWDEOH
7KH,(&7HFKQLFDO&RPPLWWHHDQG,(((7HFKQLFDO&RPPLWWHHKDYHGHFLGHGWKDWWKHFRQWHQWV
RIWKLVSXEOLFDWLRQZLOOUHPDLQXQFKDQJHGXQWLOWKHVWDELOLW\GDWHLQGLFDWHGRQWKH,(&ZHEVLWH
XQGHUKWWSZHEVWRUHLHFFKLQWKHGDWDUHODWHGWRWKHVSHFLILFSXEOLFDWLRQ$WWKLVGDWHWKH
SXEOLFDWLRQZLOOEH
‡ UHFRQILUPHG
‡ ZLWKGUDZQ
‡ UHSODFHGE\DUHYLVHGHGLWLRQRU
‡ DPHQGHG

IEEE Std 1636
...

Questions, Comments and Discussion

Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.