IEC 62321-3-1:2026

Determination of certain substances in electrotechnical products - Part 3-1: Screening - Lead, mercury, cadmium, total chromium, total bromine, total phosphorus, total chlorine, total tin and total antimony content by X-ray fluorescence spectrometry

IEC 62321-3-1:2026 is available as IEC 62321-3-1:2026 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.
IEC 62321-3-1:2026 describes the screening analysis of substances, specifically lead (Pb), mercury (Hg), cadmium (Cd), total chromium (Cr), total bromine (Br), total phosphorus (P), assuming the source of P is related to TCEP (CAS 115‑96‑8), Trixylyl-phosphate (CAS 25155‑23‑1), total chlorine (Cl), assuming the source of Cl is related to SCCP (CAS 85535‑84‑8), TCEP (CAS 115‑96‑8) , TBTC (CAS 1461‑22‑9), total tin (Sn), assuming the source of Sn is related to restricted organo-tin compounds, total antimony (Sb), assuming the source of Sb is related to Pyrochlore, and antimony lead yellow (CAS 8012‑00‑8) in uniform materials found in electrotechnical products, using the analytical technique of X‑ray fluorescence (XRF) spectrometry.
This edition includes the following significant technical changes with respect to the previous editions of IEC 62321-3-1:2013 and IEC 62321:2008:
a) This second edition of IEC 62321-3-1 includes the analysis of additional elements as indicators for additional substances. The selection is based on IEC TR 62936:2016. There are also comments about using the same methology for screening for content of critical raw materials (CRMs).
This document has been given the status of a horizontal document in accordance with the ISO/IEC Directives, Part 1.

Détermination de certaines substances dans les produits électrotechniques - Partie 3-1: Détection - Présence de plomb, mercure, cadmium, chrome total, brome total, phosphore total, chlore total, étain total et antimoine total par la spectrométrie de fluorescence X

IEC 62321-3-1:2026 est disponible sous forme de IEC 62321-3-1:2026 RLV qui contient la Norme internationale et sa version Redline, illustrant les modifications du contenu technique depuis l'édition précédente.
L'IEC 62321-3-1:2026 présente partie de l'IEC 62321 décrit une méthode de détection de substances, en particulier le plomb (Pb), le mercure (Hg), le cadmium (Cd), le chrome total (Cr), le brome total (Br), le phosphore total (P), en prenant pour hypothèse que la source de P est associée au TCEP (CAS 115‑96‑8) ou au phosphate de trixylyle (CAS 25155‑23‑1), le chlore total (Cl), en prenant pour hypothèse que la source de Cl est associée au PCCC (CAS 85535‑84‑8), au TCEP (CAS 115‑96‑8) ou au TBTC (CAS 1461‑22‑9), l'étain total (Sn), en prenant pour hypothèse que la source de Sn est associée aux composés organostanniques réglementés, l'antimoine total (Sb), en prenant pour hypothèse que la source de Sb est associée au pyrochlore ou à l'antimoniate de plomb (ou jaune de Naples) (CAS 8012‑00‑8), dans des matériaux homogènes rencontrés dans les produits électrotechniques, en utilisant la technique d'analyse de spectrométrie de fluorescence X (XRF, X‑Ray Fluorescence).
Cette édition inclut les modifications techniques majeures suivantes par rapport aux éditions précédentes de l'IEC 62321‑3‑1:2013 et de l'IEC 62321:2008:
a) Cette deuxième édition de l'IEC 62321‑3‑1 inclut l'analyse d'éléments complémentaires comme indicateurs de substances supplémentaires. La sélection repose sur l'IEC TR 62936:2016. Cette édition contient également des commentaires concernant l'utilisation de la même méthodologie pour la détection de la présence de matières premières critiques (CRM, Critical Raw Materials).
Le présent document a obtenu le statut de publication horizontale conformément aux Directives ISO/IEC, Partie 1.

General Information

• Status: Published
• Publication Date: 05-May-2026
• ICS: 13.020.01 - Environment and environmental protection in general
• ICS: 43.040.10 - Electrical and electronic equipment
• Technical Committee: TC 111 - Environmental standardization for electrical and electronic products and systems
• Drafting Committee: WG 3 - TC 111/WG 3
• Current Stage: PPUB - Publication issued
• Start Date: 06-May-2026
• Completion Date: 22-May-2026

Relations

• Replaces: IEC 62321:2008 - Electrotechnical products - Determination of levels of six regulated substances (lead, mercury, cadmium, hexavalent chromium, polybrominated biphenyls, polybrominated diphenyl ethers)
• Effective Date: 08-May-2026
• Revises: IEC 62321-3-1:2013 - Determination of certain substances in electrotechnical products - Part 3-1: Screening - Lead, mercury, cadmium, total chromium and total bromine by X-ray fluorescence spectrometry
• Effective Date: 05-Sep-2023

Overview

IEC 62321-3-1:2026, published by the International Electrotechnical Commission (IEC), is an essential international standard for the determination of restricted and controlled substances in electrotechnical products. Part 3-1 specifically addresses the screening of lead, mercury, cadmium, total chromium, total bromine, total phosphorus, total chlorine, total tin, and total antimony contents using X-ray fluorescence (XRF) spectrometry. This updated second edition has expanded its scope to include additional elements and reflects major technical changes to align with evolving global regulatory and market needs.

IEC 62321-3-1:2026 stands as a horizontal environmental standard, designed to help the electrotechnical industry and laboratories identify hazardous substances efficiently, ensuring safer, compliant, and more sustainable products.

Key Topics

• Substances Covered: The standard provides guidance for screening the following substances commonly regulated in electrical and electronic equipment:

  • Lead (Pb)
  • Mercury (Hg)
  • Cadmium (Cd)
  • Total Chromium (Cr)
  • Total Bromine (Br)
  • Total Phosphorus (P), related to TCEP and trixylyl-phosphate
  • Total Chlorine (Cl), linked to SCCP, TCEP, TBTC
  • Total Tin (Sn), associated with organotin compounds
  • Total Antimony (Sb), associated with pyrochlore and antimony lead yellow

• Sample Types: Procedures apply to uniform materials found in plastics, metals, ceramics, and processed mixtures relevant to electrotechnical manufacturing.

• Analytical Technique: X-ray fluorescence (XRF) spectrometry is used as a rapid, non-destructive screening tool for initial detection and risk assessment.

• New Elements & Methodology: The second edition incorporates additional screening indicators for critical raw materials, in line with IEC TR 62936:2016 and recognizes market demand for the detection of new restricted substances.

• Interpretation of Results: The screening identifies total content of each element; it does not distinguish chemical forms (e.g., Cr(VI) from total Cr), hence positive detections near or above thresholds require additional, confirmatory testing.

Applications

IEC 62321-3-1:2026 is widely adopted by:

• Manufacturers of electrical and electronic products: To ensure compliance with global regulations such as RoHS, REACH, and regional market requirements.
• Testing laboratories: For routine, fast screening of components, assemblies, cables, housing plastics, solder, and more.
• Product safety and compliance departments: To implement risk management strategies for restricted substances, critical raw materials, and environmental responsibility.
• Quality assurance and auditing: To minimize the cost and time of compliance checks by using XRF as a frontline screening method before further analysis.
• Supply chain partners: To ensure material declarations are robust and verified throughout the procurement and manufacturing process.
• Regulatory authorities: As a reference method for market surveillance and enforcement.

By establishing harmonized methods for detecting regulated substances, the standard helps organizations reduce the risks of non-compliance, facilitates timely product launches, and supports sustainable production practices.

Related Standards

To fully implement a robust substance management program, IEC 62321-3-1:2026 should be considered alongside:

• IEC 62321-1: Introduction and overview for the determination of certain substances in electrotechnical products.
• IEC 62321-2: Sample disassembly, dismantling, and preparation for testing.
• IEC TR 62936:2016: Technical report guiding the screening of critical raw materials in electrical and electronic equipment.
• ISO/IEC Guide 98-1: Guidance for the expression of measurement uncertainty.

Keywords: IEC 62321-3-1:2026, hazardous substances, XRF screening, lead detection, mercury analysis, cadmium screening, brominated flame retardants, chlorine, RoHS compliance, electrotechnical product testing, restricted materials, international standard, critical raw materials, environmental compliance, electronics industry standards.

Standards Content (Sample)

IEC 62321-3-1 ®
Edition 2.0 2026-05
INTERNATIONAL
STANDARD
REDLINE VERSION
HORIZONTAL STANDARD
Determination of certain substances in electrotechnical products -
Part 3-1: Screening - Lead, mercury, cadmium, total chromium, total bromine,
total phosphorus, total chlorine, total tin and total antimony content by X-ray
fluorescence spectrometry
ICS 13.020.01; 43.040.10 ISBN 978-2-8327-1244-3
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CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 7
2 Normative references . 10
3 Terms, definitions and abbreviated terms . 10
3.1 Terms and definitions. 10
3.2 Abbreviated terms . 10
4 Principle . 11
4.1 Overview . 11
4.2 Principle of test . 11
4.3 Explanatory comments . 12
5 Apparatus, equipment and materials . 12
5.1 XRF spectrometer . 12
5.2 Materials and tools. 13
6 Reagents . 13
7 Sampling . 13
7.1 General . 13
7.2 Non-destructive approach . 13
7.3 Destructive approach . 13
8 Test procedure . 14
8.1 General . 14
8.2 Preparation of the spectrometer . 14
8.3 Test portion specimen . 16
8.4 Verification of spectrometer performance . 16
8.5 Tests . 17
8.6 Calibration . 17
9 Calculations. 18
10 Precision . 19
10.1 General . 19
10.2 Lead . 19
10.3 Mercury . 19
10.4 Cadmium . 20
10.5 Chromium . 20
10.6 Bromine . 20
10.7 Phosphorus, chlorine, tin, and antimony . 20
10.8 Repeatability statement for five tested substances sorted by type of tested
material . 20
10.9 Reproducibility statement for five tested substances sorted by type of tested
material . 23
11 Quality control . 26
11.1 Accuracy of calibration . 26
11.2 Control samples . 26
12 Special cases . 26
13 Test report . 27
Annex A (informative) Practical aspects of screening by X-ray fluorescence
spectrometry (XRF) and interpretation of the results . 28
A.1 Introductory remark . 28
A.2 Matrix and interference effects . 28
A.3 Interpretation of results (for regulated substances) . 29
A.4 Statistical data of the IIS2, IIS4, and IIS5 for the XRF method . 32
Annex B (informative) Practical examples of screening with XRF . 36
B.1 Introductory remark . 36
B.2 XRF instrumentation . 36
B.3 Factors affecting XRF results . 37
B.3.1 General . 37
B.3.2 Examples of screening with XRF . 37
Bibliography . 45

Figure B.1 – AC power cord, X-ray spectra of sampled sections . 38
Figure B.2 – RS232 cable and its X-ray spectra . 39
Figure B.3 – Cell phone charger shown partially disassembled . 39
Figure B.4 – PWB and cable of cell phone charger . 40
Figure B.5 – Analysis of a single solder joint on a PWB . 41
Figure B.6 – Spectra and results obtained on printed circuit board with two collimators . 42
Figure B.7 – Examples of substance mapping on PWBs . 43
Figure B.8 – SEM-EDX image of Pb free solder with small intrusions of Pb
(size = 30 µm). 44

Table 1 – Tested concentration ranges for lead in materials. 7
Table 2 – Tested concentration ranges for mercury in materials . 8
Table 3 – Tested concentration ranges for cadmium in materials . 8
Table 4 – Tested concentration ranges for total chromium in materials . 8
Table 5 – Tested concentration ranges for total bromine in materials . 8
Table 6 – Tested concentration ranges for total phosphorus in materials . 9
Table 7 – Tested concentration ranges for total chlorine in materials . 9
Table 8 – Tested concentration ranges for total tin in materials . 9
Table 9 – Tested concentration ranges for total antimony in materials . 9
a
Table 10 – Recommended X-ray lines for individual analytes . 15
Table 11 – Material: ABS (acrylonitrile butadiene styrene), as granules and plates . 21
Table 12 – Material: PE (low density polyethylene), as granules . 21
Table 13 – Material: PC/ABS (polycarbonate and ABS blend), as granules . 21
Table 14 – Material: HIPS (high impact polystyrene), as plate . 22
Table 15 – Material: PVC (polyvinyl chloride), as granules . 22
Table 16 – Material: Polyolefin, as granules . 22
Table 17 – Material: Crystal glass . 22
Table 18 – Material: Glass . 22
Table 19 – Material: Lead-free solder, chips . 22
Table 20 – Material: Si/Al Alloy, chips . 22
Table 21 – Material: Aluminum casting alloy, chips . 22
Table 22 – Material: PCB – Printed circuit board ground to less than 250 µm . 23
Table 23 – Material: different plastics materials, as plates . 23
Table 24 – Material: ABS (Acrylonitrile butadiene styrene), as granules and plates . 23
Table 25 – Material: PE (low density polyethylene), as granules . 24
Table 26 – Material: PC/ABS (Polycarbonate and ABS blend), as granules . 24
Table 27 – Material: HIPS (high impact polystyrene), as plate . 24
Table 28 – Material: PVC (polyvinyl chloride), as granules . 24
Table 29 – Material: Polyolefin, as granules . 24
Table 30 – Material: Crystal glass . 24
Table 31 – Material: Glass . 25
Table 32 – Material: Lead-free solder, chips . 25
Table 33 – Material: Si/Al alloy, chips . 25
Table 34 – Material: Aluminum casting alloy, chips . 25
Table 35 – Material: PCB – Printed circuit board ground to less than 250 µm . 25
Table 36 – Material: different plastics materials, as plates . 25
Table A.1 – Effect of matrix composition on limits of detection of some controlled
elements . 29
Table A.2 –Screening limits in mg/kg for regulated elements in various matrices . 30
Table A.3 – Statistical data from IIS2 . 33
Table A.4 – Statistical data from IIS4 . 34
Table A.5 –Statistical data from IIS5 . 35
Table B.1 – Selection of samples for analysis of AC power cord . 37
Table B.2 – Selection of samples (testing locations) for analysis after visual inspection
– Cell phone charger . 40
Table B.3 – Results of XRF analysis at spots (1) and (2) as shown in Figure B.7 . 42

INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
Determination of certain substances in electrotechnical products -
Part 3-1: Screening - Lead, mercury, cadmium, total chromium, total
bromine, total phosphorus, total chlorine, total tin and total antimony
content by X-ray fluorescence spectrometry

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
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shall not be held responsible for identifying any or all such patent rights.
This redline version of the official IEC Standard allows the user to identify the changes made
to the previous edition IEC 62321-3-1:2013. A vertical bar appears in the margin wherever a
change has been made. Additions are in green text, deletions are in strikethrough red text.

IEC 62321‑3‑1 has been prepared by IEC technical committee 111: Environmental
standardization for electrical and electronic products and systems. It is an International
Standard.
This second edition cancels and replaces the first edition published in 2013 and the first edition
of IEC 62321 published in 2008. This edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
editions of IEC 62321‑3‑1:2013 and IEC 62321:2008:
a) This second edition of IEC 62321‑3‑1 includes the analysis of additional elements as
indicators for additional substances. The selection is based on IEC TR 62936:2016. There
are also comments about using the same methodology for screening for content of critical
raw materials (CRMs).
This document has been given the status of a horizontal document in accordance with the
ISO/IEC Directives, Part 1.
The text of this International Standard is based on the following documents:
Draft Report on voting
111/871/FDIS 111/887/RVD
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
Future parts in the IEC 62321 series will gradually replace the corresponding clauses in
IEC 62321:2008. Until such time as all parts are published, however, IEC 62321:2008 remains
valid for those clauses not yet re‑published as a separate part.
The language used for the development of this International Standard is English.
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are
described in greater detail at www.iec.ch/publications.
A list of all parts in the IEC 62321 series, published under the general title Determination of
certain substances in electrotechnical products, can be found on the IEC website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under webstore.iec.ch in the data related to the
specific document. At this date, the document will be
– reconfirmed,
– withdrawn, or
– revised.
INTRODUCTION
The widespread use of electrotechnical products has drawn increased attention to their impact
on the environment. In many countries this has resulted in the adaptation of regulations
affecting wastes, substances and energy use of electrotechnical products.
The use of certain substances (e.g. lead (Pb), cadmium (Cd) and polybrominated diphenyl
ethers (PBDEs)) in electrotechnical products, is a source of concern in current and proposed
regional legislation. With the actual revision the following elements are added: phosphorus (P),
assuming the source of P is related to TCEP, Trixylyl-phosphate, chlorine (Cl), assuming the
source of Cl is related to SCCP, TCEP, TBTC, tin (Sn), assuming the source of Sn is related to
restricted organo-tin compounds, antimony (Sb), assuming the source of Sb is related to
Pyrochlore, antimony lead yellow.
The purpose of the IEC 62321 series is therefore to provide test methods that will allow the
electrotechnical industry to determine the levels of certain substances of concern in
electrotechnical products on a consistent global basis.
WARNING – Persons using this International Standard should be familiar with normal
laboratory practice. This standard does not purport to address all of the safety problems,
if any, associated with its use. It is the responsibility of the user to establish appropriate
safety and health practices and to ensure compliance with any national regulatory
conditions.
The first edition of IEC 62321:2008 was a 'stand alone' standard that included an introduction,
an overview of test methods, a mechanical sample preparation as well as various test method
clauses.
The first edition of IEC 62321‑3‑1 was a partial replacement of IEC 62321:2008, forming a
structural revision and generally replacing Clauses 6 and Annex D.

1 Scope
This part of IEC 62321 describes the screening analysis of five substances, specifically lead
(Pb), mercury (Hg), cadmium (Cd), total chromium (Cr), total bromine (Br), total phosphorus (P),
assuming the source of P is related to TCEP (CAS 115‑96‑8), Trixylyl‑phosphate
(CAS 25155‑23‑1), total chlorine (Cl), assuming the source of Cl is related to SCCP
(CAS 85535‑84‑8), TCEP (CAS 115‑96‑8) , TBTC (CAS 1461‑22‑9), total tin (Sn), assuming the
source of Sn is related to restricted organo‑tin compounds, total antimony (Sb), assuming the
source of Sb is related to Pyrochlore, and antimony lead yellow (CAS 8012‑00‑8) in uniform
materials found in electrotechnical products, using the analytical technique of X‑ray
fluorescence (XRF) spectrometry.
The same methodology can also be used for screening of substances discussed as critical raw
materials in various countries (for example currently discussed in the EU: antimony (Sb), baryte,
bismuth (Bi), cobalt (Co), fluorspar, gallium (Ga), germanium (Ge), hafnium (Hf), indium (In),
magnesium (Mg), niobium (Nb), phosphorus (P), scandium (Sc), tantalum (Ta), tungsten (W),
vanadium (V), platinum group metals, heavy rare earth elements, light rare earth elements).
NOTE From EU information on critical raw materials [1] raw materials are crucial to Europe's economy. They form
a strong industrial base, producing a broad range of goods and applications used in everyday life and modern
technologies. Reliable and unhindered access to certain raw materials is a growing concern within the EU and across
the globe. To address this challenge, the European Commission has created a list of critical raw materials (CRMs)
for the EU, which is subject to a regular review and update. CRMs combine raw materials of high importance to the
EU economy and of high risk associated with their supply.
The method is applicable to polymers plastics, metals and ceramic materials. The test method
may can be applied to raw materials, individual materials taken from products and
"homogenized" mixtures of more than one material. Screening of a sample is performed using
any type of XRF spectrometer, provided it has the performance characteristics specified in this
test method. Not all types of XRF spectrometers are suitable for all sizes and shapes of sample.
Care should be taken to select The appropriate spectrometer design will be selected with care
for the task concerned.
The performance of this test method has been tested for the following substances in various
media and within the concentration ranges as specified in Table 1 to Table 5. During an IIS
(international interlaboratory study) the feasibility of the test method to use for the added
elements was tested. The results are listed in Table 6 to Table 10.
Table 1 – Tested concentration ranges for lead in materials
Substance/
Lead
element
Medium/material tested
Unit of
a b d
Low- Al, Lead- Ground Crystal Polyolefin
ABS PE PVC
Parameter
measure
c
alloy Al-Si free
glass
PWB
steel alloy solder
Concentration
15,7 14 190 22 000 390
or 240
e
mg/kg to to to 174 to to 380 to 640
concentration 000
954 108 930 23 000 665
range tested
a
Acrylonitrile butadiene styrene.
b
Polyethylene.
c
Printed wiring board.
d
Polyvinyl chloride.
e
This lead concentration was not detectable by instruments participating in tests.
___________
Numbers in square brackets refer to the Bibliography.
Table 2 – Tested concentration ranges for mercury in materials
Substance/element Mercury
Medium/material tested
Parameter Unit of measure
a b
ABS PE
Concentration or concentration range tested mg/kg 100 to 942 4 to 25
a
Acrylonitrile butadiene styrene.
b
Polyethylene.
Table 3 – Tested concentration ranges for cadmium in materials
Substance/element Cadmium
Medium/material tested
Unit of
Parameter
measure
a b
Lead-free solder
ABS PE
c
Concentration or concentration range tested mg/kg 10 to 183 19,6 to 141
a
Acrylonitrile butadiene styrene.
b
Polyethylene.
c
This cadmium concentration was not detectable by instruments participating in tests.

Table 4 – Tested concentration ranges for total chromium in materials
Substance/element Chromium
Medium/material tested
Parameter Unit of measure
Low-alloy
a b
Al, Al-Si alloy Glass
ABS PE
steel
Concentration or
concentration range mg/kg 16 to 944 16 to 115 240 130 to 1 100 94
tested
a
Acrylonitrile butadiene styrene.
b
Polyethylene.
Table 5 – Tested concentration ranges for total bromine in materials
Substance/element Bromine
Medium/material tested
Unit of
Parameter
measure
c a d b
HIPS , ABS PC/ABS PE
Concentration or concentration range tested mg/kg 25 to 118 400 800 to 2 400 96 to 808
a
Acrylonitrile butadiene styrene.
b
Polyethylene.
c
High impact polystyrene.
d
Polycarbonate and ABS blend.
Table 6 – Tested concentration ranges for total phosphorus in materials
Substance/element Phosphorus
Medium/material tested
Parameter Unit of measure
plastics
Concentration or concentration range tested mg/kg 90 to 8 300

Table 7 – Tested concentration ranges for total chlorine in materials
Substance/element Chlorine
Medium/material tested
Parameter Unit of measure
plastics
Concentration or concentration range tested mg/kg 100 to 380

Table 8 – Tested concentration ranges for total tin in materials
Substance/element Tin
Medium/material tested
Parameter Unit of measure
plastics
Concentration or concentration range tested mg/kg 30 to 110

Table 9 – Tested concentration ranges for total antimony in materials
Substance/element Antimony
Medium/material tested
Parameter Unit of measure
plastics
Concentration or concentration range tested mg/kg 190 to 380

These substances in similar media outside of the specified concentration ranges may can be
analysed according to this test method; however, the performance has not been established for
this document.
WARNING – Persons using this International Standard should be familiar with normal
laboratory practice. This standard does not purport to address all of the safety problems,
if any, associated with its use. It is the responsibility of the user to establish appropriate
safety and health practices and to ensure compliance with any national regulatory
conditions.
This document is a basic environment horizontal publication focusing on test methods and is
primarily intended for use by committees in the preparation of publications within the area of
environment in accordance with the principles laid down in IEC Guide 123. Wherever applicable,
it is the responsibility of committees to make use of environment basic publications in the
preparation of their environment group and product publications. Committees can apply this
document directly to products when they do not develop a product publication in the area of
environment.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies.
For undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC 62321‑1, Determination of certain substances in electrotechnical products ‑ Part 1:
Introduction and overview
IEC 62321‑2, Determination of certain substances in electrotechnical products ‑ Part 2:
Disassembly, disjointment and mechanical sample preparation
IEC/ISO Guide 98-1, Uncertainty of measurement – Part 1: Introduction to the expression of
uncertainty in measurement
ISO/IEC Guide 98‑1, Guide to the expression of uncertainty in measurement ‑ Part 1:
Introduction
3 Terms, definitions and abbreviated terms
3.1 Terms and definitions
For the purposes of this document, the terms and definitions given in IEC 62321‑1 and
IEC 62321‑2 apply.
ISO and IEC maintain terminology databases for use in standardization at the following
addresses:
– IEC Electropedia: available at https://www.electropedia.org/
– ISO Online browsing platform: available at https://www.iso.org/obp
3.2 Abbreviated terms
CRM Certified reference material
CRMs Critical raw materials
HBCDD Hexabromocyclododecane
MCCP Medium chain chlorinated paraffins
PBB Polybrominated biphenyl
PBDE Polybrominated diphenyl ether
SCCP Short chain chlorinated paraffins
TBBPA Tetrabromobisphenol A
TBTC Tributyltin chloride
TCEP Tris(2-chloroethyl) phosphate
___________
To be published.
4 Principle
4.1 Overview
The concept of "screening" has been developed to reduce the amount of testing. Executed as
a predecessor to any other test analysis, the main objective of screening is to quickly determine
whether the screened part or section of a product:
– contains a certain substance at a concentration significantly higher than its value or values
chosen as criterion, and therefore may can be deemed unacceptable;
– contains a certain substance at a concentration significantly lower than its value or values
chosen as criterion, and therefore may can be deemed acceptable;
– contains a certain substance at a concentration so close to the value or values chosen as
criterion that when all possible errors of measurement and safety factors are considered,
no conclusive decision can be made about the acceptable absence or presence of a certain
substance and, therefore, a follow-up action may can be required, including further analysis
using verification testing procedures.
For the screening analysis of critical raw materials only the analysis results are important, there
is no interpretation with regards to a maximum threshold value required.
This test method is designed specifically to screen for lead, mercury, cadmium, chromium,
bromine, phosphorus, chlorine, tin and antimony (Pb, Hg, Cd, Cr, Br, P, Cl, Sn, Sb) plus
elements required for screening for content of critical raw materials in uniform materials, which
occur in most electrotechnical products. Under typical circumstances, XRF spectrometry
provides information on the total quantity of each element present in the sample but does not
identify compounds or valence states of the elements. Therefore, special attention shall be paid
when screening for chromium, bromine, phosphorus, chlorine, tin and antimony, where the
result will reflect only the total chromium, total bromine, total phosphorus, total chlorine, total
tin and total antimony present. The presence of Cr(VI) or the brominated flame retardants PBB
or PBDE or TBBPA or HBCDD, or TCEP, Trixylyl-phosphate, red phosphorus, SCCP or MCCP,
TBTC, restricted organo-tin compounds, Pyrochlore, or antimony lead yellow shall be confirmed
by a verification test procedure that identify compounds or valence states of the elements. When
applying this method to electronics "as received", which, by the nature of their design, are not
uniform, care shall be taken in interpreting the results. Similarly, the analysis of Cr in conversion
coatings may can be difficult due to the presence of Cr in substrate material and/or. It also can
be difficult because of insufficient sensitivity for Cr in typically very thin (several hundred
typically 200 nm to 600 nm) conversion coating layers.
Screening analysis can be carried out by one of two means:
– non-destructively - by directly analysing the sample "as received";
– destructively - by applying one or more sample preparation steps prior to analysis.
In the latter case, the user shall apply the procedure for sample preparation as described in
IEC 62321‑2. This test method will guide the user in choosing the proper approach to sample
presentation.
4.2 Principle of test
The representative specimen of the object tested is placed in the measuring chamber or over
the measuring aperture of the X-ray fluorescence spectrometer. Alternatively, a measuring
window/ or aperture of a handheld, portable XRF analyser is placed flush against the surface
of the object tested. The analyser illuminates the specimen for a preselected measurement time
with a beam of X-rays which in turn excite characteristic X-rays of elements in the specimen.
The intensities of these characteristic X-rays are measured and converted to mass fractions or
concentrations of the elements in the tested sample using a calibration implemented in the
analyser.
The fundamentals of XRF spectrometry, as well as practical aspects of sampling for XRF, are
covered in detail in [2], [3], and [4].
4.3 Explanatory comments
To achieve its purpose, this test method shall provide rapid, unambiguous identification of the
elements of interest. The test method shall provide at least a level of accuracy that is sometimes
described as semi-quantitative, i.e. the relative uncertainty of a result is typically 30 % or better
at a defined level of confidence of 68 %. Some users may can tolerate higher relative
uncertainty, depending on their needs. This level of performance allows the user to sort
materials for additional testing. The overall goal is to obtain information for risk management
purposes.
This test method is designed to allow XRF spectrometers of all designs, complexity and
capability to contribute screening analyses. However, the capabilities of different XRF
spectrometers cover such a wide range that some will be relatively inadequate in their selectivity
and sensitivity while others will be more than adequate. Some spectrometers will allow easy
measurement of a wide range of sample shapes and sizes, while others, especially research-
grade WDXRF units, will be very inflexible in terms of test portions.
NOTE One technical parameter for ED-XRF instruments can be for example the detector resolution. A resolution of
better than 250 eV (at Mn K ) has been found suitable.
α
Given the above level of required performance and the wide variety of XRF spectrometers
capable of contributing useful measurements, the requirements for the specification of
procedures are considerably lower than for a high-performance test method for quantitative
determinations with low estimates of uncertainty must be defined carefully. As guidance the
information listed in Table A.2 can be used.
This test method is based on the concept of a performance-based measurement system.
Apparatus, sample preparation and calibration are specified in this document in relatively
general terms. It is the responsibility of the user to document all procedures developed in the
laboratory that uses the test method. The user shall establish a written procedure for all cases
denoted in this method by the term "work instructions".
The user of this test method shall document all relevant spectrometer and method performance
parameters.
For additional practical aspects of screening by X-ray fluorescence spectrometry (XRF) and
interpretation of the results please also refer to Annex A. For practical examples of screening
with XRF refer to Annex B.
WARNING 1 Persons using the XRF test method shall be trained in the use of XRF
spectrometers and the related sampling requirements.
WARNING 2 X-rays are hazardous to humans. Care shall be taken to operate the
equipment in accordance with both the safety instructions provided by the manufacturer
and the applicable local health and occupational safety regulations.
5 Apparatus, equipment and materials
5.1 XRF spectrometer
An XRF spectrometer consists of an X-ray excitation source, a means of reproducible sample
presentation, an X-ray detector, a data processor and a control system [5], [6] and [7]:
a) source of X-ray excitation - X-ray tube or radio-isotope sources are commonly used;
b) X-ray detector (detection subsystem) - device used to convert the energy of an X-ray photon
to a corresponding electric pulse of amplitude proportional to the photon energy.
5.2 Materials and tools
All materials used in the preparation of samples for XRF measurements shall be shown to be
free of contamination, specifically by the analytes of this test method. This means that all
grinding materials, solvents, fluxes, etc. shall not contain detectable quantities of Pb, Hg, Cd,
Cr and/or, Br, P, Cl, Sn, Sb, or any other critical raw material.
Tools used in the handling of samples shall be chosen to minimize contamination by the
analytes of this test method as well as by any other elements. Any procedures used to clean
the tools shall not introduce contaminants.
6 Reagents
Reagents, if any, shall be of recognized analytical grade and shall not contain detectable
quantities of Pb, Hg, Cd, Cr and/or, Br, P, Cl, Sn, Sb or any critical raw materials.
7 Sampling
7.1 General
It is the responsibility of the user of this test method to define the test sample using documented
work instructions. The user may can choose to define the test sample in a number of ways,
either via a non-destructive approach in which the portion to be measured is defined by the
viewing area of the spectrometer, or by a destructive approach in which the portion to be
measured is removed from the larger body of material and either measured as is, or destroyed
and prepared using a defined procedure.
7.2 Non-destructive approach
The user of this test method shall:
a) establish the area viewed by the spectrometer and place the test sample within that area,
taking care to ascertain that no fluorescent X-rays will be detected from materials other than
the defined test portion specimen. Usually, the area viewed by the spectrometer is a section
of a plane delineated by the shape and boundary of the measuring window of the instrument.
The area of the test sample viewed by the spectrometer shall be flat. Any deviation from the
flat area requirement shall be documented;
b) make sure that a repeatable measurement geometry with a repeatable distance between
the spectrometer and the test portion is established;
c) document the steps taken to disassemble a larger object to obtain a test portion.
7.3 Destructive approach
The following points shall be taken into account in the destructive approach:
a) the user shall create and follow a documented work instruction for the means of destruction
applied to obtain the test portion, as this information is critical for correct interpretation of
the measurement results;
b) a procedure that results in a powder shall produce a material with a known or controlled
particle size. In cases where the particles have different chemical, phase or mineralogical
compositions, it is critical to reduce their size sufficiently to minimize differential absorption
effects;
c) in a procedure that results in a material being dissolved in a liquid matrix, the quantity and
physical characteristics of the material to be dissolved shall be controlled and documented.
The resulting solution shall be completely homogeneous. Instructio
...

IEC 62321-3-1 ®
Edition 2.0 2026-05
INTERNATIONAL
STANDARD
HORIZONTAL STANDARD
Determination of certain substances in electrotechnical products -
Part 3-1: Screening - Lead, mercury, cadmium, total chromium, total bromine,
total phosphorus, total chlorine, total tin and total antimony content by X-ray
fluorescence spectrometry
ICS 13.020.01; 43.040.10 ISBN 978-2-8327-1223-8

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CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 7
2 Normative references . 10
3 Terms, definitions and abbreviated terms . 10
3.1 Terms and definitions. 10
3.2 Abbreviated terms . 10
4 Principle . 11
4.1 Overview . 11
4.2 Principle of test . 11
4.3 Explanatory comments . 12
5 Apparatus, equipment and materials . 12
5.1 XRF spectrometer . 12
5.2 Materials and tools. 13
6 Reagents . 13
7 Sampling . 13
7.1 General . 13
7.2 Non-destructive approach . 13
7.3 Destructive approach . 13
8 Test procedure . 14
8.1 General . 14
8.2 Preparation of the spectrometer . 14
8.3 Test specimen . 16
8.4 Verification of spectrometer performance . 16
8.5 Tests . 17
8.6 Calibration . 17
9 Calculations. 18
10 Precision . 19
10.1 General . 19
10.2 Lead . 19
10.3 Mercury . 19
10.4 Cadmium . 20
10.5 Chromium . 20
10.6 Bromine . 20
10.7 Phosphorus, chlorine, tin, and antimony . 20
10.8 Repeatability statement for five tested substances sorted by type of tested
material . 20
10.9 Reproducibility statement for five tested substances sorted by type of tested
material . 23
11 Quality control . 26
11.1 Accuracy of calibration . 26
11.2 Control samples . 26
12 Special cases . 26
13 Test report . 27
Annex A (informative) Practical aspects of screening by X-ray fluorescence
spectrometry (XRF) and interpretation of the results . 28
A.1 Introductory remark . 28
A.2 Matrix and interference effects . 28
A.3 Interpretation of results (for regulated substances) . 29
A.4 Statistical data of the IIS2, IIS4, and IIS5 for the XRF method . 32
Annex B (informative) Practical examples of screening with XRF . 36
B.1 Introductory remark . 36
B.2 XRF instrumentation . 36
B.3 Factors affecting XRF results . 37
B.3.1 General . 37
B.3.2 Examples of screening with XRF . 37
Bibliography . 45

Figure B.1 – AC power cord, X-ray spectra of sampled sections . 38
Figure B.2 – RS232 cable and its X-ray spectra . 39
Figure B.3 – Cell phone charger shown partially disassembled . 39
Figure B.4 – PWB and cable of cell phone charger . 40
Figure B.5 – Analysis of a single solder joint on a PWB . 41
Figure B.6 – Spectra and results obtained on printed circuit board with two collimators . 42
Figure B.7 – Examples of substance mapping on PWBs . 43
Figure B.8 – SEM-EDX image of Pb free solder with small intrusions of Pb
(size = 30 µm). 44

Table 1 – Tested concentration ranges for lead in materials. 7
Table 2 – Tested concentration ranges for mercury in materials . 8
Table 3 – Tested concentration ranges for cadmium in materials . 8
Table 4 – Tested concentration ranges for total chromium in materials . 8
Table 5 – Tested concentration ranges for total bromine in materials . 8
Table 6 – Tested concentration ranges for total phosphorus in materials . 9
Table 7 – Tested concentration ranges for total chlorine in materials . 9
Table 8 – Tested concentration ranges for total tin in materials . 9
Table 9 – Tested concentration ranges for total antimony in materials . 9
a
Table 10 – Recommended X-ray lines for individual analytes . 15
Table 11 – Material: ABS (acrylonitrile butadiene styrene), as granules and plates . 21
Table 12 – Material: PE (low density polyethylene), as granules . 21
Table 13 – Material: PC/ABS (polycarbonate and ABS blend), as granules . 21
Table 14 – Material: HIPS (high impact polystyrene), as plate . 22
Table 15 – Material: PVC (polyvinyl chloride), as granules . 22
Table 16 – Material: Polyolefin, as granules . 22
Table 17 – Material: Crystal glass . 22
Table 18 – Material: Glass . 22
Table 19 – Material: Lead-free solder, chips . 22
Table 20 – Material: Si/Al Alloy, chips . 22
Table 21 – Material: Aluminum casting alloy, chips . 22
Table 22 – Material: PCB – Printed circuit board ground to less than 250 µm . 23
Table 23 – Material: different plastics materials, as plates . 23
Table 24 – Material: ABS (Acrylonitrile butadiene styrene), as granules and plates . 23
Table 25 – Material: PE (low density polyethylene), as granules . 24
Table 26 – Material: PC/ABS (Polycarbonate and ABS blend), as granules . 24
Table 27 – Material: HIPS (high impact polystyrene), as plate . 24
Table 28 – Material: PVC (polyvinyl chloride), as granules . 24
Table 29 – Material: Polyolefin, as granules . 24
Table 30 – Material: Crystal glass . 24
Table 31 – Material: Glass . 25
Table 32 – Material: Lead-free solder, chips . 25
Table 33 – Material: Si/Al alloy, chips . 25
Table 34 – Material: Aluminum casting alloy, chips . 25
Table 35 – Material: PCB – Printed circuit board ground to less than 250 µm . 25
Table 36 – Material: different plastics materials, as plates . 25
Table A.1 – Effect of matrix composition on limits of detection of some controlled
elements . 29
Table A.2 –Screening limits in mg/kg for regulated elements in various matrices . 30
Table A.3 – Statistical data from IIS2 . 33
Table A.4 – Statistical data from IIS4 . 34
Table A.5 –Statistical data from IIS5 . 35
Table B.1 – Selection of samples for analysis of AC power cord . 37
Table B.2 – Selection of samples (testing locations) for analysis after visual inspection
– Cell phone charger . 40
Table B.3 – Results of XRF analysis at spots (1) and (2) as shown in Figure B.7 . 42

INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
Determination of certain substances in electrotechnical products -
Part 3-1: Screening - Lead, mercury, cadmium, total chromium, total
bromine, total phosphorus, total chlorine, total tin and total antimony
content by X-ray fluorescence spectrometry

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international
co‑operation on all questions concerning standardization in the electrical and electronic fields. To this end and
in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports,
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Standardization (ISO) in accordance with conditions determined by agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
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3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
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6) All users should ensure that they have the latest edition of this publication.
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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) IEC draws attention to the possibility that the implementation of this document may involve the use of (a)
patent(s). IEC takes no position concerning the evidence, validity or applicability of any claimed patent rights in
respect thereof. As of the date of publication of this document, IEC had not received notice of (a) patent(s), which
may be required to implement this document. However, implementers are cautioned that this may not represent
the latest information, which may be obtained from the patent database available at https://patents.iec.ch. IEC
shall not be held responsible for identifying any or all such patent rights.
IEC 62321‑3‑1 has been prepared by IEC technical committee 111: Environmental
standardization for electrical and electronic products and systems. It is an International
Standard.
This second edition cancels and replaces the first edition published in 2013 and the first edition
of IEC 62321 published in 2008. This edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
editions of IEC 62321‑3‑1:2013 and IEC 62321:2008:
a) This second edition of IEC 62321‑3‑1 includes the analysis of additional elements as
indicators for additional substances. The selection is based on IEC TR 62936:2016. There
are also comments about using the same methodology for screening for content of critical
raw materials (CRMs).
This document has been given the status of a horizontal document in accordance with the
ISO/IEC Directives, Part 1.
The text of this International Standard is based on the following documents:
Draft Report on voting
111/871/FDIS 111/887/RVD
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
Future parts in the IEC 62321 series will gradually replace the corresponding clauses in
IEC 62321:2008. Until such time as all parts are published, however, IEC 62321:2008 remains
valid for those clauses not yet re‑published as a separate part.
The language used for the development of this International Standard is English.
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are
described in greater detail at www.iec.ch/publications.
A list of all parts in the IEC 62321 series, published under the general title Determination of
certain substances in electrotechnical products, can be found on the IEC website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under webstore.iec.ch in the data related to the
specific document. At this date, the document will be
– reconfirmed,
– withdrawn, or
– revised.
INTRODUCTION
The widespread use of electrotechnical products has drawn increased attention to their impact
on the environment. In many countries this has resulted in the adaptation of regulations
affecting wastes, substances and energy use of electrotechnical products.
The use of certain substances (e.g. lead (Pb), cadmium (Cd) and polybrominated diphenyl
ethers (PBDEs)) in electrotechnical products, is a source of concern in current and proposed
regional legislation. With the actual revision the following elements are added: phosphorus (P),
assuming the source of P is related to TCEP, Trixylyl-phosphate, chlorine (Cl), assuming the
source of Cl is related to SCCP, TCEP, TBTC, tin (Sn), assuming the source of Sn is related to
restricted organo-tin compounds, antimony (Sb), assuming the source of Sb is related to
Pyrochlore, antimony lead yellow.
The purpose of the IEC 62321 series is therefore to provide test methods that will allow the
electrotechnical industry to determine the levels of certain substances of concern in
electrotechnical products on a consistent global basis.
The first edition of IEC 62321:2008 was a 'stand alone' standard that included an introduction,
an overview of test methods, a mechanical sample preparation as well as various test method
clauses.
The first edition of IEC 62321‑3‑1 was a partial replacement of IEC 62321:2008, forming a
structural revision and generally replacing Clauses 6 and Annex D.

1 Scope
This part of IEC 62321 describes the screening analysis of substances, specifically lead (Pb),
mercury (Hg), cadmium (Cd), total chromium (Cr), total bromine (Br), total phosphorus (P),
assuming the source of P is related to TCEP (CAS 115‑96‑8), Trixylyl‑phosphate
(CAS 25155‑23‑1), total chlorine (Cl), assuming the source of Cl is related to SCCP
(CAS 85535‑84‑8), TCEP (CAS 115‑96‑8) , TBTC (CAS 1461‑22‑9), total tin (Sn), assuming the
source of Sn is related to restricted organo‑tin compounds, total antimony (Sb), assuming the
source of Sb is related to Pyrochlore, and antimony lead yellow (CAS 8012‑00‑8) in uniform
materials found in electrotechnical products, using the analytical technique of X‑ray
fluorescence (XRF) spectrometry.
The same methodology can also be used for screening of substances discussed as critical raw
materials in various countries (for example currently discussed in the EU: antimony (Sb), baryte,
bismuth (Bi), cobalt (Co), fluorspar, gallium (Ga), germanium (Ge), hafnium (Hf), indium (In),
magnesium (Mg), niobium (Nb), phosphorus (P), scandium (Sc), tantalum (Ta), tungsten (W),
vanadium (V), platinum group metals, heavy rare earth elements, light rare earth elements).
NOTE From EU information on critical raw materials [1] raw materials are crucial to Europe's economy. They form
a strong industrial base, producing a broad range of goods and applications used in everyday life and modern
technologies. Reliable and unhindered access to certain raw materials is a growing concern within the EU and across
the globe. To address this challenge, the European Commission has created a list of critical raw materials (CRMs)
for the EU, which is subject to a regular review and update. CRMs combine raw materials of high importance to the
EU economy and of high risk associated with their supply.
The method is applicable to plastics, metals and ceramic materials. The test method can be
applied to raw materials, individual materials taken from products and "homogenized" mixtures
of more than one material. Screening of a sample is performed using any type of XRF
spectrometer, provided it has the performance characteristics specified in this test method. Not
all types of XRF spectrometers are suitable for all sizes and shapes of sample. The appropriate
spectrometer design will be selected with care for the task concerned.
The performance of this test method has been tested for the following substances in various
media and within the concentration ranges as specified in Table 1 to Table 5. During an IIS
(international interlaboratory study) the feasibility of the test method to use for the added
elements was tested. The results are listed in Table 6 to Table 10.
Table 1 – Tested concentration ranges for lead in materials
Substance/
Lead
element
Medium/material tested
Unit of
a b d
Low- Al, Lead- Ground Crystal Polyolefin
Parameter ABS PE PVC
measure
c
alloy Al-Si free glass
PWB
steel alloy solder
Concentration
15,7 14 190 22 000 390
or 240
e
mg/kg to to 30 to 174 to to 380 to 640
concentration 000
954 108 930 23 000 665
range tested
a
Acrylonitrile butadiene styrene.
b
Polyethylene.
c
Printed wiring board.
d
Polyvinyl chloride.
e
This lead concentration was not detectable by instruments participating in tests.

___________
Numbers in square brackets refer to the Bibliography.
Table 2 – Tested concentration ranges for mercury in materials
Substance/element Mercury
Medium/material tested
Parameter Unit of measure
a b
ABS PE
Concentration or concentration range tested mg/kg 100 to 942 4 to 25
a
Acrylonitrile butadiene styrene.
b
Polyethylene.
Table 3 – Tested concentration ranges for cadmium in materials
Substance/element Cadmium
Medium/material tested
Unit of
Parameter
measure
a b
Lead-free solder
ABS PE
c
Concentration or concentration range tested mg/kg 10 to 183 19,6 to 141
a
Acrylonitrile butadiene styrene.
b
Polyethylene.
c
This cadmium concentration was not detectable by instruments participating in tests.

Table 4 – Tested concentration ranges for total chromium in materials
Substance/element Chromium
Medium/material tested
Parameter Unit of measure
Low-alloy
a b
Al, Al-Si alloy Glass
ABS PE
steel
Concentration or
concentration range mg/kg 16 to 944 16 to 115 240 130 to 1 100 94
tested
a
Acrylonitrile butadiene styrene.
b
Polyethylene.
Table 5 – Tested concentration ranges for total bromine in materials
Substance/element Bromine
Medium/material tested
Unit of
Parameter
measure
c a d b
HIPS , ABS PC/ABS PE
Concentration or concentration range tested mg/kg 25 to 118 400 800 to 2 400 96 to 808
a
Acrylonitrile butadiene styrene.
b
Polyethylene.
c
High impact polystyrene.
d
Polycarbonate and ABS blend.
Table 6 – Tested concentration ranges for total phosphorus in materials
Substance/element Phosphorus
Medium/material tested
Parameter Unit of measure
plastics
Concentration or concentration range tested mg/kg 90 to 8 300

Table 7 – Tested concentration ranges for total chlorine in materials
Substance/element Chlorine
Medium/material tested
Parameter Unit of measure
plastics
Concentration or concentration range tested mg/kg 100 to 380

Table 8 – Tested concentration ranges for total tin in materials
Substance/element Tin
Medium/material tested
Parameter Unit of measure
plastics
Concentration or concentration range tested mg/kg 30 to 110

Table 9 – Tested concentration ranges for total antimony in materials
Substance/element Antimony
Medium/material tested
Parameter Unit of measure
plastics
Concentration or concentration range tested mg/kg 190 to 380

These substances in similar media outside of the specified concentration ranges can be
analysed according to this test method; however, the performance has not been established for
this document.
WARNING – Persons using this International Standard should be familiar with normal
laboratory practice. This standard does not purport to address all of the safety problems,
if any, associated with its use. It is the responsibility of the user to establish appropriate
safety and health practices and to ensure compliance with any national regulatory
conditions.
This document is a basic environment horizontal publication focusing on test methods and is
primarily intended for use by committees in the preparation of publications within the area of
environment in accordance with the principles laid down in IEC Guide 123. Wherever applicable,
it is the responsibility of committees to make use of environment basic publications in the
preparation of their environment group and product publications. Committees can apply this
document directly to products when they do not develop a product publication in the area of
environment.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies.
For undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC 62321‑1, Determination of certain substances in electrotechnical products ‑ Part 1:
Introduction and overview
IEC 62321‑2, Determination of certain substances in electrotechnical products ‑ Part 2:
Disassembly, disjointment and mechanical sample preparation
ISO/IEC Guide 98‑1, Guide to the expression of uncertainty in measurement ‑ Part 1:
Introduction
3 Terms, definitions and abbreviated terms
3.1 Terms and definitions
For the purposes of this document, the terms and definitions given in IEC 62321‑1 and
IEC 62321‑2 apply.
ISO and IEC maintain terminology databases for use in standardization at the following
addresses:
– IEC Electropedia: available at https://www.electropedia.org/
– ISO Online browsing platform: available at https://www.iso.org/obp
3.2 Abbreviated terms
CRM Certified reference material
CRMs Critical raw materials
HBCDD Hexabromocyclododecane
MCCP Medium chain chlorinated paraffins
PBB Polybrominated biphenyl
PBDE Polybrominated diphenyl ether
SCCP Short chain chlorinated paraffins
TBBPA Tetrabromobisphenol A
TBTC Tributyltin chloride
TCEP Tris(2-chloroethyl) phosphate
4 Principle
4.1 Overview
The concept of "screening" has been developed to reduce the amount of testing. Executed as
a predecessor to any other test analysis, the main objective of screening is to quickly determine
whether the screened part or section of a product:
– contains a certain substance at a concentration significantly higher than its value or values
chosen as criterion, and therefore can be deemed unacceptable;
– contains a certain substance at a concentration significantly lower than its value or values
chosen as criterion, and therefore can be deemed acceptable;
– contains a certain substance at a concentration so close to the value or values chosen as
criterion that when all possible errors of measurement and safety factors are considered,
no conclusive decision can be made about the acceptable absence or presence of a certain
substance and, therefore, a follow-up action can be required, including further analysis
using verification testing procedures.
For the screening analysis of critical raw materials only the analysis results are important, there
is no interpretation with regards to a maximum threshold value required.
This test method is designed specifically to screen for lead, mercury, cadmium, chromium,
bromine, phosphorus, chlorine, tin and antimony (Pb, Hg, Cd, Cr, Br, P, Cl, Sn, Sb) plus
elements required for screening for content of critical raw materials in uniform materials, which
occur in most electrotechnical products. Under typical circumstances, XRF spectrometry
provides information on the total quantity of each element present in the sample but does not
identify compounds or valence states of the elements. Therefore, special attention shall be paid
when screening for chromium, bromine, phosphorus, chlorine, tin and antimony, where the
result will reflect only the total chromium, total bromine, total phosphorus, total chlorine, total
tin and total antimony present. The presence of Cr(VI) or the brominated flame retardants PBB
or PBDE or TBBPA or HBCDD, or TCEP, Trixylyl-phosphate, red phosphorus, SCCP or MCCP,
TBTC, restricted organo-tin compounds, Pyrochlore, or antimony lead yellow shall be confirmed
by a verification test procedure that identify compounds or valence states of the elements. When
applying this method to electronics "as received", which, by the nature of their design, are not
uniform, care shall be taken in interpreting the results. Similarly, the analysis of Cr in conversion
coatings can be difficult due to the presence of Cr in substrate material. It also can be difficult
because of insufficient sensitivity for Cr in typically very thin (typically 200 nm to 600 nm)
conversion coating layers.
Screening analysis can be carried out by one of two means:
– non-destructively - by directly analysing the sample "as received";
– destructively - by applying one or more sample preparation steps prior to analysis.
In the latter case, the user shall apply the procedure for sample preparation as described in
IEC 62321‑2. This test method will guide the user in choosing the proper approach to sample
presentation.
4.2 Principle of test
The representative specimen of the object tested is placed in the measuring chamber or over
the measuring aperture of the X-ray fluorescence spectrometer. Alternatively, a measuring
window or aperture of a handheld, portable XRF analyser is placed flush against the surface of
the object tested. The analyser illuminates the specimen for a preselected measurement time
with a beam of X-rays which in turn excite characteristic X-rays of elements in the specimen.
The intensities of these characteristic X-rays are measured and converted to mass fractions or
concentrations of the elements in the tested sample using a calibration implemented in the
analyser.
The fundamentals of XRF spectrometry, as well as practical aspects of sampling for XRF, are
covered in detail in [2], [3], and [4].
4.3 Explanatory comments
To achieve its purpose, this test method shall provide rapid, unambiguous identification of the
elements of interest. The test method shall provide at least a level of accuracy that is sometimes
described as semi-quantitative, i.e. the relative uncertainty of a result is typically 30 % or better
at a defined level of confidence of 68 %. Some users can tolerate higher relative uncertainty,
depending on their needs. This level of performance allows the user to sort materials for
additional testing. The overall goal is to obtain information for risk management purposes.
This test method is designed to allow XRF spectrometers of all designs, complexity and
capability to contribute screening analyses. However, the capabilities of different XRF
spectrometers cover such a wide range that some will be relatively inadequate in their selectivity
and sensitivity while others will be more than adequate. Some spectrometers will allow easy
measurement of a wide range of sample shapes and sizes, while others, especially research-
grade WDXRF units, will be very inflexible in terms of test portions.
NOTE One technical parameter for ED-XRF instruments can be for example the detector resolution. A resolution of
better than 250 eV (at Mn K ) has been found suitable.
α
Given the above level of required performance and the wide variety of XRF spectrometers
capable of contributing useful measurements, the requirements for the specification of
procedures must be defined carefully. As guidance the information listed in Table A.2 can be
used.
This test method is based on the concept of a performance-based measurement system.
Apparatus, sample preparation and calibration are specified in this document in relatively
general terms. It is the responsibility of the user to document all procedures developed in the
laboratory that uses the test method. The user shall establish a written procedure for all cases
denoted in this method by the term "work instructions".
The user of this test method shall document all relevant spectrometer and method performance
parameters.
For additional practical aspects of screening by X-ray fluorescence spectrometry (XRF) and
interpretation of the results please also refer to Annex A. For practical examples of screening
with XRF refer to Annex B.
WARNING 1 Persons using the XRF test method shall be trained in the use of XRF
spectrometers and the related sampling requirements.
WARNING 2 X-rays are hazardous to humans. Care shall be taken to operate the
equipment in accordance with both the safety instructions provided by the manufacturer
and the applicable local health and occupational safety regulations.
5 Apparatus, equipment and materials
5.1 XRF spectrometer
An XRF spectrometer consists of an X-ray excitation source, a means of reproducible sample
presentation, an X-ray detector, a data processor and a control system [5], [6] and [7]:
a) source of X-ray excitation - X-ray tube or radio-isotope sources are commonly used;
b) X-ray detector (detection subsystem) - device used to convert the energy of an X-ray photon
to a corresponding electric pulse of amplitude proportional to the photon energy.
5.2 Materials and tools
All materials used in the preparation of samples for XRF measurements shall be shown to be
free of contamination, specifically by the analytes of this test method. This means that all
grinding materials, solvents, fluxes, etc. shall not contain detectable quantities of Pb, Hg, Cd,
Cr, Br, P, Cl, Sn, Sb, or any other critical raw material.
Tools used in the handling of samples shall be chosen to minimize contamination by the
analytes of this test method as well as by any other elements. Any procedures used to clean
the tools shall not introduce contaminants.
6 Reagents
Reagents, if any, shall be of recognized analytical grade and shall not contain detectable
quantities of Pb, Hg, Cd, Cr, Br, P, Cl, Sn, Sb or any critical raw materials.
7 Sampling
7.1 General
It is the responsibility of the user of this test method to define the test sample using documented
work instructions. The user can choose to define the test sample in a number of ways, either
via a non-destructive approach in which the portion to be measured is defined by the viewing
area of the spectrometer, or by a destructive approach in which the portion to be measured is
removed from the larger body of material and either measured as is, or destroyed and prepared
using a defined procedure.
7.2 Non-destructive approach
The user of this test method shall:
a) establish the area viewed by the spectrometer and place the test sample within that area,
taking care to ascertain that no fluorescent X-rays will be detected from materials other than
the defined test specimen. Usually, the area viewed by the spectrometer is a section of a
plane delineated by the shape and boundary of the measuring window of the instrument.
The area of the test sample viewed by the spectrometer shall be flat. Any deviation from the
flat area requirement shall be documented;
b) make sure that a repeatable measurement geometry with a repeatable distance between
the spectrometer and the test portion is established;
c) document the steps taken to disassemble a larger object to obtain a test portion.
7.3 Destructive approach
The following points shall be taken into account in the destructive approach:
a) the user shall create and follow a documented work instruction for the means of destruction
applied to obtain the test portion, as this information is critical for correct interpretation of
the measurement results;
b) a procedure that results in a powder shall produce a material with a known or controlled
particle size. In cases where the particles have different chemical, phase or mineralogical
compositions, it is critical to reduce their size sufficiently to minimize differential absorption
effects;
c) in a procedure that results in a material being dissolved in a liquid matrix, the quantity and
physical characteristics of the material to be dissolved shall be controlled and documented.
The resulting solution shall be completely homogeneous. Instructions shall be provided to
deal with undissolved portions to ensure proper interpretation of the measured results.
Instructions shall be provided for presentation of the test portion of the solution to the X-ray
spectrometer in a repeatable manner, i.e. in a liquid cell of specified construction and
dimensions;
d) in a procedure that results in a sample material being fused or pressed in a solid matrix, the
quantity and physical characteristics of the sample material shall be controlled and
documented. The resulting solid (fused or pressed pellet) shall be completely uniform.
Instructions shall be provided to deal with unmixed portions to ensure proper interpretation
of the measured results.
8 Test procedure
8.1 General
The test procedure covers preparation of the X-ray spectrometer, preparation and mounting of
test portions and calibration. Certain instructions are presented in general terms due to the wide
range of XRF equipment and the even greater variety of laboratory and test samples to which
this test method will be applied. However, a cardinal rule that applies without exception to all
spectromete
...

IEC 62321-3-1 ®
Edition 2.0 2026-05
NORME
INTERNATIONALE
NORME HORIZONTALE
Détermination de certaines substances dans les produits électrotechniques -
Partie 3-1: Détection - Présence de plomb, mercure, cadmium, chrome total,
brome total, phosphore total, chlore total, étain total et antimoine total par la
spectrométrie de fluorescence X
ICS 13.020.01; 43.040.10 ISBN 978-2-8327-1223-8

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SOMMAIRE
AVANT-PROPOS . 4
INTRODUCTION . 6
1 Domaine d'application . 7
2 Références normatives . 10
3 Termes, définitions et abréviations . 10
3.1 Termes et définitions . 10
3.2 Abréviations . 10
4 Principe . 11
4.1 Vue d'ensemble . 11
4.2 Principe de l'essai . 12
4.3 Commentaires explicatifs . 12
5 Appareillage, équipements et matériaux . 13
5.1 Spectromètre XRF . 13
5.2 Matériaux et outils . 13
6 Réactifs . 13
7 Échantillonnage . 13
7.1 Généralités . 13
7.2 Approche non destructive . 14
7.3 Approche destructive . 14
8 Procédure d'essai . 14
8.1 Généralités . 14
8.2 Préparation du spectromètre . 15
8.3 Éprouvette . 16
8.4 Vérification des performances du spectromètre . 16
8.5 Essais . 18
8.6 Étalonnage . 18
9 Calculs . 19
10 Fidélité . 20
10.1 Généralités . 20
10.2 Plomb . 20
10.3 Mercure . 20
10.4 Cadmium . 21
10.5 Chrome . 21
10.6 Brome . 21
10.7 Phosphore, chlore, étain et antimoine . 21
10.8 Indication de répétabilité pour cinq substances soumises à l'essai triées par
type de matériau . 21
10.9 Indication de reproductibilité pour cinq substances soumises à l'essai triées
par type de matériau . 24
11 Contrôle de la qualité . 27
11.1 Exactitude de l'étalonnage . 27
11.2 Échantillons témoins . 27
12 Cas particuliers . 27
13 Rapport d'essai . 28
Annexe A (informative) Aspects pratiques de la détection par spectrométrie de
fluorescence X (XRF) et interprétation des résultats . 29
A.1 Remarque préliminaire . 29
A.2 Effets de la matrice et des interférences . 29
A.3 Interprétation des résultats (pour les substances réglementées) . 31
A.4 Données statistiques d'IIS2, IIS4 et IIS5 pour la méthode XRF . 34
Annexe B (informative) Exemples pratiques de détection par XRF . 38
B.1 Remarque préliminaire . 38
B.2 Instruments XRF . 38
B.3 Facteurs influant sur les résultats de XRF . 39
B.3.1 Généralités . 39
B.3.2 Exemples de détection avec XRF . 39
Bibliographie . 48

Figure B.1 – Cordon d'alimentation en courant alternatif, spectre de rayons X des
parties échantillonnées . 40
Figure B.2 – Câble RS232 et son spectre de rayons X . 41
Figure B.3 – Chargeur de téléphone portable représenté partiellement démonté . 41
Figure B.4 – CCI et câble de chargeur de téléphone portable . 42
Figure B.5 – Analyse d'un composant électronique à montage en surface sur une CCI . 43
Figure B.6 – Spectres et résultats obtenus sur une carte de circuit imprimé avec deux
collimateurs . 44
Figure B.7 – Exemples de cartographies de substances sur des CCI . 46
Figure B.8 – Image SEM-EDX de soudure sans Pb avec de petites inclusions de Pb
(taille = 30 µm) . 47

Tableau 1 – Plages de concentrations de plomb évaluées dans différents matériaux . 8
Tableau 2 – Plages de concentrations de mercure évaluées dans différents matériaux . 8
Tableau 3 – Plages de concentrations de cadmium évaluées dans différents matériaux. 8
Tableau 4 – Plages de concentrations de chrome total évaluées dans différents
matériaux . 8
Tableau 5 – Plages de concentrations de brome total évaluées dans différents
matériaux . 9
Tableau 6 – Plages de concentrations de phosphore total évaluées dans différents
matériaux . 9
Tableau 7 – Plages de concentrations de chlore total évaluées dans différents matériaux . 9
Tableau 8 – Plages de concentrations d'étain total évaluées dans différents matériaux . 9
Tableau 9 – Plages de concentrations d'antimoine total évaluées dans différents matériaux . 9
a
Tableau 10 – Raies de rayons X recommandées pour les différents analytes . 15
Tableau 11 – Matériau: ABS (acrylonitrile butadiène styrène), en granulés et en
plaques . 22
Tableau 12 – Matériau: PE (polyéthylène faible densité), en granulés . 22
Tableau 13 – Matériau: PC/ABS (mélange de polycarbonate et d'ABS), en granulés . 22
Tableau 14 – Matériau: HIPS (polystyrène choc), en plaques. 23
Tableau 15 – Matériau: PVC (polychlorure de vinyle), en granulés . 23
Tableau 16 – Matériau: polyoléfine, en granulés . 23
Tableau 17 – Matériau: cristal . 23
Tableau 18 – Matériau: verre . 23
Tableau 19 – Matériau: soudure sans plomb, copeaux . 23
Tableau 20 – Matériau: alliage Si/Al, copeaux. 23
Tableau 21 – Matériau: alliage d'aluminium coulé, copeaux . 23
Tableau 22 – Matériau: CCI – Carte de circuits imprimés broyée à moins de 250 µm . 24
Tableau 23 – Matériau: différentes matières plastiques, en plaques. 24
Tableau 24 – Matériau: ABS (acrylonitrile butadiène styrène), en granulés et en
plaques . 24
Tableau 25 – Matériau: PE (polyéthylène faible densité), en granulés . 25
Tableau 26 – Matériau: PC/ABS (mélange de polycarbonate et d'ABS), en granulés . 25
Tableau 27 – Matériau: HIPS (polystyrène choc), en plaques. 25
Tableau 28 – Matériau: PVC (polychlorure de vinyle), en granulés . 25
Tableau 29 – Matériau: polyoléfine, en granulés . 25
Tableau 30 – Matériau: cristal . 25
Tableau 31 – Matériau: verre . 26
Tableau 32 – Matériau: soudure sans plomb, copeaux . 26
Tableau 33 – Matériau: alliage Si/Al, copeaux. 26
Tableau 34 – Matériau: alliage d'aluminium coulé, copeaux . 26
Tableau 35 – Matériau: CCI – Carte de circuits imprimés broyée à moins de 250 µm . 26
Tableau 36 – Matériau: différentes matières plastiques, en plaques. 26
Tableau A.1 – Effet de la composition de la matrice sur les limites de détection de
certains éléments contrôlés . 30
Tableau A.2 – Limites de détection en mg/kg pour les éléments réglementés dans
différentes matrices . 32
Tableau A.3 – Données statistiques d'IIS2 . 35
Tableau A.4 – Données statistiques d'IIS4 . 36
Tableau A.5 – Données statistiques d'IIS5 . 37
Tableau B.1 – Choix des échantillons lors de l'analyse d'un cordon d'alimentation en
courant alternatif . 39
Tableau B.2 – Sélection d'échantillons (emplacements d'essai) pour analyse après
inspection visuelle – Chargeur de téléphone portable . 42
Tableau B.3 – Résultats d'analyse XRF aux spots (1) et (2) comme cela est
représenté à la B . 45

COMMISSION ÉLECTROTECHNIQUE INTERNATIONALE
____________
Détermination de certaines substances dans les produits
électrotechniques -
Partie 3-1: Détection - Présence de plomb, mercure, cadmium, chrome
total, brome total, phosphore total, chlore total, étain total et antimoine
total par la spectrométrie de fluorescence X

AVANT-PROPOS
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L'IEC 62321-3-1 a été établie par le comité d'études 111 de l'IEC: Normalisation
environnementale pour les produits et les systèmes électriques et électroniques. Il s'agit
d'une Norme internationale.
Cette deuxième édition annule et remplace la première édition parue en 2013 et la première
édition de l'IEC 62321 parue en 2008. Cette édition constitue une révision technique.
Cette édition inclut les modifications techniques majeures suivantes par rapport aux éditions
précédentes de l'IEC 62321-3-1:2013 et de l'IEC 62321:2008:
a) Cette deuxième édition de l'IEC 62321-3-1 inclut l'analyse d'éléments complémentaires
comme indicateurs de substances supplémentaires. La sélection repose sur
l'IEC TR 62936:2016. Cette édition contient également des commentaires concernant
l'utilisation de la même méthodologie pour la détection de la présence de matières
premières critiques (CRM, Critical Raw Materials).
Le présent document a obtenu le statut de publication horizontale conformément
aux Directives ISO/IEC, Partie 1.
Le texte de cette Norme internationale est issu des documents suivants:
Projet Rapport de vote
111/871/FDIS 111/887/RVD
Le rapport de vote indiqué dans le tableau ci-dessus donne toute information sur le vote ayant
abouti à son approbation.
Les parties futures de la série IEC 62321 remplaceront progressivement les articles
correspondants de l'IEC 62321:2008. Cependant, jusqu'à ce que toutes les parties soient
publiées, l'IEC 62321:2008 reste valable pour les articles qui n'ont pas encore fait l'objet
d'une nouvelle publication en tant que partie distincte.
La langue employée pour l'élaboration de cette Norme internationale est l'anglais.
Ce document a été rédigé selon les Directives ISO/IEC, Partie 2, il a été développé selon
les Directives ISO/IEC, Partie 1 et les Directives ISO/IEC, Supplément IEC, disponibles
sous www.iec.ch/members_experts/refdocs. Les principaux types de documents développés
par l'IEC sont décrits plus en détail sous www.iec.ch/publications.
Une liste de toutes les parties de la série IEC 62321, publiées sous le titre général
Détermination de certaines substances dans les produits électrotechniques, se trouve sur
le site web de l'IEC.
Le comité a décidé que le contenu de ce document ne sera pas modifié avant la date de stabilité
indiquée sur le site web de l'IEC sous webstore.iec.ch dans les données relatives au document
recherché. À cette date, le document sera
– reconduit,
– supprimé, ou
– révisé.
INTRODUCTION
L'utilisation largement répandue des produits électrotechniques suscite une attention accrue
concernant leur incidence sur l'environnement. Dans de nombreux pays, ceci a conduit
à l'adaptation de réglementations relatives aux déchets, aux substances et à la consommation
d'énergie des produits électrotechniques.
L'utilisation de certaines substances (comme le plomb (Pb), le cadmium (Cd) et
les diphényléthers polybromés (PBDE)) dans les produits électrotechniques est une source
de préoccupation dans la législation régionale en vigueur et en cours d'élaboration.
Avec la présente révision, les éléments suivants sont ajoutés: le phosphore (P), en prenant
pour hypothèse que la source de P est associée au TCEP ou au phosphate de trixylyle, le chlore
(Cl), en prenant pour hypothèse que la source de Cl est associée au PCCC, au TCEP ou
au TBTC, l'étain (Sn), en prenant pour hypothèse que la source de Sn est associée
aux composés organostanniques réglementés, l'antimoine (Sb), en prenant pour hypothèse que
la source de Sb est associée au pyrochlore ou à l'antimoniate de plomb (ou jaune de Naples).
L'objet de la série IEC 62321 est par conséquent de fournir, à une échelle mondiale et
de manière cohérente, des méthodes d'essai qui permettent à l'industrie électrotechnique
de déterminer les niveaux de certaines substances, sources de préoccupation,
dans les produits électrotechniques.
La première édition de l'IEC 62321:2008 était une norme "indépendante" qui comprenait
une introduction, une vue d'ensemble des méthodes d'essai, une préparation mécanique
des échantillons ainsi que plusieurs articles relatifs aux méthodes d'essai.
La première édition de l'IEC 62321-3-1 était un remplacement partiel de l'IEC 62321:2008,
constituant une révision structurelle et remplaçant de manière générale l'Article 6 et l'Annexe D.

1 Domaine d'application
La présente partie de l'IEC 62321 décrit une méthode de détection de substances, en particulier
le plomb (Pb), le mercure (Hg), le cadmium (Cd), le chrome total (Cr), le brome total (Br),
le phosphore total (P), en prenant pour hypothèse que la source de P est associée au TCEP
(CAS 115-96-8) ou au phosphate de trixylyle (CAS 25155-23-1), le chlore total (Cl), en prenant
pour hypothèse que la source de Cl est associée au PCCC (CAS 85535-84-8), au TCEP
(CAS 115-96-8) ou au TBTC (CAS 1461-22-9), l'étain total (Sn), en prenant pour hypothèse
que la source de Sn est associée aux composés organostanniques réglementés, l'antimoine
total (Sb), en prenant pour hypothèse que la source de Sb est associée au pyrochlore ou
à l'antimoniate de plomb (ou jaune de Naples) (CAS 8012-00-8), dans des matériaux
homogènes rencontrés dans les produits électrotechniques, en utilisant la technique d'analyse
de spectrométrie de fluorescence X (XRF, X-Ray Fluorescence).
La même méthodologie peut également être utilisée pour la détection de substances
considérées comme des matières premières critiques dans différents pays (par exemple,
les substances actuellement considérées comme telles dans l'UE sont: l'antimoine (Sb),
la baryte, le bismuth (Bi), le cobalt (Co), le spath fluor (ou fluorure de calcium), le gallium (Ga),
le germanium (Ge), le hafnium (Hf), l'indium (In), le magnésium (Mg), le niobium (Nb),
le phosphore (P), le scandium (Sc), le tantale (Ta), le tungstène (W), le vanadium (V),
les métaux du groupe des platineux, les éléments de terres rares lourds, les éléments de terres
rares légers).
NOTE D'après les informations de l'UE sur les matières premières critiques [1] , les matières premières
sont essentielles à l'économie européenne. Elles constituent une base industrielle solide, produisant un large
éventail de biens et d'applications utilisés dans la vie de tous les jours et dans les technologies modernes.
L'accès fiable et sans entrave à certaines matières premières est une préoccupation croissante au sein de l'UE et
dans le monde entier. Pour relever ce défi, la Commission européenne a établi une liste de matières premières
critiques (CRM) pour l'UE, qui fait l'objet d'une révision et d'une mise à jour régulières. Les CRM combinent
des matières premières de haute importance pour l'économie de l'UE et dont l'approvisionnement présente un risque
élevé.
La méthode s'applique aux plastiques, aux métaux et aux matériaux céramiques. La méthode
d'essai peut être appliquée aux matières premières, à des matériaux particuliers issus
de produits et à des mélanges "homogénéisés" de plusieurs matériaux. L'analyse
d'un échantillon est réalisée au moyen de tout type de spectromètre XRF, à condition qu'il ait
les caractéristiques de performance spécifiées dans la présente méthode d'essai.
Tous les types de spectromètres XRF ne conviennent pas à toutes les tailles et
toutes les formes d'échantillon. Le modèle de spectromètre approprié sera choisi avec soin
pour la tâche concernée.
Les performances de la présente méthode d'essai ont été évaluées pour les substances
présentes dans différents supports et dans les plages de concentrations spécifiées
dans les Tableaux 1 à 5. La faisabilité de la méthode d'essai utilisée pour les éléments ajoutés
a été vérifiée au cours d'une étude interlaboratoire internationale (IIS). Les résultats
sont répertoriés dans les Tableaux 6 à 10.
___________
Les chiffres entre crochets renvoient à la Bibliographie.
Tableau 1 – Plages de concentrations de plomb évaluées dans différents matériaux
Substance/
Plomb
élément
Milieu/matériau analysé
Unité
a b d
Acier Al, Soudure CCI Cristal Polyoléfine
Paramètre de ABS PE PVC
c
faiblement alliage sans
mesure broyée
allié Al-Si plomb
Concentration
15,7 14 22 000 390
ou plage de 190 à 240
e
à à à à
mg/kg 30 174 380 à 640
concentrations 930 000
954 108 23 000 665
évaluée
a
Acrylonitrile butadiène styrène.
b
Polyéthylène.
c
Carte de circuits imprimés.
d
Polychlorure de vinyle.
e
Cette concentration en plomb n'était pas détectable par les instruments participant aux essais.

Tableau 2 – Plages de concentrations de mercure évaluées dans différents matériaux
Substance/élément Mercure
Milieu/matériau analysé
Paramètre Unité de mesure
a b
ABS PE
Concentration ou plage de concentrations évaluée mg/kg 100 à 942 4 à 25
a
Acrylonitrile butadiène styrène.
b
Polyéthylène.
Tableau 3 – Plages de concentrations de cadmium évaluées dans différents matériaux
Substance/élément Cadmium
Milieu/matériau analysé
Paramètre Unité de mesure
a b
Soudure sans plomb ABS PE
Concentration ou plage
c
mg/kg 10 à 183 19,6 à 141
de concentrations évaluée
a
Acrylonitrile butadiène styrène.
b
Polyéthylène.
c
Cette concentration en cadmium n'était pas détectable par les instruments participant aux essais.

Tableau 4 – Plages de concentrations de chrome total évaluées dans différents
matériaux
Chrome
Substance/élément
Milieu/matériau analysé
Acier
Unité de mesure
Paramètre Al, alliage
a b
Verre
faiblement
ABS PE
Al-Si
allié
Concentration ou plage 16 à
16 à 115 240 130 à 1 100
mg/kg
de concentrations évaluée 944
a
Acrylonitrile butadiène styrène.
b
Polyéthylène.
Tableau 5 – Plages de concentrations de brome total évaluées dans différents
matériaux
Substance/élément Brome
Milieu/matériau analysé
Unité de
Paramètre
mesure
c a d b
HIPS , ABS PC/ABS PE
Concentration ou plage de concentrations évaluée mg/kg 25 à 118 400 800 à 2 400 96 à 808
a
Acrylonitrile butadiène styrène.
b
Polyéthylène.
c
Polystyrène choc.
d
Mélange de polycarbonate et d'ABS.

Tableau 6 – Plages de concentrations de phosphore total évaluées dans différents
matériaux
Substance/élément Phosphore
Milieu/matériau analysé
Paramètre Unité de mesure
plastique
Concentration ou plage de concentrations évaluée mg/kg 90 à 8 300

Tableau 7 – Plages de concentrations de chlore total évaluées dans différents
matériaux
Substance/élément Chlore
Milieu/matériau analysé
Paramètre Unité de mesure
plastique
Concentration ou plage de concentrations évaluée mg/kg 100 à 380

Tableau 8 – Plages de concentrations d'étain total évaluées dans différents matériaux
Substance/élément Étain
Milieu/matériau analysé
Paramètre Unité de mesure
plastique
Concentration ou plage de concentrations évaluée mg/kg 30 à 110

Tableau 9 – Plages de concentrations d'antimoine total évaluées dans différents
matériaux
Substance/élément Antimoine
Milieu/matériau analysé
Paramètre Unité de mesure
plastique
Concentration ou plage de concentrations évaluée mg/kg 190 à 380

Ces substances, présentes dans des supports similaires, en dehors des plages
de concentrations spécifiées, peuvent être analysées conformément à la présente méthode
d'essai; cependant, les performances correspondantes n'ont pas été établies par le présent
document.
AVERTISSEMENT – Il convient que les personnes qui utilisent la présente Norme
internationale aient une bonne connaissance des pratiques normales de laboratoire.
La présente norme ne prétend pas traiter tous les problèmes de sécurité éventuels
associés à son utilisation. Il incombe à l'utilisateur de mettre en place les pratiques
adéquates en matière de sécurité et de santé, mais aussi d'assurer la conformité
aux conditions réglementaires nationales.
Le présent document est une publication horizontale environnementale fondamentale qui met
l'accent sur les méthodes d'essai et est principalement destiné à être utilisé par les comités
pour l'élaboration de publications relevant du domaine de l'environnement, conformément
aux principes énoncés dans le Guide 123 de l'IEC. Le cas échéant, il incombe aux comités
d'utiliser les publications environnementales fondamentales dans le cadre de l'élaboration
de leurs publications environnementales et leurs publications de produits. Les comités peuvent
appliquer le présent document directement aux produits lorsqu'ils n'élaborent pas de publication
de produit dans le domaine de l'environnement.
2 Références normatives
Les documents suivants sont cités dans le texte de sorte qu'ils constituent, pour tout ou partie
de leur contenu, des exigences du présent document. Pour les références datées, seule
l'édition citée s'applique. Pour les références non datées, la dernière édition du document
de référence s'applique (y compris les éventuels amendements).
IEC 62321-1, Détermination de certaines substances dans les produits électrotechniques -
Partie 1: Introduction et présentation
IEC 62321-2, Détermination de certaines substances dans les produits électrotechniques -
Partie 2: Démontage, défabrication et préparation mécanique de l'échantillon
ISO/IEC Guide 98-1, Guide pour l'expression de l'incertitude de mesure - Partie 1: Introduction
3 Termes, définitions et abréviations
3.1 Termes et définitions
Pour les besoins du présent document, les termes, définitions et abréviations de l'IEC 62321-1
et l'IEC 62321-2 s'appliquent.
L'ISO et l'IEC tiennent à jour des bases de données terminologiques destinées à être utilisées
en normalisation, consultables aux adresses suivantes:
– IEC Electropedia: disponible à l'adresse https://www.electropedia.org/
– ISO Online browsing platform: disponible à l'adresse https://www.iso.org/obp
3.2 Abréviations
MRC matériau de référence certifié
CRM (Critical Raw Materials) matières premières critiques
HBCDD hexabromocyclododécane
PCCM paraffines chlorées à chaîne moyenne
PBB (PolyBrominated Biphenyl) biphényle polybromé
PBDE (PolyBrominated Diphenyl Ether) diphényléther polybromé
PCCC paraffines chlorées à chaîne courte
TBBPA tétrabromobisphénol A
TBTC chlorure de tributylétain
TCEP (Tris(2-ChloroEthyl) Phosphate) phosphate de tris(2-chloroéthyle)
4 Principe
4.1 Vue d'ensemble
Le concept de "détection" a été élaboré pour diminuer le nombre d'essais. Réalisée avant toute
autre analyse, le principal objectif de la détection est de déterminer rapidement si la pièce ou
une partie d'un produit:
– contient une certaine substance à une concentration significativement supérieure à sa ou
ses valeurs choisies comme critère et peut donc être considérée comme inacceptable;
– contient une certaine substance à une concentration significativement inférieure à sa ou
ses valeurs choisies comme critère et peut donc être considérée comme acceptable;
– contient une certaine substance à une concentration trop proche de la valeur ou des valeurs
choisies comme critère de sorte que, lorsque toutes les erreurs de mesure et
tous les facteurs de sécurité possibles sont pris en compte, aucune décision définitive
ne puisse être prise concernant l'absence ou la présence acceptable d'une certaine
substance, et une action de suivi peut donc être nécessaire, incluant une analyse
complémentaire utilisant des procédures d'essai de vérification.
Pour l'analyse de détection des matières premières critiques, seuls les résultats de l'analyse
sont importants, il n'y a pas d'interprétation concernant une valeur de seuil maximal exigée.
La présente méthode d'essai est conçue spécifiquement pour la détection du plomb, du mercure,
du cadmium, du chrome, du brome, du phosphore, du chlore, de l'étain et de l'antimoine (Pb, Hg,
Cd, Cr, Br, P, Cl, Sn, Sb) ainsi que des éléments des matières premières critiques
dont la détection est exigée dans les matériaux homogènes utilisés dans la plupart des produits
électrotechniques. De manière générale, la spectrométrie XRF fournit des informations
sur la quantité totale de chaque élément présent dans l'échantillon, mais ne permet pas
d'identifier des composés ou les états de valence des éléments. Par conséquent, la détection
du chrome, du brome, du phosphore, du chlore, de l'étain et de l'antimoine doit faire l'objet
d'une attention toute particulière, car les résultats reflètent uniquement la présence de chrome
total, de brome total, de phosphore total, de chlore total, d'étain total et d'antimoine total.
La présence de Cr(VI) ou des retardateurs de flamme bromés PBB, PBDE, TBBPA ou HBCDD,
ou encore de TCEP, de phosphate de trixylyle, de phosphore rouge, de PCCC ou de PCCM,
de TBTC, de composés organostanniques réglementés, de pyrochlore ou d'antimoniate
de plomb (ou jaune de Naples) doit être confirmée par une procédure d'essai de vérification
qui identifie les composés ou les états de valence des éléments. Lorsque cette méthode
est appliquée à des produits électroniques "en l'état" qui, par la nature de leur conception,
ne sont pas homogènes, l'interprétation des résultats doit faire l'objet d'une attention
toute particulière. De la même manière, l'analyse du Cr dans des couches de conversion
peut être difficile du fait de la présence de Cr dans le matériau de substrat. Elle peut également
s'avérer difficile du fait d'une sensibilité insuffisante au Cr dans des couches de revêtement
de conversion généralement très fines (généralement de 200 nm à 600 nm).
L'analyse de détection peut être de deux types:
– non destructive - par analyse directe de l'échantillon "en l'état";
– destructive - en appliquant une ou plusieurs phases de préparation de l'échantillon avant
analyse.
Dans ce dernier cas, l'utilisateur doit appliquer la procédure de préparation des échantillons
décrite dans l'IEC 62321-2. Cette méthode d'essai guide l'utilisateur dans le choix de la bonne
approche de préparation de l'échantillon.
4.2 Principe de l'essai
L'éprouvette représentative de l'objet soumis à l'essai est placée dans la chambre de mesure
ou sur l'orifice de mesure du spectromètre de fluorescence X. En variante, une fenêtre ou
un orifice de mesure d'un analyseur XRF portatif est placé directement en contact
avec la surface de l'objet soumis à l'essai. L'analyseur illumine l'éprouvette pendant un temps
de mesure sélectionné à l'avance avec un faisceau de rayons X qui excite lui-même
les rayons X caractéristiques des éléments de l'éprouvette. Les intensités de ces rayons X
caractéristiques sont mesurées et converties en fractions ou concentrations massiques
des éléments dans l'échantillon soumis à l'essai en utilisant une configuration d'étalonnage
mise en œuvre dans l'analyseur.
Les principes fondamentaux de la spectrométrie XRF, ainsi que les aspects pratiques
de l'échantillonnage pour XRF, sont traités en détail dans les références [2], [3] et [4].
4.3 Commentaires explicatifs
Pour atteindre son objectif, la méthode d'essai doit permettre une identification rapide et
univoque des éléments d'intérêt. Elle doit présenter, au minimum, un niveau d'exactitude parfois
décrit comme semi-quantitatif, ce qui signifie que l'incertitude relative d'un résultat
est normalement de 30 % ou moins pour un niveau de confiance défini de 68 %.
Certains utilisateurs peuvent tolérer une incertitude relative plus élevée en fonction
de leurs besoins. Ce niveau de performance permet à l'utilisateur de trier des matériaux
pour des essais supplémentaires. L'objectif général est d'obtenir des informations
pour les besoins de la gestion du risque.
Cette méthode d'essai est conçue pour permettre la réalisation des analyses de détection
avec des spectromètres XRF de tous les modèles, complexités et capacités existants.
Cependant, les capacités des différents spectromètres XRF couvrent une telle gamme
que certains sont relativement inadaptés du point de vue de leur sélectivité et de leur sensibilité,
tandis que d'autres sont plus qu'appropriés. Certains spectromètres mesurent facilement
une vaste plage de formes et de tailles d'échantillon alors que d'autres, notamment
les appareils WDXRF utilisés pour la recherche, sont très limités en matière de prises d'essai.
NOTE Un paramètre technique pour les instruments ED-XRF peut, par exemple, être la résolution du détecteur.
Une résolution supérieure à 250 eV (à Mn K ) a été jugée appropriée.
α
Compte tenu du niveau de performance exigé ci-dessus et de la grande diversité
des spectromètres XRF capables de fournir de bonnes mesures, les exigences relatives
à la spécification des procédures doivent être définies avec soin. Les informations énumérées
dans le Tableau A.2 peuvent être utilisées à titre de recommandation.
Cette méthode d'essai repose sur le concept d'un système de mesure fondé sur la performance.
L'appareillage, la préparation des échantillons et l'étalonnage sont spécifiés dans le présent
document de manière relativement générale. Il incombe à l'utilisateur de documenter l'ensemble
des procédures élaborées dans le laboratoire qui applique la méthode d'essai. L'utilisateur doit
établir une procédure écrite pour tous les cas désignés dans cette méthode par le terme
"consignes d'emploi".
L'utilisateur de cette méthode d'essai doit documenter tous les paramètres de performance
pertinents des spectromètres et des méthodes.
Pour des aspects pratiques additionnels de la détection par spectrométrie de fluorescence X
(XRF) et interprétation des résultats, se référer également à l'Annexe A. Pour des exemples
pratiques de détection par XRF, se référer à l'Annexe B.
AVERTISSEMENT 1 Les personnes qui utilisent la méthode d'essai XRF doivent être
formées à l'emploi des spectromètres XRF et aux exigences associées
à l'échantillonnage.
AVERTISSEMENT 2 Les rayons X sont dangereux pour l'homme. Un soin tout
particulier doit être apporté au fonctionnement de l'équipement c
...