IEC 62631-2-2:2022
(Main)Dielectric and resistive properties of solid insulating materials - Part 2-2: Relative permittivity and dissipation factor - High frequencies (1 MHz to 300 MHz) - AC methods
Dielectric and resistive properties of solid insulating materials - Part 2-2: Relative permittivity and dissipation factor - High frequencies (1 MHz to 300 MHz) - AC methods
IEC 62631-2-2:2022 specifies test methods for the determination of permittivity and dissipation factor properties of solid insulating materials in a high frequency range from 1 MHz to 300 MHz.
Propriétés diélectriques et résistives des matériaux isolants solides - Partie 2-2: Permittivité relative et facteur de dissipation - Hautes fréquences (1 MHz à 300 MHz) - Méthodes en courant alternatif
L'IEC 62631-2-2:2022 spécifie les méthodes d'essai pour déterminer les propriétés de la permittivité et du facteur de dissipation de matériaux isolants solides dans la plage des hautes fréquences de 1 MHz à 300 MHz.
General Information
Standards Content (sample)
IEC 62631-2-2
Edition 1.0 2022-04
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Dielectric and resistive properties of solid insulating materials –
Part 2-2: Relative permittivity and dissipation factor – High frequencies
(1 MHz to 300 MHz) – AC methods
Propriétés diélectriques et résistives des matériaux isolants solides –
Partie 2-2: Permittivité relative et facteur de dissipation – Hautes fréquences
(1 MHz à 300 MHz) – Méthodes en courant alternatif
IEC 62631-2-2:2022-04(en-fr)
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IEC 62631-2-2
Edition 1.0 2022-04
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Dielectric and resistive properties of solid insulating materials –
Part 2-2: Relative permittivity and dissipation factor – High frequencies
(1 MHz to 300 MHz) – AC methods
Propriétés diélectriques et résistives des matériaux isolants solides –
Partie 2-2: Permittivité relative et facteur de dissipation – Hautes fréquences
(1 MHz à 300 MHz) – Méthodes en courant alternatif
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 17.220.99; 29.035.01 ISBN 978-2-8322-1096-7
Warning! Make sure that you obtained this publication from an authorized distributor.
Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agréé.
® Registered trademark of the International Electrotechnical CommissionMarque déposée de la Commission Electrotechnique Internationale
---------------------- Page: 3 ----------------------
– 2 – IEC 62631-2-2:2022 © IEC 2022
CONTENTS
FOREWORD ........................................................................................................................... 4
INTRODUCTION ..................................................................................................................... 6
1 Scope .............................................................................................................................. 7
2 Normative references ...................................................................................................... 7
3 Terms and definitions ...................................................................................................... 7
4 Methods of test ................................................................................................................ 8
4.1 Basic theory ............................................................................................................ 8
4.2 Distinctive factors for the measurement in high frequency range ........................... 12
4.3 Power supply ........................................................................................................ 13
4.4 Equipment ............................................................................................................ 13
4.4.1 Accuracy ....................................................................................................... 13
4.4.2 Distinctive feature of equipment for measurement in high frequencyrange ............................................................................................................. 14
4.4.3 Choice of measurement methods ................................................................... 15
4.5 Calibration ............................................................................................................ 16
4.6 Test specimen ...................................................................................................... 16
4.6.1 General ......................................................................................................... 16
4.6.2 Recommended dimensions of test specimen and electrodearrangements ................................................................................................ 16
4.6.3 Number of test specimens ............................................................................. 16
4.6.4 Conditioning and pre-treatment of test specimen ........................................... 16
4.7 Procedures for specific materials .......................................................................... 17
5 Test procedure .............................................................................................................. 17
5.1 General ................................................................................................................. 17
5.2 Calculation of permittivity and relative permittivity ................................................. 17
5.2.1 Relative permittivity ....................................................................................... 17
5.2.2 Dielectric dissipation factor tan δ ................................................................... 17
6 Report ........................................................................................................................... 17
7 Repeatability and reproducibility .................................................................................... 18
Annex A (informative) Compensation method using a series circuit ...................................... 19
Annex B (informative) Parallel electrodes with shield ring .................................................... 20
Annex C (informative) Apparatus ......................................................................................... 21
C.1 Parallel T network bridge ...................................................................................... 21
C.2 Resonance method ............................................................................................... 22
C.3 I-V method designed for high frequencies ............................................................. 24
C.4 Auto-balancing bridge method ............................................................................... 24
Annex D (informative) Non-contacting electrode method with micrometer-controlled
parallel electrodes in air ........................................................................................................ 26
Bibliography .......................................................................................................................... 28
Figure 1 – Dielectric dissipation factor .................................................................................. 10
Figure 2 – Equivalent circuit diagrams with capacitive test specimen .................................... 11
Figure 3 – Equivalent parallel circuit for test fixture with sample and leads toequipment ............................................................................................................................. 12
Figure 4 – Existence of residual impedance and stray capacitance in directlyconnected system ................................................................................................................. 15
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Figure A.1 – Compensation method using a series circuit ..................................................... 19
Figure B.1 – Configuration of parallel electrode with shield ring ............................................ 20
Figure C.1 – Parallel T network, principal circuit diagram ...................................................... 21
Figure C.2 – Parallel T network, practical circuit diagram ...................................................... 21
Figure C.3 – Principle of resonance method, circuit diagram (originally from Q meter) .......... 23
Figure C.4 – Auto-balancing circuit ....................................................................................... 25
Figure D.1 – Non-contacting electrode method ..................................................................... 27
Table 1 – Applicable frequency range in effective apparatus ................................................. 16
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INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
DIELECTRIC AND RESISTIVE PROPERTIES OF
SOLID INSULATING MATERIALS –
Part 2-2: Relative permittivity and dissipation factor –
High frequencies (1 MHz to 300 MHz) – AC methods
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international
co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and
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Publications.8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent
rights. IEC shall not be held responsible for identifying any or all such patent rights.
IEC 62631-2-2 has been prepared by of IEC technical committee 112: Evaluation and
qualification of electrical insulating materials and systems. It is an International Standard.
The text of this International Standard is based on the following documents:Draft Report on voting
112/562/FDIS 112/565/RVD
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.The language used for the development of this International Standard is English.
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IEC 62631-2-2:2022 © IEC 2022 – 5 –
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are
described in greater detail at www.iec.ch/standardsdev/publications.A list of all parts in the IEC 62631 series, published under the general title Dielectric and
resistive properties of solid insulating materials, can be found on the IEC website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under webstore.iec.ch in the data related to the
specific document. At this date, the document will be• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
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INTRODUCTION
Permittivity and dissipation factor (tan δ) are basic parameters for the quality of insulating
materials. The dissipation factor depends on several parameters, such as environmental factors,
moisture, temperature, applied voltage, and highly depends on frequency, the accuracy of
measuring apparatus and other parameters applied to the measured specimen.The frequency range measurable for permittivity and dissipation factor is highly limited by the
design of the electrode system, dimension of the sample and impedance of the wiring lead.
Special consideration should be given to the measurement in the high frequency range. This
document focuses on the method for measurements of permittivity and dissipation factor in the
high frequency range from 1 MHz to 300 MHz.---------------------- Page: 8 ----------------------
IEC 62631-2-2:2022 © IEC 2022 – 7 –
DIELECTRIC AND RESISTIVE PROPERTIES OF
SOLID INSULATING MATERIALS –
Part 2-2: Relative permittivity and dissipation factor –
High frequencies (1 MHz to 300 MHz) – AC methods
1 Scope
This part of IEC 62631 specifies test methods for the determination of permittivity and
dissipation factor properties of solid insulating materials in a high frequency range from 1 MHz
to 300 MHz.2 Normative references
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies.
For undated references, the latest edition of the referenced document (including any
amendments) applies.IEC 60212, Standard conditions for use prior to and during the testing of solid electrical
insulating materials3 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
ISO and IEC maintain terminological databases for use in standardization at the following
addresses:• ISO Online browsing platform: available at https://www.iso.org/obp
• IEC Electropedia: available at http://www.electropedia.org/
3.1
solid electrical insulating material
solid with negligibly low electric conductivity, used to separate conducting parts at different
electrical potentialsNote 1 to entry: The term "electrical insulating material" is sometimes used in a broader sense to designate also
insulating liquids and gases. Insulating liquids are covered by IEC 60247 [1].3.2
dielectric properties
comprehensive behaviour of an insulating material measured with an alternating current
comprising the capacitance, absolute permittivity, relative permittivity, relative complex
permittivity, dielectric dissipation factor3.3
absolute permittivity
electric flux density divided by the electric field strength
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3.4
vacuum permittivity
permittivity of a vacuum, which is related to the magnetic constant ε μ and to the speed of light
0 0in vacuum c by the relation ε μ c = 1
0 0 0 0
3.5
relative permittivity
ratio of the absolute permittivity to the permittivity of a vacuum ε
3.6
relative complex permittivity
permittivity in a complex number representation, under steady sinusoidal field conditions
3.7dielectric dissipation factor tan δ (loss tangent)
numerical value of the ratio of the imaginary to the real part of the complex permittivity
3.8capacitance
property of an arrangement of conductors and dielectrics which permits the storage of electrical
charge when a potential difference exists between the conductors3.9
voltage application
application of a voltage between electrodes
Note 1 to entry: Voltage application is sometimes referred to as electrification.
3.10measuring electrodes
conductors applied to, or embedded in, a material to make contact with it to measure its
dielectric or resistive propertiesNote 1 to entry: The design of the measuring electrodes depends on the specimen and the purpose of the test.
4 Methods of test4.1 Basic theory
Capacitance C is the property of an arrangement of conductors and dielectrics which permits
the storage of electrical charge when a potential difference exists between the conductors.
C is the ratio of a quantity q of charge to a potential difference U. A capacitance value is always
positive. The unit is farad when the charge is expressed in coulomb and the potential in volts.
C= (1)---------------------- Page: 10 ----------------------
IEC 62631-2-2:2022 © IEC 2022 – 9 –
The measured permittivity (formerly known as dielectric constant) ε of an insulating material is
the product of its relative permittivity ε and the permittivity of a vacuum ε :r 0
ε = ε · ε
(2)
0 r
This general method describes common values for general measurements. If a method for a
specific type of material is described in this document, the specific method shall be used.
The permittivity is expressed in farad per metre (F/m); the permittivity of vacuum ε has the
following value:−12
(3)
ε 8,854187817×10
Relative permittivity is the ratio of the absolute permittivity to the permittivity of a vacuum ε .
In the case of constant fields and alternating fields of sufficiently low frequency, the relative
permittivity of an isotropic or quasi-isotropic dielectric is equal to the ratio of the capacitance of
a capacitor, in which the space between and around the electrodes is entirely and exclusively
filled with the dielectric, to the capacitance of the same configuration of electrodes in vacuum.
ε =(4)
The relative permittivity ε of dry air, at normal atmospheric pressure, equals 1,000 59, so that
in practice, the capacitances C of the configuration of electrodes in air can normally be used
instead of C to determine the relative permittivity ε with sufficient accuracy.0 r
Relative complex permittivity is permittivity in a complex number representation under steady
sinusoidal field conditions expressed as'" − jδ
ε=ε−jε=ε e (5)
rr r r
' "
where ε and ε have positive values.
r r
' "
NOTE 1 The complex permittivity ε is customarily quoted either in terms of ε and ε , or in terms of ε and tan δ.
r r rNOTE 2 ε is termed loss index.
The dielectric dissipation factor tan δ (loss tangent) is the numerical value of the ratio of the
imaginary to the real part of the complex permittivity.---------------------- Page: 11 ----------------------
– 10 – IEC 62631-2-2:2022 © IEC 2022
Key
U applied voltage
I current
I real part of current
I imaginary part of current
φ phase difference between applied voltage and current
δ subtracted angle of φ from
Figure 1 – Dielectric dissipation factor
tanδ= (6)
Thus, the dielectric dissipation factor tan δ of an insulating material is the tangent of the angle
δ by which the phase difference φ between the applied voltage and the resulting current deviates
from π/2 rad when the solid insulating material is exclusively used as dielectric in a capacitive
test specimen (capacitor), compared with Figure 1. The dielectric dissipation factor can also be
expressed by an equivalent circuit diagram using an ideal capacitor with a resistor in series or
parallel connection (see Figure 2).tanδ ωC ×R
ss (7)
ωC ×R
with
(8)
1+ tan δ
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IEC 62631-2-2:2022 © IEC 2022 – 11 –
and
(9)
tan δ
NOTE 3 R and R respectively are not directly related to but affected by the volume and the surface resistance of
s pan insulating material. Therefore, the dielectric dissipation factor can also be affected by these resistive materials
properties.Key
C and R capacitance and resistance for equivalent parallel circuit, respectively
p p
C and R capacitance and resistance for equivalent series circuit, respectively
s s
Figure 2 – Equivalent circuit diagrams with capacitive test specimen
This general method describes common values for general measurements. If a method for a
specific type of material is described in this document, the specific method shall be used.
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Key
a and b terminals
C R and Z capacitance, resistance and impedance for equivalent parallel circuit with sample P,
p p Prespectively
R , L , C and Z Z is the impedance due to the residual resistance R and residual inductance L
lead leadlead lead lead lead lead
existing with leads from the equipment to the test fixture. The stray capacitor, C is
leadthe stray capacitor involved in Z
lead
C , R and Z Z is the impedance due to the edge capacitance of the electrode and leakage
edge leak edge edgeresistance on sample and insulators of the electrode fixture
Figure 3 – Equivalent parallel circuit for test fixture with sample and leads to equipment
The measurement of permittivity and dielectric dissipation factor shall be made taking into
consideration the electric properties of the measuring circuit as well as the specific electric
properties of the material. To carry out the test, in most cases, the use of high voltage is
necessary. Care should be taken to prevent any electric shock.The basic principles of apparatus and methods are not described here. Some references to the
literature are given in the bibliography of IEC 62631-2-1 [2] .4.2 Distinctive factors for the measurement in high frequency range
Figure 3 shows an equivalent parallel circuit comprising an electrode system with a sample and
wiring leads from terminals a and b.The impedance of C , , decreases when the frequency is increased, which causes the
jωCincrease in current through C in the high frequency range. When the frequency is increased
from 100 kHz to 100 MHz, the current through C increases 1 000 times more than that at
100 kHz. This causes a decrease of accuracy in the obtained results.___________
Numbers in square brackets refer to the bibliography.
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IEC 62631-2-2:2022 © IEC 2022 – 13 –
The impedances due to the inductance of leads (L ), and the stray capacitance (C ) also
lead leaddepend on the frequency. That kind of impedance can be ignored in the measurements in the
low frequency range. In the high frequency range, on the other hand, the effect of the impedance
of Z on the measured values cannot be ignored and causes errors in the measured results.
edgeThe impedance due to Z is also a significant factor in the high frequency range. R which
edge leakis independent of the frequency could be negligible, because the leakage current on the sample
surface is much smaller than the current through the edge capacitance in the high frequency
range.In the low frequency range, as described in IEC 62631-2-1, effective guarding and shielding
should be applied to avoid measurement errors resulting from the stray capacitance and the
residual impedance. In the frequency range higher than 100 kHz, however, the current through
the guard and shielding are significant in comparison with the current through the specimen in
the lower frequency range. Furthermore, care should be taken to prevent any electromagnetic
interference (EMI) during measurements in the radio frequency range.NOTE 1 Since the impedance of a capacitor is inversely proportional to frequency, at high frequencies it is
essentially acting as a wire.NOTE 2 The stray capacitance is the additional capacitance which exists in parallel with the capacitance of the test
specimen. The stray capacitance also exists between the ground and a lead line connecting a terminal of an
equipment to an electrode.NOTE 3 The residual impedance is the impedance existing in series with the impedance of the test specimen. The
residual impedance includes an impedance of the electrode produced on the surface of the
...
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