IEC PAS 62562:2008

Cavity resonator method to measure the complex permittivity of low-loss dielectric plates

Describes the measurement method of dielectric properties in the planer direction of dielectric plate at microwave frequency in order to develop new materials and to design microwave active and passive devices. This method is called a cavity resonator method.

General Information

• Status: Replaced
• Publication Date: 21-Jan-2008
• ICS: 17.220.01 - Electricity. Magnetism. General aspects
• Technical Committee: SC 46F - RF and microwave passive components
• Current Stage: DELPUB - Deleted Publication
• Completion Date: 18-Feb-2010

Relations

• Replaced By: IEC 62562:2010 - Cavity resonator method to measure the complex permittivity of low-loss dielectric plates
• Effective Date: 05-Sep-2023

Standards Content (Sample)

IEC/PAS 62562
Edition 1.0 2008-01
PUBLICLY AVAILABLE
SPECIFICATION
PRE-STANDARD
Cavity resonator method to measure the complex permittivity of low-loss
dielectric plates
IEC/PAS 62562:2008(E)
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form

or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester.
If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication,

please contact the address below or your local IEC member National Committee for further information.

IEC Central Office
3, rue de Varembé
CH-1211 Geneva 20
Switzerland
Email: [e-mail]
Web: www.iec.ch
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.

About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigenda or an amendment might have been published.
ƒ Catalogue of IEC publications: www.iec.ch/searchpub
The IEC on-line Catalogue enables you to search by a variety of criteria (reference number, text, technical committee,…).
It also gives information on projects, withdrawn and replaced publications.
ƒ IEC Just Published: www.iec.ch/online_news/justpub
Stay up to date on all new IEC publications. Just Published details twice a month all new publications released. Available
on-line and also by email.
ƒ Electropedia: www.electropedia.org
The world's leading online dictionary of electronic and electrical terms containing more than 20 000 terms and definitions
in English and French, with equivalent terms in additional languages. Also known as the International Electrotechnical
Vocabulary online.
ƒ Customer Service Centre: www.iec.ch/webstore/custserv
If you wish to give us your feedback on this publication or need further assistance, please visit the Customer Service
Centre FAQ or contact us:
Email: [e-mail]
Tel.: [phone]
Fax: [phone]
IEC/PAS 62562
Edition 1.0 2008-01
PUBLICLY AVAILABLE
SPECIFICATION
PRE-STANDARD
Cavity resonator method to measure the complex permittivity of low-loss
dielectric plates
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
PRICE CODE
Q
ICS 17.220 ISBN 2-8318-9524-3
– 2 – PAS 62562 © IEC:2008(E)
CONTENTS
FOREWORD.3

1 Scope.4

2 Measurement parameters .4

3 Theory and calculation equations .5

3.1 Relative permittivity and loss tangent .5

3.2 Temperature dependence of ε′ and tan δ.7

3.3 Cavity parameters .8

4 Measurement equipment and apparatus .9
4.1 Measurement equipment .9
4.2 Measurement apparatus for complex permittivity .9
5 Measurement procedure.10
5.1 Preparation of measurement apparatus .10
5.2 Measurement of reference level .10
5.3 Measurement of cavity parameters: D, H, σ , α , TCρ.10
r c
5.4 Measurement of complex permittivity of test specimen: ε′, tan δ .12
5.5 Temperature dependence of ε′ and tan δ.13
Annex A (informative) Example of measured result and accuracy .14
A.1 Cavity parameters .14
A.2 Relative permittivity ε′ and loss tangent tan δ .15
A.3 Measurement accuracy.16
Bibliography.17

Figure 1 – Resonator structures of two types .5
Figure 2 – Correction term Δε’/ε’ .7
a
Figure 3 – Correction terms ΔA/A and ΔB/B .7
Figure 4 – Schematic diagram of measurement equipments.9
Figure 5 – Cavity resonator used for measurement .10
Figure 6 – Photograph of cavity resonator for measurement around 10 GHz .10
Figure 7 – Mode chart of cavity resonator .11
Figure 8 – Resonance peaks of cavity resonator.11

Figure 9 – Resonance frequency f , insertion attenuation IA and half-power band
0 0
width f .12
BW
Figure 10 – Resonance frequency f of TE mode of cavity resonator with dielectric
0 011
plate (D = 35 mm, H = 25 mm).12
Figure A.1 – Measured temperature dependence of f and Q .14
uc
Figure A.2 – Resonance peaks of cavity resonator clamping sapphire plate.15
Figure A.3 – Measured results of temperature dependence of f , Q , ε′ and tan δ for
0 u
sapphire plate.16

Table A.1 – Measured results of cavity parameters.14
Table A.2 – Measured results of of ε' and tan δ for sapphire plate.15

PAS 62562 © IEC:2008(E) – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION

____________
CAVITY RESONATOR METHOD TO MEASURE THE COMPLEX

PERMITTIVITY OF LOW-LOSS DIELECTRIC PLATES

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising

all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with an IEC Publication.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
A PAS is a technical specification not fulfilling the requirements for a standard but made
available to the public.
IEC-PAS 62562 has been processed by subcommittee 46F: RF and microwave passive
components, of IEC technical committee 46: Cables, wires, waveguides, r.f. connectors, r.f.
and microwave passive components and accessories.
The text of this PAS is based on the This PAS was approved for
following document: publication by the P-members of the
committee concerned as indicated in
the following document
Draft PAS Report on voting
46F/73/NP 46F/78/RVN
Following publication of this PAS, which is a pre-standard publication, the technical committee
or subcommittee concerned will transform it into an International Standard.
This PAS shall remain valid for an initial maximum period of three years starting from
2008-01. The validity may be extended for a single three-year period, following which it shall
be revised to become another type of normative document or shall be withdrawn.

– 4 – PAS 62562 © IEC:2008(E)
CAVITY RESONATOR METHOD TO MEASURE THE COMPLEX

PERMITTIVITY OF LOW-LOSS DIELECTRIC PLATES

1 Scope
This PAS describes the measurement method of dielectric properties in the planer direction of

dielectric plate at microwave frequency in order to develop new materials and to design

microwave active and passive devices. This method is called a cavity resonator method.

This method has the following characteristics:
• the relative permittivity ε′ and loss tangent tan δ values of a dielectric plate sample can be
measured accurately and non-destructively;
• temperature dependence of complex permittivity can be measured;
-6
• the measurement accuracy is within 0,3% for ε′ and within 5 ×10 for tan δ;
• fringing effect is corrected using correction charts calculated on the basis of rigorous
analysis.
This method is applicable for measurements in the following conditions:
• frequency    : 2 GHz < f < 40 GHz;
• relative permittivity : 2 < ε′ < 100;
–6 –2
• loss tangent    : 10 < tan δ < 10 .

2 Measurement parameters
The measurement parameters are defined as follows.
ε = ε '− jε"= D /(ε E)    (1)
r 0
tan δ = ε" / ε'     (2)
-
ε ε
T ref –6
TC = × 10      (1 × 10 /K)         (3)
ε
T − T
ε
ref
ref
where
D  is the electric flux density;

E  is the electric field strength;
ε  is the permittivity in a vacuum;
ε′ and ε″  are the real and imaginary components of the complex relative permittivity ε ;
r
TCε  is the temperature coefficient of relative permittivity;
ε and ε are the real parts of the complex relative permittivity at temperature T and
T ref
reference temperature T (= 20 °C to 25 °C), respectively.
ref
PAS 62562 © IEC:2008(E) – 5 –
3 Theory and calculation equations

3.1 Relative permittivity and loss tangent

A resonator structure used in the non-destructive measurement of the complex permittivity is

shown in Figure 1a. A cavity having diameter D and length H = 2M is cut into two halves in the

middle of its length. A dielectric plate sample having ε′, tan δ and thickness t is placed

between these two halves. The TE mode, having only the electric field component
tangential to the plane of the sample, is used for the measurement, since air gaps at the

plate-cavity interfaces do not affect the electromagnetic field. Taking account of fringing field
in the plate-region outside diameter of the cavity on the basis of the rigorous mode matching
analysis, we determine ε′ and tan δ from the measured values of the resonant frequency f
and the unloaded Q-factor Q . This numerical calculation, however, is rather tedious.
u
Therefore, we first determine approximate values ε′ and tan δ from the f and Q values by
0 u
a
a
using simple formula for a resonator structure shown in Figure 1b, where the fringing effect
for Figure 1a is neglecte
...