IEC 60512-16-18:2008

Connectors for electronic equipment - Tests and measurements - Part 16-18: Mechanical tests on contacts and terminations - Test 16r: Deflection of contacts, simulation

IEC 60512-16-18:2008 details a standard test method to measure the deflection of a simulated contact in its cavity or housing. Although this test method is intended for cylindrical male contacts, and is particularly applicable to those where the contacts fit into an insert, which may have some elasticity, its use for contacts with other geometries and housing details, is not excluded.

Connecteurs pour équipements électroniques - Essais et mesures - Partie 16-18: Essais mécaniques des contacts et des sorties - Essai 16r: Débattement des contacts, simulation

La CEI 60512-16-18:2008 détaille une méthode d'essai normalisée pour mesurer le débattement d'un contact simulé dans son alvéole ou son capot. Bien que cette méthode d'essai soit destinée à des contacts mâles cylindriques et soit particulièrement applicable à ceux où les contacts s'adaptent dans un isolant, qui peut avoir une certaine élasticité, son utilisation pour des contacts avec d'autres géométries et détails de capot n'est pas exclue.

General Information

• Status: Published
• Publication Date: 13-May-2008
• ICS: 01 - GENERALITIES. TERMINOLOGY. STANDARDIZATION. DOCUMENTATION
• ICS: 31.220.10 - Plug-and-socket devices. Connectors
• Technical Committee: SC 48B - Electrical connectors
• Current Stage: PPUB - Publication issued
• Start Date: 15-Jun-2008
• Completion Date: 14-May-2008

Standards Content (Sample)

IEC 60512-16-18
Edition 1.0 2008-05
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Connectors for electronic equipment – Tests and measurements –
Part 16-18: Mechanical tests on contacts and terminations – Test 16r: Deflection
of contacts, simulation
Connecteurs pour équipements électroniques – Essais et mesures –
Partie 16-18: Essais mécaniques des contacts et des sorties – Essai 16r:
Débattement des contacts, simulation

All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by
any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either IEC or
IEC's member National Committee in the country of the requester.
If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication,
please contact the address below or your local IEC member National Committee for further information.

Droits de reproduction réservés. Sauf indication contraire, aucune partie de cette publication ne peut être reproduite
ni utilisée sous quelque forme que ce soit et par aucun procédé, électronique ou mécanique, y compris la photocopie
et les microfilms, sans l'accord écrit de la CEI ou du Comité national de la CEI du pays du demandeur.
Si vous avez des questions sur le copyright de la CEI ou si vous désirez obtenir des droits supplémentaires sur cette
publication, utilisez les coordonnées ci-après ou contactez le Comité national de la CEI de votre pays de résidence.

IEC Central Office
3, rue de Varembé
CH-1211 Geneva 20
Switzerland
Email: [e-mail]
Web: www.iec.ch
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.

About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigenda or an amendment might have been published.
ƒ Catalogue of IEC publications: www.iec.ch/searchpub
The IEC on-line Catalogue enables you to search by a variety of criteria (reference number, text, technical committee,…).
It also gives information on projects, withdrawn and replaced publications.
ƒ IEC Just Published: www.iec.ch/online_news/justpub
Stay up to date on all new IEC publications. Just Published details twice a month all new publications released. Available
on-line and also by email.
ƒ Electropedia: www.electropedia.org
The world's leading online dictionary of electronic and electrical terms containing more than 20 000 terms and definitions
in English and French, with equivalent terms in additional languages. Also known as the International Electrotechnical
Vocabulary online.
ƒ Customer Service Centre: www.iec.ch/webstore/custserv
If you wish to give us your feedback on this publication or need further assistance, please visit the Customer Service
Centre FAQ or contact us:
Email: [e-mail]
Tel.: [phone]
Fax: [phone]
A propos de la CEI
La Commission Electrotechnique Internationale (CEI) est la première organisation mondiale qui élabore et publie des
normes internationales pour tout ce qui a trait à l'électricité, à l'électronique et aux technologies apparentées.

A propos des publications CEI
Le contenu technique des publications de la CEI est constamment revu. Veuillez vous assurer que vous possédez
l’édition la plus récente, un corrigendum ou amendement peut avoir été publié.
ƒ Catalogue des publications de la CEI: www.iec.ch/searchpub/cur_fut-f.htm
Le Catalogue en-ligne de la CEI vous permet d’effectuer des recherches en utilisant différents critères (numéro de référence,
texte, comité d’études,…). Il donne aussi des informations sur les projets et les publications retirées ou remplacées.
ƒ Just Published CEI: www.iec.ch/online_news/justpub
Restez informé sur les nouvelles publications de la CEI. Just Published détaille deux fois par mois les nouvelles
publications parues. Disponible en-ligne et aussi par email.
ƒ Electropedia: www.electropedia.org
Le premier dictionnaire en ligne au monde de termes électroniques et électriques. Il contient plus de 20 000 termes et
définitions en anglais et en français, ainsi que les termes équivalents dans les langues additionnelles. Egalement appelé
Vocabulaire Electrotechnique International en ligne.
ƒ Service Clients: www.iec.ch/webstore/custserv/custserv_entry-f.htm
Si vous désirez nous donner des commentaires sur cette publication ou si vous avez des questions, visitez le FAQ du
Service clients ou contactez-nous:
Email: [e-mail]
Tél.: [phone]
Fax: [phone]
IEC 60512-16-18
Edition 1.0 2008-05
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Connectors for electronic equipment – Tests and measurements –
Part 16-18: Mechanical tests on contacts and terminations – Test 16r: Deflection
of contacts, simulation
Connecteurs pour équipements électroniques – Essais et mesures –
Partie 16-18: Essais mécaniques des contacts et des sorties – Essai 16r:
Débattement des contacts, simulation

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
F
CODE PRIX
ICS 31.220.10 ISBN 2-8318-9789-0

– 2 – 60512-16-18 © IEC:2008
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
CONNECTORS FOR ELECTRONIC EQUIPMENT –
TESTS AND MEASUREMENTS –
Part 16-18: Mechanical tests on contacts and terminations –
Test 16r: Deflection of contacts, simulation

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with an IEC Publication.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60512-16-18 has been prepared by subcommittee 48B:
Connectors, of IEC technical committee 48: Electromechanical components and mechanical
structures for electronic equipment.
This standard cancels and replaces test 16r of IEC 60512-8, issued in 1993. This standard is
to be read in conjunction with IEC 60512-1 and IEC 60512-1-100 which explains the structure
of the IEC 60512 series.
60512-16-18 © IEC:2008 – 3 –
The text of this standard is based on the following documents:
FDIS Report on voting
48B/1875/FDIS 48B/1907/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts of the IEC 60512 series, under the general title Connectors for electronic
equipment – Tests and measurements, can be found on the IEC website.
The committee has decided that the contents of this publication will remain unchanged until
the maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in
the data related to the specific publication. At this date, the publication will be
• reconfirmed;
• withdrawn;
• replaced by a revised edition; or
• amended.
– 4 – 60512-16-18 © IEC:2008
CONNECTORS FOR ELECTRONIC EQUIPMENT –
TESTS AND MEASUREMENTS –
Part 16-18: Mechanical tests on contacts and terminations –
Test 16r: Deflection of contacts, simulation

1 Scope and object
This part of IEC 60512, when required by the detail specification, is used for testing
electomechanical components within the scope of technical committee 48. It may also be
used for similar devices when specified in a detail specification.
The object of this part of IEC 60512 is to detail a standard test method to measure the
deflection of a simulated contact in its cavity or housing.
Although this test method is intended for cylindrical male contacts, and is particularly
applicable to those where the contacts fit into an insert, which may have some elasticity, its
use for contacts with other geometries and housing details, is not excluded. In which case,
the detail specification should contain sufficient detail, given under Clause 5, to enable the
test to be done.
2 Normative references
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
IEC 60512-1-1, Connectors for electronic equipment – Tests and measurements – Part 1-1:
General examination – Test 1a: Visual examination
3 Preparations
3.1 Preparation of specimen
The specimen shall consist of a housing, with an insert or other contact-receiving connector
body or device. Any preconditioning given in the component detail specification shall be
applied. Five such specimens shall be prepared.
3.2 Equipment
A test pin (gauge pin) shall be provided, the design of which shall replicate those parts of the
contact normally fitted into the cavity that have relevance to this test.
A universal testing machine suitable for the test procedure detailed in Clause 4 shall be
required, equipped with all relevant test fixtures needed to hold the specimen under test.
3.3 Mounting
If mounting of the specimen is appropriate, it shall be as specified in the component detail
specification.
The specimen shall not be mated to its corresponding, or other, component.

60512-16-18 © IEC:2008 – 5 –
Figure 1 and Table 1 give an example of a test set up.

Pa
(1)
A
180°
B
Pa
(2)
IEC  747/08
Figure 1 – Application of force (example)

Table 1 – Relevant dimensions for Figure 1 (example)
1 Pivot point of lever arm
2 Effective length of lever arm
Pa(1) Point of application of force, phase 1
Pa(2)
Point of application of force, phase 2
3 Fixed or free connector housing or similar device
4 Total deflection
A Deflection, phase 1
B Deflection, phase 2
4 Test method
4.1 Procedure
At least 10 cavities shall be selected at random from the 5 specimens provided that at least
one cavity shall be near the periphery, and one, at or near, the centre of the connector insert
or housing. For inserts or housings having 3 or less cavities, all shall be tested. A specified
force shall be applied in a manner as, or similar to, that shown in Figure 1 (which is an
example). The force shall be applied at a rate not exceeding 10 N/s and shall be maintained
for 10 s.
The foregoing shall be repeated in the opposite direction. An example is shown in Figure 1.
In some cases where the geometry of the connector or insert is not symmetrical, the direction
or plane of application of the forces will influence the results. In all cases, the plane of
application shall be that which causes the greatest deflection.

– 6 – 60512-16-18 © IEC:2008
4.2 Measurements and requirements
4.2.1 Before testing
Visual examination according to IEC 60512-1-1 shall be carried out. There shall be no
defects, which would impair the validity of the test.
4.2.2 During testing
Deflection on each direction shall be recorded. The sum of these deflections shall be
regarded as the total deflection. It shall not exceed that given in the component detail
specification.
Observation of the test pin shall be made during the test. The test pin shall not distort, either
temporarily or permanently, during the test to a degree that would invalidate the test.
4.2.3 After testing
Visual examination according to IEC 60512-1-1 shall be carried out. There shall be no defects
...