IEC 61000-4-14:1999+AMD1:2001+AMD2:2009 CSV

Electromagnetic compatibility (EMC) - Part 4-14: Testing and measurement techniques - Voltage fluctuation immunity test for equipment with input current not exceeding 16 A per phase

IEC 61000-4-14:1999+A1:2001+A2:2009 applies to electrical and/or electronic equipment that have a rated input current up to 16 A per phase. Aims to establish a reference for evaluating the immunity of electric and/or electronic equipment when subjected to positive and negative low amplitude voltage fluctuations. Only conducted phenomena are considered, including immunity tests for equipment connected to public and industrial power supply networks. Has the status of a Basic EMC publication. This consolidated version consists of the first edition (1999), its amendment 1 (2001) and its amendment 2 (2009). Therefore, no need to order amendment in addition to this publication.

Compatibilité électromagnétique (CEM) - Partie 4-14: Techniques d'essai et de mesure - Essai d'immunité aux fluctuations de tension pour le matériel dont le courant d'entrée est inférieur ou égal à 16 A par phase

La CEI 61000-4-14:1999+A1:2001+A2:2009 s'applique aux équipements électriques et/ou électroniques absorbant un courant nominal inférieur ou égal à 16 A par phase. A pour but d'établir une référence permettant d'évaluer l'immunité des équipements électriques et/ou électroniques soumis à des fluctuations de tension positive et négative de faible amplitude. Seuls les phénomènes conduits sont pris en compte, notamment les essais d'immunité concernant les équipements raccordés à des réseaux d'alimentation publics ou industriels. Cette norme a le statut de publication fondamentale en CEM.  Cette version consolidée comprend la première édition (1999), son amendement 1 (2001) et son amendement 2 (2009). Il n'est donc pas nécessaire de commander l'amendement avec cette publication.

General Information

• Status: Published
• Publication Date: 11-Aug-2009
• ICS: 01 - GENERALITIES. TERMINOLOGY. STANDARDIZATION. DOCUMENTATION
• ICS: 33.100.20 - Immunity
• Technical Committee: SC 77A - EMC - Low frequency phenomena
• Current Stage: PPUB - Publication issued
• Start Date: 12-Aug-2009
• Completion Date: 12-Aug-2009

Standards Content (Sample)

IEC 61000-4-14
®

Edition 1.2 2009-08
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM

Electromagnetic compatibility (EMC) –
Part 4-14: Testing and measurement techniques – Voltage fluctuation immunity
test for equipment with input current not exceeding 16 A per phase

Compatibilité électromagnétique (CEM) –
Partie 4-14: Techniques d'essai et de mesure – Essai d’immunité aux
fluctuations de tension pour le matériel dont le courant d’entrée est inférieur ou
égal à 16 A par phase
IEC 61000-4-14:1999+A1:2001+A2:2009

---------------------- Page: 1 ----------------------
THIS PUBLICATION IS COPYRIGHT PROTECTED
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---------------------- Page: 2 ----------------------
IEC 61000-4-14
®

Edition 1.2 2009-08
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM

Electromagnetic compatibility (EMC) –
Part 4-14: Testing and measurement techniques – Voltage fluctuation immunity
test for equipment with input current not exceeding 16 A per phase

Compatibilité électromagnétique (CEM) –
Partie 4-14: Techniques d'essai et de mesure – Essai d’immunité aux
fluctuations de tension pour le matériel dont le courant d’entrée est inférieur ou
égal à 16 A par phase

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX CD
ICS 33.100.20 ISBN 2-8318-1049-3
® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale

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– 2 – 61000-4-14  IEC:1999+A1:2001
+A2:2009
CONTENTS
FOREWORD . 3
INTRODUCTION . 5

1 Scope . 6
2 Normative references. 6
3 General . 6
3.1 Effects of voltage fluctuations . 6
3.2 Sources . 7
4 Definitions . 7
5 Test levels . 7
6 Test equipment . 8
6.1 Test generator . 8
6.2 Characteristics and performance of the test generator . 9
6.3 Verification of the test generator . 9
7 Test set-up . 9
8 Test procedure . 9
8.1 Climatic conditions. 10
8.2 Execution of the test . 10
9 Evaluation of test results . 10
10 Test report . 11

Annex A (informative) Electromagnetic environment classes . 16

Bibliography . 17

Figure 1a – Test diagram . 12
Figure 1b – Example of a voltage step for falling voltage. 13
Figure 1c – Example of a voltage step for rising voltage . 13
Figure 1d – Example of a complete voltage fluctuation . 14
Figure 1 – Example of test sequences of voltage fluctuations . 14
Figure 2 – Example of successive applications of voltage fluctuations . 14
Figure 3 – Schematic (single-phase) of test instrumentation for voltage fluctuations,
with power amplifier . 15
Figure 4 – Example of test generator verification load . 15

Table 1 – Test levels . 8
Table 2 – Characteristics of the test generator . 9

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61000-4-14  IEC:1999+A1:2001 – 3 –
+A2:2009
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
ELECTROMAGNETIC COMPATIBILITY (EMC) –

Part 4-14: Testing and measurement techniques –
Voltage fluctuation immunity test for equipment
with input current not exceeding 16 A per phase



FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
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4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
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between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
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equipment declared to be in conformity with an IEC Publication.
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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61000-4-14 has been prepared by subcommittee 77A: Low fre-
quency phenomena, of IEC technical committee 77: Electromagnetic compatibility.
This standard forms part 4-14 of IEC 61000 series. It has the status of basic EMC publication
in accordance with IEC Guide 107.
This consolidated version of IEC 61000-4-14 consists of the first edition (1999) [documents
77A/263/FDIS and 77A/268/RVD], its amendment 1 (2001) [documents 77B/291+293/FDIS and
77B/298+300/RVD] and its amendment 2 (2009) [documents 77A/669/CDV and 77A/685/RVC].
The technical content is therefore identical to the base edition and its amendments and has
been prepared for user convenience.
It bears the edition number 1.2.

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– 4 – 61000-4-14  IEC:1999+A1:2001
+A2:2009
A vertical line in the margin shows where the base publication has been modified by
amendments 1 and 2.
The committee has decided that the contents of the base publication and its amendments will
remain unchanged until the maintenance result date indicated on the IEC web site under
"http://webstore.iec.ch" in the data related to the specific publication. At this date,
the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.

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61000-4-14  IEC:1999+A1:2001 – 5 –
+A2:2009
INTRODUCTION

IEC 61000 is published in separate parts according to the following structure:
Part 1: General
General considerations (introduction, fundamental principles)
Definitions, terminology
Part 2: Environment
Description of the environment
Classification of the environment
Compatibility levels
Part 3: Limits
Emission limits
Immunity limits (insofar as these limits do not fall under the responsibility of the product
committees)
Part 4: Testing and measurement techniques
Measurement techniques
Testing techniques
Part 5: Installation and mitigation guidelines
Installation guidelines
Mitigation methods and devices
Part 6: Generic standards
Part 9: Miscellaneous
Each part is further subdivided into several parts, published either as International Standards,
or as technical reports, some of which have already been published as sections. Others will be
published with the part number followed by a dash and a second number identifying the
subdivision (example 61000-6-1).

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– 6 – 61000-4-14  IEC:1999+A1:2001
+A2:2009
ELECTROMAGNETIC COMPATIBILITY (EMC) –

Part 4-14: Testing and measurement techniques –
Voltage fluctuation immunity test for equipment
with input current not exceeding 16 A per phase



1 Scope
This part of IEC 61000 is a basic electromagnetic compatibility (EMC) publication. It considers
immunity tests for electrical and/or electronic equipment in their electromagnetic environment.
Only conducted phenomena are considered, including immunity tests for equipment connected
to public and industrial power supply networks.
This part aims to establish a reference for evaluating the immunity of electric and electronic
equipment when subjected to positive and negative low amplitude voltage fluctuations.
The voltage fluctuations considered by this standard do not include flicker, which is a
physiological phenomenon due to lighting luminance fluctuations.
This standard applies to electrical and/or electronic equipment that have a rated input current
up to 16 A per phase. It does not apply to electrical and/or electronic equipment connected to
d.c. or a.c. 400 Hz distribution networks. Tests concerning these networks will be covered by
other IEC standards.
The immunity test levels required for a specific electromagnetic environment, together with the
performance criteria, are indicated in the product, product family or generic standards as
applicable. However, most product groups do not have a history of being susceptible to voltage
fluctuations. Consequently, testing for these phenomena is often not required.
2 Normative references
The following referenced documents are indispensable for the application of this document. For
dated references, only the edition cited applies. For undated references, the latest edition of
the referenced document (including any amendments) applies.
IEC 60050(161), International Electrotechnical Vocabulary (IEV) – Chapter 161: Electro-
magnetic compatibility
IEC 60068-1, Environmental testing – Part 1: General and guidance
IEC 61000-2-4, Electromagnetic compatibility (EMC) – Part 2: Environment – Section 4:
Compatibility levels in industrial plants for low-frequency conducted disturbances
3 General
3.1 Effects of voltage fluctuations
Electrical and electronic equipment may be affected by voltage fluctuations. Examples of these
effects include the following:
– degradation of performances in equipment using storage devices (e.g. capacitors);
– loss of function in control systems;

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61000-4-14  IEC:1999+A1:2001 – 7 –
+A2:2009
– instability of internal voltages and currents in equipment;
– increased ripple.
3.2 Sources
There is a significant number of domestic appliances in the low-voltage network. However,
fluctuations caused by these appliances are not generally significant.
Fluctuations are mainly produced by
a) continuously but randomly varying large loads such as:
1) resistance welding machines;
2) rolling mills;
3) large motors with varying loads;
4) arc furnaces;
5) arc welding plant;
b) single on/off switching of loads (e.g. motors);
c) step voltage changes (due to tap voltage regulators of transformers).
These industrially produced fluctuations can affect a large number of consumers. Such
equipment operates continuously or infrequently. The public supply network impedance has
wide variations, consequently the transmission of the disturbances will be different for different
networks.
4 Definitions
For the purpose of this part of IEC 61000, the following definitions and terms apply. They are
applicable only to the field of voltage fluctuations; not all of them are included in
IEC 60050(161).
4.1
immunity
ability of a device, equipment or system to perform without degradation of performance in the
presence of an electromagnetic disturbance [IEV 161-01-20]
4.2
voltage fluctuations
series of voltage changes or a cyclic variation of the voltage envelope [IEV 161-08-05]
5 Test levels
This test may apply to all equipment intended for connection to public networks, industrial
networks and electricity plants that are likely to be sensitive to this type of disturbance.
It can be assumed that step voltage changes are the most disturbing type of voltage
fluctuations.
The equipment under test (EUT) is initially operated using a steady supply voltage and is then
subjected to repetitive step voltage changes according to figure 1a.
The initial voltage is set to
U , U – 10 % U , U + 10 % U
n n n n n
NOTE  U is the nominal voltage.
n

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– 8 – 61000-4-14  IEC:1999+A1:2001
+A2:2009
The magnitude of the voltage steps is chosen as follows:
Class 1: no test required.
Class 2: ∆U = 8 % U for equipment intended for connection to public networks or other lightly
n
disturbed networks. This test level is specified for class 2.
Class 3: ∆U = 12 % U for equipment connected to heavily disturbed networks (i.e. industrial
n
networks). This test level is specified for class 3.
Classes 1, 2 and 3 are defined in annex A.
Table 1 gives the test levels for the different initial voltages:
U , U – 10 % U , U + 10 % U
n n n n n
Table 1 – Test levels
U
Class U – 10 % U U + 10 % U
n n n n n
1 No test required
2 ∆U = ±8 % U ∆U = +8 % U ∆U = –8 % U
n n n
3
∆U = ±12 % U ∆U = +12 % U ∆U = –12 % U
n n n
x x x x
NOTE  The levels for class "x" are open.

The repetition period T and the duration t of the voltage fluctuations are specified as T = 5 s
and t = 2 s (see Figure 1d).
The changes from the initial voltage to the test voltage, or from the test voltage back to the
initial voltage are achieved through five successive voltage steps in five consecutive cycles of
the mains supply, see Figure 1d. Each voltage step is of ΔU/5 and occurs over π/2 radians of
the period of the nominal frequency, f , (e.g. 5 ms for 50 Hz) see Figure 1b and Figure 1c.
n
For falling voltage changes, the voltage step begins at phase angle φ = 270° and finishes at
φ = 360°, see Figure 1b.
For rising voltage changes, the voltage step begins at phase angle φ = 180° and finishes at
φ = 270°, see Figure 1c.
x is an open test level. This value may be defined by the product standard in order to cover
situations other than the normal operating conditions of the network.
All of the levels can be proposed by the product committee, but for equipment for use in public
supply systems, the values shall not be lower than those specified for class 2.
NOTE The upper and lower voltage operation limits defined by the product manufacturer should not be exceeded.
6 Test equipment
6.1 Test generator
The generator used for the test shall have provisions to prevent the emission of heavy
disturbances which, if injected into the power supply network, may influence the test results.

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61000-4-14  IEC:1999+A1:2001 – 9 –
+A2:2009
6.2 Characteristics and performance of the test generator
Table 2 – Characteristics of the test generator
Output voltage capability U ± 15 %
n
Voltage accuracy
±1 %
Zero crossing accuracy 250 µs at zero voltage crossover
The generator shall be able to supply enough current
Output current capability
according to the type of EUT in the test voltage range.
Overshoot/undershoot of the actual voltage Less than 5 % of the change in voltage
Voltage rise (and fall) time during switching Under 1 ms
Maximum interphase error (three-phase power supply) 2,5°
Frequency accuracy 2,5 % of f (50 Hz or 60 Hz)
n
NOTE The generator with a power amplifier specified in IEC 61000-4-11 is suitable for this test. An over-
voltage capability of U + 15 % is necessary.
n

6.3 Verification of the test generator
Test generators with different output power capabilities may be used.
The test generator shall be verified that it complies with the characteristics and specifications
listed in Table 2.
Performance of the test generator shall be verified with a resistive load drawing an r.m.s.
current of no more than the output capability of the generator. For example, a 230 V/16 A
generator shall be verified with a 14,3 Ω load.
In addition, the generator’s output current capability shall be verified as being able to provide a
crest factor of at least 3 when U is applied to a single phase load drawing an r.m.s. current of
n
no more than the output capability of the generator. Each output phase of the generator shall
be verified in turn. An example of a suitable 230 V/16 A verification load is given in Figure 4.
7 Test set-up
Figure 3 shows the test configuration for mains supply simulation.
Waveform generators and power amplifiers may be used.
Tests on three-phase EUT are carried out using three synchronised generators.
8 Test procedure
Before starting the test of a given equipment, a test plan shall be prepared.
It is recommended that the test plan include the following:
– description of the EUT;
– information on possible connections (plugs, terminals, etc.) and corresponding cables and
peripherals;
– input power port of the EUT;
– representative operational modes of the EUT for the test;

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– 10 – 61000-4-14  IEC:1999+A1:2001
+A2:2009
– performance criteria used and defined in the technical specifications;
– description of the test set-up.
If the actual operating signal sources are not available to the EUT, they may be simulated.
For each test, any degradation of performance shall be recorded. The monitoring equipment
should be capable of displaying the status of the operational mode of the EUT during and after
the tests. After each group of tests, a full functional check shall be performed.
8.1 Climatic conditions
Unless otherwise specified by the committee responsible for the generic or product standard,
the climatic conditions in the laboratory shall be within any limits specified for the operation of
the EUT and the test equipment by their respective manufacturers.
Tests shall not be performed if the relative humidity is so high as to cause condensation on the
EUT or the test equipment.
NOTE Where it is considered that there is sufficient evidence to demonstrate that the effects of the phenomenon
covered by this standard are influenced by climatic conditions, this should be brought to the attention of the
committee responsible for this standard.
8.2 Execution of the test
The EUT shall be tested for each selected combination of test level and duration with a series
of three sequences of voltage fluctuations, with intervals of two times 60 s minimum between
the voltage fluctuation sequences (see figure 2). Each representative mode of operation shall
be tested.
The test duration shall be determined by the product committee.
In the case of a three-phase apparatus, all three phases shall be tested at the same time. The
voltage steps are made phase by phase at the same phase angle, ϕ, and not simultaneously on
the three phases.
9 Evaluation of test results
The test results shall be classified in terms of the loss of function or degradation of
performance of the equipment under test, relative to a performance level defined by its
manufacturer or the requestor of the test, or agreed between the manufacturer and the
purchaser of the product. The recommended classification is as follows:
a) normal performance within limits specified by the manufacturer, requestor or purchaser;
b) temporary loss of function or degradation of performance which ceases after the
disturbance ceases, and from which the equipment under test recovers its normal
performance, without operator intervention;
c) temporary loss of function or degradation of performance, the correction of which requires
operator intervention;
d) loss of function or degradation of performance which is not recoverable, owing to damage
to hardware or software, or loss of data.
The manufacturer’s specification may define effects on the EUT which may be considered
insignificant, and therefore acceptable.

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61000-4-14  IEC:1999+A1:2001 – 11 –
+A2:2009
This classification may be used as a guide in formulating performance criteria, by committees
responsible for generic, product and product-family standards, or as a framework for the
agreement on performance criteria between the manufacturer and the purchaser, for example
where no suitable generic, product or product-family standard exists.
10 Test report
The test report shall contain all the information necessary to reproduce the test. In particular,
the following shall be recorded:
– the items specified in the test plan required by clause 8 of this standard;
– identification of the EUT and any associated equipment, for example, brand name, product
type, serial number;
– identification of the test equipment, for example, brand name, product type, serial number;
– any special environmental conditions in which the test was performed, for example, shielded
enclosure;
– any specific conditions necessary to enable the test to be performed;
– performance level defined by the manufacturer, requestor or purchaser;
– performance criterion specified in the generic, product or product-family standard;
– any effects on the EUT observed during or after the application of the test disturbance, and
the duration for which these effects persist;
– the rationale for the pass/fail decision (based on the performance criterion specified in the
generic, product or product-family standard, or agreed between the manufacturer and the
purchaser);
– any specific conditions of use, for example cable length or type, shielding or grounding, or
EUT operating condition
...