Photovoltaic cells - Part 4: Measurement of light and elevated temperature induced degradation of crystalline silicon photovoltaic cells

IEC TS 63202-4:2022 describes procedures for measuring the light and elevated temperature induced degradation (LETID) of crystalline silicon photovoltaic (PV) cells in simulated sunlight. The requirements for measuring initial light induced degradation (LID) of crystalline silicon PV cells are covered by IEC 63202-1, where LID degradation risk of PV cells under moderate temperature and initial durations within termination criteria of 20 kWh·m-2 are evaluated. The procedures described in this document are to evaluate the degradation behaviour of PV cells under elevated temperature and longer duration of light irradiation. The procedures described in this document can be used to detect the LETID risks of PV cells [2],[3] and to judge the effectiveness of LETID mitigation measures, e.g. quick test for production monitoring, thus helping improve the energy yield of PV modules.

General Information

Status
Published
Publication Date
27-Jun-2022
Current Stage
PPUB - Publication issued
Completion Date
28-Jun-2022
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IEC TS 63202-4:2022 - Photovoltaic cells - Part 4: Measurement of light and elevated temperature induced degradation of crystalline silicon photovoltaic cells
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IEC TS 63202-4
Edition 1.0 2022-06
TECHNICAL
SPECIFICATION
colour
inside
Photovoltaic cells –
Part 4: Measurement of light and elevated temperature induced degradation of
crystalline silicon photovoltaic cells
IEC TS 63202-4:2022-06(en)
---------------------- Page: 1 ----------------------
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---------------------- Page: 2 ----------------------
IEC TS 63202-4
Edition 1.0 2022-06
TECHNICAL
SPECIFICATION
colour
inside
Photovoltaic cells –
Part 4: Measurement of light and elevated temperature induced degradation of
crystalline silicon photovoltaic cells
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 27.160 ISBN 978-2-8322-3924-7

Warning! Make sure that you obtained this publication from an authorized distributor.

® Registered trademark of the International Electrotechnical Commission
---------------------- Page: 3 ----------------------
– 2 – IEC TS 63202-4:2022 © IEC 2022
CONTENTS

FOREWORD ........................................................................................................................... 3

1 Scope .............................................................................................................................. 5

2 Normative references ...................................................................................................... 5

3 Terms and definitions ...................................................................................................... 6

4 Apparatus ........................................................................................................................ 6

5 Sampling ......................................................................................................................... 6

6 Measurement ................................................................................................................... 7

7 Report ............................................................................................................................. 8

Annex A (informative) LETID behaviour ................................................................................. 9

Bibliography .......................................................................................................................... 10

Figure A.1 – Dependence of ΔP on cumulative irradiation dose .......................................... 9

max

Table A.1 – Summary of the LETID behaviours for the curves in Figure A.1 ............................ 9

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IEC TS 63202-4:2022 © IEC 2022 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
PHOTOVOLTAIC CELLS –
Part 4: Measurement of light and elevated temperature induced
degradation of crystalline silicon photovoltaic cells
FOREWORD

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IEC TS 63202-4 has been prepared by IEC technical committee 82: Solar photovoltaic energy

systems. It is a Technical Specification.
The text of this Technical Specification is based on the following documents:
Draft Report on voting
82/1994/DTS 82/2043/RVDTS

Full information on the voting for its approval can be found in the report on voting indicated in

the above table.

The language used for the development of this Technical Specification is English.

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– 4 – IEC TS 63202-4:2022 © IEC 2022

This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in

accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available

at https://www.iec.ch/members_experts/refdocs. The main document types developed by IEC

are described in greater detail at https://www.iec.ch/standardsdev/publications.

A list of all parts in the IEC 63202 series, published under the general title Photovoltaic cells,

can be found on the IEC website.

The committee has decided that the contents of this document will remain unchanged until the

stability date indicated on the IEC website under webstore.iec.ch in the data related to the

specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.

IMPORTANT – The "colour inside" logo on the cover page of this document indicates that it

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contents. Users should therefore print this document using a colour printer.
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IEC TS 63202-4:2022 © IEC 2022 – 5 –
PHOTOVOLTAIC CELLS –
Part 4: Measurement of light and elevated temperature induced
degradation of crystalline silicon photovoltaic cells
1 Scope

This part of IEC 63202 describes procedures for measuring the light and elevated temperature

induced degradation (LETID) of crystalline silicon photovoltaic (PV) cells in simulated sunlight.

The requirements for measuring initial light induced degradation (LID) of crystalline silicon PV

cells are covered by IEC 63202-1, where LID degradation risk of PV cells under moderate

temperature and initial durations within termination criteria of 20 kWh·m are evaluated.

Energy yield of PV modules is significantly affected by the inherent LETID performance of the

PV cells, which are used in it. This LETID performance includes LID and other degradation

mechanisms. The procedures described in this document are to evaluate the degradation

behaviour of PV cells under elevated temperature and longer duration of light irradiation. The

degradation rate, maximum degradation ratio and possible regeneration are determined by

comparing the cell maximum power, Pmax, at Standard Test Conditions (STC) during the light

irradiation process with respect to the initial P . A P degradation profile with respect to

max max
cumul
...

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