IEC 60384-10:1989/AMD2:2000

Amendment 2 - Fixed capacitors for use in electronic equipment - Part 10: Sectional specification: Fixed multilayer ceramic chip capacitors

General Information

• Status: Replaced
• Publication Date: 13-Sep-2000
• ICS: 31.060.20 - Ceramic and mica capacitors
• Technical Committee: TC 40 - Capacitors and resistors for electronic equipment
• Current Stage: DELPUB - Deleted Publication
• Completion Date: 24-Jun-2004

Relations

• Replaced By: IEC 60384-21:2004 - Fixed capacitors for use in electronic equipment - Part 21: Sectional specification: Fixed surface mount multilayer capacitors of ceramic dielectric, Class 1
• Effective Date: 05-Sep-2023
• Replaced By: IEC 60384-22:2004 - Fixed capacitors for use in electronic equipment - Part 22: Sectional specification: Fixed surface mount multilayer capacitors of ceramic dielectric, Class 2
• Effective Date: 05-Sep-2023
• Replaced By: IEC 60384-21-1:2004 - Fixed capacitors for use in electronic equipment - Part 21-1: Blank detail specification: Fixed surface mount multilayer capacitors of ceramic dielectric, Class 1 - Assessment level EZ
• Effective Date: 05-Sep-2023
• Replaced By: IEC 60384-22-1:2004 - Fixed capacitors for use in electronic equipment - Part 22-1: Blank detail specification: Fixed surface mount multilayer capacitors of ceramic dielectric, Class 2 - Assessment level EZ
• Effective Date: 05-Sep-2023

Standards Content (Sample)

INTERNATIONAL
IEC
STANDARD
60384-10
AMENDMENT 2
2000-09
Amendment 2
Fixed capacitors for use in electronic equipment –
Part 10:
Sectional specification: Fixed multilayer ceramic
chip capacitors
Amendement 2
Condensateurs fixes utilisés dans les équipements
électroniques –
Partie 10:
Spécification intermédiaire: Condensateurs fixes
chipses à diélectrique en céramique multicouche

 IEC 2000  Copyright - all rights reserved
International Electrotechnical Commission 3, rue de Varembé Geneva, Switzerland
Telefax: [phone] e-mail: [e-mail] IEC web site http://www.iec.ch
Commission Electrotechnique Internationale
PRICE CODE
H
International Electrotechnical Commission
For price, see current catalogue

– 2 – 60384-10 Amend. 2 © IEC:2000(E)

FOREWORD
This amendment has been prepared by IEC technical committee 40: Capacitors and resistors

for electronic equipment.
The text of this amendment is based on the following documents:

FDIS Report on voting
40/1144/FDIS 40/1180/RVD
Full information on the voting for the approval of this amendment can be found in the report on
voting indicated in the above table.
The committee has decided that the contents of the base publication and its amendments will
remain unchanged until 2005. At this date, the publication will be
• reconfirmed;
• withdrawn;
• replaced by a revised edition, or
• amended.
A bilingual version of this publication may be issued at a later date.
___________
Page 25
2.2.6 Temperature characteristic of capacitance
Replace Table V by the following new table V:
Sub- Max. capacitance change within the Category temperature and corresponding
class category temperature range with number code
letter respect to the capacitance at 20 °C
code measured with and without a d.c.

voltage applied
% –55/+125 °C –55/+85 °C –40/+85 °C –25/+85 °C –10/+85 °C
Without d.c. With d.c. voltage* 12 3 4 6
voltage applied applied
2B ±10 Requirements – × × × –
2C ±20 specified in × × × – –
2D +20/-30 the relevant – – – × –
2E +22/-56 specification – × × × ×
2F +30/-80 – × × × ×
2R ±15 × – – – –
2X ±15 × – – – –
* d.c. voltage applied is either rated voltage or the voltage specified in the relevant specification.

60384-10 Amend. 2  IEC:2000(E) – 3 –

Page 31
Table VI
Change in the first column of the table, in the row for “Group no. 3”, the footnote reference

“(2)” to “(3)”
Page 49
4.5.2 Requirements
Replace, on page 51, the first sentence of the paragraph numbered "4." by:
For chips less than, or equal to, 2 mm in length the ceramic shall be free from conducting
smears (metallization, tinning …) of diameter greater than 0,1 mm over a zone at least 0,3 mm
in length.
Page 51
4.6.1.1 Measuring conditions
Replace the table for “Class 2” by the following new table:
Sub-class Measuring voltage Referee voltage
2B, 2C, 2X 1,0 ± 0,2 V 1,00 ± 0,02 V
2D, 2E, 2F, 2R 0,3 ± 0,2 V 0,3 ± 0,02 V
or requirements specified in the or requirements specified in the
relevant specification relevant specification
Page 53
4.6.1.2 Requirements
In the second paragraph, replace “Group 2A” by “Group 3”.
Page 61
4.10.4 Final inspection, measurements and requirements
Replace the table “For Class 1 capacitors” by the following new table:
–6
Requirements(*)
α rated in 10 /°C
+100 ≥ α ≥ –750 0,5 % or 0,5 pF
1 % or 1 pF
−750 > α ≥ −1 500
and SL (1C) and UM (1D)
* whichever is the greater.
– 4 – 60384-10 Amend. 2 © IEC:2000(E)

Replace, on page 63, the table “For class 2 capacitors” by the following new table:

Sub-class Requirements
2B, 2C and 2X ±10 %
2D and 2R ±15 %
2E and 2F ±20 %
Page 65
4.12.5 Final inspection, measurements and requirements
Replace the table “For Class 1 capacitors” by the following new table:
–6
Requirements(*)
α rated in 10 /°C
+100 ≥ α ≥−750 1 % or 1 pF
2 % or 1 pF
−750 > α ≥–1 500
and SL (1C) and UM (1D)
*whichever is the greater.
Page 67
4.13.7 Final inspection, measurements and requirements
In the table “For Class 1 capacitors”, on page 69, change the row for “Capacitance” as follows:
Measuring
Measurement α rated and (sub-class) Requirement
conditions
+100 ≥ α
...