IEC 60512-26-100:2008+AMD1:2011 CSV

Connectors for electronic equipment - Tests and measurements - Part 26-100: Measurement setup, test and reference arrangements and measurements for connectors according to IEC 60603-7 - Tests 26a to 26g

IEC 60512-26-100:2008+A1:2011 specifies the test and measurements and the related measurement setup and reference arrangements for interoperability and backward compatibility tests for the development and qualification of 8-way, free and fixed connectors for data transmission. The following test methods are provided:
- insertion loss, test 26a;
- return loss, test 26b;
- near-end crosstalk (NEXT), test 26c;
- far-end crosstalk (FEXT), test 26d;
- transfer impedance, test 26e;
- transverse conversion loss (TCL), test 26f;
- transverse conversion transfer loss (TCTL), test 26g.
This publication is to be read in conjunction with  IEC 60512-1:2001 and IEC 60512-1-100:2006.
This consolidated version consists of the first edition (2008) and its amendment 1 (2011). Therefore, no need to order amendment in addition to this publication.

Connecteurs pour équipements électroniques - Essais et mesures - Partie 26-100: Montage de mesure, dispositifs d'essai et de référence et mesures pour les connecteurs conformes à la CEI 60603-7 - Essais 26a à 26g

La CEI 60512-26-100:2008+A1:2011 spécifie les essais et mesures ainsi que le montage de mesure et les dispositifs de référence associés pour les essais d'interopérabilité et de compatibilité amont pour le développement et la qualification des embases et des fiches à 8 voies pour la transmissions des données. Les méthodes d'essai suivantes sont spécifiées:
- perte d'insertion, essai 26a;
- affaiblissement de réflexion, essai 26b;
- paradiaphonie, essai 26c;
- télédiaphonie, essai 26d;
- impédance de transfert, essai 26e;
- perte de conversion transverse, essai 26f;
- perte de transfert de conversion transverse, essai 26g.
Cette publication doit être lue conjointement avec la  CEI 60512-1:2001 et la CEI 60512-1-100:2006.
Cette version consolidée comprend la première édition (2008) et son amendement 1 (2011). Il n'est donc pas nécessaire de commander l'amendement avec cette publication.

General Information

• Status: Published
• Publication Date: 24-May-2011
• ICS: 01 - GENERALITIES. TERMINOLOGY. STANDARDIZATION. DOCUMENTATION
• ICS: 31.220.10 - Plug-and-socket devices. Connectors
• Technical Committee: SC 48B - Electrical connectors
• Current Stage: PPUB - Publication issued
• Start Date: 25-May-2011
• Completion Date: 25-May-2011

Standards Content (Sample)

IEC 60512-26-100
®

Edition 1.1 2011-05
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Connectors for electronic equipment – Tests and measurements –
Part 26-100: Measurement setup, test and reference arrangements and
measurements for connectors according to IEC 60603-7 – Tests 26a to 26g

Connecteurs pour équipements électroniques – Essais et mesures –
Partie 26-100: Montage de mesure, dispositifs d’essai et de référence et mesures
pour les connecteurs conformes à la CEI 60603-7 – Essais 26a à 26g

IEC 60512-26-100:2008+A1:2011

---------------------- Page: 1 ----------------------
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IEC 60512-26-100
®

Edition 1.1 2011-05

INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Connectors for electronic equipment – Tests and measurements –
Part 26-100: Measurement setup, test and reference arrangements and
measurements for connectors according to IEC 60603-7 – Tests 26a to 26g

Connecteurs pour équipements électroniques – Essais et mesures –
Partie 26-100: Montage de mesure, dispositifs d’essai et de référence et mesures
pour les connecteurs conformes à la CEI 60603-7 – Essais 26a à 26g

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX CN
ICS 13.220.10 ISBN 978-2-88912-512-8

® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale

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– 2 – 60512-26-100  IEC:2008+A1:2011
CONTENTS
FOREWORD . 6
INTRODUCTION . 8
1 Scope . 9
2 Normative reference . 9
3 General requirements for measurement setup . 10
3.1 Test instrumentation . 10
3.2 Coaxial cables and test leads for network analysers . 10
3.3 Measurement precautions . 10
3.4 Balun requirements . 11
3.5 Reference components for calibrations . 12
3.5.1 Reference loads for calibration . 12
3.5.2 Reference cables for calibration . 12
3.6 Termination loads for termination of conductor pairs . 12
3.7 Termination of screens . 13
3.8 Test specimen and reference planes . 13
3.9 Termination of balun with low return loss for common mode . 14
3.9.1 General . 14
3.9.2 Centre tap connected to ground . 14
3.9.3 Centre tap open . 14
4 Connector measurement up to 250 MHz . 15
4.1 Insertion loss (IL), Test 26a . 15
4.1.1 Object . 15
4.1.2 Free connector for insertion loss. 15
4.1.3 Test method . 15
4.1.4 Test set-up . 15
4.1.5 Procedure . 15
4.1.6 Test report . 17
4.1.7 Accuracy . 17
4.2 Return loss (RL), Test 26b . 17
4.2.1 Object . 17
4.2.2 Free connector for return loss . 17
4.2.3 Test method . 17
4.2.4 Test set-up . 17
4.2.5 Procedure . 17
4.2.6 Test report . 17
4.2.7 Accuracy . 17
4.3 Near-end crosstalk (NEXT), Test 26c . 18
4.3.1 Object . 18
4.3.2 Fixed and free connector combinations to be tested . 18
4.3.3 Test method . 18
4.3.4 Test set-up . 18
4.3.5 Procedure . 19
4.3.6 Test report . 20
4.3.7 Accuracy . 20
4.4 Far-end crosstalk (FEXT), Test 26d . 20
4.4.1 Object . 20

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60512-26-100  IEC:2008+A1:2011 – 3 –
4.4.2 Fixed and free connector combinations to be tested . 20
4.4.3 Test method . 20
4.4.4 Test set-up . 20
4.4.5 Procedure . 21
4.4.6 Test report . 22
4.4.7 Accuracy . 22
4.5 Transfer impedance (Z ), Test 26e . 22
T
4.5.1 Object . 22
4.5.2 Test method . 22
4.5.3 Definitions . 22
4.5.4 Test set-up . 23
4.5.5 Procedure . 27
4.5.6 Test report . 29
4.5.7 Accuracy . 29
4.6 Transverse Conversion Loss (TCL), Test 26f . 29
4.6.1 Object . 29
4.6.2 Test method . 29
4.6.3 Test set-up . 29
4.6.4 Procedure . 30
4.6.5 Test report . 30
4.6.6 Accuracy . 30
4.7 Transverse Conversion Transfer Loss (TCTL), Test 26g . 31
4.7.1 Object . 31
4.7.2 Test method . 31
4.7.3 Test set-up . 31
4.7.4 Procedure . 31
4.7.5 Test report . 32
4.7.6 Accuracy . 32
5 Construction and qualification of test plugs . 32
5.1 De-embedding near-end crosstalk (NEXT) test plug . 32
5.1.1 Set-up and calibration of reference plug . 32
5.1.2 Test plug construction . 34
5.1.3 Test plug NEXT measurement . 34
5.1.4 Test plug NEXT requirements . 36
5.1.5 Test plug balance . 38
5.2 Far-end crosstalk (FEXT) test plug . 39
5.2.1 General . 39
5.2.2 Test plug FEXT measurement – de-embedding method . 40
5.2.3 Test plug FEXT measurement – direct method . 40
5.2.4 FEXT test plug requirements . 41
5.3 Return loss test plug . 41
6 Reference plug and jack construction and measurement – the basics of the de-
embedding test method . 41
6.1 De-embedding near-end crosstalk (NEXT) reference plug and jack . 41
6.1.1 Reference plug construction . 41
6.1.2 Return loss reference plug . 42
6.1.3 Set-up and calibration of reference plug . 43
6.1.4 De-embedding reference plug NEXT measurement. 43
6.1.5 Delay adjustment in lieu of port extension. 43

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– 4 – 60512-26-100  IEC:2008+A1:2011
6.2 De-embedding near-end crosstalk (NEXT) reference jack . 43
6.2.1 Reference jack construction. 43
6.2.2 De-embedding reference jack NEXT measurement . 45
6.2.3 Differential mode jack vector . 45
6.3 Determining reference jack FEXT vector . 45
6.3.1 FEXT reference plug details . 45
6.3.2 FEXT reference jack assembly . 48
6.3.3 De-embedding reference jack FEXT assembly measurement . 49
Annex A (informative) Example test fixtures in support . 50
Bibliography . 56

Figure 1 – Optional 180° hybrid used instead of a balun . 11
Figure 2 – Example of calibration of reference loads . 12
Figure 3 – Resistor load . 13
Figure 4 – Definition of reference planes. 14
Figure 5 – Balanced attenuator for balun centre tap grounded . 14
Figure 6 – Balanced attenuator for balun centre tap open . 15
Figure 7 – Calibration . 16
Figure 8 – Measuring set-up . 16
Figure 9 – NEXT measurement for differential and common mode terminations . 19
Figure 10 – FEXT measurement for differential and common mode terminations . 21
Figure 11 – Preparation of test specimen . 23
Figure 12 – Triaxial test set-up . 24
Figure 13 – Impedance matching for R < 50 Ω . 26
1
Figure 14 – Impedance matching for R > 50 Ω . 27
1
Figure 15 – TCL measurement . 29
Figure 16 – TCTL measurement . 31
Figure 17 – Back-to-back through calibration (for more information see Annex A) . 33
Figure 18 – Mated test plug/direct fixture test configuration . 40
Figure 19 – De-embedding reference plug . 42
Figure 20 – De-embedding reference jack . 44
Figure 21 – De-embedding reference FEXT plug without sockets . 45
Figure 22 – De-embedding reference FEXT plug with sockets. 46
Figure 23 – Reference FEXT plug mated to PWB . 46
Figure 24 – Reference FEXT plug-test lead position . 47
Figure 25 – Reference FEXT plug assembly . 47
Figure 26 – Test leads connected to de-embedded reference jack/PWB assembly . 49
Figure 27 – Reference FEXT plug mated to reference jack/PWB assembly . 49
Figure A.1 – THI3KIT test head interface with baluns attached . 50
Figure A.2 – Alternative to item 3.1 in Table A.2 . 52
Figure A.3 – Pyramid test setup for shielded connectors . 52
Figure A.4 – Exploded assembly of the coaxial termination reference test head . 54
Figure A.5 – Detailed view of the coaxial termination reference test-head interface . 54

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60512-26-100  IEC:2008+A1:2011 – 5 –
Table 1 – Test balun performance characteristics . 11
Table 2 – Uncertainty band of return loss measurement at frequencies below 100 MHz . 18
Table 3 – Uncertainty band of return loss measurement at frequencies above 100 MHz. 18
Table 4 – De-embedded NEXT real and imaginary reference jack vectors . 35
Table 5 – Differential mode reference jack vectors . 36
Table 6 – Test plug NEXT loss limits for connectors specified up to 100 MHz according
to IEC 60603-7-2 or IEC 60603-7-3 . 37
Table 7 – Test plug NEXT loss limits for connectors specified up to 250 MHz according
to IEC 60603-7-4 or IEC 60603-7-5 . 38
Table 8 – Test-plug differential and differential with common-mode consistency . 39
Table 9 – Test plug FEXT requirements – De-embedding method . 41
Table 10 – Return loss requirements for return loss reference plug . 43
Table A.1 – Coaxial termination reference head component list . 50
Table A.2 – Coaxial termination reference head, additional parts . 51
Table A.3 – Coaxial termination reference head component list . 53

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– 6 – 60512-26-100  IEC:2008+A1:2011
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________

CONNECTORS FOR ELECTRONIC EQUIPMENT –
TESTS AND MEASUREMENTS –

Part 26-100: Measurement setup, test and reference arrangements and
measurements for connectors according to IEC 60603-7 – Tests 26a to 26g



FOREWORD
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This consolidated version of IEC 60512-26-100 consists of the first edition (2008)
[documents 48B/1892/FDIS and 48B/1925/RVD] and its amendment 1 (2011) [documents
48B/2065/FDIS and 48B/2149/RVD]. It bears the edition number 1.1.
The technical content is therefore identical to the base edition and its amendment and
has been prepared for user convenience. A vertical line in the margin shows where the
base publication has been modified by amendment 1. Additions and deletions are
displayed in red, with deletions being struck through.

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60512-26-100  IEC:2008+A1:2011 – 7 –
International Standard IEC 60512-26-100 has been prepared by subcommittee 48B:
Connectors, of IEC technical committee 48: Electromechanical components and mechanical
structures for electronic equipment.
This standard is to be read in conjunction with IEC 60512-1 and IEC 60512-1-100 which
explains the structure of the IEC 60512 series.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts of the IEC 60512 series, under the general title Connectors for electronic
equipment – Tests and measurements, can be found on the IEC website.
The committee has decided that the contents of the base publication and its amendments will
remain unchanged until the stability date indicated on the IEC web site under
"http://webstore.iec.ch" in the data related to the specific publication. At this date, the
publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.

IMPORTANT – The “colour inside” logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct understanding
of its contents. Users should therefore print this publication using a colour printer.

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– 8 – 60512-26-100  IEC:2008+A1:2011
INTRODUCTION
Detail specifications for 8-way, free and fixed connectors such as IEC 60603-7-4:2005 and
IEC 60603-7-5:2007 define measurement setup, test and reference arrangements and
measurements for interoperability and backward compatibility tests for connectors according
IEC 60603-7 up to 250 MHz for insertion loss (IL), near end crosstalk (NEXT), far end
crosstalk (FEXT), return loss (RL) and balance (transverse conversion loss, TCL, and
transverse conversion transfer loss, TCTL) as well as the de-embedding method to qualify the
fixed (outlet) connector.
This standard keeps the technical content of the test methods specified in the annexes C to J
as specified in IEC 60603-7-4:2005 and annexes C to K as specified in IEC 60603-7-5:
...