IEC 62343-5-1:2009

Dynamic modules - Test methods - Part 5-1: Dynamic gain tilt equalizer - Response time measurement

IEC 62343-5-1:2009 contains the measurement method of response time for a dynamic gain tilt equalizer (DGTE) to change its gain tilt from an arbitrary initial value to a desired target value. Keywords: dynamic gain tilt equalizer (DGTE)

Modules dynamiques - Méthodes d'essai - Partie 5-1: Egaliseur dynamique de basculement de gain - Mesure du temps de réponse

IEC 62343-5-1:2009 contient la méthode de mesure du temps de réponse d'un égaliseur dynamique de basculement de gain (DGTE, Dynamic Gain Tilt Equalizer) nécessaire pour basculer le gain d'une valeur initiale arbitraire à une valeur cible désirée. Mots clés: égaliseur dynamique de basculement de gain (DGTE, Dynamic Gain Tilt Equalizer)

General Information

• Status: Published
• Publication Date: 28-Jun-2009
• ICS: 33.180.01 - Fibre optic systems in general
• ICS: 33.180.99 - Other fibre optic equipment
• Technical Committee: SC 86C - Fibre optic systems and active devices
• Drafting Committee: WG 5 - TC 86/SC 86C/WG 5
• Current Stage: DELPUB - Deleted Publication
• Completion Date: 25-Nov-2014

Relations

• Revised: IEC 62343-5-1:2014 - Dynamic modules - Part 5-1: Test methods - Dynamic gain tilt equalizer - Gain tilt settling time measurement
• Effective Date: 05-Sep-2023

Standards Content (Sample)

IEC 62343-5-1
®
Edition 1.0 2009-06
INTERNATIONAL
STANDARD


Dynamic modules – Test methods –
Part 5-1: Dynamic gain tilt equalizer – Response time measurement



IEC 62343-5-1:2009(E)

---------------------- Page: 1 ----------------------
THIS PUBLICATION IS COPYRIGHT PROTECTED
Copyright © 2009 IEC, Geneva, Switzerland

All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester.
If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication,
please contact the address below or your local IEC member National Committee for further information.

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Switzerland
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About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.

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---------------------- Page: 2 ----------------------
IEC 62343-5-1
®
Edition 1.0 2009-06
INTERNATIONAL
STANDARD


Dynamic modules – Test methods –
Part 5-1: Dynamic gain tilt equalizer – Response time measurement


INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
PRICE CODE
R
ICS 33.180.01; 33.180.99 ISBN 978-2-88910-679-0
® Registered trademark of the International Electrotechnical Commission

---------------------- Page: 3 ----------------------
– 2 – 62343-5-1 © IEC:2009(E)
CONTENTS
FOREWORD.4
1 Scope and general information .6
2 Terms, definitions, abbreviations and response waveforms .6
2.1 Terms and definitions .6
2.2 Abbreviations .7
2.3 Response waveforms .7
3 Apparatus.9
3.1 Light source .9
3.2 Pulse generator.9
3.3 O/E converter .10
3.4 Temperature and humidity chamber .10
3.5 Oscilloscope.10
3.6 Temporary joints .10
3.7 Control system .10
3.8 Measurement set-up.10
4 Procedure .11
4.1 Direct control type .11
4.1.1 Set-up .11
4.1.2 Preparation.12
4.1.3 Wavelength setting .12
4.1.4 Pulse generator setting.12
4.1.5 Applying the driving pulse.12
4.1.6 Monitoring and recording the output signal from DGTE under test
(DUT) .12
4.1.7 Calculation of the response time.12
4.2 Digital control type .12
4.2.1 Set-up .12
4.2.2 Preparation.12
4.2.3 Wavelength setting .12
4.2.4 Sending command.12
4.2.5 Monitoring and recording the command complete flag .13
4.2.6 Calculation of the response time.13
4.3 Analogue control type.13
4.3.1 Set-up .13
4.3.2 Preparation.13
4.3.3 Wavelength setting .13
4.3.4 Applying the control signal.13
4.3.5 Monitoring and recording the command complete flag .13
4.3.6 Calculation of the response time.13
5 Details to be specified .14
5.1 Apparatus.14
5.1.1 Light source.14
5.1.2 Pulse generator .14
5.1.3 O/E converter .14
5.1.4 Control system .14
5.2 Measurement conditions.14

---------------------- Page: 4 ----------------------
62343-5-1 © IEC:2009(E) – 3 –
Annex A (informative) Convergence criterion .15
Annex B (informative) Measurement examples .16
Annex C (informative) Response time for specific DGTEs .17
Annex D (informative) Necessity for the correction of temperature dependency .18

Figure 1 – Response waveforms for direct control DGTEs .8
Figure 2 – Response waveforms for digital control DGTEs.8
Figure 3 – Response waveforms for analogue control DGTEs.9
Figure 4 – Measurement set-up for direct control .10
Figure 5 – Measurement set-up for digital control .11
Figure 6 – Measurement set-up for analogue control .11
Figure B.1 – In case of insertion loss change is enough.16
Figure B.2 – In case of insertion loss change is small .16

Table 1 – The categorization of DGTE by the control method .6

---------------------- Page: 5 ----------------------
– 4 – 62343-5-1 © IEC:2009(E)
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________

DYNAMIC MODULES –
TEST METHODS –

Part 5-1: Dynamic gain tilt equalizer –
Response time measurement


FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with an IEC Publication.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 62343-5-1 has been prepared by subcommittee 86C: Fibre optic
systems and active devices, of IEC technical committee 86: Fibre optics.
The text of this standard is based on the following documents:
FDIS Report on voting
86C/883/FDIS 86C/899/RVD

Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts of IEC 62343 series, published under the general title Dynamic modules –
Test methods, can be found on the IEC website.

---------------------- Page: 6 ----------------------
62343-5-1 © IEC:2009(E) – 5 –
The committee has decided that the contents of this publication will remain unchanged until
the maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in
the data related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
A bilingual version of this publication may be issued at a later date.

---------------------- Page: 7 ----------------------
– 6 – 62343-5-1 © IEC:2009(E)
DYNAMIC MODULES –
TEST METHODS –

Part 5-1: Dynamic gain tilt equalizer –
Response time measurement



1 Scope and general information
1.1 Scope
This part of IEC 62343 contains the measurement method of response time for a dynamic
gain tilt equalizer (DGTE) to change its gain tilt from an arbitrary initial value to a desired
target value.
1.2 General information
The DGTE is categorized into three control methods as shown in Table 1. The direct control
type is driven directly by voltage or current, the digital control type is operated by digital
control system with digital signals, and the analogue control type is operated by analogue
signals. The definition and the measurement method of response time for DGTE are different
for the three control types. Table1 also shows the configuration of operating systems and the
correction for temperature dependency for three control types of DGTE. When the response
time for the DGTE has temperature dependency, users may need to calibrate the temperature
effect. The bottom row in Table 1 indicates the typical methods of the correction for
temperature dependency (refer to Annex D).
Table 1 – Categorization of DGTE by the control method

Direct control Digital control Analogue control
Control By voltage or current By command through digital By voltage or current
directly circuit through analogue circuit
Configurations
DGTE DGTE
DGTE
w/digital circuit
w/analogue circuit
V/I applied
Command
V/I control
(RS232c, I2C,
(ex. 0~+5V)
)
Control system Control system Control system

Correction for By control system By digital circuit or control By analogue circuit or
temperature system control system
dependency

2 Terms, definitions, abbreviations and response waveforms
2.1 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
...

IEC 62343-5-1
®

Edition 1.0 2009-06
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside


Dynamic modules – Test methods –
Part 5-1: Dynamic gain tilt equalizer – Response time measurement

Modules dynamiques – Méthodes d’essai –
Partie 5-1: Egaliseur dynamique de basculement de gain – Mesure du temps
de réponse

IEC 62343-5-1:2009-06(en-fr)

---------------------- Page: 1 ----------------------
THIS PUBLICATION IS COPYRIGHT PROTECTED
Copyright © 2009 IEC, Geneva, Switzerland

All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
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---------------------- Page: 2 ----------------------
IEC 62343-5-1

®


Edition 1.0 2009-06




INTERNATIONAL



STANDARD




NORME



INTERNATIONALE
colour

inside










Dynamic modules – Test methods –

Part 5-1: Dynamic gain tilt equalizer – Response time measurement




Modules dynamiques – Méthodes d’essai –

Partie 5-1: Egaliseur dynamique de basculement de gain – Mesure du temps

de réponse















INTERNATIONAL

ELECTROTECHNICAL

COMMISSION


COMMISSION

ELECTROTECHNIQUE

PRICE CODE
INTERNATIONALE

CODE PRIX R


ICS 33.180.01; 33.180.99 ISBN 978-2-8891-0679-0



Warning! Make sure that you obtained this publication from an authorized distributor.

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® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale

---------------------- Page: 3 ----------------------
– 2 – IEC 62343-5-1:2009 © IEC 2009
CONTENTS
FOREWORD . 4
1 Scope and general information . 6
2 Terms, definitions, abbreviations and response waveforms . 6
2.1 Terms and definitions . 6
2.2 Abbreviations . 7
2.3 Response waveforms . 7
3 Apparatus . 9
3.1 Light source . 9
3.2 Pulse generator . 9
3.3 O/E converter . 10
3.4 Temperature and humidity chamber . 10
3.5 Oscilloscope . 10
3.6 Temporary joints . 10
3.7 Control system . 10
3.8 Measurement set-up . 10
4 Procedure . 11
4.1 Direct control type . 11
4.1.1 Set-up . 11
4.1.2 Preparation . 12
4.1.3 Wavelength setting . 12
4.1.4 Pulse generator setting . 12
4.1.5 Applying the driving pulse . 12
4.1.6 Monitoring and recording the output signal from DGTE under test
(DUT) . 12
4.1.7 Calculation of the response time . 12
4.2 Digital control type . 12
4.2.1 Set-up . 12
4.2.2 Preparation . 12
4.2.3 Wavelength setting . 12
4.2.4 Sending command . 12
4.2.5 Monitoring and recording the command complete flag . 13
4.2.6 Calculation of the response time . 13
4.3 Analogue control type . 13
4.3.1 Set-up . 13
4.3.2 Preparation . 13
4.3.3 Wavelength setting . 13
4.3.4 Applying the control signal . 13
4.3.5 Monitoring and recording the command complete flag . 13
4.3.6 Calculation of the response time . 13
5 Details to be specified . 14
5.1 Apparatus . 14
5.1.1 Light source. 14
5.1.2 Pulse generator . 14
5.1.3 O/E converter . 14
5.1.4 Control system . 14
5.2 Measurement conditions . 14

---------------------- Page: 4 ----------------------
IEC 62343-5-1:2009 © IEC 2009 – 3 –
Annex A (informative) Convergence criterion . 15
Annex B (informative) Measurement examples . 16
Annex C (informative) Response time for specific DGTEs . 17
Annex D (informative) Necessity for the correction of temperature dependency . 18

Figure 1 – Response waveforms for direct control DGTEs . 8
Figure 2 – Response waveforms for digital control DGTEs . 8
Figure 3 – Response waveforms for analogue control DGTEs . 9
Figure 4 – Measurement set-up for direct control . 10
Figure 5 – Measurement set-up for digital control . 11
Figure 6 – Measurement set-up for analogue control . 11
Figure B.1 – In case of insertion loss change is enough . 16
Figure B.2 – In case of insertion loss change is small . 16

Table 1 – The categorization of DGTE by the control method . 6

---------------------- Page: 5 ----------------------
– 4 – IEC 62343-5-1:2009 © IEC 2009
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________

DYNAMIC MODULES –
TEST METHODS –

Part 5-1: Dynamic gain tilt equalizer –
Response time measurement


FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with an IEC Publication.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 62343-5-1 has been prepared by subcommittee 86C: Fibre optic
systems and active devices, of IEC technical committee 86: Fibre optics.
This bilingual version (2014-07) corresponds to the English version, published in 2009-06.
The text of this standard is based on the following documents:
FDIS Report on voting
86C/883/FDIS 86C/899/RVD

Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
The French version of this standard has not been voted upon.

---------------------- Page: 6 ----------------------
IEC 62343-5-1:2009 © IEC 2009 – 5 –
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts of IEC 62343 series, published under the general title Dynamic modules –
Test methods, can be found on the IEC website.
The committee has decided that the contents of this publication will remain unchanged until
the maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in
the data related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.

IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct
understanding of its contents. Users should therefore print this document using a
colour printer.

---------------------- Page: 7 ----------------------
– 6 – IEC 62343-5-1:2009 © IEC 2009
DYNAMIC MODULES –
TEST METHODS –

Part 5-1: Dynamic gain tilt equalizer –
Response time measurement



1 Scope and general information
1.1 Scope
This part of IEC 62343 contains the measurement method of response time for a dynamic
gain tilt equalizer (DGTE) to change its gain tilt from an arbitrary initial value to a desired
target value.
1.2 General information
The DGTE is categorized into three control methods as shown in Table 1. The direct control
type is driven directly by voltage or current, the digital control type is operated by digital
control system with digital signals, and the analogue control type is operated by analogue
signals. The definition and the measurement method of response time for DGTE are different
for the three control types. Table1 also shows the configuration of operating systems and the
correction for temperature dependency for three control types of DGTE. When the response
time for the DGTE has temperature dependency, users may need to calibrate the temperature
effect. The bottom row in Table 1 indicates the typical methods of the correction for
temperature dependency (refer to Annex D).
Table 1 – Categorization of DGTE by the control method

Direct control Digital control Analogue control
Control By voltage or current By command through digital By voltage or current
directly circuit through analogue circuit
Configurations
DGTE DGTE
DGTE
w/digital circuit
w/analogue circuit
V/I applied
Command
V/I control
(RS232c, I2C,
(ex. 0~+5V)
)
Control system
Control system Control system



Correction for By control system By digital circuit or control By analogue circuit or
temperature system control system
dependency

2 Terms, definitions, abbreviations and response waveforms
2.1 Terms and definitions
For the purposes of this document, the following terms and definitions apply.

---------------------- Page: 8 ----------------------
IEC 62343-5-1:2009 © IEC 2009 – 7 –
2.1.1
convergence time
T
c
time to converge from the first hit at the target ±Y % to the stay within the deviation ±Y % in
the optical power from the output port of DGTE at pre-determined wavelength
2.1.2
latency time
T
l
for the direct and the analogue control types, time between the application of control signal
and the change in optical power by ±X % from the output port of DGTE at pre-determined
wavelength
2.1.3
processing time

T
p
for the digital control type, time between the application of control command and the change
in optical power by ±X % from the output port of DGTE at pre-determined wavelength
2.1.4
response time
(T or T ) + T + T
l p r c
2.1.5
rise time
T
r
time to change from the initial ±X % to the target ±Y % in the optical power from the output
port of DGTE at pre-determined wavelength
2.1.6
setting time
T
s
time to be suppressed from the first hit at the target ±Y % to the final stay at the target within
a required resolution of the optical power from the output port of DGTE at pre-determined
wavelength
2.2 Abbreviations
CPU Central processing unit
DGTE Dynamic gain tilt equalizer
DUT  Device under test
O/E Optical-to-electrical
PDL Polarization dependent loss
TLS Tunable laser source
WDM Wavelength division multiplexing
2.3 Response waveforms
The definitions and symbols defined in 2.1 are shown in Figures 1 through Figure 3.

---------------------- Page: 9 ----------------------
– 8 – IEC 62343-5-1:2009 © IEC 2009
Optical power (W)
Suppressed within
required resolution
100 + Y %
P
o
 Target power 100 %
100 – Y % P
u
Parameters
 T : Latency time
l
 T : Rise time
r
 T : Convergence time
c
Response time: T + T + T
 T : Setting time
l r c
s
 P : Overshoot
o
 P : Undershoot
T
100 + X % u
s
Initial power
100 %
100 – X %
T T T
l
r c
Time
Control signal

Figure 1 – Response waveforms for direct control DGTEs

Optical power (W)
Suppressed within
required resolution
100 + Y %
P
o
Target power
100 %
100 – Y %
P
u
Parameters
 T : Latency time
l
 T : Rise time
r
 T : Convergence time
c
Response time: T + T + T
p r c
 T : Setting time
s
 P : Overshoot
o
 P : Undershoot
100 + X % T u
s

Initial power
100 %
100 – X %
T
p T T
r c
Time
Command

Figure 2 – Response waveforms for digital control DGTEs

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IEC 62343-5-1:2009 © IEC 2009 – 9 –
Optical power (W)
Suppressed within
required resolution
100 + Y %
P
o
Target power 100 %
100 – Y % P
u
Parameters
 T : Latency time
l
 T : Rise time
r
 T : Convergence time
c
Response time: T + T + T
 T : Setting time
l r c
s
 P : Overshoot
o
T  P : Undershoot
100 + X %
s u

Initial power
100 %
100 – X %
T T T
l
r c
Time
Control signal

Figure 3 – Response waveforms for analogue control DGTEs
3 Apparatus
3.1 Light source
A tunable wavelength device is used as the light source. A tunable laser source (TLS) or a
combination of a broadband light source and tunable filter is the typical equipment of a
tunable wavelength light source. The tuning range of the tunable wavelength light source shall
be enough to cover the operating wavelength of DGTE to be measured.
In order to minimize the measurement uncertainty caused by the linewidth of the light source,
the linewidth multiplied by the maximum value of the gain tilt slope of DGTE shall be smaller
than one-tenth of the dynamic gain tilt range. Typical values of operating wavelength range
and dynamic gain tilt range of DGTE are 35 nm and ± 4 dB respectively. For example, the
error for the linewidth of 1 nm is calculated as:
4 / 35
(1) )= 1,4 %
(+4− (−4))

The output power of the light source shall remain stable during the measurement. The stability
of the output power during the response time of DGTE to be measured shall be smaller than
one-tenth of dynamic gain tilt range of DGTE.
If polarization dependent loss (PDL) of DGTE to be measured is larger than 0,5 dB, a de-
polarized light source shall be used.
3.2 Pulse generator
A pulse generator is used to drive the DGTE to be measured. The shape of the pulse shall be
rectangular to change the gain tilt. The intensity and width of the pulse shall be such to make
the maximum tilt change defined as the specification of DGTE. The rise time/fall time of the
rectangular pulse shall be shorter than 10 ns or one-tenth of the rise time/fall time to be
measured.

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3.3 O/E converter
An O/E converter is used to convert the optical output power of the DGTE to be measured to
the electrical power to be observed by an oscilloscope. The bandwidth of O/E converter shall
be from DC to greater than 10(1/T ) Hz, where T is the rise time to be measured.
r r
The maximum power input to the O/E converter before compression shall be more than 10
times the optical power to be measured.
3.4 Temperature and humidity chamber
The test set-up shall include an environmental chamber capable of producing and maintaining
the specified temperature and/or humidity.
3.5 Oscilloscope
The oscilloscope shall have a storage function and sufficient bandwidth and accuracy. It shall
have at least two traces.
3.6 Temporary joints
This is a method, device, or mechanical fixture for temporarily aligning two fibre ends into a
reproducible, low loss joint. It may be, for example, a precision V-groove vacuum chuck,
micromanipulator or a fusion or mechanical splice. The stability of the temporary joint shall be
compatible with the measurement precision required.
3.7 Control system
For digital and analogue control types, the control system is used to drive the DGTE. The
specification is defined individually.
3.8 Measurement set-up
The measurement set-up for the three control types is shown in Figures 4 to Figure 6.
Chamber
Oscilloscope
O/E
Light source DGTE
converter
Pulse generator
Signal pulse

Figure 4 – Measurement set-up for direct control

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IEC 62343-5-1:2009 © IEC 2009 – 11 –
Oscilloscope
Chamber
O/E
DGTE
Light source
converter
w/digital circuit
Command complete flag
Command
RS232c
GP-IB
I2C
Dual port RAM
etc.
Command sending flag
Control system

NOTE Either command complete flag or command sending flag can be used.
Figure 5 – Measurement set-up for digital control
Oscilloscope
OscOscililloloscscopopee
Chamber
O/E
DGTE
  Light source
converter
w/analog circuit
Voltage
or
current
  Command complete flag
Control system
NOTE It should be driven by a step signal from the control system.


Figure 6 – Measurement set-up for analogue control
4 Procedure
4.1 Direct control type
4.1.1 Set-up
The measurement set-up shall be made up as shown in Figure 1. The temperature in the
chamber after setting shall be kept constant and uniform in order to achieve stable
measurement. The light source, the pulse generator, the O/E converter and the oscilloscope
shall be turned on for the measurement.

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– 12 – IEC 62343-5-1:2009 © IEC 2009
4.1.2 Preparation
Before starting the measurement, the set-up shall be turned on for more than 1 h for
stabilization.
4.1.3 Wavelength setting
The wavelength of the light source shall be set at the measuring wavelength. Measurement
shall take place at three wavelengths: shortest, medium and longest wavelengths in the
operating wavelength range. An alternative method is to measure the wavelength at the
maximum deviation in insertion loss.
4.1.4 Pulse generator setting
The voltage or current needed to drive from minimum (maximum) tilt to maximum (minimum)
shall be set. The minimum and maximum states of tilt occur when the deviation in insertion
loss takes the maximum value at the shortest or the longest wavelength within the operating
wavelength.
4.1.5 Applying the driving pulse
The driving pulse shall be applied to the DGTE to be measured by the pulse generator.
4.1.6 Monitoring and recording the output signal from DGTE under test (DUT)
The output signal from the O/E converter shall be monitored by the oscilloscope and the data
shall be recorded. In addition, the signal pulse from the pulse generator shall be monitored
and recorded.
4.1.7 Calculation of the response time
After the three wavelengths have been measured, the response time shall be calculated
according to Figure 1. Generally, the response time is defined as the maximum value among
the three response times.
4.2 Digital control type
4.2.1 Set-up
The measurement set-up is shown in Figure 2. The temperature in the chamber after setting
shall be kept constant and uniform for stable measurement. The light source, the digital
control system, the O/E converter and the oscilloscope shall be turned on for the
measurement.
4.2.2 Preparation
Before starting the measurement, the set-up shall be turn
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