IEC 60749-17:2019

Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

IEC 60749-17:2019 is performed to determine the susceptibility of semiconductor devices to non-ionizing energy loss (NIEL) degradation. The test described herein is applicable to integrated circuits and discrete semiconductor devices and is intended for military- and aerospace-related applications. It is a destructive test.
This edition includes the following significant technical changes with respect to the previous edition:
updates to better align the test method with MIL-STD 883J, method 1017, including removal of restriction of use of the document, and a requirement to limit the total ionization dose;
addition of a Bibliography, including US MIL- and ASTM standards relevant to this test method.

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 17: Irradiation aux neutrons

L’IEC 60749-17:2019 est réalisé pour déterminer la sensibilité des dispositifs à semiconducteurs à la dégradation par perte d’énergie non ionisante (NIEL, Non-Ionizing Energy Loss). L’essai décrit dans le présent document s’applique aux circuits intégrés et aux dispositifs discrets à semiconducteurs, et est destiné aux applications des domaines militaire et aérospatial. Il s’agit d’un essai destructif.
Cette édition inclut les modifications techniques majeures suivantes par rapport à l’édition précédente:
mises à jour afin de mieux aligner la méthode d’essai avec la méthode 1 017 du document MIL-STD 883J, comprenant la suppression des restrictions d’utilisation du document, et une exigence visant à limiter la dose ionisante totale;
ajout d’une bibliographie, comprenant les normes US MIL- et ASTM correspondant à la présente méthode d’essai.

General Information

• Status: Published
• Publication Date: 27-Mar-2019
• ICS: 31.080.01 - Semiconductor devices in general
• Technical Committee: TC 47 - Semiconductor devices
• Drafting Committee: WG 2 - TC 47/WG 2
• Current Stage: PPUB - Publication issued
• Start Date: 26-Apr-2019
• Due Date: 28-Mar-2019
• Completion Date: 28-Mar-2019

Relations

• Revises: IEC 60749-17:2003 - Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
• Effective Date: 05-Sep-2023

Standards Content (Sample)

IEC 60749-17 ®
Edition 2.0 2019-03
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Semiconductor devices – Mechanical and climatic test methods –
Part 17: Neutron irradiation
Dispositifs à semiconducteurs – Méthodes d’essais mécaniques et climatiques –
Partie 17: Irradiation aux neutrons
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IEC 60749-17 ®
Edition 2.0 2019-03
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Semiconductor devices – Mechanical and climatic test methods –

Part 17: Neutron irradiation
Dispositifs à semiconducteurs – Méthodes d’essais mécaniques et climatiques –

Partie 17: Irradiation aux neutrons

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.080.01 ISBN 978-2-8322-6702-8

– 2 – IEC 60749-17:2019 © IEC 2019
CONTENTS
FOREWORD . 3
1 Scope . 5
2 Normative references . 5
3 Terms and definitions . 5
4 Test apparatus . 5
4.1 Test instruments . 5
4.2 Radiation source . 5
4.3 Dosimetry equipment . 6
4.4 Dosimetry measurements . 6
4.4.1 Neutron fluences . 6
4.4.2 Dose measurements . 6
5 Procedure . 6
5.1 Safety requirements . 6
5.2 Test samples . 6
5.3 Pre-exposure . 7
5.3.1 Electrical tests . 7
5.3.2 Exposure set-up . 7
5.4 Exposure . 7
5.5 Post-exposure . 7
5.5.1 Electrical tests . 7
5.5.2 Anomaly investigation . 7
5.6 Reporting . 7
6 Summary . 8
Bibliography . 9

INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
SEMICONDUCTOR DEVICES –
MECHANICAL AND CLIMATIC TEST METHODS –

Part 17: Neutron irradiation
FOREWORD
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International Standard IEC 60749-17 has been prepared by IEC technical committee 47:
Semiconductor devices.
This second edition cancels and replaces the first edition published in 2003. This edition
constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
a) updates to better align the test method with MIL-STD 883J, method 1017, including
removal of restriction of use of the document, and a requirement to limit the total
ionization dose;
b) addition of a Bibliography, including US MIL- and ASTM standards relevant to this test
method.
– 4 – IEC 60749-17:2019 © IEC 2019
The text of this International Standard is based on the following documents:
FDIS Report on voting
47/2538/FDIS 47/2553/RVD
Full information on the voting for the approval of this International Standard can be found in
the report on voting indicated in the above table.
This document has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts in the IEC 60749 series, published under the general title Semiconductor
devices – Mechanical and climatic test methods, can be found on the IEC website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under "http://webstore.iec.ch" in the data related to
the specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
SEMICONDUCTOR DEVICES –
MECHANICAL AND CLIMATIC TEST METHODS –

Part 17: Neutron irradiation
1 Scope
The neutron irradiation test is performed to determine the susceptibility of semiconductor
devices to non-ionizing energy loss (NIEL) degradation. The test described herein is
applicable to integrated circuits and discrete semiconductor devices and is intended for
military- and aerospace-related applications. It is a destructive test.
The objectives of the test are as follows:
a) to detect and measure the degradation of critical sem
...