Cards and security devices for personal identification -- Test methods

The ISO/IEC 10373 series defines test methods for characteristics of identification cards according to the definition given in ISO/IEC 7810. Each test method is cross‑referenced to one or more base standards, which can be ISO/IEC 7810 or one or more of the supplementary standards that define the information storage technologies employed in identification card applications. NOTE 1 Criteria for acceptability do not form part of the ISO/IEC 10373 series, but can be found in the International Standards mentioned above. This document defines test methods which are specific to proximity cards and objects, proximity coupling devices and proximity extended devices, defined in ISO/IEC 14443‑1, ISO/IEC 14443‑2, ISO/IEC 14443‑3 and ISO/IEC 14443‑4. NOTE 2 Test methods defined in this document are intended to be performed separately. A given proximity card or object, proximity coupling device or proximity extended device, is not required to pass through all the tests sequentially. ISO/IEC 10373‑1 defines test methods which are common to one or more integrated circuit card technologies and other parts in the ISO/IEC 10373 series deal with other technology‑specific tests. The conformance test plan defined in Annex O specifies the list of tests applicable for each part of the ISO/IEC 14443 series.

Cartes et dispositifs de sécurité pour l'identification personnelle -- Méthodes d'essai

General Information

Status
Published
Publication Date
21-Jul-2020
Current Stage
9092 - International Standard to be revised
Start Date
11-Oct-2021
Ref Project

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INTERNATIONAL ISO/IEC
STANDARD 10373-6
Fourth edition
2020-07
Cards and security devices for
personal identification — Test
methods —
Part 6:
Contactless proximity objects
Cartes et dispositifs de sécurité pour l'identification personnelle —
Méthodes d'essai —
Partie 6: Objets sans contact de proximité
Reference number
ISO/IEC 10373-6:2020(E)
ISO/IEC 2020
---------------------- Page: 1 ----------------------
ISO/IEC 10373-6:2020(E)
COPYRIGHT PROTECTED DOCUMENT
© ISO/IEC 2020

All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may

be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting

on the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address

below or ISO’s member body in the country of the requester.
ISO copyright office
CP 401 • Ch. de Blandonnet 8
CH-1214 Vernier, Geneva
Phone: +41 22 749 01 11
Email: copyright@iso.org
Website: www.iso.org
Published in Switzerland
ii © ISO/IEC 2020 – All rights reserved
---------------------- Page: 2 ----------------------
ISO/IEC 10373-6:2020(E)
Contents Page

Foreword ..........................................................................................................................................................................................................................................v

1 Scope ................................................................................................................................................................................................................................. 1

2 Normative references ...................................................................................................................................................................................... 1

3 Terms, definitions, symbols and abbreviated terms ....................................................................................................... 2

3.1 Terms and definitions ....................................................................................................................................................................... 2

3.2 Symbols and abbreviated terms............................................................................................................................................... 3

4 Default items applicable to the test methods ......................................................................................................................... 5

4.1 Test environment .................................................................................................................................................................................. 5

4.2 Pre-conditioning .................................................................................................................................................................................... 5

4.3 Setup tolerances..................................................................................................................................................................................... 6

4.4 Spurious inductance ........................................................................................................................................................................... 6

4.5 Measurement uncertainty ............................................................................................................................................................. 6

4.6 DUT position ............................................................................................................................................................................................. 6

4.7 Test conditions for PCD ................................................................................................................................................................... 6

4.8 Test conditions for PICC .................................................................................................................................................................. 8

5 Apparatus and circuits for test of ISO/IEC 14443-1 and ISO/IEC 14443-2 parameters ..........10

5.1 Overview ...................................................................................................................................................................................................10

5.2 Minimum requirements for measurement instruments — Oscilloscope .........................................11

5.3 Calibration coils...................................................................................................................................................................................11

5.3.1 General...................................................................................................................................................................................11

5.3.2 Size of the calibration coil card ........................................................................................................................11

5.3.3 Thickness and material of the calibration coil card........................................................................12

5.3.4 Coil characteristics ......................................................................................................................................................12

5.4 Test PCD assembly ............................................................................................................................................................................12

5.4.1 General...................................................................................................................................................................................12

5.4.2 Test PCD antenna ..........................................................................................................................................................13

5.4.3 Sense coils ...........................................................................................................................................................................13

5.4.4 Assembly of Test PCD ........................................................................................................................................... .....14

5.5 Reference PICC and Active Reference PICC .................................................................................................................16

5.5.1 General...................................................................................................................................................................................16

5.5.2 Reference PICC ................................................................................................................................................................16

5.5.3 Active Reference PICC ...............................................................................................................................................19

5.6 PICC transmission test setup ...................................................................................................................................................21

5.6.1 General description ....................................................................................................................................................21

5.6.2 Phase stability precondition test ....................................................................................................................21

5.7 EMD test setup .....................................................................................................................................................................................22

5.7.1 General description ....................................................................................................................................................22

5.7.2 Computation of power versus time ..............................................................................................................22

5.7.3 Noise floor precondition test .............................................................................................................................23

6 Test of ISO/IEC 14443-1 parameters ............................................................................................................................................24

6.1 PCD tests ....................................................................................................................................................................................................24

6.1.1 Alternating magnetic field ....................................................................................................................................24

6.2 PICC tests ..................................................................................................................................................................................................25

6.2.1 Alternating magnetic field ....................................................................................................................................25

6.2.2 Void ...........................................................................................................................................................................................25

6.3 PXD tests ....................................................................................................................................................................................................25

7 Test of ISO/IEC 14443-2 parameters ............................................................................................................................................26

7.1 PCD tests ....................................................................................................................................................................................................26

7.1.1 PCD field strength ........................................................................................................................................................26

7.1.2 Void ...........................................................................................................................................................................................27

7.1.3 Void ...........................................................................................................................................................................................27

7.1.4 Modulation index m and waveform..............................................................................................................27

© ISO/IEC 2020 – All rights reserved iii
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ISO/IEC 10373-6:2020(E)

7.1.5 Phase stability test ......................................................................................................................................................28

7.1.6 Load modulation reception for PICC to PCD bit rates of f /128, f /64,
c c

f /32 and f /16 ...............................................................................................................................................................29

c c

7.1.7 Load modulation reception for PICC to PCD bit rates of f /8, f /4 and f /2 ..............36

c c c

7.1.8 PCD EMD immunity test .........................................................................................................................................37

7.2 PICC tests ..................................................................................................................................................................................................38

7.2.1 PICC transmission ........................................................................................................................................................38

7.2.2 PICC EMD level and low EMD time test .....................................................................................................40

7.2.3 PICC reception .................................................................................................................................................................41

7.2.4 PICC resonance frequency ....................................................................................................................................44

7.2.5 PICC maximum loading effect ............................................................................................................................45

7.2.6 PICC operating field strength test ..................................................................................................................46

7.3 Test methods for bit rates of 3f /4, f , 3f /2 and 2f from PCD to PICC ...............................................47

c c c c

7.4 PXD tests ....................................................................................................................................................................................................47

8 Test of ISO/IEC 14443-3 and ISO/IEC 14443-4 parameters .................................................................................48

8.1 PCD tests ....................................................................................................................................................................................................48

8.1.1 PCD EMD recovery test ............................................................................................................................................48

8.1.2 Additional PCD tests ..................................................................................................................................................49

8.2 PICC tests ..................................................................................................................................................................................................49

8.3 PXD tests ....................................................................................................................................................................................................49

8.3.1 PCD and PICC Modes .................................................................................................................................................49

8.3.2 Automatic mode alternation ...............................................................................................................................49

Annex A (normative) Test PCD antennas ......................................................................................................................................................54

Annex B (informative) Test PCD Antenna tuning ..................................................................................................................................64

Annex C (normative) Sense coil ..............................................................................................................................................................................67

Annex D (normative) Reference PICCs and Active Reference PICCs..................................................................................70

Annex E (normative) PCD modulation index m and waveform analysis tool ...........................................................82

Annex F (informative) Program for the evaluation of the load modulation amplitude ...........................127

Annex G (normative) Additional PICC test methods .....................................................................................................................132

Annex H (normative) Additional PCD test methods ......................................................................................................................198

Annex I (normative) High bit rate selection test methods for PCD ................................................................................245

Annex J (informative) Program for EMD level measurements ............................................................................................257

Annex K (normative) Test methods for bit rates of 3f /4, f , 3f /2 and 2f from PCD to PICC .............264

c c c c

Annex L (normative) Frame with error correction test methods ....................................................................................327

Annex M (normative) PCD phase stability analysis tool ............................................................................................................337

Annex N (normative) PICC amplitude and phase drift analysis tool ............................................................................343

Annex O (normative) Conformance test plan .......................................................................................................................................442

Annex P (normative) PICC Type A Frame Delay Time (FDT) determination method .................................450

Bibliography .........................................................................................................................................................................................................................459

iv © ISO/IEC 2020 – All rights reserved
---------------------- Page: 4 ----------------------
ISO/IEC 10373-6:2020(E)
Foreword

ISO (the International Organization for Standardization) and IEC (the International Electrotechnical

Commission) form the specialized system for worldwide standardization. National bodies that

are members of ISO or IEC participate in the development of International Standards through

technical committees established by the respective organization to deal with particular fields of

technical activity. ISO and IEC technical committees collaborate in fields of mutual interest. Other

international organizations, governmental and non-governmental, in liaison with ISO and IEC, also

take part in the work.

The procedures used to develop this document and those intended for its further maintenance are

described in the ISO/IEC Directives, Part 1. In particular, the different approval criteria needed for

the different types of document should be noted. This document was drafted in accordance with the

editorial rules of the ISO/IEC Directives, Part 2 (see www .iso .org/ directives).

Attention is drawn to the possibility that some of the elements of this document may be the subject

of patent rights. ISO and IEC shall not be held responsible for identifying any or all such patent

rights. Details of any patent rights identified during the development of the document will be in the

Introduction and/or on the ISO list of patent declarations received (see www .iso .org/ patents) or the IEC

list of patent declarations received (see http:// patents .iec .ch).

Any trade name used in this document is information given for the convenience of users and does not

constitute an endorsement.

For an explanation of the voluntary nature of standards, the meaning of ISO specific terms and

expressions related to conformity assessment, as well as information about ISO's adherence to the

World Trade Organization (WTO) principles in the Technical Barriers to Trade (TBT) see www .iso .org/

iso/ foreword .html.

This document was prepared by Joint Technical Committee ISO/IEC JTC 1, Information technology, SC 17,

Cards and security devices for personal identification.

This fourth edition cancels and replaces the third edition (ISO/IEC 10373-6:2016), which has been

technically revised. It also incorporates the Amendment ISO/IEC 10373-6:2016/Amd.3:2018.

The main changes compared to the previous edition are as follows:

— enhancement of test methods for PCD load modulation reception and PICC transmission including

introduction of Active Reference PICC and PICC amplitude and phase drift analysis tool;

— introduction of PICC Type A Frame Delay Time (FDT) determination method;
— extension of frame with error correction test methods.

A list of all the parts in the ISO/IEC 10373 series can be found on the ISO website.

Any feedback or questions on this document should be directed to the user’s national standards body. A

complete listing of these bodies can be found at www .iso .org/ members .html.
© ISO/IEC 2020 – All rights reserved v
---------------------- Page: 5 ----------------------
INTERNATIONAL STANDARD ISO/IEC 10373-6:2020(E)
Cards and security devices for personal identification —
Test methods —
Part 6:
Contactless proximity objects
1 Scope

The ISO/IEC 10373 series defines test methods for characteristics of identification cards according

to the definition given in ISO/IEC 7810. Each test method is cross-referenced to one or more base

standards, which can be ISO/IEC 7810 or one or more of the supplementary standards that define the

information storage technologies employed in identification card applications.

NOTE 1 Criteria for acceptability do not form part of the ISO/IEC 10373 series, but can be found in the

International Standards mentioned above.

This document defines test methods which are specific to proximity cards and objects, proximity

coupling devices and proximity extended devices, defined in ISO/IEC 14443-1, ISO/IEC 14443-2,

ISO/IEC 14443-3 and ISO/IEC 14443-4.

NOTE 2 Test methods defined in this document are intended to be performed separately. A given proximity

card or object, proximity coupling device or proximity extended device, is not required to pass through all the

tests sequentially.

ISO/IEC 10373-1 defines test methods which are common to one or more integrated circuit card

technologies and other parts in the ISO/IEC 10373 series deal with other technology-specific tests.

The conformance test plan defined in Annex O specifies the list of tests applicable for each part of the

ISO/IEC 14443 series.
2 Normative references

The following documents are referred to in the text in such a way that some or all of their content

constitutes requirements of this document. For dated references, only the edition cited applies. For

undated references, the latest edition of the referenced document (including any amendments) applies.

ISO/IEC 7810, Identification cards — Physical characteristics

ISO/IEC 14443-1:2018, Cards and security devices for personal identification — Contactless proximity

objects — Part 1: Physical characteristics

ISO/IEC 14443-2:2020, Cards and security devices for personal identification — Contactless proximity

objects — Part 2: Radio frequency power and signal interface

ISO/IEC 14443-3:2018, Cards and security devices for personal identification — Contactless proximity

objects — Part 3: Initialization and anticollision

ISO/IEC 14443-4:2018, Cards and security devices for personal identification — Contactless proximity

objects — Part 4: Transmission protocol
© ISO/IEC 2020 – All rights reserved 1
---------------------- Page: 6 ----------------------
ISO/IEC 10373-6:2020(E)
3 Terms, definitions, symbols and abbreviated terms
3.1 Terms and definitions

For the purposes of this document, the terms and definitions given in ISO/IEC 14443-1, ISO/IEC 14443-2,

ISO/IEC 14443-3, ISO/IEC 14443-4 and the following apply.

ISO and IEC maintain terminological databases for use in standardization at the following addresses:

— ISO Online browsing platform: available at https:// www .iso .org/ obp
— IEC Electropedia: available at http:// www .electropedia .org/
3.1.1
base standard
standard to which the test method (3.1.8) is used to verify conformance
3.1.2
CascadeLevels
number of cascade levels of the PICC
3.1.3
Command Set
set describing the PICC commands during initialization and anticollision

Note 1 to entry: See ISO/IEC 14443-3:2018, 6.4 for PICC Type A and ISO/IEC 14443-3:2018, 7.5 for PICC Type B.

3.1.4
loading effect

change in PCD antenna current caused by the presence of PICC(s) in the field due to the mutual coupling

modifying the PCD antenna resonance and quality factor
3.1.5
Mute
no response within a specified timeout
EXAMPLE Expiration of FWT.
3.1.6
scenario

defined typical protocol and application specific communication to be used with the test methods (3.1.8)

defined in this document
3.1.7
Test Initial State
TIS

element from PICC states that is the PICC state before performing a specific PICC command from

Command Set (3.1.3)
3.1.8
test method

method for testing characteristics of identification cards for the purpose of confirming their compliance

with International Standards
3.1.9
Test Target State
TTS

element from PICC states that is the PICC state after performing a specific PICC command from Command

Set (3.1.3)
2 © ISO/IEC 2020 – All rights reserved
---------------------- Page: 7 ----------------------
ISO/IEC 10373-6:2020(E)
3.2 Symbols and abbreviated terms

For the purposes of this document, the symbols and abbreviated terms given in ISO/IEC 14443-1,

ISO/IEC 14443-2, ISO/IEC 14443-3, ISO/IEC 14443-4 and the following apply.
NOTE Elements in bold square brackets [ ] are optional definitions.

Answer to ATTRIB(cid) Answer to ATTRIB, i.e. (MBLI = mbli, CID = cid, CRC_B), with mbli

an arbitrary hex value (see ISO/IEC 14443-3:2018, 7.11)
ATTRIB(cid, fsdi) Default ATTRIB command with PUPI from ATQB, CID = cid and
Maximum Frame Size Code value = fsdi, i.e. ('1D' PUPI cid fsdi '01
00' CRC_B)
DUT Device under test

I(c) (inf [,CID = cid] [,NAD = nad] ISO/IEC 14443-4 I-block with chaining bit c∈{1,0}, block number

[,~CRC]) n∈{1,0} and information field inf. By default no CID and no NAD
will be transmitted. If CID = cid∈{0...15} is specified, it will be
transmitted as second parameter. If NAD = nad∈{0...'FF'} is speci-
fied, it will be transmitted as third parameter (or second parame-
ter if no CID is transmitted). If the literal '~CRC' is not specified, a
valid CRC corresponding to the communication signal interface of
the PICC will be transmitted by default (i.e. CRC_A or CRC_B)
IUT Implementation Under Test (ISO/IEC 9646); within the scope of
this document, IUT represents the PCD under the test
LT Lower Tester (ISO/IEC 9646), the PICC-emulation part of the
PCD-test-apparatus
N/A Not applicable
PPS(cid, dri, dsi) Default PPS request with CID = cid, DRI = dri and DSI = dsi,
i.e. ('D' + cid '11' dsi × 4 + dri CRC_A)

R(ACK [,CID = cid] [,~CRC]) ISO/IEC 14443-4 R(ACK) block with block number n. The defini-

tion of the optional CID and ~CRC symbols is as described in the
I(c) block above

R(NAK [,CID = cid][,~CRC]) ISO/IEC 14443-4 R(NAK) block with block number n. The defini-

tion of the optional CID and ~CRC symbols is as described in the
I(c) block above
RATS(cid, fsdi) Default RATS command with CID = cid and FSDI value = fsdi
i.e. ('E0' fsdi × 16 + cid CRC_A)
READY(I) READY state in cascade level I, I ∈ {1, 2, 3}; e.g. READY(2) is a PICC
cascade level 2
READY*(I) READY* state in cascade level I, I ∈ {1, 2, 3}; e.g. READY*(2) is a
PICC cascade level 2
REQB(N) REQB command with N as defined in ISO/IEC 14443-3:2018, 7.7

S(WTX)(WTXM [,CID = cid][,~CRC]) ISO/IEC 14443-4 S(WTX) block with parameter WTXM. The

definition of the optional CID and ~CRC symbols is as described
in the I(c) block above
© ISO/IEC 2020 – All rights reserved 3
---------------------- Page: 8 ----------------------
ISO/IEC 10373-6:2020(E)

S(DESELECT [,CID = cid] [,~CRC]) ISO/IEC 14443-4 S(DESELECT) block. The definition of the option-

al CID and ~CRC symbols is as described in the I(c) block above
SAK(cascade) the SELECT(I) answer with the cascade bit (bit 3) set to (1)b
SAK(complete) the SELECT(I) answer with the cascade bit (bit 3) set to (0)b
SEL(c) Select code of level c (i.e. SEL(1) = '93', SEL(2) = '95', SEL(3) = '97')
SELECT(I) SELECT command of cascade level I, i.e.
SELECT(1) = ( '93 70' UIDTX BCC CRC_A)
SELECT(2) = ( '95 70' UIDTX BCC CRC_A)
SELECT(3) = ( '97 70' UIDTX BCC CRC_A)
SLOTMARKER(n) Slot-MARKER command with slot number n, i.e.
(16 × (n − 1) + 5 CRC_B)
TB-PDU Transmission Block Protocol Data Unit, which consists of either
I-block, R-block or S-block
TEST_COMMAND_SEQUENCE1 Sequence of commands used for several PICC tests.
NOTE Its definition depends on applicative layer and represents
a standard transaction of the application supported by the DUT.
The applicant may also provide a specified set of commands.
TEST_COMMAND1(1) Default test command consisting of one unchained I-block
NOTE This command depends on the negotiated maximum
frame size value of the PICC.

TEST_COMMAND1(n), n > 1 Default test command consisting of n chained I-blocks (PCD

chaining)
NOTE This command depends on the negotiated maximum
frame size value of the PICC.
TEST_COMMAND1(n) INF field of k'th I-block chain of TEST_COMMAND1(n)
NOTE This command depends on the negotiated maximum
frame size value of the PICC.

TEST_COMMAND2(n), n > 1 Default test command which expects a response consisting of n

chained I-blocks
NOTE This command depends on the negotiated maximum
frame size value of the PCD.
TEST_COMMAND3 Default test command consisting of one I-block which needs more
than FWT time for execution
TEST_COMMAND4 Default test command which expects a response of one I-block
complying with the PICC transmission minimum frame length
required for the PICC transmission test
TEST_RESPONSE1(n) INF field of the response to TEST_COMMAND1(n)
NOTE This response is assumed to be always unchained.
4 © ISO/IEC 2020 – All rights reserved
---------------------- Page: 9 ----------------------
ISO/IEC 10373-6:2020(E)
TEST_RESPONSE2(n) Response to TEST_COMMAND2(n)
NOTE This response depends on the negotiated maximum frame
size value of the PCD.
TEST_RESPONSE2(n) INF field of k'th I-block chain of TEST_RESPONSE2(n)
NOTE This r
...

FINAL
INTERNATIONAL ISO/IEC
DRAFT
STANDARD FDIS
10373-6
ISO/IEC JTC 1/SC 17
Cards and security devices for
Secretariat: BSI
personal identification — Test
Voting begins on:
2020-04-08 methods —
Voting terminates on:
Part 6:
2020-06-03
Contactless proximity objects
Cartes et dispositifs de sécurité pour l'identification personnelle —
Méthodes d'essai —
Partie 6: Objets sans contact de proximité
RECIPIENTS OF THIS DRAFT ARE INVITED TO
SUBMIT, WITH THEIR COMMENTS, NOTIFICATION
OF ANY RELEVANT PATENT RIGHTS OF WHICH
THEY ARE AWARE AND TO PROVIDE SUPPOR TING
DOCUMENTATION.
IN ADDITION TO THEIR EVALUATION AS
Reference number
BEING ACCEPTABLE FOR INDUSTRIAL, TECHNO-
ISO/IEC FDIS 10373-6:2020(E)
LOGICAL, COMMERCIAL AND USER PURPOSES,
DRAFT INTERNATIONAL STANDARDS MAY ON
OCCASION HAVE TO BE CONSIDERED IN THE
LIGHT OF THEIR POTENTIAL TO BECOME STAN-
DARDS TO WHICH REFERENCE MAY BE MADE IN
NATIONAL REGULATIONS. ISO/IEC 2020
---------------------- Page: 1 ----------------------
ISO/IEC FDIS 10373-6:2020(E)
COPYRIGHT PROTECTED DOCUMENT
© ISO/IEC 2020

All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may

be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting

on the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address

below or ISO’s member body in the country of the requester.
ISO copyright office
CP 401 • Ch. de Blandonnet 8
CH-1214 Vernier, Geneva
Phone: +41 22 749 01 11
Fax: +41 22 749 09 47
Email: copyright@iso.org
Website: www.iso.org
Published in Switzerland
ii © ISO/IEC 2020 – All rights reserved
---------------------- Page: 2 ----------------------
ISO/IEC FDIS 10373-6:2020(E)
Contents Page

Foreword ..........................................................................................................................................................................................................................................v

1 Scope ................................................................................................................................................................................................................................. 1

2 Normative references ...................................................................................................................................................................................... 1

3 Terms, definitions, symbols and abbreviated terms ....................................................................................................... 2

3.1 Terms and definitions ....................................................................................................................................................................... 2

3.2 Symbols and abbreviated terms............................................................................................................................................... 3

4 Default items applicable to the test methods ......................................................................................................................... 5

4.1 Test environment .................................................................................................................................................................................. 5

4.2 Pre-conditioning .................................................................................................................................................................................... 5

4.3 Setup tolerances..................................................................................................................................................................................... 6

4.4 Spurious inductance ........................................................................................................................................................................... 6

4.5 Measurement uncertainty ............................................................................................................................................................. 6

4.6 DUT position ............................................................................................................................................................................................. 6

4.7 Test conditions for PCD ................................................................................................................................................................... 6

4.8 Test conditions for PICC .................................................................................................................................................................. 8

5 Apparatus and circuits for test of ISO/IEC 14443-1 and ISO/IEC 14443-2 parameters ..........10

5.1 Overview ...................................................................................................................................................................................................10

5.2 Minimum requirements for measurement instruments — Oscilloscope .........................................11

5.3 Calibration coils...................................................................................................................................................................................11

5.3.1 General...................................................................................................................................................................................11

5.3.2 Size of the calibration coil card ........................................................................................................................11

5.3.3 Thickness and material of the calibration coil card........................................................................11

5.3.4 Coil characteristics ......................................................................................................................................................12

5.4 Test PCD assembly ............................................................................................................................................................................12

5.4.1 General...................................................................................................................................................................................12

5.4.2 Test PCD antenna ..........................................................................................................................................................13

5.4.3 Sense coils ...........................................................................................................................................................................13

5.4.4 Assembly of Test PCD ........................................................................................................................................... .....14

5.5 Reference PICC and Active Reference PICC .................................................................................................................16

5.5.1 General...................................................................................................................................................................................16

5.5.2 Reference PICC ................................................................................................................................................................16

5.5.3 Active Reference PICC ...............................................................................................................................................19

5.6 PICC transmission test setup ...................................................................................................................................................21

5.6.1 General description ....................................................................................................................................................21

5.6.2 Phase stability precondition test ....................................................................................................................21

5.7 EMD test setup .....................................................................................................................................................................................22

5.7.1 General description ....................................................................................................................................................22

5.7.2 Computation of power versus time ..............................................................................................................22

5.7.3 Noise floor precondition test .............................................................................................................................23

6 Test of ISO/IEC 14443‑1 parameters ............................................................................................................................................24

6.1 PCD tests ....................................................................................................................................................................................................24

6.1.1 Alternating magnetic field ....................................................................................................................................24

6.2 PICC tests ..................................................................................................................................................................................................25

6.2.1 Alternating magnetic field ....................................................................................................................................25

6.2.2 Void ...........................................................................................................................................................................................25

6.3 PXD tests ....................................................................................................................................................................................................25

7 Test of ISO/IEC 14443‑2 parameters ............................................................................................................................................26

7.1 PCD tests ....................................................................................................................................................................................................26

7.1.1 PCD field strength ........................................................................................................................................................26

7.1.2 Void ...........................................................................................................................................................................................27

7.1.3 Void ...........................................................................................................................................................................................27

7.1.4 Modulation index m and waveform ..............................................................................................................27

© ISO/IEC 2020 – All rights reserved iii
---------------------- Page: 3 ----------------------
ISO/IEC FDIS 10373-6:2020(E)

7.1.5 Phase stability test ......................................................................................................................................................28

7.1.6 Load modulation reception for PICC to PCD bit rates of f /128, f /64,
c c

f /32 and f /16 ...............................................................................................................................................................29

c c

7.1.7 Load modulation reception for PICC to PCD bit rates of f /8, f /4 and f /2 ..............36

c c c

7.1.8 PCD EMD immunity test .........................................................................................................................................37

7.2 PICC tests ..................................................................................................................................................................................................38

7.2.1 PICC transmission ........................................................................................................................................................38

7.2.2 PICC EMD level and low EMD time test .....................................................................................................40

7.2.3 PICC reception .................................................................................................................................................................41

7.2.4 PICC resonance frequency ....................................................................................................................................44

7.2.5 PICC maximum loading effect ............................................................................................................................45

7.2.6 PICC operating field strength test ..................................................................................................................46

7.3 Test methods for bit rates of 3f /4, f , 3f /2 and 2f from PCD to PICC ...............................................47

c c c c

7.4 PXD tests ....................................................................................................................................................................................................47

8 Test of ISO/IEC 14443‑3 and ISO/IEC 14443‑4 parameters .................................................................................48

8.1 PCD tests ....................................................................................................................................................................................................48

8.1.1 PCD EMD recovery test ............................................................................................................................................48

8.1.2 Additional PCD tests ..................................................................................................................................................49

8.2 PICC tests ..................................................................................................................................................................................................49

8.3 PXD tests ....................................................................................................................................................................................................49

8.3.1 PCD and PICC Modes .................................................................................................................................................49

8.3.2 Automatic mode alternation ...............................................................................................................................49

Annex A (normative) Test PCD antennas ......................................................................................................................................................54

Annex B (informative) Test PCD Antenna tuning ..................................................................................................................................63

Annex C (normative) Sense coil ..............................................................................................................................................................................65

Annex D (normative) Reference PICCs and Active Reference PICCs..................................................................................68

Annex E (normative) PCD modulation index m and waveform analysis tool ...........................................................80

Annex F (informative) Program for the evaluation of the load modulation amplitude ...........................125

Annex G (normative) Additional PICC test methods .....................................................................................................................130

Annex H (normative) Additional PCD test methods ......................................................................................................................196

Annex I (normative) High bit rate selection test methods for PCD ................................................................................243

Annex J (informative) Program for EMD level measurements ............................................................................................255

Annex K (normative) Test methods for bit rates of 3f /4, f , 3f /2 and 2f from PCD to PICC .............262

c c c c

Annex L (normative) Frame with error correction test methods ....................................................................................325

Annex M (normative) PCD phase stability analysis tool ............................................................................................................335

Annex N (normative) PICC amplitude and phase drift analysis tool ............................................................................341

Annex O (normative) Conformance test plan .......................................................................................................................................440

Annex P (normative) PICC Type A Frame Delay Time (FDT) determination method .................................448

Bibliography .........................................................................................................................................................................................................................457

iv © ISO/IEC 2020 – All rights reserved
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ISO/IEC FDIS 10373-6:2020(E)
Foreword

ISO (the International Organization for Standardization) and IEC (the International Electrotechnical

Commission) form the specialized system for worldwide standardization. National bodies that

are members of ISO or IEC participate in the development of International Standards through

technical committees established by the respective organization to deal with particular fields of

technical activity. ISO and IEC technical committees collaborate in fields of mutual interest. Other

international organizations, governmental and non-governmental, in liaison with ISO and IEC, also

take part in the work.

The procedures used to develop this document and those intended for its further maintenance are

described in the ISO/IEC Directives, Part 1. In particular, the different approval criteria needed for

the different types of document should be noted. This document was drafted in accordance with the

editorial rules of the ISO/IEC Directives, Part 2 (see www .iso .org/ directives).

Attention is drawn to the possibility that some of the elements of this document may be the subject

of patent rights. ISO and IEC shall not be held responsible for identifying any or all such patent

rights. Details of any patent rights identified during the development of the document will be in the

Introduction and/or on the ISO list of patent declarations received (see www .iso .org/ patents) or the IEC

list of patent declarations received (see http:// patents .iec .ch).

Any trade name used in this document is information given for the convenience of users and does not

constitute an endorsement.

For an explanation of the voluntary nature of standards, the meaning of ISO specific terms and

expressions related to conformity assessment, as well as information about ISO's adherence to the

World Trade Organization (WTO) principles in the Technical Barriers to Trade (TBT) see www .iso .org/

iso/ foreword .html.

This document was prepared by Joint Technical Committee ISO/IEC JTC 1, Information technology, SC 17,

Cards and security devices for personal identification.

This fourth edition cancels and replaces the third edition (ISO/IEC 10373-6:2016), which has been

technically revised. It also incorporates the Amendment ISO/IEC 10373‑6:2016/Amd.3:2018.

The main changes compared to the previous edition are as follows:

— enhancement of test methods for PCD load modulation reception and PICC transmission including

introduction of Active Reference PICC and PICC amplitude and phase drift analysis tool;

— introduction of PICC Type A Frame Delay Time (FDT) determination method;
— extension of frame with error correction test methods.

A list of all the parts in the ISO/IEC 10373 series can be found on the ISO website.

Any feedback or questions on this document should be directed to the user’s national standards body. A

complete listing of these bodies can be found at www .iso .org/ members .html.
© ISO/IEC 2020 – All rights reserved v
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FINAL DRAFT INTERNATIONAL STANDARD ISO/IEC FDIS 10373-6:2020(E)
Cards and security devices for personal identification —
Test methods —
Part 6:
Contactless proximity objects
1 Scope

The ISO/IEC 10373 series defines test methods for characteristics of identification cards according

to the definition given in ISO/IEC 7810. Each test method is cross‑referenced to one or more base

standards, which can be ISO/IEC 7810 or one or more of the supplementary standards that define the

information storage technologies employed in identification card applications.

NOTE 1 Criteria for acceptability do not form part of the ISO/IEC 10373 series, but can be found in the

International Standards mentioned above.

This document defines test methods which are specific to proximity cards and objects, proximity

coupling devices and proximity extended devices, defined in ISO/IEC 14443‑1, ISO/IEC 14443‑2,

ISO/IEC 14443-3, and ISO/IEC 14443-4.

NOTE 2 Test methods defined in this document are intended to be performed separately. A given proximity

card or object, proximity coupling device or proximity extended device, is not required to pass through all the

tests sequentially.

ISO/IEC 10373‑1 defines test methods which are common to one or more integrated circuit card

technologies and other parts in the ISO/IEC 10373 series deal with other technology‑specific tests.

The conformance test plan defined in Annex O specifies the list of tests applicable for each part of the

ISO/IEC 14443 series.
2 Normative references

The following documents are referred to in the text in such a way that some or all of their content

constitutes requirements of this document. For dated references, only the edition cited applies. For

undated references, the latest edition of the referenced document (including any amendments) applies.

ISO/IEC 7810, Identification cards — Physical characteristics

ISO/IEC 14443-1:2018, Cards and security devices for personal identification — Contactless proximity

objects — Part 1: Physical characteristics

ISO/IEC 14443‑2:—, Cards and security devices for personal identification — Contactless proximity

objects — Part 2: Radio frequency power and signal interface

ISO/IEC 14443-3:2018, Cards and security devices for personal identification — Contactless proximity

objects — Part 3: Initialization and anticollision

ISO/IEC 14443-4:2018, Cards and security devices for personal identification — Contactless proximity

objects — Part 4: Transmission protocol
© ISO/IEC 2020 – All rights reserved 1
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ISO/IEC FDIS 10373-6:2020(E)
3 Terms, definitions, symbols and abbreviated terms
3.1 Terms and definitions

For the purposes of this document, the terms and definitions given in ISO/IEC 14443‑1, ISO/IEC 14443‑2,

ISO/IEC 14443‑3, ISO/IEC 14443‑4 and the following apply.

ISO and IEC maintain terminological databases for use in standardization at the following addresses:

— ISO Online browsing platform: available at https:// www .iso .org/ obp
— IEC Electropedia: available at http:// www .electropedia .org/
3.1.1
base standard
standard to which the test method (3.1.8) is used to verify conformance
3.1.2
CascadeLevels
number of cascade levels of the PICC
3.1.3
Command Set
set describing the PICC commands during initialization and anticollision

Note 1 to entry: See ISO/IEC 14443‑3:2018, 6.4 for PICC Type A and ISO/IEC 14443‑3:2018, 7.5 for PICC Type B.

3.1.4
loading effect

change in PCD antenna current caused by the presence of PICC(s) in the field due to the mutual coupling

modifying the PCD antenna resonance and quality factor
3.1.5
Mute
no response within a specified timeout
EXAMPLE Expiration of FWT.
3.1.6
scenario

defined typical protocol and application specific communication to be used with the test methods (3.1.8)

defined in this document
3.1.7
Test Initial State
TIS

element from PICC states that is the PICC state before performing a specific PICC command from

Command Set (3.1.3)
3.1.8
test method

method for testing characteristics of identification cards for the purpose of confirming their compliance

with International Standards
3.1.9
Test Target State
TTS

element from PICC states that is the PICC state after performing a specific PICC command from Command

Set (3.1.3)
2 © ISO/IEC 2020 – All rights reserved
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ISO/IEC FDIS 10373-6:2020(E)
3.2 Symbols and abbreviated terms

For the purposes of this document, the symbols and abbreviated terms given in ISO/IEC 14443‑1,

ISO/IEC 14443‑2, ISO/IEC 14443‑3, ISO/IEC 14443‑4 and the following apply.
NOTE Elements in bold square brackets [ ] are optional definitions.

Answer to ATTRIB(cid) Answer to ATTRIB, i.e. (MBLI = mbli, CID = cid, CRC_B), with mbli

an arbitrary hex value (see ISO/IEC 14443‑3:2018, 7.11)
ATTRIB(cid, fsdi) Default ATTRIB command with PUPI from ATQB, CID = cid and
Maximum Frame Size Code value = fsdi, i.e. ('1D' PUPI cid fsdi '01
00' CRC_B)
DUT Device under test

I(c) (inf [,CID = cid] [,NAD = nad] ISO/IEC 14443‑4 I‑block with chaining bit c∈{1,0}, block number

[,~CRC]) n∈{1,0} and information field inf. By default no CID and no NAD
will be transmitted. If CID = cid∈{0...15} is specified, it will be
transmitted as second parameter. If NAD = nad∈{0...'FF'} is speci-
fied, it will be transmitted as third parameter (or second parame-
ter if no CID is transmitted). If the literal '~CRC' is not specified, a
valid CRC corresponding to the communication signal interface of
the PICC will be transmitted by default (i.e. CRC_A or CRC_B)
IUT Implementation Under Test (ISO/IEC 9646); within the scope of
this document, IUT represents the PCD under the test
LT Lower Tester (ISO/IEC 9646), the PICC-emulation part of the
PCD-test-apparatus
N/A Not applicable
PPS(cid, dri, dsi) Default PPS request with CID = cid, DRI = dri and DSI = dsi,
i.e. ('D' + cid '11' dsi × 4 + dri CRC_A)

R(ACK [,CID = cid] [,~CRC]) ISO/IEC 14443‑4 R(ACK) block with block number n. The defini-

tion of the optional CID and ~CRC symbols is as described in the
I(c) block above

R(NAK [,CID = cid][,~CRC]) ISO/IEC 14443‑4 R(NAK) block with block number n. The defini-

tion of the optional CID and ~CRC symbols is as described in the
I(c) block above
RATS(cid, fsdi) Default RATS command with CID = cid and FSDI value = fsdi
i.e. ('E0' fsdi × 16 + cid CRC_A)
READY(I) READY state in cascade level I, I ∈ {1, 2, 3}; e.g. READY(2) is a PICC
cascade level 2
READY*(I) READY* state in cascade level I, I ∈ {1, 2, 3}; e.g. READY*(2) is a
PICC cascade level 2
REQB(N) REQB command with N as defined in ISO/IEC 14443‑3:2018, 7.7

S(WTX)(WTXM [,CID = cid][,~CRC]) ISO/IEC 14443-4 S(WTX) block with parameter WTXM. The

definition of the optional CID and ~CRC symbols is as described
in the I(c) block above
© ISO/IEC 2020 – All rights reserved 3
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ISO/IEC FDIS 10373-6:2020(E)

S(DESELECT [,CID = cid] [,~CRC]) ISO/IEC 14443‑4 S(DESELECT) block. The definition of the option-

al CID and ~CRC symbols is as described in the I(c) block above
SAK(cascade) the SELECT(I) answer with the cascade bit (bit 3) set to (1)b
SAK(complete) the SELECT(I) answer with the cascade bit (bit 3) set to (0)b
SEL(c) Select code of level c (i.e. SEL(1) = '93', SEL(2) = '95', SEL(3) = '97')
SELECT(I) SELECT command of cascade level I, i.e.
SELECT(1) = ( '93 70' UIDTX BCC CRC_A)
SELECT(2) = ( '95 70' UIDTX BCC CRC_A)
SELECT(3) = ( '97 70' UIDTX BCC CRC_A)
SLOTMARKER(n) Slot-MARKER command with slot number n, i.e.
(16 × (n − 1) + 5 CRC_B)
TB-PDU Transmission Block Protocol Data Unit, which consists of either
I-block, R-block or S-block
TEST_COMMAND_SEQUENCE1 Sequence of commands used for several PICC tests.
NOTE Its definition depends on applicative layer and represents
a standard transaction of the application supported by the DUT.
The applicant may also provide a specified set of commands.
TEST_COMMAND1(1) Default test command consisting of one unchained I-block
NOTE This command depends on the negotiated maximum
frame size value of the PICC.

TEST_COMMAND1(n), n > 1 Default test command consisting of n chained I-blocks (PCD

chaining)
NOTE This command depends on the negotiated maximum
frame size value of the PICC.
TEST_COMMAND1(n) INF field of k'th I‑block chain of TEST_COMMAND1(n)
NOTE This command depends on the negotiated maximum
frame size value of the PICC.

TEST_COMMAND2(n), n > 1 Default test command which expects a response consisting of n

chained I-blocks
NOTE This command depends on the negotiated maximum
frame size value of the PCD.
TEST_COMMAND3 Default test command consisting of one I-block which needs more
than FWT tim
...

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