ISO/IEC 10373-6:2020

Cards and security devices for personal identification — Test methods — Part 6: Contactless proximity objects

The ISO/IEC 10373 series defines test methods for characteristics of identification cards according to the definition given in ISO/IEC 7810. Each test method is cross‑referenced to one or more base standards, which can be ISO/IEC 7810 or one or more of the supplementary standards that define the information storage technologies employed in identification card applications. NOTE 1 Criteria for acceptability do not form part of the ISO/IEC 10373 series, but can be found in the International Standards mentioned above. This document defines test methods which are specific to proximity cards and objects, proximity coupling devices and proximity extended devices, defined in ISO/IEC 14443‑1, ISO/IEC 14443‑2, ISO/IEC 14443‑3 and ISO/IEC 14443‑4. NOTE 2 Test methods defined in this document are intended to be performed separately. A given proximity card or object, proximity coupling device or proximity extended device, is not required to pass through all the tests sequentially. ISO/IEC 10373‑1 defines test methods which are common to one or more integrated circuit card technologies and other parts in the ISO/IEC 10373 series deal with other technology‑specific tests. The conformance test plan defined in Annex O specifies the list of tests applicable for each part of the ISO/IEC 14443 series.

Cartes et dispositifs de sécurité pour l'identification personnelle — Méthodes d'essai — Partie 6: Objets sans contact de proximité

General Information

• Status: Published
• Publication Date: 21-Jul-2020
• ICS: 35.240.15 - Identification cards. Chip cards. Biometrics
• Technical Committee: ISO/IEC JTC 1/SC 17 - Cards and security devices for personal identification
• Drafting Committee: ISO/IEC JTC 1/SC 17/WG 8 - Integrated circuit cards without contacts
• Current Stage: 9599 - Withdrawal of International Standard
• Due Date: 13-Feb-2025
• Completion Date: 13-Feb-2025

Relations

• Consolidated By: ISO/TS 5499:2024 - Health informatics — Clinical particulars — Core principles for the harmonization of therapeutic indications terms and identifiers
• Effective Date: 06-Jun-2022
• Amended By: ISO/IEC 10373-6:2020/Amd 2:2020 - Cards and security devices for personal identification — Test methods — Part 6: Contactless proximity objects — Amendment 2: Enhancements for harmonization
• Effective Date: 11-Dec-2021
• Amended By: ISO/IEC 10373-6:2020/Amd 1:2021 - Cards and security devices for personal identification — Test methods — Part 6: Contactless proximity objects — Amendment 1: Dynamic power level management
• Effective Date: 14-Aug-2021
• Revised: ISO/IEC 10373-6:2025 - Cards and security devices for personal identification — Test methods — Part 6: Contactless proximity objects
• Effective Date: 06-Jun-2022
• Revises: ISO/IEC 10373-6:2016/Amd 3:2018 - Identification cards — Test methods — Part 6: Proximity cards — Amendment 3: PICC loading effect
• Effective Date: 23-Apr-2020
• Revises: ISO/IEC 10373-6:2016 - Identification cards — Test methods — Part 6: Proximity cards
• Effective Date: 22-Apr-2017

Standards Content (Sample)

INTERNATIONAL ISO/IEC
STANDARD 10373-6
Fourth edition
2020-07
Cards and security devices for
personal identification — Test
methods —
Part 6:
Contactless proximity objects
Cartes et dispositifs de sécurité pour l'identification personnelle —
Méthodes d'essai —
Partie 6: Objets sans contact de proximité
Reference number
©
ISO/IEC 2020
© ISO/IEC 2020
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may
be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting
on the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address
below or ISO’s member body in the country of the requester.
ISO copyright office
CP 401 • Ch. de Blandonnet 8
CH-1214 Vernier, Geneva
Phone: [phone]
Email: [e-mail]
Website: www.iso.org
Published in Switzerland
ii © ISO/IEC 2020 – All rights reserved

Contents Page
Foreword .v
1 Scope . 1
2 Normative references . 1
3 Terms, definitions, symbols and abbreviated terms . 2
3.1 Terms and definitions . 2
3.2 Symbols and abbreviated terms. 3
4 Default items applicable to the test methods . 5
4.1 Test environment . 5
4.2 Pre-conditioning . 5
4.3 Setup tolerances. 6
4.4 Spurious inductance . 6
4.5 Measurement uncertainty . 6
4.6 DUT position . 6
4.7 Test conditions for PCD . 6
4.8 Test conditions for PICC . 8
5 Apparatus and circuits for test of ISO/IEC 14443-1 and ISO/IEC 14443-2 parameters .10
5.1 Overview .10
5.2 Minimum requirements for measurement instruments — Oscilloscope .11
5.3 Calibration coils.11
5.3.1 General.11
5.3.2 Size of the calibration coil card .11
5.3.3 Thickness and material of the calibration coil card.12
5.3.4 Coil characteristics .12
5.4 Test PCD assembly .12
5.4.1 General.12
5.4.2 Test PCD antenna .13
5.4.3 Sense coils .13
5.4.4 Assembly of Test PCD . .14
5.5 Reference PICC and Active Reference PICC .16
5.5.1 General.16
5.5.2 Reference PICC .16
5.5.3 Active Reference PICC .19
5.6 PICC transmission test setup .21
5.6.1 General description .21
5.6.2 Phase stability precondition test .21
5.7 EMD test setup .22
5.7.1 General description .22
5.7.2 Computation of power versus time .22
5.7.3 Noise floor precondition test .23
6 Test of ISO/IEC 14443-1 parameters .24
6.1 PCD tests .24
6.1.1 Alternating magnetic field .24
6.2 PICC tests .25
6.2.1 Alternating magnetic field .25
6.2.2 Void .25
6.3 PXD tests .25
7 Test of ISO/IEC 14443-2 parameters .26
7.1 PCD tests .26
7.1.1 PCD field strength .26
7.1.2 Void .27
7.1.3 Void .27
7.1.4 Modulation index m and waveform.27
© ISO/IEC 2020 – All rights reserved iii

7.1.5 Phase stability test .28
7.1.6 Load modulation reception for PICC to PCD bit rates of f /128, f /64,
c c
f /32 and f /16 .29
c c
7.1.7 Load modulation reception for PICC to PCD bit rates of f /8, f /4 and f /2 .36
c c c
7.1.8 PCD EMD immunity test .37
7.2 PICC tests .38
7.2.1 PICC transmission .38
7.2.2 PICC EMD level and low EMD time test .40
7.2.3 PICC reception .41
7.2.4 PICC resonance frequency .44
7.2.5 PICC maximum loading effect .45
7.2.6 PICC operating field strength test .46
7.3 Test methods for bit rates of 3f /4, f , 3f /2 and 2f from PCD to PICC .47
c c c c
7.4 PXD tests .47
8 Test of ISO/IEC 14443-3 and ISO/IEC 14443-4 parameters .48
8.1 PCD tests .48
8.1.1 PCD EMD recovery test .48
8.1.2 Additional PCD tests .49
8.2 PICC tests .49
8.3 PXD tests .49
8.3.1 PCD and PICC Modes .49
8.3.2 Automatic mode alternation .49
Annex A (normative) Test PCD antennas .54
Annex B (informative) Test PCD Antenna tuning .
...

INTERNATIONAL ISO/IEC
STANDARD 10373-6
Fourth edition
2020-07
Cards and security devices for
personal identification — Test
methods —
Part 6:
Contactless proximity objects
Cartes et dispositifs de sécurité pour l'identification personnelle —
Méthodes d'essai —
Partie 6: Objets sans contact de proximité
Reference number
©
ISO/IEC 2020
© ISO/IEC 2020
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may
be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting
on the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address
below or ISO’s member body in the country of the requester.
ISO copyright office
CP 401 • Ch. de Blandonnet 8
CH-1214 Vernier, Geneva
Phone: [phone]
Email: [e-mail]
Website: www.iso.org
Published in Switzerland
ii © ISO/IEC 2020 – All rights reserved

Contents Page
Foreword .v
1 Scope . 1
2 Normative references . 1
3 Terms, definitions, symbols and abbreviated terms . 2
3.1 Terms and definitions . 2
3.2 Symbols and abbreviated terms. 3
4 Default items applicable to the test methods . 5
4.1 Test environment . 5
4.2 Pre-conditioning . 5
4.3 Setup tolerances. 6
4.4 Spurious inductance . 6
4.5 Measurement uncertainty . 6
4.6 DUT position . 6
4.7 Test conditions for PCD . 6
4.8 Test conditions for PICC . 8
5 Apparatus and circuits for test of ISO/IEC 14443-1 and ISO/IEC 14443-2 parameters .10
5.1 Overview .10
5.2 Minimum requirements for measurement instruments — Oscilloscope .11
5.3 Calibration coils.11
5.3.1 General.11
5.3.2 Size of the calibration coil card .11
5.3.3 Thickness and material of the calibration coil card.12
5.3.4 Coil characteristics .12
5.4 Test PCD assembly .12
5.4.1 General.12
5.4.2 Test PCD antenna .13
5.4.3 Sense coils .13
5.4.4 Assembly of Test PCD . .14
5.5 Reference PICC and Active Reference PICC .16
5.5.1 General.16
5.5.2 Reference PICC .16
5.5.3 Active Reference PICC .19
5.6 PICC transmission test setup .21
5.6.1 General description .21
5.6.2 Phase stability precondition test .21
5.7 EMD test setup .22
5.7.1 General description .22
5.7.2 Computation of power versus time .22
5.7.3 Noise floor precondition test .23
6 Test of ISO/IEC 14443-1 parameters .24
6.1 PCD tests .24
6.1.1 Alternating magnetic field .24
6.2 PICC tests .25
6.2.1 Alternating magnetic field .25
6.2.2 Void .25
6.3 PXD tests .25
7 Test of ISO/IEC 14443-2 parameters .26
7.1 PCD tests .26
7.1.1 PCD field strength .26
7.1.2 Void .27
7.1.3 Void .27
7.1.4 Modulation index m and waveform.27
© ISO/IEC 2020 – All rights reserved iii

7.1.5 Phase stability test .28
7.1.6 Load modulation reception for PICC to PCD bit rates of f /128, f /64,
c c
f /32 and f /16 .29
c c
7.1.7 Load modulation reception for PICC to PCD bit rates of f /8, f /4 and f /2 .36
c c c
7.1.8 PCD EMD immunity test .37
7.2 PICC tests .38
7.2.1 PICC transmission .38
7.2.2 PICC EMD level and low EMD time test .40
7.2.3 PICC reception .41
7.2.4 PICC resonance frequency .44
7.2.5 PICC maximum loading effect .45
7.2.6 PICC operating field strength test .46
7.3 Test methods for bit rates of 3f /4, f , 3f /2 and 2f from PCD to PICC .47
c c c c
7.4 PXD tests .47
8 Test of ISO/IEC 14443-3 and ISO/IEC 14443-4 parameters .48
8.1 PCD tests .48
8.1.1 PCD EMD recovery test .48
8.1.2 Additional PCD tests .49
8.2 PICC tests .49
8.3 PXD tests .49
8.3.1 PCD and PICC Modes .49
8.3.2 Automatic mode alternation .49
Annex A (normative) Test PCD antennas .54
Annex B (informative) Test PCD Antenna tuning .
...