ISO/IEC PRF 15415
(Main)Information technology, Automatic identification and data capture techniques — Bar code symbol print quality test specification — Two-dimensional symbols
Information technology, Automatic identification and data capture techniques — Bar code symbol print quality test specification — Two-dimensional symbols
Technologies de l'information — Techniques automatiques d'identification et de capture des données — Spécification de test de qualité d'impression des symboles de code à barres — Symboles bidimensionnels
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ISO/IEC 15415
Third edition
Information technology, Automatic
identification and data capture
techniques — Bar code symbol print
quality test specification — Two-
dimensional symbols
Technologies de l'information — Techniques automatiques
d'identification et de capture des données — Spécification de
test de qualité d'impression des symboles de code à barres —
Symboles bidimensionnels
PROOF/ÉPREUVE
Reference number
ISO/IEC 15415:2024(en) © ISO/IEC 2024
ISO/IEC 15415:2024(en)
© ISO/IEC 2024
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may
be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting on
the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address below
or ISO’s member body in the country of the requester.
ISO copyright office
CP 401 • Ch. de Blandonnet 8
CH-1214 Vernier, Geneva
Phone: +41 22 749 01 11
Email: copyright@iso.org
Website: www.iso.org
Published in Switzerland
PROOF/ÉPREUVE
© ISO/IEC 2024 – All rights reserved
ii
ISO/IEC 15415:2024(en)
Contents Page
Foreword .v
Introduction .vi
1 Scope . 1
2 Normative references . 1
3 Terms and definitions . 1
4 Symbols and abbreviated terms. 3
4.1 Symbols .3
4.2 Abbreviated terms .3
5 Quality grading . 4
5.1 General .4
5.2 Expression of quality grades . .4
5.3 Symbol grade.4
5.4 Specifying the symbol grade requirement in an application specification .5
5.5 Reporting of symbol grade .5
5.6 Optical setup and obtaining the test images .6
5.6.1 General requirements .6
5.6.2 Convolving with the measuring aperture .7
5.6.3 Geometry of the optical setup .7
5.6.4 Inspection area .9
5.6.5 Measurement conditions .9
6 Measurement methodology for two-dimensional multi-row bar code symbols .10
6.1 General .10
6.2 Symbologies with cross-row scanning ability.10
6.2.1 Basis of grading .10
6.2.2 Grade based on analysis of scan reflectance profile .10
6.2.3 Grade based on codeword yield .11
6.2.4 Grade based on unused error correction . 12
6.2.5 Grade based on codeword print quality . 13
6.2.6 Overall symbol grade . 15
6.3 Symbologies requiring row-by-row scanning . 15
7 Measurement methodology for two-dimensional matrix symbols .16
7.1 Overview of methodology .16
7.2 Test images.16
7.2.1 Raw image .16
7.2.2 Reference grey-scale image .16
7.2.3 Binarised image .16
7.3 Reference reflectivity measurements .17
7.3.1 Application specification defines the aperture size .17
7.4 Grading procedure .17
7.5 Image assessment parameters and grading .18
7.5.1 Use of reference decode algorithm .18
7.5.2 Decode .18
7.5.3 Computing R and R .18
max min
7.5.4 Symbol contrast .19
7.5.5 Modulation and related measurements .19
7.5.6 Fixed pattern damage . 22
7.5.7 Axial nonuniformity . 22
7.5.8 Grid nonuniformity . 23
7.5.9 Unused error correction . 23
7.5.10 Print growth .24
7.5.11 Additional grading parameters . 25
7.6 Symbol grade. 25
PROOF/ÉPREUVE
© ISO/IEC 2024 – All rights reserved
iii
ISO/IEC 15415:2024(en)
8 Measurement methodologies for composite symbologies .25
Annex A (normative) Thresholding algorithm based on histogram .27
Annex B (informative) Interpreting the scan and symbol grades .31
Annex C (informative) Guidance on selecting grading parameters in application specifications .34
Annex D (informative) Substrate characteristics .40
Annex E (informative) Parameter grade overlay applied to two-dimensional symbologies .42
Annex F (informative) Explanation of the main changes in this edition of this document .43
Bibliography .46
PROOF/ÉPREUVE
© ISO/IEC 2024 – All rights reserved
iv
ISO/IEC 15415:2024(en)
Foreword
ISO (the International Organization for Standardization) and IEC (the International Electrotechnical
Commission) form the specialized system for worldwide standardization. National bodies that are
members of ISO or IEC participate in the development of International Standards through technical
committees established by the respective organization to deal with particular fields of technical activity.
ISO and IEC technical committees collaborate in fields of mutual interest. Other international organizations,
governmental and non-governmental, in liaison with ISO and IEC, also take part in the work.
The procedures used to develop this document and those intended for its further maintenance are described
in the ISO/IEC Directives, Part 1. In particular, the different approval criteria needed for the different types
of document should be noted. This document was drafted in accordance with the editorial rules of the ISO/
IEC Directives, Part 2 (see www.iso.org/directives or www.iec.ch/members_experts/refdocs).
ISO and IEC draw attention to the possibility that the implementation of this document may involve the
use of (a) patent(s). ISO and IEC take no position concerning the evidence, validity or applicability of any
claimed patent rights in respect thereof. As of the date of publication of this document, ISO and IEC had not
received notice of (a) patent(s) which may be required to implement this document. However, implementers
are cautioned that this may not represent the latest information, which may be obtained from the patent
database available at www.iso.org/patents and https://patents.iec.ch. ISO and IEC shall not be held
responsible for identifying any or all such patent rights.
Any trade name used in this document is information given for the convenience of users and does not
constitute an endorsement.
For an explanation of the voluntary nature of standards, the meaning of ISO specific terms and expressions
related to conformity assessment, as well as information about ISO's adherence to the World Trade
Organization (WTO) principles in the Technical Barriers to Trade (TBT) see www.iso.o
...
ISO/IEC DIS 15415:2023(E2024(en)
ISO/IEC JTC 1/SC 31/WG 1
Secretariat: ANSI
Date: 2023-07-25
Information technology, Automatic identification and data capture techniques — Bar code
symbol print quality test specification — Two-dimensional symbols
Technologies de l'information, Informatique, Techniques d'identification et de saisie de données
automatiques — Spécification de test de qualité d'impression des symboles de code à barres —
Symboles bi-dimensionnels
Third edition
Date: 2024-10-16
ISO/IEC DIS 15415:2023(E)
© ISO/IEC 20232024
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this
publication may be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including
photocopying, or posting on the internet or an intranet, without prior written permission. Permission can be requested
from either ISO at the address below or ISO's member body in the country of the requester.
ISO Copyright Office
CP 401 • CH-1214 Vernier, Geneva
Phone: + 41 22 749 01 11
Email: copyright@iso.org
Website: www.iso.org
Published in Switzerland.
© ISO/IEC 2023 – All rights reserved ii
ISO/IEC DIS 15415:2023(E2024(en)
Contents
Foreword . vi
Introduction . viii
1 Scope . 1
2 Normative references . 1
3 Terms and definitions . 2
4 Symbols and abbreviated terms . 3
4.1 Symbols . 3
4.2 Abbreviated terms . 5
5 Quality grading . 6
5.1 General . 6
5.2 Expression of quality grades . 6
5.3 Symbol grade . 7
5.4 Specifying the symbol grade requirement in an application specification . 7
5.5 Reporting of symbol grade . 8
5.6 Optical setup and obtaining the test images . 9
5.6.1 General requirements . 9
5.6.2 Convolving with the measuring aperture . 9
5.6.3 Geometry of the optical setup . 10
5.6.4 Inspection area . 14
5.6.5 Measurement conditions . 14
iii © ISO/IEC 2023 – All rights reserved
© ISO/IEC 2024 – All rights reserved
iii
ISO/IEC DIS 15415:2023(E)
6 Measurement methodology for two-dimensional multi-row bar code symbols . 15
6.1 General . 15
6.2 Symbologies with cross-row scanning ability . 15
6.2.1 Basis of grading . 15
6.2.2 Grade based on analysis of scan reflectance profile . 15
6.2.3 Grade based on codeword yield . 16
6.2.4 Grade based on unused error correction . 18
6.2.5 Grade based on codeword print quality . 18
6.2.6 Overall symbol grade . 21
6.3 Symbologies requiring row-by-row scanning . 23
7 Measurement methodology for two-dimensional matrix symbols . 23
7.1 Overview of methodology . 23
7.2 Test images . 24
7.2.1 Raw image . 24
7.2.2 Reference grey-scale image . 24
7.2.3 Binarised image . 24
7.3 Reference reflectivity measurements . 24
7.3.1 Application specification defines the aperture size . 24
7.4 Grading procedure . 25
7.5 Image assessment parameters and grading . 26
7.5.1 Use of reference decode algorithm . 26
7.5.2 Decode . 26
7.5.3 Computing Rmax and Rmin . 26
7.5.4 Symbol contrast . 26
7.5.5 Modulation and related measurements . 27
7.5.6 Fixed pattern damage . 31
© ISO/IEC 2023 – All rights reserved iv
ISO/IEC DIS 15415:2023(E2024(en)
7.5.7 Axial nonuniformity . 31
7.5.8 Grid Nonuniformity . 32
7.5.9 Unused error correction . 33
7.5.10 Print growth . 33
7.5.11 Additional grading parameters . 34
7.6 Symbol grade . 35
8 Measurement methodologies for composite symbologies . 35
Annex A (normative) Thresholding algorithm based on histogram . 36
Annex B (informative) Interpreting the scan and symbol grades . 41
Annex C (informative) Guidance on selection of grading parameters in application
specifications. 47
Annex D (informative) Substrate characteristics . 54
Annex E (informative) Parameter grade overlay applied to two-dimensional
symbologies . 57
Annex F (informative) Explanation of some changes in this revision . 59
Bibliography . 63
v © ISO/IEC 2023 – All rights reserved
© ISO/IEC 2024 – All rights reserved
v
ISO/IEC DIS 15415:2023(E)
Foreword
ISO (the International Organization for Standardization) and IEC (the International Electrotechnical
Commission) form the specialized system for worldwide standardization. National bodies that are members
of ISO or IEC participate in the development of International Standards through technical committees
established by the respective organization to deal with particular fields of technical activity. ISO and IEC
technical committees collaborate in fields of mutual interest. Other international organizations,
governmental and non-governmental, in liaison with ISO and IEC, also take part in the work. In the field of
information technology, ISO and IEC have established a joint technical committee, ISO/IEC JTC 1.
International StandardsThe procedures used to develop this document and those intended for its further
maintenance are described in the ISO/IEC Directives, Part 1. In particular, the different approval criteria
needed for the different types of document should be noted. This document was drafted in accordance with
the editorial rules given inof the ISO/IEC Directives, Part 2 (see www.iso.org/directives or
www.iec.ch/members_experts/refdocs.).
The main task of the joint technical committee is to prepare International Standards. Draft International
Standards adopted by the joint technical committee are circulated to national bodies for voting. Publication
as an International Standard requires approval by at least 75 % of the national bodies casting a vote.
Attention is drawnISO and IEC draw attention to the possibility that some of the elementsimplementation of
this document may beinvolve the subjectuse of (a) patent(s). ISO and IEC take no position concerning the
evidence, validity or applicability of any claimed patent rights in respect thereof. As of the date of publication
of this document, ISO and IEC had not received notice of (a) patent(s) which may be required to implement
this document. However, implementers are cautioned that this may not represent the latest information,
which may be obtained from the patent database available at www.iso.org/patents and
https://patents.iec.ch. ISO and IEC shall not be held responsible for identifying any or all such patent rights.
Any trade name used in this document is information given for the convenience of users and does not
constitute an endorsement.
For an explanation of the voluntary nature of standards, the meaning of ISO specific terms and expressions
related to conformity assessment, as well as information about ISO's adherence to the World Trade
Organization (WTO) principles in the Technical Barriers to Trade (TBT) see
www.iso.org/iso/foreword.html. In the IEC, see www.iec.ch/understanding-standardsISO/IEC 15415.
This document was prepared by Joint Technical Committee ISO/IEC JTC 1, Information technology,
Subcommittee SC 31, Automatic identification and data capture techniques.
This third edition cancels and replaces the second edition (ISO/IEC 15415:2011) which has been technically
revised.
The main changes compared to the previous edition are as follows:
- introduction of— a continuous (or decimal) grading has been introduced;
- introduction of — a more optimal threshold calculation has been introduced;
- introduction of — a more stable symbol contrast calculation has been introduced;
- — a definition of grading for print growth has been added;
© ISO/IEC 2023 – All rights reserved vi
ISO/IEC DIS 15415:2023(E2024(en)
- — combination of modulation and reflectance margin into a single measurement.
Any feedback or questions on this document should be directed to the user’s national standards body. A
complete listing of these bodies can be found at www.iso.org/members.html and www.iec.ch/national-
committees.
vii © ISO/IEC 2023 – All rights reserved
© ISO/IEC 2024 – All rights reserved
vii
ISO/IEC DIS 15415:2023(E)
Introduction
The technology of bar coding is based on the recognition of patterns encoded, in bars and spaces or in a
matrix of modules of defined dimensions, according to rules defining the translation of characters into such
patterns, known as the symbology specification. Symbology specifications may be categorised into those for
linear symbols, on the one hand, and two-dimensional symbols on the other; the latter may in turn be sub-
dividedsubdivided into “multi-row bar code symbols” sometimes referred to as “stacked bar code symbols”,
and “two-dimensional matrix symbols”. In addition, there is a hybrid group of symbologies known as
“composite symbologies”; these symbols consi
...
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