ISO 5754
(Main)Sintered metal materials, excluding hardmetals — Unnotched impact test piece
Sintered metal materials, excluding hardmetals — Unnotched impact test piece
ISO 5754 specifies the dimensions of an unnotched impact test piece of sintered metal materials. The test piece may be obtained directly by pressing and sintering or by machining a sintered part. ISO 5754 applies to all sintered metals and alloys, with the exception of hardmetals. However, for certain materials (for example, materials with low porosity or materials with high ductility), it may be more appropriate to use a notched test piece which, in this case, will give results with less scatter. (In this case, refer to ISO 148‑1.) NOTE For porous sintered materials, the results obtained from impact tests are not necessarily very accurate compared with results obtained from tests on solid metals.
Matériaux métalliques frittés, à l'exclusion des métaux-durs — Éprouvette non entaillée pour essai de résilience
L'ISO 5754 spécifie les dimensions d'une éprouvette non entaillée pour essai de résilience, constituée de matériaux métalliques frittés. L'éprouvette peut être soit obtenue directement par compression et frittage, soit prélevée par usinage sur une pièce frittée. L'ISO 5754 s'applique à tous les métaux et alliages frittés, à l'exclusion des métaux-durs. Cependant, pour certains matériaux (par exemple, les matériaux à faible porosité, ou à grande ductilité), il peut être plus approprié d'utiliser une éprouvette entaillée qui permet alors de réduire la dispersion des résultats (dans ce cas, voir l'ISO 148‑1). NOTE Pour les matériaux frittés poreux, les résultats obtenus lors d'essais de résilience peuvent ne pas être très exacts par rapport à ceux obtenus sur des métaux compacts.
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ISO/FDIS 5754:2023(E)
ISO TC 119/SC 3/WG
Date: 2023-03-0109
Sintered metal materials, excluding hardmetals — Unnotched impact test piece
Matériaux métalliques frittés, à l'exclusion des métaux-durs — Éprouvette non entaillée pour essai
de résilience
FDIS stage
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ISO/FDIS 5754:2023(E)
© ISO 2023
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part
of this publication may be reproduced or utilized otherwise in any form or by any means, electronic or
mechanical, including photocopying, or posting on the internet or an intranet, without prior written
permission. Permission can be requested from either ISO at the address below or ISO’s member body
in the country of the requester.
ISO copyright office
CP 401 • Ch. de Blandonnet 8
CH-1214 Vernier, Geneva
Phone: +41 22 749 01 11
Email: copyright@iso.org
Website: www.iso.orgwww.iso.org
Published in Switzerland
© ISO 2023 – All rights reserved
ii © ISO 2023 – All rights reserved
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ISO/FDIS 5754:2023(E)
Contents
Foreword . iv
1 Scope . 1
2 Normative references . 1
3 Terms and definitions . 1
4 Dimensions of test piece . 1
© ISO 2023 – All rights reserved © ISO 2023 – All rights iii
reserved
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ISO/FDIS 5754:2023(E)
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards
bodies (ISO member bodies). The work of preparing International Standards is normally carried out
through ISO technical committees. Each member body interested in a subject for which a technical
committee has been established has the right to be represented on that committee. International
organizations, governmental and non-governmental, in liaison with ISO, also take part in the work. ISO
collaborates closely with the International Electrotechnical Commission (IEC) on all matters of
electrotechnical standardization.
The procedures used to develop this document and those intended for its further maintenance are
described in the ISO/IEC Directives, Part 1. In particular, the different approval criteria needed for the
different types of ISO documentsdocument should be noted. This document was drafted in accordance
with the editorial rules of the ISO/IEC Directives, Part 2 (see www.iso.org/directives).
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Attention is drawnISO draws attention to the possibility that some of the elementsimplementation of this
document may beinvolve the subjectuse of (a) patent(s). ISO takes no position concerning the evidence,
validity or applicability of any claimed patent rights in respect thereof. As of the date of publication of
this document, ISO had not received notice of (a) patent(s) which may be required to implement this
document. However, implementers are cautioned that this may not represent the latest information,
which may be obtained from the patent database available at www.iso.org/patents. ISO shall not be held
responsible for identifying any or all such patent rights. Details of any patent rights identified during the
development of the document will be
...
FINAL
INTERNATIONAL ISO/FDIS
DRAFT
STANDARD 5754
ISO/TC 119/SC 3
Sintered metal materials, excluding
Secretariat: DIN
hardmetals — Unnotched impact test
Voting begins on:
2023-04-07 piece
Voting terminates on:
Matériaux métalliques frittés, à l'exclusion des métaux-durs —
2023-06-30
Éprouvette non entaillée pour essai de résilience
ISO/CEN PARALLEL PROCESSING
RECIPIENTS OF THIS DRAFT ARE INVITED TO
SUBMIT, WITH THEIR COMMENTS, NOTIFICATION
OF ANY RELEVANT PATENT RIGHTS OF WHICH
THEY ARE AWARE AND TO PROVIDE SUPPOR TING
DOCUMENTATION.
IN ADDITION TO THEIR EVALUATION AS
Reference number
BEING ACCEPTABLE FOR INDUSTRIAL, TECHNO-
ISO/FDIS 5754:2023(E)
LOGICAL, COMMERCIAL AND USER PURPOSES,
DRAFT INTERNATIONAL STANDARDS MAY ON
OCCASION HAVE TO BE CONSIDERED IN THE
LIGHT OF THEIR POTENTIAL TO BECOME STAN-
DARDS TO WHICH REFERENCE MAY BE MADE IN
NATIONAL REGULATIONS. © ISO 2023
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FINAL
INTERNATIONAL ISO/FDIS
DRAFT
STANDARD 5754
ISO/TC 119/SC 3
Sintered metal materials, excluding
Secretariat: DIN
hardmetals — Unnotched impact test
Voting begins on:
piece
Voting terminates on:
Matériaux métalliques frittés, à l'exclusion des métaux-durs —
Éprouvette non entaillée pour essai de résilience
COPYRIGHT PROTECTED DOCUMENT
© ISO 2023
ISO/CEN PARALLEL PROCESSING
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may
be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting on
the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address below
or ISO’s member body in the country of the requester.
RECIPIENTS OF THIS DRAFT ARE INVITED TO
ISO copyright office
SUBMIT, WITH THEIR COMMENTS, NOTIFICATION
OF ANY RELEVANT PATENT RIGHTS OF WHICH
CP 401 • Ch. de Blandonnet 8
THEY ARE AWARE AND TO PROVIDE SUPPOR TING
CH-1214 Vernier, Geneva
DOCUMENTATION.
Phone: +41 22 749 01 11
IN ADDITION TO THEIR EVALUATION AS
Reference number
Email: copyright@iso.org
BEING ACCEPTABLE FOR INDUSTRIAL, TECHNO
ISO/FDIS 5754:2023(E)
Website: www.iso.org
LOGICAL, COMMERCIAL AND USER PURPOSES,
DRAFT INTERNATIONAL STANDARDS MAY ON
Published in Switzerland
OCCASION HAVE TO BE CONSIDERED IN THE
LIGHT OF THEIR POTENTIAL TO BECOME STAN
DARDS TO WHICH REFERENCE MAY BE MADE IN
ii
© ISO 2023 – All rights reserved
NATIONAL REGULATIONS. © ISO 2023
---------------------- Page: 2 ----------------------
ISO/FDIS 5754:2023(E)
Contents Page
Foreword .iv
1 Scope . 1
2 Normative references . 1
3 Terms and definitions . 1
4 Dimensions of test piece .1
iii
© ISO 2023 – All rights reserved
---------------------- Page: 3 ----------------------
ISO/FDIS 5754:2023(E)
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards
bodies (ISO member bodies). The work of preparing International Standards is normally carried out
through ISO technical committees. Each member body interested in a subject for which a technical
committee has been established has the right to be represented on that committee. International
organizations, governmental and nongovernmental, in liaison with ISO, also take part in the work.
ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of
electrotechnical standardization.
The procedures used to develop this document and those intended for its further maintenance are
described in the ISO/IEC Directives
...
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