SIST-TS 102 694-1 V10.1.0:2015

Smart Cards;Test specification for the Single Wire Protocol (SWP) interface;Part 1: Terminal features (Release 10)

The present document covers the minimum characteristics which are considered necessary for the terminal in order to
provide compliance to ETSI TS 102 613 [1].
The present document specifies the test cases for:
• the physical layer of the interface CLF - UICC;
• the electrical interface of the CLF;
• the initial communication establishment CLF - UICC;
• the data link layer.
Test cases for the UICC relating to ETSI TS 102 613 [1] and test cases for the host controller interface (HCI) covering
both terminal and UICC are out of scope of this document.

Pametne kartice - Specifikacija preskusa za enožični protokol (SWP) vmesnika - 1. del: Priključki (izdaja 10)

General Information

• Status: Published
• Publication Date: 10-Jun-2015
• ICS: 35.240.15 - Identification cards. Chip cards. Biometrics
• Technical Committee: MOC - Mobile Communications
• Current Stage: 6060 - National Implementation/Publication (Adopted Project)
• Start Date: 11-Mar-2015
• Due Date: 16-May-2015
• Completion Date: 11-Jun-2015
• Ref Project: ETSI TS 102 694-1 V10.1.0 (2015-02) - Smart Cards; Test specification for the Single Wire Protocol (SWP) interface; Part 1: Terminal features (Release 10)

Standards Content (Sample)

ETSI TS 102 694-1 V10.1.0 (2015-02)






TECHNICAL SPECIFICATION
Smart Cards;
Test specification for the
Single Wire Protocol (SWP) interface;
Part 1: Terminal features
(Release 10)

---------------------- Page: 1 ----------------------
Release 10 2 ETSI TS 102 694-1 V10.1.0 (2015-02)



Reference
RTS/SCP-00SWPTva10
Keywords
smart card, terminal
ETSI
650 Route des Lucioles
F-06921 Sophia Antipolis Cedex - FRANCE

Tel.: [phone]  Fax: [phone]

Siret N° 348 623 562 00017 - NAF 742 C
Association à but non lucratif enregistrée à la
Sous-Préfecture de Grasse (06) N° 7803/88

Important notice
The present document can be downloaded from:
http://www.etsi.org/standards-search
The present document may be made available in electronic versions and/or in print. The content of any electronic and/or
print versions of the present document shall not be modified without the prior written authorization of ETSI. In case of any
existing or perceived difference in contents between such versions and/or in print, the only prevailing document is the
print of the Portable Document Format (PDF) version kept on a specific network drive within ETSI Secretariat.
Users of the present document should be aware that the document may be subject to revision or change of status.
Information on the current status of this and other ETSI documents is available at
http://portal.etsi.org/tb/status/status.asp
If you find errors in the present document, please send your comment to one of the following services:
https://portal.etsi.org/People/CommiteeSupportStaff.aspx
Copyright Notification
No part may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying
and microfilm except as authorized by written permission of ETSI.
The content of the PDF version shall not be modified without the written authorization of ETSI.
The copyright and the foregoing restriction extend to reproduction in all media.

© European Telecommunications Standards Institute 2015.
All rights reserved.

TM TM TM
DECT , PLUGTESTS , UMTS and the ETSI logo are Trade Marks of ETSI registered for the benefit of its Members.
TM
3GPP and LTE™ are Trade Marks of ETSI registered for the benefit of its Members and
of the 3GPP Organizational Partners.
GSM® and the GSM logo are Trade Marks registered and owned by the GSM Association.
ETSI

---------------------- Page: 2 ----------------------
Release 10 3 ETSI TS 102 694-1 V10.1.0 (2015-02)
Contents
Intellectual Property Rights . 9
Foreword . 9
Modal verbs terminology . 9
Introduction . 10
1 Scope . 11
2 References . 11
2.1 Normative references . 11
2.2 Informative references . 12
3 Definitions, symbols and abbreviations . 12
3.1 Definitions . 12
3.2 Symbols . 13
3.3 Abbreviations . 13
3.4 Formats . 14
3.4.1 Format of the table of optional features . 14
3.4.2 Format of the applicability table . 14
3.4.3 Status and Notations . 15
4 Test environment . 16
4.1 Table of optional features . 16
4.2 Applicability table . 17
4.3 Information provided by the device supplier . 21
4.4 Test equipment . 21
4.4.1 Measurement/setting uncertainties . 22
4.4.2 Default conditions for DUT operation . 22
4.4.2.1 Temperature . 23
4.4.2.2 ETSI TS 102 221 interface contacts (CLK, RST, I/O) and contact Vcc . 23
4.4.2.3 ETSI TS 102 600 interface contacts (IC_DP, IC_DM) . 23
4.4.2.4 ETSI TS 102 613 interface contact (SWIO). 23
4.4.2.5 Status of UICC interfaces . 23
4.4.2.6 Characteristics of LLC's . 23
4.4.2.6.1 ACT LLC . 23
4.4.2.6.2 SHDLC LLC . 24
4.4.2.6.3 CLT LLC . 24
4.4.3 Minimum/maximum conditions for DUT operation . 24
4.4.4 Execution requirements . 24
4.4.4.1 Definition of TR1 . 24
4.4.4.2 Definition of TR2 . 24
4.5 Test execution . 25
4.5.1 Parameter variations . 25
4.5.2 Execution requirements . 25
4.6 Pass criterion . 26
5 Test cases . 26
5.1 Principle of the Single Wire Protocol . 26
5.2 System architecture . 26
5.2.1 General overview . 26
5.2.2 ETSI TS 102 221 support . 26
5.2.2.1 Conformance requirements . 26
5.2.3 Configurations . 27
5.2.3.1 Conformance requirements . 27
5.2.4 Interaction with other interfaces . 27
5.2.4.1 Conformance requirements . 27
5.3 Physical characteristic s . 27
5.3.1 Temperature range for card operations . 27
ETSI

---------------------- Page: 3 ----------------------
Release 10 4 ETSI TS 102 694-1 V10.1.0 (2015-02)
5.3.1.1 Conformance requirements . 27
5.3.2 Contacts . 27
5.3.2.1 Provision of contacts . 27
5.3.2.1.1 Conformance requirements . 27
5.3.2.2 Contact activation and deactivation . 28
5.3.2.2.1 Conformance requirements . 28
5.3.2.2.2 Test case 1: activation of SWP additionally to other interfaces . 28
5.3.2.2.3 Test case 2: activation of SWP in low power mode . 29
5.3.2.3 Interface activation . 29
5.3.2.3.1 Conformance requirements . 29
5.3.2.3.2 Test case 1: SWP initial activation in full power mode - normal procedure . 32
5.3.2.3.3 Test case 2: SWP Initial activation - no resume . 32
5.3.2.3.4 Test case 3: SWP initial activation in full power mode - corrupted ACT_SYNC frame (repeat
the last frame) . 32
5.3.2.3.5 Test case 4: SWP initial activation in full power mode - no ACT_SYNC frame (repeat the
last frame) . 33
5.3.2.3.6 Test case 5: SWP initial activation failed in full power mode - corrupted ACT_SYNC frame
(multiple) . 33
5.3.2.3.7 Test case 6: SWP initial activation failed in full power mode - no ACT_SYNC frame
(multiple) . 34
5.3.2.3.8 Test case 7: SWP Initial activation in full power mode - corrupted ACT_READY frame
(repeat last frame) . 35
5.3.2.3.9 Void . 35
5.3.2.3.9a Test case 8a: SWP Initial activation in full power mode - no ACT_READY frame (repeat last
frame) . 35
5.3.2.3.10 Test case 9: SWP initial activation failed in full power mode - corrupted ACT_READY
frame (multiple) . 36
5.3.2.3.11 Test case 10: SWP initial activation failed in full power mode - no ACT_READY frame
(multiple) . 37
5.3.2.3.12 Test case 11: SWP initial activation in low power mode . 37
5.3.2.3.13 Test case 12:SWP initial activation in low power mode - corrupted ACT_SYNC frame
(repeat the last frame) . 38
5.3.2.3.14 Test case 13: SWP initial activation in low power mode - no ACT_SYNC frame (repeat the
last frame) . 38
5.3.2.3.15 Test case 14: SWP initial activation failed in low power mode - corrupted ACT_SYNC frame
(multiple) . 39
5.3.2.3.16 Test case 15: SWP initial activation failed in low power mode - no ACT_SYNC frame
(multiple) . 40
5.3.2.3.17 Test case 16: SWP subsequent activation in full power mode . 40
5.3.2.3.18 Void . 41
5.3.2.3.19 Test case 18: SWP initial activation in full power mode - send ACT frames in wrong order,
ACT_READY frame after activation (repeat the last frame) . 41
5.3.2.4 Behavior of a UICC in a terminal not supporting SWP . 41
5.3.2.4.1 Conformance requirements . 41
5.3.2.5 Behavior of terminal connected to a UICC not supporting SWP . 42
5.3.2.5.1 Conformance requirements . 42
5.3.2.5.2 Void . 42
5.3.2.6 Inactive contacts . 42
5.3.2.6.1 Conformance requirements . 42
5.4 Electrical characteristics . 42
5.4.1 Operating conditions and sub-clauses . 42
5.4.1.1 Operating conditions . 42
5.4.1.2 Supply voltage classes. 42
5.4.1.3 V (C1) low power mode definition . 42
CC
5.4.1.3.1 Conformance requirements . 42
5.4.1.3.2 Test case 1: current provided in low power mode, no spikes . 43
5.4.1.3.3 Test case 2: current provided in low power mode, with spikes . 43
5.4.1.4 Signal S1 . 45
5.4.1.4.1 Conformance requirements . 45
5.4.1.4.2 Test case 1: communication with S2 variation in full power mode . 45
5.4.1.4.3 Test case 2: communication with S2 variation in low power mode . 46
5.4.1.5 Signal S2 and subclauses . 46
ETSI

---------------------- Page: 4 ----------------------
Release 10 5 ETSI TS 102 694-1 V10.1.0 (2015-02)
5.4.1.5.1 Signal S2. 46
5.4.1.5.2 Operating current for S2 . 46
5.5 Physical transmission layer . 48
5.5.1 S1 Bit coding and sampling time . 48
5.5.1.1 Conformance requirements . 48
5.5.1.2 Test case 1: S1 waveforms, default bit duration. 48
5.5.1.2.1 Test execution . 48
5.5.1.2.2 Initial conditions . 49
5.5.1.2.3 Test procedure . 49
5.5.1.3 Test case 2: S1 waveforms, extended bit durations . 49
5.5.1.3.1 Test execution . 49
5.5.1.3.2 Initial conditions . 49
5.5.1.3.3 Test procedure . 50
5.5.2 S2 switching management . 50
5.5.2.1 Conformance requirements . 50
5.5.3 SWP interface states management . 51
5.5.3.1 Conformance requirements . 51
5.5.3.2 Test case 1: SWP states and transitions, communication . 51
5.5.3.2.1 Test execution . 51
5.5.3.2.2 Initial conditions . 52
5.5.3.2.3 Test procedure . 52
5.5.3.3 Test Case 2: SWP resume after upper layer indication that the UICC requires no more activity on
this interface . 52
5.5.3.3.1 Test execution . 52
5.5.3.3.2 Initial Conditions . 52
5.5.3.3.3 Test procedure . 53
5.5.4 Power mode states/transitions and Power saving mode . 53
5.5.4.1 Conformance requirements . 53
5.5.4.2 Test case 1: power provided in full power mode . 53
5.5.4.2.1 Test execution . 53
5.5.4.2.2 Initial conditions . 53
5.5.4.2.3 Test procedure . 54
5.5.4.3 Test case 2: switching from full to low power mode . 54
5.5.4.3.1 Test execution . 54
5.5.4.3.2 Initial conditions . 54
5.5.4.3.3 Test procedure . 54
5.5.4.4 Test case 3: switching from low to full power mode . 54
5.5.4.4.1 Test execution . 54
5.5.4.4.2 Initial conditions . 54
5.5.4.4.3 Test procedure . 55
5.6 Data link layer . 55
5.6.1 Overview . 55
5.6.2 Medium Access Control (MAC) layer . 55
5.6.2.1 Bit order . 55
5.6.2.1.1 Conformance requirements . 55
5.6.2.2 Structure . 55
5.6.2.2.1 Conformance requirements . 55
5.6.2.2.2 Test case 1: interpretation of incorrectly formed frames - SHDLC RSET frames . 56
5.6.2.2.3 Test case 2: interpretation of incorrectly formed frames - SHDLC I-frames . 56
5.6.2.3 Bit stuffing . 57
5.6.2.3.1 Conformance requirements . 57
5.6.2.3.2 Test case 1: behavior of CLF with bit stuffing in frame . 57
5.6.2.4 Error detection . 57
5.6.2.4.1 Conformance requirements . 57
5.6.3 Supported LLC layers and sub clauses . 58
5.6.3.1 Supported LLC layers . 58
5.6.3.1.1 Conformance requirements . 58
5.6.3.2 Interworking of the LLC layers . 58
5.6.3.2.1 Conformance requirements . 58
5.6.3.2.2 Test case 1: ignore ACT LLC frame reception after the SHDLC link establishment . 58
5.6.3.2.3 Test case 2: ignore ACT LLC frame reception in CLT session. 59
5.6.3.2.4 Test case 3: CLT session during SHDLC communication . 59
ETSI

---------------------- Page: 5 ----------------------
Release 10 6 ETSI TS 102 694-1 V10.1.0 (2015-02)
5.6.3.2.5 Test case 4: closing condition of CLT session whereas SHDLC link has been established
before CLT session . 59
5.6.4 ACT LLC definition and sub clauses . 60
5.6.4.1 ACT LLC definition . 60
5.6.4.1.1 Conformance requirements . 60
5.6.4.2 SYNC_ID verification process .
...

SLOVENSKI STANDARD
SIST-TS 102 694-1 V10.1.0:2015
01-julij-2015
3DPHWQHNDUWLFH6SHFLILNDFLMDSUHVNXVD]DHQRåLþQLSURWRNRO6:3YPHVQLND
GHO3ULNOMXþNLL]GDMD
Smart Cards;Test specification for the Single Wire Protocol (SWP) interface;Part 1:
Terminal features (Release 10)
Ta slovenski standard je istoveten z: TS 102 694-1 V10.1.0
ICS:
35.240.15 Identifikacijske kartice in Identification cards and
sorodne naprave related devices
SIST-TS 102 694-1 V10.1.0:2015 en,fr,de
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

---------------------- Page: 1 ----------------------

SIST-TS 102 694-1 V10.1.0:2015

---------------------- Page: 2 ----------------------

SIST-TS 102 694-1 V10.1.0:2015
ETSI TS 102 694-1 V10.1.0 (2015-02)






TECHNICAL SPECIFICATION
Smart Cards;
Test specification for the
Single Wire Protocol (SWP) interface;
Part 1: Terminal features
(Release 10)

---------------------- Page: 3 ----------------------

SIST-TS 102 694-1 V10.1.0:2015
Release 10 2 ETSI TS 102 694-1 V10.1.0 (2015-02)



Reference
RTS/SCP-00SWPTva10
Keywords
smart card, terminal
ETSI
650 Route des Lucioles
F-06921 Sophia Antipolis Cedex - FRANCE

Tel.: [phone]  Fax: [phone]

Siret N° 348 623 562 00017 - NAF 742 C
Association à but non lucratif enregistrée à la
Sous-Préfecture de Grasse (06) N° 7803/88

Important notice
The present document can be downloaded from:
http://www.etsi.org/standards-search
The present document may be made available in electronic versions and/or in print. The content of any electronic and/or
print versions of the present document shall not be modified without the prior written authorization of ETSI. In case of any
existing or perceived difference in contents between such versions and/or in print, the only prevailing document is the
print of the Portable Document Format (PDF) version kept on a specific network drive within ETSI Secretariat.
Users of the present document should be aware that the document may be subject to revision or change of status.
Information on the current status of this and other ETSI documents is available at
http://portal.etsi.org/tb/status/status.asp
If you find errors in the present document, please send your comment to one of the following services:
https://portal.etsi.org/People/CommiteeSupportStaff.aspx
Copyright Notification
No part may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying
and microfilm except as authorized by written permission of ETSI.
The content of the PDF version shall not be modified without the written authorization of ETSI.
The copyright and the foregoing restriction extend to reproduction in all media.

© European Telecommunications Standards Institute 2015.
All rights reserved.

TM TM TM
DECT , PLUGTESTS , UMTS and the ETSI logo are Trade Marks of ETSI registered for the benefit of its Members.
TM
3GPP and LTE™ are Trade Marks of ETSI registered for the benefit of its Members and
of the 3GPP Organizational Partners.
GSM® and the GSM logo are Trade Marks registered and owned by the GSM Association.
ETSI

---------------------- Page: 4 ----------------------

SIST-TS 102 694-1 V10.1.0:2015
Release 10 3 ETSI TS 102 694-1 V10.1.0 (2015-02)
Contents
Intellectual Property Rights . 9
Foreword . 9
Modal verbs terminology . 9
Introduction . 10
1 Scope . 11
2 References . 11
2.1 Normative references . 11
2.2 Informative references . 12
3 Definitions, symbols and abbreviations . 12
3.1 Definitions . 12
3.2 Symbols . 13
3.3 Abbreviations . 13
3.4 Formats . 14
3.4.1 Format of the table of optional features . 14
3.4.2 Format of the applicability table . 14
3.4.3 Status and Notations . 15
4 Test environment . 16
4.1 Table of optional features . 16
4.2 Applicability table . 17
4.3 Information provided by the device supplier . 21
4.4 Test equipment . 21
4.4.1 Measurement/setting uncertainties . 22
4.4.2 Default conditions for DUT operation . 22
4.4.2.1 Temperature . 23
4.4.2.2 ETSI TS 102 221 interface contacts (CLK, RST, I/O) and contact Vcc . 23
4.4.2.3 ETSI TS 102 600 interface contacts (IC_DP, IC_DM) . 23
4.4.2.4 ETSI TS 102 613 interface contact (SWIO). 23
4.4.2.5 Status of UICC interfaces . 23
4.4.2.6 Characteristics of LLC's . 23
4.4.2.6.1 ACT LLC . 23
4.4.2.6.2 SHDLC LLC . 24
4.4.2.6.3 CLT LLC . 24
4.4.3 Minimum/maximum conditions for DUT operation . 24
4.4.4 Execution requirements . 24
4.4.4.1 Definition of TR1 . 24
4.4.4.2 Definition of TR2 . 24
4.5 Test execution . 25
4.5.1 Parameter variations . 25
4.5.2 Execution requirements . 25
4.6 Pass criterion . 26
5 Test cases . 26
5.1 Principle of the Single Wire Protocol . 26
5.2 System architecture . 26
5.2.1 General overview . 26
5.2.2 ETSI TS 102 221 support . 26
5.2.2.1 Conformance requirements . 26
5.2.3 Configurations . 27
5.2.3.1 Conformance requirements . 27
5.2.4 Interaction with other interfaces . 27
5.2.4.1 Conformance requirements . 27
5.3 Physical characteristic s . 27
5.3.1 Temperature range for card operations . 27
ETSI

---------------------- Page: 5 ----------------------

SIST-TS 102 694-1 V10.1.0:2015
Release 10 4 ETSI TS 102 694-1 V10.1.0 (2015-02)
5.3.1.1 Conformance requirements . 27
5.3.2 Contacts . 27
5.3.2.1 Provision of contacts . 27
5.3.2.1.1 Conformance requirements . 27
5.3.2.2 Contact activation and deactivation . 28
5.3.2.2.1 Conformance requirements . 28
5.3.2.2.2 Test case 1: activation of SWP additionally to other interfaces . 28
5.3.2.2.3 Test case 2: activation of SWP in low power mode . 29
5.3.2.3 Interface activation . 29
5.3.2.3.1 Conformance requirements . 29
5.3.2.3.2 Test case 1: SWP initial activation in full power mode - normal procedure . 32
5.3.2.3.3 Test case 2: SWP Initial activation - no resume . 32
5.3.2.3.4 Test case 3: SWP initial activation in full power mode - corrupted ACT_SYNC frame (repeat
the last frame) . 32
5.3.2.3.5 Test case 4: SWP initial activation in full power mode - no ACT_SYNC frame (repeat the
last frame) . 33
5.3.2.3.6 Test case 5: SWP initial activation failed in full power mode - corrupted ACT_SYNC frame
(multiple) . 33
5.3.2.3.7 Test case 6: SWP initial activation failed in full power mode - no ACT_SYNC frame
(multiple) . 34
5.3.2.3.8 Test case 7: SWP Initial activation in full power mode - corrupted ACT_READY frame
(repeat last frame) . 35
5.3.2.3.9 Void . 35
5.3.2.3.9a Test case 8a: SWP Initial activation in full power mode - no ACT_READY frame (repeat last
frame) . 35
5.3.2.3.10 Test case 9: SWP initial activation failed in full power mode - corrupted ACT_READY
frame (multiple) . 36
5.3.2.3.11 Test case 10: SWP initial activation failed in full power mode - no ACT_READY frame
(multiple) . 37
5.3.2.3.12 Test case 11: SWP initial activation in low power mode . 37
5.3.2.3.13 Test case 12:SWP initial activation in low power mode - corrupted ACT_SYNC frame
(repeat the last frame) . 38
5.3.2.3.14 Test case 13: SWP initial activation in low power mode - no ACT_SYNC frame (repeat the
last frame) . 38
5.3.2.3.15 Test case 14: SWP initial activation failed in low power mode - corrupted ACT_SYNC frame
(multiple) . 39
5.3.2.3.16 Test case 15: SWP initial activation failed in low power mode - no ACT_SYNC frame
(multiple) . 40
5.3.2.3.17 Test case 16: SWP subsequent activation in full power mode . 40
5.3.2.3.18 Void . 41
5.3.2.3.19 Test case 18: SWP initial activation in full power mode - send ACT frames in wrong order,
ACT_READY frame after activation (repeat the last frame) . 41
5.3.2.4 Behavior of a UICC in a terminal not supporting SWP . 41
5.3.2.4.1 Conformance requirements . 41
5.3.2.5 Behavior of terminal connected to a UICC not supporting SWP . 42
5.3.2.5.1 Conformance requirements . 42
5.3.2.5.2 Void . 42
5.3.2.6 Inactive contacts . 42
5.3.2.6.1 Conformance requirements . 42
5.4 Electrical characteristics . 42
5.4.1 Operating conditions and sub-clauses . 42
5.4.1.1 Operating conditions . 42
5.4.1.2 Supply voltage classes. 42
5.4.1.3 V (C1) low power mode definition . 42
CC
5.4.1.3.1 Conformance requirements . 42
5.4.1.3.2 Test case 1: current provided in low power mode, no spikes . 43
5.4.1.3.3 Test case 2: current provided in low power mode, with spikes . 43
5.4.1.4 Signal S1 . 45
5.4.1.4.1 Conformance requirements . 45
5.4.1.4.2 Test case 1: communication with S2 variation in full power mode . 45
5.4.1.4.3 Test case 2: communication with S2 variation in low power mode . 46
5.4.1.5 Signal S2 and subclauses . 46
ETSI

---------------------- Page: 6 ----------------------

SIST-TS 102 694-1 V10.1.0:2015
Release 10 5 ETSI TS 102 694-1 V10.1.0 (2015-02)
5.4.1.5.1 Signal S2. 46
5.4.1.5.2 Operating current for S2 . 46
5.5 Physical transmission layer . 48
5.5.1 S1 Bit coding and sampling time . 48
5.5.1.1 Conformance requirements . 48
5.5.1.2 Test case 1: S1 waveforms, default bit duration. 48
5.5.1.2.1 Test execution . 48
5.5.1.2.2 Initial conditions . 49
5.5.1.2.3 Test procedure . 49
5.5.1.3 Test case 2: S1 waveforms, extended bit durations . 49
5.5.1.3.1 Test execution . 49
5.5.1.3.2 Initial conditions . 49
5.5.1.3.3 Test procedure . 50
5.5.2 S2 switching management . 50
5.5.2.1 Conformance requirements . 50
5.5.3 SWP interface states management . 51
5.5.3.1 Conformance requirements . 51
5.5.3.2 Test case 1: SWP states and transitions, communication . 51
5.5.3.2.1 Test execution . 51
5.5.3.2.2 Initial conditions . 52
5.5.3.2.3 Test procedure . 52
5.5.3.3 Test Case 2: SWP resume after upper layer indication that the UICC requires no more activity on
this interface . 52
5.5.3.3.1 Test execution . 52
5.5.3.3.2 Initial Conditions . 52
5.5.3.3.3 Test procedure . 53
5.5.4 Power mode states/transitions and Power saving mode . 53
5.5.4.1 Conformance requirements . 53
5.5.4.2 Test case 1: power provided in full power mode . 53
5.5.4.2.1 Test execution . 53
5.5.4.2.2 Initial conditions . 53
5.5.4.2.3 Test procedure . 54
5.5.4.3 Test case 2: switching from full to low power mode . 54
5.5.4.3.1 Test execution . 54
5.5.4.3.2 Initial conditions . 54
5.5.4.3.3 Test procedure . 54
5.5.4.4 Test case 3: switching from low to full power mode . 54
5.5.4.4.1 Test execution . 54
5.5.4.4.2 Initial conditions . 54
5.5.4.4.3 Test procedure . 55
5.6 Data link layer . 55
5.6.1 Overview . 55
5.6.2 Medium Access Control (MAC) layer . 55
5.6.2.1 Bit order . 55
5.6.2.1.1 Conformance requirements . 55
5.6.2.2 Structure . 55
5.6.2.2.1 Conformance requirements . 55
5.6.2.2.2 Test case 1: interpretation of incorrectly formed frames - SHDLC RSET frames . 56
5.6.2.2.3 Test case 2: interpretation of incorrectly formed frames - SHDLC I-frames . 56
5.6.2.3 Bit stuffing . 57
5.6.2.3.1 Conformance requirements . 57
5.6.2.3.2 Test case 1: behavior of CLF with bit stuffing in frame . 57
5.6.2.4 Error detection . 57
5.6.2.4.1 Conformance requirements . 57
5.6.3 Supported LLC layers and sub clauses . 58
5.6.3.1 Supported LLC layers . 58
5.6.3.1.1 Conformance requirements . 58
5.6.3.2 Interworking of the LLC layers . 58
5.6.3.2.1 Conformance requirements . 58
5.6.3.2.2 Test case 1: ignore ACT LLC frame reception after the SHDLC link establishment . 58
5.6.3.2.3 Test case 2: ignore ACT LLC frame reception in CLT session. 59
5.6.3.2.4 Test case 3: CLT session during SHDLC communication . 59
ETSI

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...