SIST EN 60679-6:2011

Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines (IEC 60679-6:2011)

This part of the IEC 60679 series applies to the phase jitter measurement of quartz crystal oscillators and SAW oscillators used for electronic devices and gives guidance for phase jitter that allows the accurate measurement of r.m.s. jitter.
In the measurement method, phase noise measurement equipment or a phase noise measurement system is used.
The measuring frequency range is from 10 MHz to1 000 MHz.
This standard applies to quartz crystal oscillators and SAW oscillators used in electronic devices and modules that have the multiplication or division functions based on these oscillators. The type of phase jitter applied to these oscillators is the r.m.s. jitter. In the following text, these oscillators and modules will be referred to as “oscillator(s)” for simplicity.

Quarzoszillatoren mit bewerteter Qualität - Teil 6: Phasenjitter-Messverfahren für Quarzoszillatoren und OFW-Oszillatoren - Leitfaden für die Anwendung (IEC 60679-6:2011)

Oscillateurs pilotés par quartz sous assurance de la qualité - Partie 6: Méthode de mesure de la gigue de phase pour les oscillateurs à quartz et les oscillateurs SAW - Lignes directrices pour l'application (CEI 60679-6:2011)

La CEI 60679-6:2011 s'applique à la mesure de la gigue de phase des oscillateurs à quartz et des oscillateurs SAW utilisés sur des appareils électroniques. Elle fournit également des lignes directrices sur la gigue de phase qui permet de mesurer précisément une gigue en valeurs efficaces. Dans la méthode de mesure, un appareil de mesure des bruits de phase ou un système de mesure des bruits de phase est utilisé. La gamme de fréquences mesurées s'étend de 10 MHz à 1 000 MHz. La présente norme concerne les oscillateurs à quartz et les oscillateurs SAW utilisés sur des appareils électroniques et des modules dont les fonctions de multiplication ou de division sont basées sur ces oscillateurs. Le type de gigue de phase qui s'applique à ces oscillateurs est la gigue en valeur efficace. Cette norme annule et remplace l'IEC/PAS 60679-6 publié en 2008. Cette première édition constitue une révision technique.

Kristalni oscilatorji določene kakovosti - 6. del: Metoda za merjenje faznega trepetanja kristalnih oscilatorjev in oscilatorjev SAW - Navodilo za uporabo (IEC 60679-6:2011)

Ta del serije IEC 60679 velja za merjenje faznega trepetanja kristalnih oscilatorjev in oscilatorjev SAW, uporabljenih za elektronske naprave, in podaja smernice za fazno trepetanje, ki dopušča natančno merjenje trepetanja r.m.s.
Pri metodi merjenja se uporablja oprema za merjenje faznega šuma ali sistem za merjenje faznega šuma.
Frekvenčni razpon merjenja je od 10 MHz do 1000 MHz.
Ta standard velja za kristalne oscilatorje in oscilatorje SAW, uporabljene v elektronskih napravah in modulih, katerih funkcije množenje ali deljenje so zasnovane na teh oscilatorjih. Vrsta faznega trepetanja, ki velja za te oscilatorje, je trepetanje r.m.s. V besedilu bodo ti oscilatorji in moduli zaradi preprostosti navedeni kot »oscilatorji«.

General Information

• Status: Withdrawn
• Publication Date: 09-May-2011
• Withdrawal Date: 24-Apr-2023
• ICS: 31.140 - Piezoelectric devices
• Technical Committee: I11 - Imaginarni 11
• Current Stage: 9900 - Withdrawal (Adopted Project)
• Start Date: 25-Apr-2023
• Due Date: 18-May-2023
• Completion Date: 25-Apr-2023
• Ref Project: EN 60679-6:2011 - Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines

Standards Content (Sample)

SLOVENSKI STANDARD
SIST EN 60679-6:2011
01-junij-2011
.ULVWDOQLRVFLODWRUMLGRORþHQHNDNRYRVWLGHO0HWRGD]DPHUMHQMHID]QHJD
WUHSHWDQMDNULVWDOQLKRVFLODWRUMHYLQRVFLODWRUMHY6$:1DYRGLOR]DXSRUDER,(&

Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter
measurement method for quartz crystal oscillators and SAW oscillators - Application
guidelines (IEC 60679-6:2011)
Quarzoszillatoren mit bewerteter Qualität - Teil 6: Phasenjitter-Messverfahren für
Quarzoszillatoren und OFW-Oszillatoren - Leitfaden für die Anwendung (IEC 60679-
6:2011)
Oscillateurs pilotés par quartz sous assurance de la qualité - Partie 6: Méthode de
mesure de la gigue de phase pour les oscillateurs à quartz et les oscillateurs SAW -
Lignes directrices pour l'application (CEI 60679-6:2011)
Ta slovenski standard je istoveten z: EN 60679-6:2011
ICS:
31.140 3LH]RHOHNWULþQHLQ Piezoelectric and dielectric
GLHOHNWULþQHQDSUDYH devices
SIST EN 60679-6:2011 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST EN 60679-6:2011

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SIST EN 60679-6:2011

EUROPEAN STANDARD
EN 60679-6

NORME EUROPÉENNE
April 2011
EUROPÄISCHE NORM

ICS 31.140


English version


Quartz crystal controlled oscillators of assessed quality -
Part 6: Phase jitter measurement method for quartz crystal oscillators and
SAW oscillators -
Application guidelines
(IEC 60679-6:2011)


Oscillateurs pilotés par quartz sous Quarzoszillatoren mit bewerteter Qualität -
assurance de la qualité - Teil 6: Phasenjitter-Messverfahren für
Partie 6: Méthode de mesure de la gigue Quarzoszillatoren und OFW-Oszillatoren -
de phase pour les oscillateurs à quartz et Leitfaden für die Anwendung
les oscillateurs SAW - (IEC 60679-6:2011)
Lignes directrices pour l'application
(CEI 60679-6:2011)




This European Standard was approved by CENELEC on 2011-04-18. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the Central Secretariat has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus,
the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy,
Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia,
Spain, Sweden, Switzerland and the United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Management Centre: Avenue Marnix 17, B - 1000 Brussels


© 2011 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 60679-6:2011 E

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SIST EN 60679-6:2011
EN 60679-6:2011 - 2 -
Foreword
The text of document 49/935/FDIS, future edition 1 of IEC 60679-6, prepared by IEC TC 49,
Piezoelectric, Dielectric and Electrostatic Devices and Associated Materials for FrequencyControl,
Selection and Detection, was submitted to the IEC-CENELEC parallel vote and was approved by
CENELEC as EN 60679-6 on 2011-04-18.
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CEN and CENELEC shall not be held responsible for identifying any or all such patent
rights.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2012-01-18
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2014-04-18
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 60679-6:2011 was approved by CENELEC as a European
Standard without any modification.
__________

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SIST EN 60679-6:2011
- 3 - EN 60679-6:2011
Annex ZA
(normative)

Normative references to international publications
with their corresponding European publications

The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.

NOTE  When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.

Publication Year Title EN/HD Year

IEC 60679-1 2007 Quartz crystal controlled oscillators of EN 60679-1 2007
assessed quality -
Part 1: Generic specification

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SIST EN 60679-6:2011

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SIST EN 60679-6:2011

IEC 60679-6
®

Edition 1.0 2011-03
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside


Quartz crystal controlled oscillators of assessed quality –
Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW
oscillators – Application guidelines

Oscillateurs pilotés par quartz sous assurance de la qualité –
Partie 6: Méthode de mesure de la gigue de phase pour les oscillateurs à quartz
et les oscillateurs SAW – Lignes directrices pour l'application

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX S
ICS 31.140 ISBN 978-2-88912-403-9

® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale

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SIST EN 60679-6:2011
– 2 – 60679-6 © IEC:2011
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 8
2 Normative references . 8
3 Terms, definitions and general concepts . 8
3.1 Terms and definitions . 8
3.2 General concepts . 8
3.2.1 Phase jitter . 8
3.2.2 r.m.s jitter . 9
3.2.3 Peak-to-peak jitter . 10
3.2.4 Random jitter . 10
3.2.5 Deterministic jitter . 11
3.2.6 Period (periodic) jitter . 11
3.2.7 Data-dependent jitter . 11
3.2.8 Total jitter . 11
3.3 Points to be considered for measurement . 12
3.3.1 Measurement equipment . 12
3.3.2 Factors of measurement errors . 12
4 Measurement method . 13
4.1 General . 13
4.2 Frequency range and the measurement method . 13
4.3 Method using the phase noise measurement value . 13
4.3.1 Overview . 13
4.3.2 Measurement equipment and system . 13
4.3.3 Measurement item . 13
4.3.4 Range of detuning frequency . 14
4.3.5 Phase noise measurement method . 14
4.4 Measurement method using the specially designed measurement equipment . 14
4.4.1 Overview . 14
4.4.2 Measurement equipment and system . 14
4.4.3 Measurement items . 14
4.4.4 Number of measurements . 14
4.5 Block diagram of the measurement. 14
4.6 Input and output impedance of the measurement system. 15
4.7 Measurement equipment . 15
4.7.1 General . 15
4.7.2 Jitter floor . 15
4.7.3 Frequency range . 15
4.7.4 Output waveform . 15
4.7.5 Output voltage . 16
4.8 Test fixture . 16
4.9 Cable, tools and instruments . 16
5 Measurement and the measurement environment . 16
5.1 Set-up before taking measurements . 16
5.2 Points to be considered and noted at the time of measurement . 16
5.3 Treatment after the measurement . 17

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SIST EN 60679-6:2011
60679-6 © IEC:2011 – 3 –
6 Measurement . 17
6.1 Reference temperature . 17
6.2 Measurement of temperature characteristics . 17
6.3 Measurement under vibration . 17
6.4 Measurement at the time of impact . 17
6.5 Measurement in accelerated ageing . 17
7 Other points to be noted . 17
8 Miscellaneous . 17
Annex A (normative) Calculation method for the amount of phase jitter . 18
Bibliography . 21

Figure 1 – Voltage versus time . 9
Figure 2 – Explanatory diagram of the amount of jitter applied to r.m.s. jitter . 10
Figure 3 – Explanatory diagram of random jitter, deterministic jitter, and total jitter . 11
Figure 4 – Equivalent block diagram . 15
Figure A.1 – Concept diagram of SSB phase noise . 19

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SIST EN 60679-6:2011
– 4 – 60679-6 © IEC:2011
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________

QUARTZ CRYSTAL CONTROLLED OSCILLATORS
OF ASSESSED QUALITY –

Part 6: Phase jitter measurement method
for quartz crystal oscillators and SAW oscillators –
Application guidelines


FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60679-6 has been prepared by lEC technical committee 49:
Piezoelectric, dielectric and electrostatic devices and associated materials for frequency
control, selection and detection.
This standard cancels and replaces IEC/PAS 60679-6 published in 2008. This first edition
constitutes a technical revision.

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SIST EN 60679-6:2011
60679-6 © IEC:2011 – 5 –
The text of this standard is based on the following documents:
FDIS Report on voting
49/935/FDIS 49/944/RVD

Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts of the IEC 60679 series, published under the general title Quartz crystal
controlled oscillators of assessed quality, can be found on the IEC website.
The committee has decided that the contents of this publication will remain unchanged until
the stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.

IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct
understanding of its contents. Users should therefore print this document using a
colour printer.

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SIST EN 60679-6:2011
– 6 – 60679-6 © IEC:2011
INTRODUCTION
The study of phase jitter measurement methods was conducted in accordance with the
agreement during the IEC TC 49 Berlin international meeting in 2001. At this meeting, the
decision was made that Japan should assume the responsibilities of this study. Then, the
technical committee of the Quartz Crystal Industry Association of Japan (QIAJ) proceeded
with this study. This study was substantially conducted during the years 2002 to 2005 and can
be referred to as the first stage of the study. The second stage is being continued at present.
Phase jitter has become one of the essential measurement items by digitization of electronic
devices. However, theoretically, some ambiguity is still left in the phase jitter. Since no
standard measurement method is proposed, suppliers and customers may be mutually
exposed to a risk which could cause enormous economic losses.
To avoid this risk, this document provides a standard, based on the study results during the
first stage, for each company of QIAJ members to avoid anxiety as to the measurement of the
phase jitter and for the purpose of giving guidance without any mistakes.
In this standard, a recommendation to make r.m.s. jitter a measurement object is presented.
The reason why this recommendation is submitted is because the oscillators resulting in ultra-
low amount of jitter are targeted as the object to be measured.
Oscillators are analogue-type electronic devices. Their sine wave output signals are more
favourable than the signals obtained by electronic systems. Moreover, the output is utilized as
the reference clock of the measurement equipment, leading to a situation in which the amount
of phase jitter is shown to be smaller than the amount of phase jitter of the measurement
equipment. Accordingly, this may give the impression that the measured amount of phase
jitter is not from the oscillators but rather the amount of phase jitter generated by the
measurement equipment, or the measurement system. Therefore, when adopting the amount
of other phase jitters as the measurement items, a recommendation is presented to select
measurement equipment and a measurement system capable of being verified and confirmed
sufficiently, contractually determined between suppliers and customers. Moreover, when the
phase noise method is used, the random jitter values need to be discussed after defining the
jitter frequency bands from start to end of integrating the phase noise.
In case of doubts related to the measurement values, refer to the application of Allan
1
.
Variance [1]
Frequency stability was compiled into a single work by IEEE in 1966 [2]. Then, the definition
was applied to atomic oscillators, crystal oscillators, as well as electronic systems for
telecommunication, information, audio-visual, and the like.
Conventional crystal oscillators and electronic systems have analogue systems and their
signal waveforms are sine waves. Therefore, the short-term frequency stability as one field of
the frequency stability is measured as the phase noise or Allan Variance. Recently,
digitization of electronic systems is progressing. Under such circumstance, the short-term
frequency stability has been measured as the phase jitter.
On the other hand, the oscillators are analogue-type electronic devices. For the oscillators,
the signals having square waves or waveforms similar thereto are demanded by users to be
easily fit into the electronic systems. Naturally, for the short-term frequency stability, the
measurement as the phase jitter is frequently demanded by users.
For advance application in electronic information and communication technology: (e.g.:
advanced satellite communications, control circuits for electric vehicle (EV) and etc.),
necessity arises for the measurement method for common guidelines of phase jitter. In these
—————————
1
 Numbers in square brackets refer to the Bibliography.

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SIST EN 60679-6:2011
60679-6 © IEC:2011 – 7 –
days, measurement method of phase jitter also becomes more important from the
electromagnetic influence (EMI) point of view.
In that sense, international standardization as IEC 60679-6 of phase jitter measurement
method is significant and timely. The measurement method of phase jitter described in this
document is the newest method by which quantitative measurement was made possible from
the breakthrough of the measurement system technology, in the hope to get attention from not
only a device engineer but also a system engineer and expected to be widely used.

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SIST EN 60679-6:2011
– 8 – 60679-6 © IEC:2011
QUARTZ CRYSTAL CONTROLLED OSCILLATORS
OF ASSESSED QUALITY –

Part 6: Phase jitter measurement method
for quartz crystal oscillators and SAW oscillators –
Application guidelines



1 Scope
This part of the IEC 60679 series applies to the phase jitter measurement of quartz crystal
oscillators and SAW oscillators used for electronic devices and gives guidance for phase jitter
that allows the accurate measurement of r.m.s. jitter.
In the measurement method, phase noise measurement equipment or a phase noise
measurement system is used.
The measuring frequency range is from 10 MHz to1 000 MHz.
This standard applies to quartz crystal oscillators and SAW oscillators used in electronic
devices and modules that have the multiplication or division functions based on these
oscillators. The type of phase jitter applied to these oscillators is the r.m.s. jitter. In the
following text, these oscillators and modules will be referred to as “oscillator(s)” for simplicity.
2 Normative references
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
IEC 60679-1:2007, Quartz crystal controlled oscillators of assessed quality – Part 1: Generic
specification
3 Terms, definitions and general concepts
3.1 Terms and definitions
For the purposes of this document, the terms and definitions given in IEC 60679-1:2007 apply.
Units, drawings, codes, and characters are also based on IEC 60679-1.
3.2 General concepts
3.2.1 Phase jitter
The phase jitter of oscillators means an electronic noise of signal waveforms in terms of time.
On the other hand, the phase jitter is described as a jitter in which the frequency of signal
deflection exceeds 10 Hz and as a wander in which the frequency is 10 Hz or less.
It is difficult to observe the wander of oscillators. The wander is a phenomenon which is
confirmed in electronic parts such as optical cables susceptible to expansion and contraction
even by a small amount of temperature changes. Therefore, the wander is generally not
discussed in the oscillators. In this document also, phase jitter is targeted only to the jitter.

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SIST EN 60679-6:2011
60679-6 © IEC:2011 – 9 –
As for signals, an ideal cycle (t) is inversely proportional to a frequency (f). More specifically,
the relation is expressed by Equation (1).
1
t = (1)
f
Actually, the cycle is varied by receiving various influences. This phenomenon is the phase
jitter and can be confirmed by thickening of edges of waveforms when using oscilloscopes or
the like. Regarding the method for measuring and evaluating such phase jitter, statistical
measurement techniques are utilized as shown is shown in Figure 1. The numerical values in
Figure 1 are treated as a symbol. The position of 0,5 of signal waveform is defined as a
reference point in the vertical axis, and the edges of the reference point are defined to be not
varied. When attention is paid to the edges after one cycle, every time when the signals
repeatedly move on the screen of CRT in the lateral direction, the edges after one cycle are
not reproduced. Then, plurality edges have become to exist. This phenomenon is induced
when repeatedly measuring the signals, and referred to as the phase jitter.

2,0
N
1,5
1,0
0,5
0,0
–0,5
–1,0
Reference point
–1,5
–2,0
0 10 20 30 40 50
Time Time

IEC  527/11
              a) Output waveform b) Histogram of the all jitters
Figure 1 – Voltage versus time
This phase jitter is treated as a normal distribution. Then, when analysed, the phase jitter can
be divided into several types of properties. More specifically, the phase jitter is classified in
several types. In this document, the phase jitter is classified in the seven types as described
below. In the following, these properties and the cause systems are made clear.
3.2.2 r.m.s jitter
The r.m.s. jitter is the phase jitter which comes to have the normal distribution shown in
Figure 2. The r.m.s. jitter is a standard deviation obtained on the basis of statistical
treatments and defined as a 1 σ portion
Voltage

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SIST EN 60679-6:2011
– 10 – 60679-6 © IEC:2011

RMS jitter (standard deviation)
Peak-to-peak jitter
IEC  528/11

Figure 2 – Explanatory diagram of the amount of jitter applied to r.m.s. jitter
From statistics, any measurement data is meant to exist in 1 σ at a probability of 68,26 %.
Therefore, when the measurement times are 10 000, approximately 6 826 pieces of the
measurement data are considered to be contained. On the contrary, 31,74 % (3 174 pieces)
of the measurement data is indicated to be outside the plus and minus sides of 1 σ. If the data
outside the definition is considered to be errors, 31,74 % can be considered to be the error
rate.
3.2.3 Peak-to-peak jitter
The peak-to-peak jitter is the phase jitter which comes to have the normal distribution shown
in Figure 2. The amount of phase jitter of one cycle is totalized and statistically treated on the
base point of the reference point of phase jitter shown in Figure 1. In this case, the amount of
phase jitter is assumed to provide the normal distribution.
The difference between the maximum value and the minimum value (namely, change width) is
referred to as the peak-to-peak jitter. Since the jitter values become larger as the
measurement times are increased, the jitter also becomes the total jitter as described later.
This term comes on when negotiating specifications between customers and oscillator makers.
NOTE Since the peak-to-peak jitter or the r.m.s. jitter indicates the amount of phase jitter to the measurement
times thereof, the jitter indicates operating conditions of measurement samples in a short period of time. Moreover,
the jitter has values effective only to an ideal normal distribution (Gaussian distributions), and the effectiveness
can be maintained to be low in cases of non-Gaussian distributions having distorted distributio
...