SIST EN 60679-6:2011

Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines (IEC 60679-6:2011)

IEC 60679-6:2011 applies to the phase jitter measurement of quartz crystal oscillators and SAW oscillators used for electronic devices and gives guidance for phase jitter that allows the accurate measurement of r.m.s. jitter. In the measurement method, phase noise measurement equipment or a phase noise measurement system is used. The measuring frequency range is from 10 MHz to 1 000 MHz. This standard applies to quartz crystal oscillators and SAW oscillators used in electronic devices and modules that have the multiplication or division functions based on these oscillators. The type of phase jitter applied to these oscillators is the r.m.s. jitter. This standard cancels and replaces IEC/PAS 60679-6 published in 2008. This first edition constitutes a technical revision.

Quarzoszillatoren mit bewerteter Qualität - Teil 6: Phasenjitter-Messverfahren für Quarzoszillatoren und OFW-Oszillatoren - Leitfaden für die Anwendung (IEC 60679-6:2011)

Oscillateurs pilotés par quartz sous assurance de la qualité - Partie 6: Méthode de mesure de la gigue de phase pour les oscillateurs à quartz et les oscillateurs SAW - Lignes directrices pour l'application (CEI 60679-6:2011)

La CEI 60679-6:2011 s'applique à la mesure de la gigue de phase des oscillateurs à quartz et des oscillateurs SAW utilisés sur des appareils électroniques. Elle fournit également des lignes directrices sur la gigue de phase qui permet de mesurer précisément une gigue en valeurs efficaces. Dans la méthode de mesure, un appareil de mesure des bruits de phase ou un système de mesure des bruits de phase est utilisé. La gamme de fréquences mesurées s'étend de 10 MHz à 1 000 MHz. La présente norme concerne les oscillateurs à quartz et les oscillateurs SAW utilisés sur des appareils électroniques et des modules dont les fonctions de multiplication ou de division sont basées sur ces oscillateurs. Le type de gigue de phase qui s'applique à ces oscillateurs est la gigue en valeur efficace. Cette norme annule et remplace l'IEC/PAS 60679-6 publié en 2008. Cette première édition constitue une révision technique.

Kristalni oscilatorji določene kakovosti - 6. del: Metoda za merjenje faznega trepetanja kristalnih oscilatorjev in oscilatorjev SAW - Navodilo za uporabo (IEC 60679-6:2011)

Ta del serije IEC 60679 velja za merjenje faznega trepetanja kristalnih oscilatorjev in oscilatorjev SAW, uporabljenih za elektronske naprave, in podaja smernice za fazno trepetanje, ki dopušča natančno merjenje trepetanja r.m.s.
Pri metodi merjenja se uporablja oprema za merjenje faznega šuma ali sistem za merjenje faznega šuma.
Frekvenčni razpon merjenja je od 10 MHz do 1000 MHz.
Ta standard velja za kristalne oscilatorje in oscilatorje SAW, uporabljene v elektronskih napravah in modulih, katerih funkcije množenje ali deljenje so zasnovane na teh oscilatorjih. Vrsta faznega trepetanja, ki velja za te oscilatorje, je trepetanje r.m.s. V besedilu bodo ti oscilatorji in moduli zaradi preprostosti navedeni kot »oscilatorji«.

General Information

• Status: Withdrawn
• Publication Date: 09-May-2011
• Withdrawal Date: 24-Apr-2023
• ICS: 31.140 - Piezoelectric devices
• Technical Committee: I11 - Imaginarni 11
• Current Stage: 9900 - Withdrawal (Adopted Project)
• Start Date: 25-Apr-2023
• Due Date: 18-May-2023
• Completion Date: 25-Apr-2023
• Ref Project: EN 60679-6:2011 - Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines

Standards Content (Sample)

SLOVENSKI STANDARD
01-junij-2011
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Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter
measurement method for quartz crystal oscillators and SAW oscillators - Application
guidelines (IEC 60679-6:2011)
Quarzoszillatoren mit bewerteter Qualität - Teil 6: Phasenjitter-Messverfahren für
Quarzoszillatoren und OFW-Oszillatoren - Leitfaden für die Anwendung (IEC 60679-
6:2011)
Oscillateurs pilotés par quartz sous assurance de la qualité - Partie 6: Méthode de
mesure de la gigue de phase pour les oscillateurs à quartz et les oscillateurs SAW -
Lignes directrices pour l'application (CEI 60679-6:2011)
Ta slovenski standard je istoveten z: EN 60679-6:2011
ICS:
31.140 3LH]RHOHNWULþQHLQ Piezoelectric and dielectric
GLHOHNWULþQHQDSUDYH devices
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD
EN 60679-6
NORME EUROPÉENNE
April 2011
EUROPÄISCHE NORM
ICS 31.140
English version
Quartz crystal controlled oscillators of assessed quality -
Part 6: Phase jitter measurement method for quartz crystal oscillators and
SAW oscillators -
Application guidelines
(IEC 60679-6:2011)
Oscillateurs pilotés par quartz sous Quarzoszillatoren mit bewerteter Qualität -
assurance de la qualité - Teil 6: Phasenjitter-Messverfahren für
Partie 6: Méthode de mesure de la gigue Quarzoszillatoren und OFW-Oszillatoren -
de phase pour les oscillateurs à quartz et Leitfaden für die Anwendung
les oscillateurs SAW - (IEC 60679-6:2011)
Lignes directrices pour l'application
(CEI 60679-6:2011)
This European Standard was approved by CENELEC on 2011-04-18. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the Central Secretariat has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus,
the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy,
Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia,
Spain, Sweden, Switzerland and the United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Management Centre: Avenue Marnix 17, B - 1000 Brussels

© 2011 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 60679-6:2011 E
Foreword
The text of document 49/935/FDIS, future edition 1 of IEC 60679-6, prepared by IEC TC 49,
Piezoelectric, Dielectric and Electrostatic Devices and Associated Materials for FrequencyControl,
Selection and Detection, was submitted to the IEC-CENELEC parallel vote and was approved by
CENELEC as EN 60679-6 on 2011-04-18.
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CEN and CENELEC shall not be held responsible for identifying any or all such patent
rights.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2012-01-18
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2014-04-18
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 60679-6:2011 was approved by CENELEC as a European
Standard without any modification.
__________
- 3 - EN 60679-6:2011
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications

The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.

NOTE  When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.
Publication Year Title EN/HD Year

IEC 60679-1 2007 Quartz crystal controlled oscillators of EN 60679-1 2007
assessed quality -
Part 1: Generic specification
IEC 60679-6 ®
Edition 1.0 2011-03
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Quartz crystal controlled oscillators of assessed quality –
Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW
oscillators – Application guidelines

Oscillateurs pilotés par quartz sous assurance de la qualité –
Partie 6: Méthode de mesure de la gigue de phase pour les oscillateurs à quartz
et les oscillateurs SAW – Lignes directrices pour l'application

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX S
ICS 31.140 ISBN 978-2-88912-403-9

– 2 – 60679-6 © IEC:2011
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 8
2 Normative references . 8
3 Terms, definitions and general concepts . 8
3.1 Terms and definitions . 8
3.2 General concepts . 8
3.2.1 Phase jitter . 8
3.2.2 r.m.s jitter . 9
3.2.3 Peak-to-peak jitter . 10
3.2.4 Random jitter . 10
3.2.5 Deterministic jitter . 11
3.2.6 Period (periodic) jitter . 11
3.2.7 Data-dependent jitter . 11
3.2.8 Total jitter . 11
3.3 Points to be considered for measurement . 12
3.3.1 Measurement equipment . 12
3.3.2 Factors of measurement errors . 12
4 Measurement method . 13
4.1 General . 13
4.2 Frequency range and the measurement method . 13
4.3 Method using the phase noise measurement value . 13
4.3.1 Overview . 13
4.3.2 Measurement equipment and system . 13
4.3.3 Measurement item . 13
4.3.4 Range of detuning frequency . 14
4.3.5 Phase noise measurement method . 14
4.4 Measurement method using the specially designed measurement equipment . 14
4.4.1 Overview . 14
4.4.2 Measurement equipment and system . 14
4.4.3 Measurement items . 14
4.4.4 Number of measurements . 14
4.5 Block diagram of the measurement. 14
4.6 Input and output impedance of the measurement system. 15
4.7 Measurement equipment . 15
4.7.1 General . 15
4.7.2 Jitter floor . 15
4.7.3 Frequency range . 15
4.7.4 Output waveform . 15
4.7.5 Output voltage . 16
4.8 Test fixture . 16
4.9 Cable, tools and instruments . 16
5 Measurement and the measurement environment . 16
5.1 Set-up before taking measurements . 16
5.2 Points to be considered and noted at the time of measurement . 16
5.3 Treatment after the measurement . 17

60679-6 © IEC:2011 – 3 –
6 Measurement . 17
6.1 Reference temperature . 17
6.2 Measurement of temperature characteristics . 17
6.3 Measurement under vibration . 17
6.4 Measurement at the time of impact . 17
6.5 Measurement in accelerated ageing . 17
7 Other points to be noted . 17
8 Miscellaneous . 17
Annex A (normative) Calculation method for the amount of phase jitter . 18
Bibliography . 21

Figure 1 – Voltage versus time . 9
Figure 2 – Explanatory diagram of the amount of jitter applied to r.m.s. jitter . 10
Figure 3 – Explanatory diagram of random jitter, deterministic jitter, and total jitter . 11
Figure 4 – Equivalent block diagram . 15
Figure A.1 – Concept diagram of SSB phase noise . 19

– 4 – 60679-6 © IEC:2011
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
QUARTZ CRYSTAL CONTROLLED OSCILLATORS
OF ASSESSED QUALITY –
Part 6: Phase jitter measurement method
for quartz crystal oscillators and SAW oscillators –
Application guidelines
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC
...