oSIST prEN IEC 62024-2:2023
(Main)High frequency inductive components - Electrical characteristics and measuring methods - Part 2: Rated current of inductors for DC-to-DC converters
High frequency inductive components - Electrical characteristics and measuring methods - Part 2: Rated current of inductors for DC-to-DC converters
Induktive Hochfrequenz-Bauelemente - Elektrische Eigenschaften und Messmethoden - Teil 2: Bemessungsstrom von Drosselspulen für DC/DC-Wandler
Composants inductifs à haute fréquence - Caractéristiques électriques et méthodes de mesure - Partie 2: Courant assigné des bobines d'induction pour des convertisseurs continu-continu
Visokofrekvenčne induktivne komponente - Električne karakteristike in merilne metode - 2. del: Naznačeni tok tuljav za presmernik DC/DC
General Information
Relations
Standards Content (Sample)
SLOVENSKI STANDARD
oSIST prEN IEC 62024-2:2023
01-junij-2023
Visokofrekvenčne induktivne komponente - Električne karakteristike in merilne
metode - 2. del: Naznačeni tok tuljav za presmernik DC/DC
High frequency inductive components - Electrical characteristics and measuring methods
- Part 2: Rated current of inductors for DC-to-DC converters
Induktive Hochfrequenz-Bauelemente - Elektrische Eigenschaften und Messmethoden -
Teil 2: Bemessungsstrom von Drosselspulen für DC/DC-Wandler
Composants inductifs à haute fréquence - Caractéristiques électriques et méthodes de
mesure - Partie 2: Courant assigné des bobines d'induction pour des convertisseurs
continu-continu
Ta slovenski standard je istoveten z: prEN IEC 62024-2:2023
ICS:
29.100.10 Magnetne komponente Magnetic components
oSIST prEN IEC 62024-2:2023 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
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oSIST prEN IEC 62024-2:2023
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oSIST prEN IEC 62024-2:2023
51/1435/CDV
COMMITTEE DRAFT FOR VOTE (CDV)
PROJECT NUMBER:
IEC 62024-2 ED3
DATE OF CIRCULATION: CLOSING DATE FOR VOTING:
2023-04-21 2023-07-14
SUPERSEDES DOCUMENTS:
51/1409/CD, 51/1414/CC
IEC TC 51 : MAGNETIC COMPONENTS, FERRITE AND MAGNETIC POWDER MATERIALS
SECRETARIAT: SECRETARY:
Japan Mr Takeshi Abe
OF INTEREST TO THE FOLLOWING COMMITTEES: PROPOSED HORIZONTAL STANDARD:
Other TC/SCs are requested to indicate their interest, if any,
in this CDV to the secretary.
FUNCTIONS CONCERNED:
EMC ENVIRONMENT QUALITY ASSURANCE SAFETY
SUBMITTED FOR CENELEC PARALLEL VOTING NOT SUBMITTED FOR CENELEC PARALLEL VOTING
Attention IEC-CENELEC parallel voting
The attention of IEC National Committees, members of
CENELEC, is drawn to the fact that this Committee Draft for
Vote (CDV) is submitted for parallel voting.
The CENELEC members are invited to vote through the
CENELEC online voting system.
This document is still under study and subject to change. It should not be used for reference purposes.
Recipients of this document are invited to submit, with their comments, notification of
• any relevant patent rights of which they are aware and to provide supporting documentation,
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the enquiry stage is the final stage for submitting "in some countries" clauses. See AC/22/2007.
TITLE:
High frequency inductive components - Electrical characteristics and measuring methods - Part 2:
Rated current of inductors for DC-to-DC converters
PROPOSED STABILITY DATE: 2028
Copyright © 2023 International Electrotechnical Commission, IEC. All rights reserved. It is permitted to download this
electronic file, to make a copy and to print out the content for the sole purpose of preparing National Committee positions.
You may not copy or "mirror" the file or printed version of the document, or any part of it, for any other purpose without
permission in writing from IEC.
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NOTE FROM TC/SC OFFICERS:
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oSIST prEN IEC 62024-2:2023
51/1435/CDV 3 IEC CDV 62024-2 © IEC 2023
1 CONTENTS
2
3 FOREWORD . 5
4 1 Scope . 7
5 2 Normative references . 7
6 3 Terms and definitions . 7
7 4 Standard atmospheric conditions . 7
8 4.1 Standard atmospheric conditions for testing . 7
9 4.2 Reference conditions . 8
10 5 Measuring method of DC saturation limited current . 8
11 5.1 General . 8
12 5.2 Test conditions . 8
13 5.3 Measuring circuit and calculation . 8
14 5.3.1 Measuring circuit . 8
15 5.3.2 Calculation . 9
16 5.4 Attachment jig of inductor . 9
17 5.5 Measuring method . 9
18 5.6 Quality conformance inspection . 10
19 6 Measuring method of temperature rise limited current. 10
20 6.1 General . 10
21 6.2 Test conditions . 10
22 6.3 Measuring jig . 10
23 6.3.1 General . 10
24 6.3.2 Printed-wiring board method . 11
25 6.3.3 Lead wire method . 18
26 6.4 Measuring method and calculation . 18
27 6.4.1 General . 18
28 6.4.2 Resistance substitution method . 19
29 6.4.3 Thermo-couple method . 20
30 6.4.4 Thermal Camera Method . 21
31 6.5 Quality conformance inspection . 22
32 7 Determination of rated current . 22
33 8 Information to be given in the detail specification . 22
34 8.1 General . 22
35 8.2 Measuring method of DC saturation limited current . 22
36 8.3 Measuring method of temperature rise limited current . 22
37 Annex A (informative) Example of recommended description on product specification
38 sheets and catalogues . 23
39 Bibliography . 24
40
41 Figure 1 – Inductance measuring circuit under application of DC saturation condition . 9
42 Figure 2 – Example of printed-wiring boards . 18
43 Figure 3 – Temperature rise measuring circuit by resistance substitution method . 19
44 Figure 4 – Temperature rise measuring circuit by thermo-couple method . 20
45 Figure 5 – Temperature rise measuring circuit by thermal camera method . 21
46
47 Table 1 – Width of circuits . 11
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48 Table 2 – Wire size of circuits . 18
49
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50 INTERNATIONAL ELECTROTECHNICAL COMMISSION
51 ____________
52
53 HIGH FREQUENCY INDUCTIVE COMPONENTS –
54 ELECTRICAL CHARACTERISTICS AND MEASURING METHODS –
55
56 Part 2: Rated current of inductors for DC-to-DC converters
57
58 FOREWORD
59 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
60 all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international
61 co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and
62 in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports,
63 Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)“). Their
64 preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with
65 may participate in this preparatory work. International, governmental and non-governmental organizations liaising
66 with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for
67 Standardization (ISO) in accordance with conditions determined by agreement between the two organizations.
68 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
69 consensus of opinion on the relevant subjects since each technical committee has representation from all
70 interested IEC National Committees.
71 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
72 Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
73 Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
74 misinterpretation by any end user.
75 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
76 transparently to the maximum extent possible in their national and regional publications. Any divergence between
77 any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter.
78 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
79 assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
80 services carried out by independent certification bodies.
81 6) All users should ensure that they have the latest edition of this publication.
82 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
83 members of its technical committees and IEC National Committees for any personal injury, property damage or
84 other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
85 expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
86 Publications.
87 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
88 indispensable for the correct application of this publication.
89 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent
90 rights. IEC shall not be held responsible for identifying any or all such patent rights.
91 IEC 62024-2 has been prepared by IEC technical committee 51: Magnetic components, ferrite
92 and magnetic powder materials.
93 This third edition cancels and replaces the second edition published in 2020. This edition
94 constitutes a technical revision.
95 This edition includes the following significant technical changes with respect to the previous
96 edition:
97 a) extension of scope by increase of range of rated current from 22 A to 125 A;
2
98 b) extension of scope by increase of footprint limitation from 12 mm X 12 mm to 625 mm ;
99 c) addition of upper current limitation for I , I and I board to Table 1;
CLASS B CLASS C CLASS D
100 d) revised application examples for Table 1;
101 e) addition of wire size references for current ranges between 22 A ≤ I ≤ 125 A to Table 2;
102 f) addition of crimp terminal references to Table 2;
103 g) addition of thermal camera method.
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104 The text of this international standard is based on the following documents:
FDIS Report on voting
51/xxxx/FDIS 51/xxxx/RVD
105
106 Full information on the voting for its approval can be found in the report on voting indicated in
107 the above table.
108 The language used for the development of this International Standard is English.
109 This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
110 accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
111 at https://www.iec.ch/members_experts/refdocs. The main document types developed by IEC
112 are described in greater detail at https://www.iec.ch/standardsdev/publications.
113 A list of all parts of IEC 62024 series, published under the general title High frequency inductive
114 components – Electrical characteristics and measuring methods can be found on the IEC
115 website.
116 The committee has decided that the contents of this document will remain unchanged until the
117 stability date indicated on the IEC website under webstore.iec.ch in the data related to the
118 specific document. At this date, the document will be
119 • reconfirmed,
120 • withdrawn,
121 • replaced by a revised edition, or
122 • amended.
123
124
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125 HIGH FREQUENCY INDUCTIVE COMPONENTS –
126 ELECTRICAL CHARACTERISTICS AND MEASURING METHODS –
127
128 Part 2: Rated current of inductors for DC-to-DC converters
129 1 Scope
130 This part of IEC 62024 specifies the measuring methods of the rated direct current limits for
131 small inductors as defined below.
132 Standardized measuring methods for the determination of ratings enable users to accurately
133 compare the current ratings given in various manufacturers’ data books.
134 This document is applicable to leaded and surface mount inductors with dimensions according
135 to IEC 62025-1 and generally with rated current less than 125 A, although inductors with rated
136 current greater than 125 A are available that fall within the dimension restrictions of this
2
137 document (no larger than a 625 mm footprint). These inductors are typically used in DC-to-DC
138 converters built on PCBs, for electronic and telecommunication equipment, and small size
139 switching power supply units.
140 The measuring methods are defined by the saturation and temperature rise limitations induced
141 solely by direct current.
142 2 Normative references
143 The following documents are referred to in the text in such a way that some or all of their content
144 constitutes requirements of this document. For dated references, only the edition cited applies.
145 For undated references, the latest edition of the referenced document (including any
146 amendments) applies.
147 IEC 60068-1:2013, Environmental testing – Part 1: General and guidance
148 3 Terms and definitions
149 For the purposes of this document, the following terms and definitions apply.
150 ISO and IEC maintain terminological databases for use in standardization at the following
151 addresses:
152 • IEC Electropedia: available at http://www.electropedia.org/
153 • ISO Online browsing platform: available at http://www.iso.org/obp
154 3.1
155 DC saturation limited current
156 allowable value of DC current for which the decrease of the inductance is within the specified
157 value
158 3.2
159 temperature rise limited current
160 allowable value of DC current for which the self-generation heat of the inductor results in
161 temperature rise within the specified value
162 4 Standard atmospheric conditions
163 4.1 Standard atmospheric conditions for testing
164 Standard atmospheric conditions for testing shall be as follows (see 4.3 of IEC 60068-1:2013):
165 – temperature: 15 °C to 35 °C;
166 – relative humidity: 25 % to 75 %;
167 – air pressure: 86 kPa to 106 kPa.
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168 In the event of dispute or where required, the measurements shall be repeated using the referee
169 temperatures and such other conditions as given in 4.2.
170 4.2 Reference conditions
171 For reference purposes, one of the standard atmospheric conditions for referee tests taken from
172 4.2 of IEC 60068-1:2013 shall be selected and shall be as follows:
173 – temperature: 20 °C ± 2 °C;
174 – relative humidity: 60 % to 70 %;
175 – air pressure: 86 kPa to 106 kPa.
176 5 Measuring method of DC saturation limited current
177 5.1 General
178 When alternating current in which DC current is superimposed is supplied to an inductor, the
179 inductance of the inductor decreases according to the DC current value.
180 In a typical application, the saturation current results from the peak current of the superposition
181 of AC on DC current. In this document, the saturation current is measured as DC current
182 offsetting a small signal AC current.
183 NOTE It is not practical to set a standard for AC saturation limited current, because there is an unlimited number
184 of different ways to apply AC current in an application. Therefore, manufacturers and users have generally defined
185 DC saturation limited current as a common point of reference. This document does the same.
186 5.2 Test conditions
187 Unless otherwise specified in the detail specification, the test conditions shall be in accordance
188 with Clause 4.
189 NOTE The variation of the value of DC saturation limited current, as a function of temperature, is dependent on the
190 magnetic material and the structure of the magnetic core of the inductor. However, measurement of DC saturating
191 currents at elevated temperatures is generally not practical for inspection purposes. Therefore, the measurement at
192 room temperature as provided by this document is generally applied for specification purposes. De-rating curves
193 indicating variation of DC saturation limited current as a function of maximum operating temperature of the inductor
194 can be generated. These curves can be used to correlate the DC saturation limited current at room temperature to
195 the DC saturation limited current at typical operating temperatures. In some cases, it will become necessary for the
196 manufacturer and user to agree on an additional specification at a high temperature such as 85 °C, 105 °C or 125 °C.
197 5.3 Measuring circuit and calculation
198 5.3.1 Measuring circuit
199 The measuring circuit is as shown in Figure 1.
200
201
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202 Key
203 Components
204 R source resistor R = R
s s
205 R range resistor R = R
r r
206 V voltmeter
1
207 V voltmeter
2
208 E RMS voltage value measured by voltmeter V
1
1
209 RMS voltage value measured by voltmeter V
E 2
2
210 E RMS voltage value of source
s
211 C DC current blocking capacitor
212 Supplies
213 f frequency of source
s
214 I supplied current to range resistor
r
215 I supplied current to specimen
x
216 I = I
x r
217 Figure 1 – Inductance measuring circuit under application of
218 DC saturation condition
219 5.3.2 Calculation
220 Voltages E and E shall be measured when frequency f and voltage E of the signal generator
1 2 s s
221 are supplied in accordance with the detail specification, and an initial value of the inductance
222 shall be calculated by the following formulae.
E −E
11
223 ZR
xr
IE
r 2
224 𝑍𝑍 = |𝑍𝑍 |cos𝜃𝜃 +𝑗𝑗|𝑍𝑍 |sin𝜃𝜃
𝑥𝑥 𝑥𝑥 𝑥𝑥
225 Z R+ jX
xx x
XX
xx
226
L
x
ωπ2 f
s
227 where
228 R is the resistance of the specimen;
x
229 X is the reactance of the specimen;
x
230 Z is the impedance of the specimen;
x
231 L is the equivalent series inductance of the specimen;
x
232 E is the applied voltage to the specimen;
1
233 E is the applied voltage to the range resistor (= I R );
2 r r
234 θ is the phase angle of the complex impedance
.
235 5.4 Attachment jig of inductor
236 The attachment jig of the specimen shall be specified in a detail specification (see Clause 8) .
237 5.5 Measuring method
238 a) A short compensation shall be done before measurement.
239 b) The specimen shall be connected to the circuit shown in Figure 1, by using the attachment
240 jig specified in 5.4.
241 c) When the specimen is connected by soldering, it shall be left until it becomes cool enough.
==
=
==
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242 d) Voltages E and E shall be measured when frequency f and voltage E of the signal
1 2 s s
243 generator are supplied in accordance with the detail specification, and an initial value of the
244 inductance shall be calculated by the formulae of 5.3.2.
245 e) The value of the DC current that is superimposed on the specimen shall be modulated and
246 the inductance value shall be measured.
247 f) The decrease from the initial value of the inductance shall be calculated. DC saturation
248 limited current shall be determined by measuring the DC current when the decrease in
249 inductance matches the specified value in the detail specification.
250 g) The decrease in inductance that is specified in the detail specification should be 10 % or
251 30 %.
252 NOTE 10 % is one of the design points typical for sharp-saturating inductors, and 30 % is one of the design points
253 typical for soft-saturating inductors. See Annex A.
254 5.6 Quality conformance inspection
255 The DC current specified in the detail specification shall be supplied to a specimen in
256 accordance with the methods specified in 5.3 to 5.5, and then inductance shall be measured.
257 The decrease in inductance shall be within the specified value.
258 6 Measuring method of temperature rise limited current
259 6.1 General
260 When DC current is supplied to an inductor, the inductor generates heat by itself according to
261 the supplied DC current value because of its DC current resistance.
262 NOTE 1 Temperature rise results from self-heating of the inductor. The sources of heating are DC copper losses,
263 AC copper losses and AC core losses. This document defines the temperature rise induced only by DC currents. In
264 actual operating conditions, it is necessary to consider AC copper losses and AC core losses for the temperature
265 rise. AC losses are highly affected by waveform, amplitude and frequency.
266 NOTE 2 It is not practical to set a standard for AC temperature rise limited current, because there is an unlimited
267 number of different ways to apply AC current in an application. Therefore, manufacturers and users have generally
268 defined DC temperature rise limited current as a common point of reference. This document does the same.
269 6.2 Test conditions
270 Unless otherwise specified in the detail specification, for example an elevated ambient
271 temperature, the test conditions shall be in accordance with Clause 4.
272 Since the value of DC current resistance increases as a function of temperature, some
273 applications require a high ambient temperature such as 85 °C, 105 °C or 125 °C for the
274 temperature rise test.
275 NOTE 1 The overall power loss of an inductor is a combination of DC power loss due to DC current resistance, as
276 well as AC power loss due to AC current in the windings and losses due to the corresponding AC flux induced in the
277 magnetic core. The value of AC and DC current resistance (the conductor resistance) increases with temperature,
278 thus the power loss associated with conductor resistance increases with temperature. The loss associated with the
279 magnetic core is all due to AC excitation. The core loss decreases with increasing temperature up to a temperature
280 typically referred to as the core loss minima temperature, above which point this loss begins to increase. The minima
281 temperature and magnitude of loss are dependent on the magnetic material type and grade. Some magnetic materials
282 components exhibits sharp minima temperature. These factors are considered when applying temperature rise
283 currents to applications with high operating temperatures and a non-trivial amount of AC power loss in addition to
284 DC power loss. The overall total loss at any given temperature can be dominated by DC loss or AC loss depending
285 on the power loss distribution at room temperature as well as the variation of each of these power losses with
286 temperature.
287 NOTE 2 Regarding DC temperature rise limited currents at high temperatures, the variation in DC temperature rise
288 limited current with ambient temperature variation can be modelled. Measurement at room temperature is commonly
289 applied for detail specifications. In any event, the ambient temperature for the test is specified in the detail
290 specification.
291 6.3 Measuring jig
292 6.3.1 General
293 The measuring jig shall be either printed-wiring board method given in 6.3.2 or lead wire method
294 given in 6.3.3, and shall be specified in the detail specification.
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295 6.3.2 Printed-wiring board method
296 The printed-wiring board shall be made of epoxide woven glass (FR4). Unless otherwise
297 specified in the detail specification, the dimensions shall be as shown in Table 1, Table 2 and
298 Figure 2.
299 Table 1 – Width of circuits
Rated Rated current Pattern width Pattern Test board Example application
current of inductor W thickness
class I t μm
mm
A
I 35 ± 10 Figure 2 a) Low heat dissipation
I ≤ 1 1,0 ± 0,2
class A
environments
Figure 2 g)
1< I ≤ 2 2,0 ± 0,2
2 < I ≤ 3 3,0 ± 0,3
3 < I ≤ 5 5,0 ± 0,3
5 < I ≤ 7 7,0 ± 0,5
7 < I ≤ 11 11,0 ± 0,5
11 < I ≤ 16 16,0 ± 0,5
16 < I ≤ 22 22,0 ± 0,5
I I ≤ 22 40,0 ± 0,5 Figure 2 b) Standard heat dissipation
class B
environments
Figure 2 c)
Figure 2 d)
I I ≤ 46 105 ± 10 High heat dissipation
Figure 2 h)
class C
environments
I I ≤ 125 1 000 ± 50 Figure 2 b) Very high heat dissipation
class D
Figure 2 e) environments
Figure 2 f)
Figure 2 i)
Figure 2 j)
NOTE Winding cable to board: See Table 2.
300
301
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302 Dimensions in millimetres
100 ± 1
10 ± 0,5
80 ± 1
0,035 ± 0,01
2 ± 0,1 2 ± 0,1
1 ± 0,1
2 ± 0,1
30 ± 0,5
b c
0,2 ± 0,1 0,2 ± 0,1
303
304 a) Example of printed-wiring board for SMD type (I class A)
305
306 Dimension in millimetres
307
f : 12 ± 0,5
4 f : 12 ± 0,5
5
308
80 ± 1
f : 10 ± 0,5
3
309
310
311
312
313
314
315
316
317
318
319
t
e :2 ± 0,1
2
320
e :2 ± 0,1
1 1 ± 0,1
321
b c
322
323
324
325
326
327
328
329
330
331
332
333 b) Example of printed-wiring board for SMD type (I class B, C, D)
e3: 2 ± 0,1
a
W
a
5 ± 0,5
20 ± 0,5
f : 19 ± 0,5
1
40 ± 1
20 ± 0,5
f : 21 ± 0,5
2
40 ± 1
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334 Dimension in millimetres
100 ± 1
f : 12 ± 0,5
f : 12 ± 0,5
5
4
f : 10 ± 0,5 80 ± 1
3
e :2 ± 0,1
2 t
e :2 ± 0,1
1
1 ± 0,1
b
0,5 ± 0,1
0,5 ± 0,1
0,5 ± 0,1
335
336 c) Example of printed-wiring board for SMD type (I class B, C)
337
338
e : 2 ± 0,1
3
a
f : 19 ± 0,5
1
20 ± 0,5
19 ± 0,5 f : 21 ± 0,5
2
40 ± 1
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339 Dimensions in millimetres
100 ± 1
5.5 ± 0,5
5.5 ± 0,5
Φ5.3 ± 0,1
Φ5.3 ± 0,1
e : 2 ± 0,1
2 t
e : 2 ± 0,1
1
1 ± 0,1
340
341
342 Note Install crimp terminals suitable for the wire size. (See Table 2.)
343 d) Example of printed-wiring board for SMD type (I class B,C)
344
345 Dimensions in millimetres
100 ± 1
5.5 ± 0,5 5.5 ± 0,5
Φ5.3 ± 0,1
Φ5.3 ± 0,1
e
...
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