Digital Enhanced Cordless Telecommunications (DECT); Integrated Services Digital Network (ISDN); DECT/ISDN interworking for intermediate system configuration; Part 3: Profile Specific Test Specification (PSTS) for Fixed radio Termination (FT)

Profile Specific Test Specification (PSTS) for voluntary testing of terminals complying to DE/RES-03039 (DECT/ISDN ISC).

Digitalne izboljšane brezvrvične telekomunikacije (DECT) - Digitalno omrežje z integriranimi storitvami (ISDN) - Vzajemno delovanje DECT/ISDN v obliki posredovalnega sistema - 3. del: Preskuševalna specifikacija, odvisna od profila (PSTS), za fiksno radijsko zaključitev (FT)

General Information

Status
Published
Publication Date
31-Dec-1999
Current Stage
6060 - National Implementation/Publication (Adopted Project)
Start Date
01-Jan-2000
Due Date
01-Jan-2000
Completion Date
01-Jan-2000

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2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.REOLNLDigital Enhanced Cordless Telecommunications (DECT); Integrated Services Digital Network (ISDN); DECT/ISDN interworking for intermediate system configuration; Part 3: Profile Specific Test Specification (PSTS) for Fixed radio Termination (FT)33.080Digitalno omrežje z integriranimi storitvami (ISDN)Integrated Services Digital Network (ISDN)33.070.30'(&7Digital Enhanced Cordless Telecommunications (DECT)ICS:Ta slovenski standard je istoveten z:EN 301 614-3 V1.1.23SIST EN 301 614-3:en01-QRYHPEHr-3SIST EN 301 614-3:SLOVENSKI

STANDARD
SIST EN 301 614-3:2000

EN 301 614-3 V1.1.2 (1999-02)European Standard (Telecommunications series)Digital Enhanced Cordless Telecommunications (DECT);Integrated Services Digital Network (ISDN);DECT/ISDN interworking forintermediate system configuration;Part 3: Profile Specific Test Specification (PSTS) forFixed radio Termination (FT)SIST EN 301 614-3:2000

ETSIEN 301 614-3 V1.1.2 (1999-02)2ReferenceDEN/DECT-040104-3 (ey0r0idc.PDF)KeywordsDECT, ICS, ISDN, profileETSIPostal addressF-06921 Sophia Antipolis Cedex - FRANCEOffice address650 Route des Lucioles - Sophia AntipolisValbonne - FRANCETel.: +33 4 92 94 42 00

Fax: +33 4 93 65 47 16Siret N° 348 623 562 00017 - NAF 742 CAssociation à but non lucratif enregistrée à laSous-Préfecture de Grasse (06) N° 7803/88Internetsecretariat@etsi.frIndividual copies of this ETSI deliverablecan be downloaded fromhttp://www.etsi.orgIf you find errors in the present document, send yourcomment to: editor@etsi.frCopyright NotificationNo part may be reproduced except as authorized by written permission.The copyright and the foregoing restriction extend to reproduction in all media.© European Telecommunications Standards Institute 1999.All rights reserved.SIST EN 301 614-3:2000

ETSIEN 301 614-3 V1.1.2 (1999-02)3ContentsIntellectual Property Rights................................................................................................................................7Foreword............................................................................................................................................................71Scope........................................................................................................................................................82Normative references...............................................................................................................................83Definitions and abbreviations................................................................................................................103.1Definitions.......................................................................................................................................................103.2Abbreviations...................................................................................................................................................114DECT NWK layer protocol...................................................................................................................124.1Additional test purposes...................................................................................................................................124.1.1Additional test purposes for IIP CC specific behaviours............................................................................134.1.1.1Test group FT/CC/BV/IS......................................................................................................................134.2Abstract test method........................................................................................................................................134.3Relevant test cases...........................................................................................................................................134.4Additional test cases........................................................................................................................................154.5Modified test cases...........................................................................................................................................155DECT DLC layer protocol.....................................................................................................................165.1Additional test purposes...................................................................................................................................165.1.1Additional test purposes for C-plane Class B procedures..........................................................................175.1.1.1Test group CA......................................................................................................................................175.1.1.2Test group BV......................................................................................................................................195.1.1.3Test group BI........................................................................................................................................205.1.1.4Test group BO......................................................................................................................................215.1.2Additional test purposes for U-plane LU7 procedures...............................................................................225.1.2.1Test group BV......................................................................................................................................225.1.3Additional test purposes for U-plane LU8 procedures...............................................................................225.1.3.1Test group BV......................................................................................................................................225.2Abstract test method........................................................................................................................................235.3Relevant test cases...........................................................................................................................................235.4Additional test cases........................................................................................................................................235.4.1Additional test cases for C-plane Class B..................................................................................................235.4.2Additional test cases for U-plane LU7.......................................................................................................235.4.3Additional test cases for U-plane LU8.......................................................................................................235.5Modified test cases...........................................................................................................................................236DECT MAC layer protocol....................................................................................................................246.1Additional test purposes...................................................................................................................................246.1.1Additional test purposes for advanced symmetric connections..................................................................256.1.2Additional test purposes for C-plane switching procedures.......................................................................256.1.2.1Dynamic switching CF to CS: DIFS initiated.......................................................................................256.1.2.2Dynamic switching CS to CF: DIPS initiated.......................................................................................266.1.2.3Dynamic switching CS to CF: DIFS initiated.......................................................................................266.1.2.4Dynamic switching CSx to CSy: DIFS initiated...................................................................................276.1.3Additional test purposes for U-plane switching procedures.......................................................................276.1.3.1Connection handover procedure...........................................................................................................276.1.3.2Release of part of double slot procedure..............................................................................................276.2Abstract test method........................................................................................................................................286.3Relevant test cases...........................................................................................................................................286.4Additional test cases........................................................................................................................................296.4.1Additional test cases for advanced symmetric connections........................................................................296.4.2Additional test cases for C-plane switching procedures.............................................................................296.4.3Additional test cases for U-plane switching procedures.............................................................................296.5Modified test cases...........................................................................................................................................29SIST EN 301 614-3:2000

ETSIEN 301 614-3 V1.1.2 (1999-02)47DECT PHL layer protocol.....................................................................................................................297.1Additional test purposes...................................................................................................................................297.2Abstract test method........................................................................................................................................297.3Relevant test cases...........................................................................................................................................297.4Additional test cases........................................................................................................................................307.5Modified test cases...........................................................................................................................................308ISDN basic access protocols..................................................................................................................308.1Applicability of ATS........................................................................................................................................308.2Additional test purposes...................................................................................................................................308.3Abstract test method........................................................................................................................................308.4Relevant test cases...........................................................................................................................................309DECT/ISDN IIP profile.........................................................................................................................319.1Profile test suite structure.................................................................................................................................319.1.1Test groups.................................................................................................................................................319.1.1.1Functional modules...............................................................................................................................319.1.1.2Main test groups...................................................................................................................................319.1.1.2.1Capability (CA) tests.......................................................................................................................329.1.1.2.2Valid Behaviour (BV) tests.............................................................................................................329.1.1.2.3Inopportune Behaviour (BO) tests..................................................................................................329.1.1.2.4Invalid Behaviour (BI) tests............................................................................................................329.2Profile test purposes.........................................................................................................................................329.2.1TP definition conventions..........................................................................................................................329.2.2TP naming conventions..............................................................................................................................339.2.3Sources of TP definitions...........................................................................................................................349.2.4Test purposes for IWU Link Association Entity........................................................................................349.2.5Test purposes for IWU missing resource management..............................................................................359.2.6Test purposes for IWU Call Control specific procedures...........................................................................359.2.7Test purposes for call release procedures...................................................................................................369.3Profile Abstract Test Method (ATM)..............................................................................................................379.4Profile Untestable test purposes.......................................................................................................................389.5Profile ATS Conventions.................................................................................................................................389.5.1Declarations part naming conventions........................................................................................................389.5.1.1Type and structured type definitions.....................................................................................................389.5.1.2Operations definitions...........................................................................................................................389.5.1.3Parameter declarations..........................................................................................................................389.5.1.4Selection expression definitions...........................................................................................................399.5.1.5Constant declarations............................................................................................................................399.5.1.6Test suite variable declarations.............................................................................................................399.5.1.7Test case variable declarations.............................................................................................................399.5.1.8PCO declarations..................................................................................................................................399.5.1.9Timer declarations................................................................................................................................399.5.1.10ASP type definitions.............................................................................................................................409.5.1.11PDU type definitions............................................................................................................................409.5.1.12Alias definitions....................................................................................................................................409.5.2Constraints part naming conventions..........................................................................................................409.5.3Dynamic part naming conventions.............................................................................................................409.5.3.1Test Case identifier...............................................................................................................................419.5.3.2Test step identifier................................................................................................................................419.5.3.3Default identifier...................................................................................................................................419.5.3.4General aspects.....................................................................................................................................419.5.3.5ATS abbreviations................................................................................................................................429.5.4Declaration part implementation conventions............................................................................................429.5.5Constraint part implementation conventions..............................................................................................429.5.6Dynamic part implementation conventions................................................................................................429.5.7Documentation implementation conventions.............................................................................................439.6Test case and test purpose mapping.................................................................................................................43SIST EN 301 614-3:2000

ETSIEN 301 614-3 V1.1.2 (1999-02)5Annex A (normative):Profile Implementation eXtra Information for Testing (IXIT)proforma.........................................................................................................44A.1Identification summary..........................................................................................................................44A.2ATS summary........................................................................................................................................44A.3Test laboratory.......................................................................................................................................44A.4Client identification...............................................................................................................................45A.5SUT........................................................................................................................................................45A.6Profile information.................................................................................................................................46A.6.1NWK layer.......................................................................................................................................................46A.6.2DLC layer........................................................................................................................................................48A.6.3MAC layer.......................................................................................................................................................50Annex B (normative):Profile Conformance Test Report (Profile CTR) proforma.....................52B.1Identification summary..........................................................................................................................52B.1.1Protocol conformance test report.....................................................................................................................52B.1.2IUT identification............................................................................................................................................52B.1.3Testing environment........................................................................................................................................53B.1.4Limits and reservation......................................................................................................................................53B.1.5Comments........................................................................................................................................................53B.2IUT conformance status.........................................................................................................................53B.3Static conformance summary.................................................................................................................54B.4Dynamic conformance summary............................................................................................................54B.5Static conformance review report..........................................................................................................54B.6Test campaign report..............................................................................................................................55B.7Observations...........................................................................................................................................55Annex C (normative):System Conformance Test Report (SCTR) proforma...............................56C.1Identification summary..........................................................................................................................56C.1.1System conformance test report.......................................................................................................................56C.1.2Test laboratory.................................................................................................................................................56C.1.3Client identification.........................................................................................................................................57C.1.4System Under Test (SUT)................................................................................................................................57C.1.5Profile identification........................................................................................................................................57C.1.6Nature of conformance testing.........................................................................................................................58C.1.7Limits and reservations....................................................................................................................................58C.1.8Record of agreement........................................................................................................................................58C.1.9Comments........................................................................................................................................................59C.2System report summary for DECT/ISDN IIP FT...................................................................................59C.2.1Profile testing summary for DECT NWK layer protocol.................................................................................59C.2.2Profile testing summary for DECT DLC layer protocol..................................................................................60C.2.3Profile testing summary for DECT MAC layer protocol.................................................................................61C.2.4Profile testing summary for DECT PHL layer protocol...................................................................................62C.2.5Profile testing summary for ISDN L2, L1 basic access protocol.....................................................................63C.2.6Profile testing summary for DECT/ISDN IIP profile.......................................................................................64Annex D (normative):Profile eXtra Requirement List (XRL) proforma......................................65D.1Profile eXtra Requirement List for IIP - FT part...................................................................................65D.1.1Parameters for IWU layer................................................................................................................................65D.1.2Specific parameters for NWK layer.................................................................................................................66D.1.3Specific parameters for DLC layer..................................................................................................................67D.1.4Specific parameters for MAC layer.................................................................................................................67SIST EN 301 614-3:2000

ETSIEN 301 614-3 V1.1.2 (1999-02)6Annex E (normative):Modifications of the DECT CI PCTR proforma........................................68E.1Modifications of DECT NWK layer PCTR proforma...........................................................................68E.2Modifications of DECT DLC layer PCTR proforma.............................................................................71E.3Modifications of DECT MAC layer PCTR proforma...........................................................................74E.4Observations...........................................................................................................................................76Annex F (normative):Abstract Test Suite (ATS) - NWK layer......................................................77F.1The TTCN Graphical form (TTCN.GR)................................................................................................77F.2The TTCN Machine Processable form (TTCN.MP).............................................................................77Annex G (normative):Abstract Test Suite (ATS) - DLC layer.......................................................78G.1The TTCN Graphical form (TTCN.GR)................................................................................................78G.2The TTCN Machine Processable form (TTCN.MP).............................................................................78Annex H (normative):Abstract Test Suite (ATS) - MAC layer......................................................79H.1The TTCN Graphical form (TTCN.GR)................................................................................................79H.2The TTCN Machine Processable form (TTCN.MP).............................................................................79Annex J (normative):Abstract Test Suite (ATS) - Interworking Unit..........................................80J.1The TTCN Graphical form (TTCN.GR)................................................................................................80J.2The TTCN Machine Processable form (TTCN.MP).............................................................................80History..............................................................................................................................................................81SIST EN 301 614-3:2000

ETSIEN 301 614-3 V1.1.2 (1999-02)7Intellectual Property RightsIPRs essential or potentially essential to the present document may have been declared to ETSI. The informationpertaining to these essential IPRs, if any, is publicly available for ETSI members and non-members, and can be foundin SR 000 314: "Intellectual Property Rights (IPRs); Essential, or potentially Essential, IPRs notified to ETSI in respectof ETSI standards", which is available free of charge from the ETSI Secretariat. Latest updates are available on theETSI Web server (http://www.etsi.org/ipr).Pursuant to the ETSI IPR Policy, no investigation, including IPR searches, has been carried out by ETSI. No guaranteecan be given as to the existence of other IPRs not referenced in SR 000 314 (or the updates on the ETSI Web server)which are, or may be, or may become, essential to the present document.ForewordThis European Standard (Telecommunications series) has been produced by ETSI Project Digital Enhanced CordlessTelecommunications (DECT).The present document is part 3 of a multi-part EN covering the DECT/ISDN interworking for intermediate systemconfiguration, as identified below:Part 1:"Profile Test Specification (PTS) summary";Part 2:"Profile Specific Test Specification (PSTS) for Portable radio Termination (PT)";Part 3:"Profile Specific Test Specification (PSTS) for Fixed radio Termination (FT)".National transposition datesDate of adoption of this EN:25 December 1998Date of latest announcement of this EN (doa):31 March 1999Date of latest publication of new National Standardor endorsement of this EN (dop/e):30 September 1999Date of withdrawal of any conflicting National Standard (dow):30 September 1999SIST EN 301 614-3:2000

ETSIEN 301 614-3 V1.1.2 (1999-02)81ScopeThe present document contains the test specification for Digital Enhanced Cordless Telecommunications/IntegratedServices Digital Network (DECT/ISDN) Interworking for Intermediate system Profile (IIP) Fixed Part (FP) applicationsas specified in ETS 300 822 [6].This test specification provides conformance tests for DECT/ISDN terminal equipment conforming to ETS 300 822 [6].The main objective is to perform a high probability of inter-operability between the DECT/ISDN terminal equipmentand an ISDN network. The D

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2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.REOLNLDigital Enhanced Cordless Telecommunications (DECT); Integrated Services Digital Network (ISDN); DECT/ISDN interworking for intermediate system configuration; Part 3: Profile Specific Test Specification (PSTS) for Fixed radio Termination (FT)33.080Digitalno omrežje z integriranimi storitvami (ISDN)Integrated Services Digital Network (ISDN)33.070.30'(&7Digital Enhanced Cordless Telecommunications (DECT)ICS:Ta slovenski standard je istoveten z:EN 301 614-3 Version 1.1.2SIST EN 301 614-3:2000en01-januar-2000SIST EN 301 614-3:2000SLOVENSKI

STANDARD
SIST EN 301 614-3:2000

EN 301 614-3 V1.1.2 (1999-02)European Standard (Telecommunications series)Digital Enhanced Cordless Telecommunications (DECT);Integrated Services Digital Network (ISDN);DECT/ISDN interworking forintermediate system configuration;Part 3: Profile Specific Test Specification (PSTS) forFixed radio Termination (FT)SIST EN 301 614-3:2000

ETSIEN 301 614-3 V1.1.2 (1999-02)2ReferenceDEN/DECT-040104-3 (ey0r0idc.PDF)KeywordsDECT, ICS, ISDN, profileETSIPostal addressF-06921 Sophia Antipolis Cedex - FRANCEOffice address650 Route des Lucioles - Sophia AntipolisValbonne - FRANCETel.: +33 4 92 94 42 00

Fax: +33 4 93 65 47 16Siret N° 348 623 562 00017 - NAF 742 CAssociation à but non lucratif enregistrée à laSous-Préfecture de Grasse (06) N° 7803/88Internetsecretariat@etsi.frIndividual copies of this ETSI deliverablecan be downloaded fromhttp://www.etsi.orgIf you find errors in the present document, send yourcomment to: editor@etsi.frCopyright NotificationNo part may be reproduced except as authorized by written permission.The copyright and the foregoing restriction extend to reproduction in all media.© European Telecommunications Standards Institute 1999.All rights reserved.SIST EN 301 614-3:2000

ETSIEN 301 614-3 V1.1.2 (1999-02)3ContentsIntellectual Property Rights................................................................................................................................7Foreword............................................................................................................................................................71Scope........................................................................................................................................................82Normative references...............................................................................................................................83Definitions and abbreviations................................................................................................................103.1Definitions.......................................................................................................................................................103.2Abbreviations...................................................................................................................................................114DECT NWK layer protocol...................................................................................................................124.1Additional test purposes...................................................................................................................................124.1.1Additional test purposes for IIP CC specific behaviours............................................................................134.1.1.1Test group FT/CC/BV/IS......................................................................................................................134.2Abstract test method........................................................................................................................................134.3Relevant test cases...........................................................................................................................................134.4Additional test cases........................................................................................................................................154.5Modified test cases...........................................................................................................................................155DECT DLC layer protocol.....................................................................................................................165.1Additional test purposes...................................................................................................................................165.1.1Additional test purposes for C-plane Class B procedures..........................................................................175.1.1.1Test group CA......................................................................................................................................175.1.1.2Test group BV......................................................................................................................................195.1.1.3Test group BI........................................................................................................................................205.1.1.4Test group BO......................................................................................................................................215.1.2Additional test purposes for U-plane LU7 procedures...............................................................................225.1.2.1Test group BV......................................................................................................................................225.1.3Additional test purposes for U-plane LU8 procedures...............................................................................225.1.3.1Test group BV......................................................................................................................................225.2Abstract test method........................................................................................................................................235.3Relevant test cases...........................................................................................................................................235.4Additional test cases........................................................................................................................................235.4.1Additional test cases for C-plane Class B..................................................................................................235.4.2Additional test cases for U-plane LU7.......................................................................................................235.4.3Additional test cases for U-plane LU8.......................................................................................................235.5Modified test cases...........................................................................................................................................236DECT MAC layer protocol....................................................................................................................246.1Additional test purposes...................................................................................................................................246.1.1Additional test purposes for advanced symmetric connections..................................................................256.1.2Additional test purposes for C-plane switching procedures.......................................................................256.1.2.1Dynamic switching CF to CS: DIFS initiated.......................................................................................256.1.2.2Dynamic switching CS to CF: DIPS initiated.......................................................................................266.1.2.3Dynamic switching CS to CF: DIFS initiated.......................................................................................266.1.2.4Dynamic switching CSx to CSy: DIFS initiated...................................................................................276.1.3Additional test purposes for U-plane switching procedures.......................................................................276.1.3.1Connection handover procedure...........................................................................................................276.1.3.2Release of part of double slot procedure..............................................................................................276.2Abstract test method........................................................................................................................................286.3Relevant test cases...........................................................................................................................................286.4Additional test cases........................................................................................................................................296.4.1Additional test cases for advanced symmetric connections........................................................................296.4.2Additional test cases for C-plane switching procedures.............................................................................296.4.3Additional test cases for U-plane switching procedures.............................................................................296.5Modified test cases...........................................................................................................................................29SIST EN 301 614-3:2000

ETSIEN 301 614-3 V1.1.2 (1999-02)47DECT PHL layer protocol.....................................................................................................................297.1Additional test purposes...................................................................................................................................297.2Abstract test method........................................................................................................................................297.3Relevant test cases...........................................................................................................................................297.4Additional test cases........................................................................................................................................307.5Modified test cases...........................................................................................................................................308ISDN basic access protocols..................................................................................................................308.1Applicability of ATS........................................................................................................................................308.2Additional test purposes...................................................................................................................................308.3Abstract test method........................................................................................................................................308.4Relevant test cases...........................................................................................................................................309DECT/ISDN IIP profile.........................................................................................................................319.1Profile test suite structure.................................................................................................................................319.1.1Test groups.................................................................................................................................................319.1.1.1Functional modules...............................................................................................................................319.1.1.2Main test groups...................................................................................................................................319.1.1.2.1Capability (CA) tests.......................................................................................................................329.1.1.2.2Valid Behaviour (BV) tests.............................................................................................................329.1.1.2.3Inopportune Behaviour (BO) tests..................................................................................................329.1.1.2.4Invalid Behaviour (BI) tests............................................................................................................329.2Profile test purposes.........................................................................................................................................329.2.1TP definition conventions..........................................................................................................................329.2.2TP naming conventions..............................................................................................................................339.2.3Sources of TP definitions...........................................................................................................................349.2.4Test purposes for IWU Link Association Entity........................................................................................349.2.5Test purposes for IWU missing resource management..............................................................................359.2.6Test purposes for IWU Call Control specific procedures...........................................................................359.2.7Test purposes for call release procedures...................................................................................................369.3Profile Abstract Test Method (ATM)..............................................................................................................379.4Profile Untestable test purposes.......................................................................................................................389.5Profile ATS Conventions.................................................................................................................................389.5.1Declarations part naming conventions........................................................................................................389.5.1.1Type and structured type definitions.....................................................................................................389.5.1.2Operations definitions...........................................................................................................................389.5.1.3Parameter declarations..........................................................................................................................389.5.1.4Selection expression definitions...........................................................................................................399.5.1.5Constant declarations............................................................................................................................399.5.1.6Test suite variable declarations.............................................................................................................399.5.1.7Test case variable declarations.............................................................................................................399.5.1.8PCO declarations..................................................................................................................................399.5.1.9Timer declarations................................................................................................................................399.5.1.10ASP type definitions.............................................................................................................................409.5.1.11PDU type definitions............................................................................................................................409.5.1.12Alias definitions....................................................................................................................................409.5.2Constraints part naming conventions..........................................................................................................409.5.3Dynamic part naming conventions.............................................................................................................409.5.3.1Test Case identifier...............................................................................................................................419.5.3.2Test step identifier................................................................................................................................419.5.3.3Default identifier...................................................................................................................................419.5.3.4General aspects.....................................................................................................................................419.5.3.5ATS abbreviations................................................................................................................................429.5.4Declaration part implementation conventions............................................................................................429.5.5Constraint part implementation conventions..............................................................................................429.5.6Dynamic part implementation conventions................................................................................................429.5.7Documentation implementation conventions.............................................................................................439.6Test case and test purpose mapping.................................................................................................................43SIST EN 301 614-3:2000

ETSIEN 301 614-3 V1.1.2 (1999-02)5Annex A (normative):Profile Implementation eXtra Information for Testing (IXIT)proforma.........................................................................................................44A.1Identification summary..........................................................................................................................44A.2ATS summary........................................................................................................................................44A.3Test laboratory.......................................................................................................................................44A.4Client identification...............................................................................................................................45A.5SUT........................................................................................................................................................45A.6Profile information.................................................................................................................................46A.6.1NWK layer.......................................................................................................................................................46A.6.2DLC layer........................................................................................................................................................48A.6.3MAC layer.......................................................................................................................................................50Annex B (normative):Profile Conformance Test Report (Profile CTR) proforma.....................52B.1Identification summary..........................................................................................................................52B.1.1Protocol conformance test report.....................................................................................................................52B.1.2IUT identification............................................................................................................................................52B.1.3Testing environment........................................................................................................................................53B.1.4Limits and reservation......................................................................................................................................53B.1.5Comments........................................................................................................................................................53B.2IUT conformance status.........................................................................................................................53B.3Static conformance summary.................................................................................................................54B.4Dynamic conformance summary............................................................................................................54B.5Static conformance review report..........................................................................................................54B.6Test campaign report..............................................................................................................................55B.7Observations...........................................................................................................................................55Annex C (normative):System Conformance Test Report (SCTR) proforma...............................56C.1Identification summary..........................................................................................................................56C.1.1System conformance test report.......................................................................................................................56C.1.2Test laboratory.................................................................................................................................................56C.1.3Client identification.........................................................................................................................................57C.1.4System Under Test (SUT)................................................................................................................................57C.1.5Profile identification........................................................................................................................................57C.1.6Nature of conformance testing.........................................................................................................................58C.1.7Limits and reservations....................................................................................................................................58C.1.8Record of agreement........................................................................................................................................58C.1.9Comments........................................................................................................................................................59C.2System report summary for DECT/ISDN IIP FT...................................................................................59C.2.1Profile testing summary for DECT NWK layer protocol.................................................................................59C.2.2Profile testing summary for DECT DLC layer protocol..................................................................................60C.2.3Profile testing summary for DECT MAC layer protocol.................................................................................61C.2.4Profile testing summary for DECT PHL layer protocol...................................................................................62C.2.5Profile testing summary for ISDN L2, L1 basic access protocol.....................................................................63C.2.6Profile testing summary for DECT/ISDN IIP profile.......................................................................................64Annex D (normative):Profile eXtra Requirement List (XRL) proforma......................................65D.1Profile eXtra Requirement List for IIP - FT part...................................................................................65D.1.1Parameters for IWU layer................................................................................................................................65D.1.2Specific parameters for NWK layer.................................................................................................................66D.1.3Specific parameters for DLC layer..................................................................................................................67D.1.4Specific parameters for MAC layer.................................................................................................................67SIST EN 301 614-3:2000

ETSIEN 301 614-3 V1.1.2 (1999-02)6Annex E (normative):Modifications of the DECT CI PCTR proforma........................................68E.1Modifications of DECT NWK layer PCTR proforma...........................................................................68E.2Modifications of DECT DLC layer PCTR proforma.............................................................................71E.3Modifications of DECT MAC layer PCTR proforma...........................................................................74E.4Observations...........................................................................................................................................76Annex F (normative):Abstract Test Suite (ATS) - NWK layer......................................................77F.1The TTCN Graphical form (TTCN.GR)................................................................................................77F.2The TTCN Machine Processable form (TTCN.MP).............................................................................77Annex G (normative):Abstract Test Suite (ATS) - DLC layer.......................................................78G.1The TTCN Graphical form (TTCN.GR)................................................................................................78G.2The TTCN Machine Processable form (TTCN.MP).............................................................................78Annex H (normative):Abstract Test Suite (ATS) - MAC layer......................................................79H.1The TTCN Graphical form (TTCN.GR)................................................................................................79H.2The TTCN Machine Processable form (TTCN.MP).............................................................................79Annex J (normative):Abstract Test Suite (ATS) - Interworking Unit..........................................80J.1The TTCN Graphical form (TTCN.GR)................................................................................................80J.2The TTCN Machine Processable form (TTCN.MP).............................................................................80History..............................................................................................................................................................81SIST EN 301 614-3:2000

ETSIEN 301 614-3 V1.1.2 (1999-02)7Intellectual Property RightsIPRs essential or potentially essential to the present document may have been declared to ETSI. The informationpertaining to these essential IPRs, if any, is publicly available for ETSI members and non-members, and can be foundin SR 000 314: "Intellectual Property Rights (IPRs); Essential, or potentially Essential, IPRs notified to ETSI in respectof ETSI standards", which is available free of charge from the ETSI Secretariat. Latest updates are available on theETSI Web server (http://www.etsi.org/ipr).Pursuant to the ETSI IPR Policy, no investigation, including IPR searches, has been carried out by ETSI. No guaranteecan be given as to the existence of other IPRs not referenced in SR 000 314 (or the updates on the ETSI Web server)which are, or may be, or may become, essential to the present document.ForewordThis European Standard (Telecommunications series) has been produced by ETSI Project Digital Enhanced CordlessTelecommunications (DECT).The present document is part 3 of a multi-part EN covering the DECT/ISDN interworking for intermediate systemconfiguration, as identified below:Part 1:"Profile Test Specification (PTS) summary";Part 2:"Profile Specific Test Specification (PSTS) for Portable radio Termination (PT)";Part 3:"Profile Specific Test Specification (PSTS) for Fixed radio Termination (FT)".National transposition datesDate of adoption of this EN:25 December 1998Date of latest announcement of this EN (doa):31 March 1999Date of latest publication of new National Standardor endorsement of this EN (dop/e):30 September 1999Date of withdrawal of any conflicting National Standard (dow):30 September 1999SIST EN 301 614-3:2000

ETSIEN 301 614-3 V1.1.2 (1999-02)81ScopeThe present document contains the test specification for Digital Enhanced Cordless Telecommunications/IntegratedServices Digital Network (DECT/ISDN) Interworking for Intermediate system Profile (IIP) Fixed Part (FP) applicationsas specified in ETS 300 822 [6].This test specification provides conformance tests for DECT/ISDN terminal equipment conforming to ETS 300 822 [6].The main objective is to perform a high probability of inter-operability between the DECT/ISDN terminal equipmentand an ISDN

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