SIST-TS CEN ISO/TS 23302:2022
(Main)Nanotechnologies - Requirements and recommendations for the identification of measurands that characterise nano-objects and materials that contain them (ISO/TS 23302:2021)
Nanotechnologies - Requirements and recommendations for the identification of measurands that characterise nano-objects and materials that contain them (ISO/TS 23302:2021)
This document specifies requirements and recommendations for the identification of measurands to characterize nano-objects and their agglomerates and aggregates, and to assess specific properties relevant to the performance of materials that contain them. It provides recommendations for relevant measurement.
Nanotechnologien - Anforderungen und Empfehlungen zur Identifizierung von Messgrößen zur Charakterisierung von Nanoobjekten und von Werkstoffen, die welche enthalten (ISO/TS 23302:2021)
Dieses Dokument legt Anforderungen und Empfehlungen für die Identifizierung von Messgrößen zur Charak¬terisierung von Nanoobjekten und deren Agglomeraten und Aggregaten fest, und für die Bewertung spezifischer Eigenschaften, die für die Leistung von Materialien maßgebend sind, welche diese enthalten. Es stellt Empfehlungen für relevante Messungen zur Verfügung.
Nanotechnologies - Exigences et recommandations pour l’identification des mesurandes qui caractérisent les nano-objets et les matériaux les contenant (ISO/TS 23302:2021)
Nanotehnologija - Zahteve in priporočila za identifikacijo merjenih veličin, ki označujejo nanopredmete in materiale, ki jih vsebujejo (ISO/TS 23302:2021)
Ta dokument določa zahteve in priporočila za identifikacijo merjenih veličin, ki označujejo nanopredmete ter njihove aglomerate in agregate, ter za ocenjevanje določenih lastnosti, pomembnih za učinkovitost materialov, ki jih vsebujejo. Podaja priporočila za ustrezne meritve.
General Information
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Standards Content (Sample)
SLOVENSKI STANDARD
SIST-TS CEN ISO/TS 23302:2022
01-november-2022
Nadomešča:
SIST-TS CEN/TS 17010:2017
Nanotehnologija - Zahteve in priporočila za identifikacijo merjenih veličin, ki
označujejo nanopredmete in materiale, ki jih vsebujejo (ISO/TS 23302:2021)
Nanotechnologies - Requirements and recommendations for the identification of
measurands that characterise nano-objects and materials that contain them (ISO/TS
23302:2021)
Nanotechnologien - Anforderungen und Empfehlungen zur Identifizierung von
Messgrößen zur Charakterisierung von Nanoobjekten und von Werkstoffen, die welche
enthalten (ISO/TS 23302:2021)
Nanotechnologies - Exigences et recommandations pour l’identification des mesurandes
qui caractérisent les nano-objets et les matériaux les contenant (ISO/TS 23302:2021)
Ta slovenski standard je istoveten z: CEN ISO/TS 23302:2022
ICS:
07.120 Nanotehnologije Nanotechnologies
SIST-TS CEN ISO/TS 23302:2022 en,fr,de
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
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SIST-TS CEN ISO/TS 23302:2022
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SIST-TS CEN ISO/TS 23302:2022
CEN ISO/TS 23302
TECHNICAL SPECIFICATION
SPÉCIFICATION TECHNIQUE
September 2022
TECHNISCHE SPEZIFIKATION
ICS 07.120 Supersedes CEN/TS 17010:2016
English Version
Nanotechnologies - Requirements and recommendations
for the identification of measurands that characterise
nano-objects and materials that contain them (ISO/TS
23302:2021)
Nanotechnologies - Exigences et recommandations Nanotechnologien - Anforderungen und Empfehlungen
pour l'identification des mesurandes qui caractérisent zur Identifizierung von Messgrößen zur
les nano-objets et les matériaux les contenant (ISO/TS Charakterisierung von Nanoobjekten und von
23302:2021) Werkstoffen, die welche enthalten (ISO/TS
23302:2021)
This Technical Specification (CEN/TS) was approved by CEN on 5 September 2022 for provisional application.
The period of validity of this CEN/TS is limited initially to three years. After two years the members of CEN will be requested to
submit their comments, particularly on the question whether the CEN/TS can be converted into a European Standard.
CEN members are required to announce the existence of this CEN/TS in the same way as for an EN and to make the CEN/TS
available promptly at national level in an appropriate form. It is permissible to keep conflicting national standards in force (in
parallel to the CEN/TS) until the final decision about the possible conversion of the CEN/TS into an EN is reached.
CEN members are the national standards bodies of Austria, Belgium, Bulgaria, Croatia, Cyprus, Czech Republic, Denmark, Estonia,
Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway,
Poland, Portugal, Republic of North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland, Türkiye and
United Kingdom.
EUROPEAN COMMITTEE FOR STANDARDIZATION
COMITÉ EUROPÉEN DE NORMALISATION
EUROPÄISCHES KOMITEE FÜR NORMUNG
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels
© 2022 CEN All rights of exploitation in any form and by any means reserved Ref. No. CEN ISO/TS 23302:2022 E
worldwide for CEN national Members.
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CEN ISO/TS 23302:2022 (E)
Contents Page
European foreword . 3
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SIST-TS CEN ISO/TS 23302:2022
CEN ISO/TS 23302:2022 (E)
European foreword
The text of ISO/TS 23302:2021 has been prepared by Technical Committee ISO/TC 299
"Nanotechnologies” of the International Organization for Standardization (ISO) and has been taken over
as CEN ISO/TS 23302:2022 by Technical Committee CEN/TC 352 “Nanotechnologies” the secretariat of
which is held by AFNOR.
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CEN shall not be held responsible for identifying any or all such patent rights.
This document supersedes CEN/TS 17010:2016.
Any feedback and questions on this document should be directed to the users’ national standards body.
A complete listing of these bodies can be found on the CEN website.
According to the CEN-CENELEC Internal Regulations, the national standards organizations of the
following countries are bound to implement this European Standard: Austria, Belgium, Bulgaria,
Croatia, Cyprus, Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland,
Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Republic of
North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland, Türkiye and the
United Kingdom.
Endorsement notice
The text of ISO/TS 23302:2021 has been approved by CEN as CEN ISO/TS 23302:2022 without any
modification.
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SIST-TS CEN ISO/TS 23302:2022
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SIST-TS CEN ISO/TS 23302:2022
TECHNICAL ISO/TS
SPECIFICATION 23302
First edition
2021-11
Nanotechnologies — Requirements
and recommendations for the
identification of measurands that
characterise nano-objects and
materials that contain them
Nanotechnologies – Exigences et recommandations pour
l’identification des mesurandes qui caractérisent les nano-objets et les
matériaux les contenant
Reference number
ISO/TS 23302:2021(E)
© ISO 2021
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SIST-TS CEN ISO/TS 23302:2022
ISO/TS 23302:2021(E)
COPYRIGHT PROTECTED DOCUMENT
© ISO 2021
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may
be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting on
the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address below
or ISO’s member body in the country of the requester.
ISO copyright office
CP 401 • Ch. de Blandonnet 8
CH-1214 Vernier, Geneva
Phone: +41 22 749 01 11
Email: copyright@iso.org
Website: www.iso.org
Published in Switzerland
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© ISO 2021 – All rights reserved
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ISO/TS 23302:2021(E)
Contents Page
Foreword .vii
Introduction .viii
1 Scope . 1
2 Normative references . 1
3 Terms and definitions . 1
3.1 General core terms . 1
3.2 Measurand related terms. 3
4 Abbreviated terms . 6
5 Approaches to identify measurands to characterize nano-objects and their
agglomerates and aggregates, and materials containing nano-objects .9
5.1 Procedure . 9
5.2 Types of measurands . 10
5.3 State of nano-objects . 10
6 Measurands related to size and shape measurement of nano-objects and their
agglomerates and aggregates .11
6.1 General . 11
6.2 Measurands related to size and shape measurement. 11
6.2.1 Overview . 11
6.2.2 General relevant standards .12
6.3 Measurands related to size and shape measurement in aerosols .12
6.3.1 Overview . 12
6.3.2 General relevant standards . 13
6.3.3 Electrical low-pressure impaction . 13
6.3.4 Cascade impactors . 14
6.3.5 Differential mobility analysing system . 14
6.3.6 Relevant standards . 15
6.3.7 Optical particle counter .15
6.3.8 Relevant standards .15
6.3.9 Aerodynamic particle sizing . 15
6.3.10 TEM combined with TEM grid samplers . 15
6.3.11 Relevant standards . 16
6.3.12 Scanning electron microscopy . 16
6.3.13 Relevant standards . 17
6.4 Measurands related to size and shape measurement in powders . 17
6.4.1 Overview . 17
6.4.2 Relevant standards . 17
6.4.3 Scanning electron microscopy . 18
6.4.4 Relevant standards . 18
6.4.5 Gas adsorption, the BET method. 18
6.4.6 Relevant standard . 18
6.4.7 Laser diffraction . 18
6.4.8 Relevant standard . 19
6.4.9 X-ray diffraction . 19
6.4.10 Relevant standards . 19
6.4.11 Raman spectroscopy . 19
6.5 Measurands related to size and shape measurements of nano-objects in liquid
dispersions . 20
6.5.1 Overview . 20
6.5.2 Centrifugal liquid sedimentation . 21
6.5.3 Relevant standards . 21
6.5.4 Dynamic light scattering . 21
6.5.5 Relevant standards . 22
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6.5.6 Laser diffraction . 22
6.5.7 Relevant standard . 22
6.5.8 Small angle X-ray scattering . 22
6.5.9 Relevant standard .22
6.5.10 Particle tracking analysis . 22
6.5.11 Relevant standards .23
6.5.12 Electron microscopy .23
6.5.13 Field flow fractionation .23
6.5.14 Relevant standard . 24
6.5.15 Single particle ICP-MS . 24
6.5.16 Relevant standard .25
6.6 Measurands related to size and shape measurement on surfaces (microscopy
techniques) . 25
6.6.1 Overview . 25
6.6.2 Scanning electron microscopy . 25
6.6.3 Atomic force microscopy . 25
6.6.4 Relevant standards . 26
7 Measurands related to chemical analysis of nano-objects and their agglomerates
and aggregates .26
7.1 General . 26
7.2 Measurands related to surface chemical analysis of nano-objects and their
agglomerates and aggregates. 27
7.2.1 Measurands . 27
7.2.2 Auger electron spectroscopy .28
7.2.3 Relevant standards .28
7.2.4 Electron energy loss spectroscopy .28
7.2.5 Relevant standard .28
7.2.6 Secondary ion mass spectroscopy .28
7.2.7 Relevant standards .29
7.2.8 X-ray fluorescence spectroscopy .29
7.2.9 Relevant standards .30
7.2.10 X-ray diffraction . 30
7.2.11 Relevant standard .30
7.2.12 X-ray photoelectron spectroscopy .30
7.2.13 Relevant standards . 31
7.2.14 Energy dispersive X-ray spectroscopy . 31
7.2.15 Low energy ion scattering . 31
7.3 Measurands related to the chemical analysis of nano-objects as bulk samples . 31
7.3.1 Measurands . 31
7.3.2 Fourier transform infrared spectroscopy . 32
7.3.3 Relevant standards . 33
7.3.4 Thermal analysis with evolved gas analyser plus FTIR or QMS .33
7.3.5 Relevant standards .34
7.3.6 Ultraviolet–visible spectroscopy .34
7.3.7 Relevant standards .34
7.3.8 Raman spectroscopy .34
7.3.9 Inductively coupled plasma techniques .34
7.3.10 Relevant standards .34
7.3.11 Contact angle . 35
8 Measurands related to mass and density .35
8.1 General . 35
8.2 Aerosols . 35
8.2.1 Measurands . 35
8.2.2 Relevant standards . 35
8.2.3 Aerosol particle mass analyser . 36
8.2.4 Time of flight mass spectrometry .36
8.3 Powders . 36
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8.3.1 Measurands .36
8.3.2 Pycnometry .36
8.3.3 Relevant standards .36
8.4 Liquid dispersions . 37
8.4.1 Measurands . 37
8.4.2 Relevant standards . 37
8.4.3 Centrifugal liquid sedimentation (isopycnic method). 37
8.4.4 Static light scattering . 37
8.4.5 Resonant mass measurement .38
9 Measurands related to charge — Liquid dispersions .38
9.1 Measurands .38
9.2 Relevant standards .38
9.3 Electrophoretic light scattering .38
9.4 Electroacoustic phenomena measurements . 39
10 Measurands related to crystallinity .39
10.1 Measurands . 39
10.2 Small-angle/wide-angle X-ray scattering .40
10.3 X-ray diffraction .40
10.4 High-resolution transmission electron microscopy . 41
10.5 Electron backscattered diffraction . 41
10.6 Neutron diffraction . 41
10.7 Reflection high-energy electron diffraction and low-energy electron diffraction . 41
10.8 Differential scanning calorimetry. 41
10.9 Re
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