Optical circuit boards - Basic test and measurement procedures - Part 2-5: Flexibility test for flexible opto-electric circuits (IEC 62496-2-5:2022)

This part of IEC 62496-2 defines a test method for folding flexibility inspection of flexible opto-electric circuits with a MIT folding endurance tester and presents a guideline for a step stress test method for finding the predetermined minimum mechanical folding radii below which the flexible opto-electric circuits can be damaged by intended folding distortion. Here, test samples are used instead of products for the flexibility test of their flexible opto-electric circuits, and the test samples have the same layer structure as the products.

Optische Leiterplatten - Grundlegende Prüf- und Messverfahren - Teil 2-5: Biegsamkeitstest für biegsame opto-elektrische Schaltkreise (IEC 62496-2-5:2022)

Cartes à circuits optiques - Procédures fondamentales d’essais et de mesures - Partie 2-5: Essai de flexibilité pour les circuits optoélectriques souples (IEC 62496-2-5:2022)

IEC 62496-2-5:2022 définit une méthode d’essai pour l’examen de la flexibilité au pliage des circuits optoélectriques souples au moyen d’un appareil de contrôle de la flexibilité, et fournit un guide qui présente une méthode d’essai sous contrainte échelonnée destinée à déterminer les rayons de pliage mécanique minimaux prédéterminés en deçà desquels les circuits optoélectriques souples peuvent être endommagés par la distorsion induite par un pliage intentionnel. Des échantillons d’essai sont utilisés ici à la place des produits pour l’essai de flexibilité de leurs circuits optoélectriques souples, et ces échantillons d’essai sont constitués du même matériau, ont la même structure de couches et utilisent la même technologie et les mêmes équipements de traitement que les produits eux-mêmes.

Plošče z optičnimi vezji - Osnovni preskusni in merilni postopki - 2-5. del: Preskušanje upogljivosti za zvijava optoelektrična vezja (IEC 62496-2-5:2022)

Ta del standarda IEC 62496-2 opredeljuje preskusno metodo za preskušanje upogljivosti zvijavih optoelektričnih vezij z napravo za preskušanje vzdržljivosti pregibanja MIT in predstavlja smernice za metodo stopenjskega preskusa obremenitve, da se ugotovi vnaprej določen minimalni mehanski zgibni polmer, pod katerim se zvijava optoelektrična vezja lahko poškodujejo zaradi namernega zvijanja. Tukaj se namesto izdelkov uporabljajo preskusni vzorci za preskušanje prožnosti njihovih zvijavih optoelektričnih vezij. Preskusni vzorci imajo enako strukturo plasti kot izdelki.

General Information

Status
Published
Public Enquiry End Date
28-Feb-2022
Publication Date
30-Jan-2023
Technical Committee
Current Stage
6060 - National Implementation/Publication (Adopted Project)
Start Date
23-Jan-2023
Due Date
30-Mar-2023
Completion Date
31-Jan-2023

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Standards Content (Sample)

SLOVENSKI STANDARD
SIST EN IEC 62496-2-5:2023
01-marec-2023
Plošče z optičnimi vezji - Osnovni preskusni in merilni postopki - 2-5. del:
Preskušanje upogljivosti za zvijava optoelektrična vezja (IEC 62496-2-5:2022)
Optical circuit boards - Basic test and measurement procedures - Part 2-5: Flexibility test
for flexible opto-electric circuits (IEC 62496-2-5:2022)
Optische Leiterplatten - Grundlegende Prüf- und Messverfahren - Teil 2-5:
Biegsamkeitstest für biegsame opto-elektrische Schaltkreise (IEC 62496-2-5:2022)
Cartes à circuits optiques - Procédures fondamentales d’essais et de mesures - Partie 2-
5: Essai de flexibilité pour les circuits optoélectriques souples (IEC 62496-2-5:2022)
Ta slovenski standard je istoveten z: EN IEC 62496-2-5:2023
ICS:
31.180 Tiskana vezja (TIV) in tiskane Printed circuits and boards
plošče
33.180.01 Sistemi z optičnimi vlakni na Fibre optic systems in
splošno general
SIST EN IEC 62496-2-5:2023 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST EN IEC 62496-2-5:2023

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SIST EN IEC 62496-2-5:2023


EUROPEAN STANDARD EN IEC 62496-2-5

NORME EUROPÉENNE

EUROPÄISCHE NORM January 2023
ICS 33.180.01

English Version
Optical circuit boards - Basic test and measurement procedures
- Part 2-5: Flexibility test for flexible opto-electric circuits
(IEC 62496-2-5:2022)
Cartes à circuits optiques - Procédures fondamentales Optische Leiterplatten - Grundlegende Prüf- und
d'essais et de mesures - Partie 2-5: Essai de flexibilité pour Messverfahren - Teil 2-5: Biegsamkeitstest für biegsame
les circuits optoélectriques souples opto-elektrische Schaltkreise
(IEC 62496-2-5:2022) (IEC 62496-2-5:2022)
This European Standard was approved by CENELEC on 2023-01-11. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the
Netherlands, Norway, Poland, Portugal, Republic of North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland,
Türkiye and the United Kingdom.


European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels
© 2023 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
 Ref. No. EN IEC 62496-2-5:2023 E

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SIST EN IEC 62496-2-5:2023
EN IEC 62496-2-5:2023 (E)
European foreword
The text of document 86/605/FDIS, future edition 1 of IEC 62496-2-5, prepared by IEC/TC 86 "Fibre
optics" was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as
EN IEC 62496-2-5:2023.
The following dates are fixed:
• latest date by which the document has to be implemented at national (dop) 2023-10-11
level by publication of an identical national standard or by endorsement
• latest date by which the national standards conflicting with the (dow) 2026-01-11
document have to be withdrawn

Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.
Any feedback and questions on this document should be directed to the users’ national committee. A
complete listing of these bodies can be found on the CENELEC website.
Endorsement notice
The text of the International Standard IEC 62496-2-5:2022 was approved by CENELEC as a
European Standard without any modification.
In the official version, for Bibliography, the following notes have to be added for the standard indicated:
IEC 60793-2-10 NOTE Harmonized as EN IEC 60793-2-10
IEC 60793-2-20 NOTE Harmonized as EN 60793-2-20
2

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SIST EN IEC 62496-2-5:2023
EN IEC 62496-2-5:2023 (E)
Annex ZA
(normative)

Normative references to international publications
with their corresponding European publications
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments)
applies.
NOTE 1 Where an International Publication has been modified by common modifications, indicated by (mod), the
relevant EN/HD applies.
NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available
here: www.cenelec.eu.
Publication Year Title EN/HD Year
IEC 60068-1 - Environmental testing - Part 1: General EN 60068-1 -
and guidance
IEC 60793-2 series Optical fibres - Part 2: Product EN IEC 60793-2 series
specifications
IEC 62496-2-1 - Optical circuit boards - Part 2-1: EN 62496-2-1 -
Measurements - Optical attenuation and
isolation
ISO 5626 1993 Paper - determination of folding endurance - -

3

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SIST EN IEC 62496-2-5:2023




IEC 62496-2-5

®


Edition 1.0 2022-12




INTERNATIONAL



STANDARD




NORME


INTERNATIONALE
colour

inside










Optical circuit boards – Basic test and measurement procedures –

Part 2-5: Flexibility test for flexible opto-electric circuits



Cartes a circuits optiques – Procédures fondamentales d’essais et de mesures



Partie 2-5: Essai de flexibilité pour les circuits optoélectriques souples















INTERNATIONAL

ELECTROTECHNICAL

COMMISSION


COMMISSION

ELECTROTECHNIQUE


INTERNATIONALE




ICS 33.180.01 ISBN 978-2-8322-6119-4




Warning! Make sure that you obtained this publication from an authorized distributor.

Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agréé.

® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale

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SIST EN IEC 62496-2-5:2023
– 2 – IEC 62496-2-5:2022 © IEC 2022
CONTENTS
FOREWORD . 4
1 Scope . 6
2 Normative references . 6
3 Terms and definitions . 6
4 Apparatus . 7
4.1 General description . 7
4.2 Flexibility tester for flexibility test of FOECBs . 8
4.2.1 FOECBs test sample of fibre optical types . 8
4.2.2 FOECBs test sample of planer waveguide optical circuit types . 8
4.3 O-E signal control source . 9
4.4 Laser source . 9
4.5 Photo detector . 9
4.6 Folding jig . 9
4.7 Relay switch . 10
4.8 Main controller . 10
5 Test sample . 10
5.1 FOECB test samples of optical fibre-types . 10
5.2 FOECB test samples of planar optical waveguide-types . 11
6 Procedures . 13
6.1 For test samples of optical fibre-types . 13
6.1.1 Preparing test samples . 13
6.1.2 Initial optical and electrical performance measurement . 13
6.1.3 Setting the test sample . 13
6.1.4 Flexibility measurement . 14
6.1.5 Final optical and electrical performance measurement . 14
6.1.6 Mechanical performance measurement . 14
6.2 For test samples of the planar optical waveguide-types. 14
6.2.1 Preparing test samples . 14
6.2.2 Initial optical and electrical performance measurement . 14
6.2.3 Setting the test sample . 15
6.2.4 Flexibility measurement . 15
6.2.5 Final optical and electrical performance measurement . 15
6.2.6 Mechanical characteristic measurement . 16
7 Report . 16
Annex A (informative) Detail requirement for structure of FOECB test samples of
optical fibre-types . 17
Annex B (informative) Requirement for structure of FOECB test samples of planar
optical waveguide-types . 18
Annex C (informative) Guideline for flexibility folding jig setting conditions of FOECB
test samples . 19
Bibliography . 20

Figure 1 – Schematic diagram of flexible opto-electric circuit board (top view) . 7
Figure 2 – Overview of the folding jig . 8
Figure 3 – Schematic diagram of the flexibility test system for fibre optical circuits . 8

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SIST EN IEC 62496-2-5:2023
IEC 62496-2-5:2022 © IEC 2022 – 3 –
Figure 4 – Schematic diagram of the flexibility test system for planar waveguide optical
circuits . 9
Figure 5 – Flexibility folding jigs (from the left, folding radius r is 1,0 mm, 2,0 mm, 3,0

mm, 4,0 mm, 5,0 mm and 10,0 mm) . 10
Figure 6 – Schematic diagram of FOECB test samples of optical fibre-types . 11
Figure 7 – Schematic diagram of FOECB test samples of planar optical waveguide-
types. 12
Figure B.1 – Schematic diagram of the flexibility test system for planar waveguide
optical circuits . 18
Figure C.1 – An example of measurement result of optical loss versus bending
diameter . 19

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INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________

OPTICAL CIRCUIT BOARDS –
BASIC TEST AND MEASUREMENT PROCEDURES –

Part 2-5: Flexibility test for flexible opto-electric circuits

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international
co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and
in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports,
Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their
preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with
may participate in this preparatory work. International, governmental and non-governmental organizations liaising
with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for
Standardization (ISO) in accordance with conditions determined by agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence between
any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent
rights. IEC shall not be held responsible for identifying any or all such patent rights.
IEC 62496-2-5 has been prepared by IEC technical committee 86: Fibre optics. It is an
International Standard.
The text of this International Standard is based on the following documents:
Draft Report on voting
86/605/FDIS 86/609/RVD

Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
The language used for the development of this International Standard is English.

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SIST EN IEC 62496-2-5:2023
IEC 62496-2-5:2022 © IEC 2022 – 5 –
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are
described in greater detail at www.iec.ch/standardsdev/publications.
A list of all parts in the IEC 62496 series, published under the general title Optical circuit boards,
can be found on the IEC website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under webstore.iec.ch in the data related to the
specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.

IMPORTANT – The "colour inside" logo on the cover page of this document indicates that it
contains colours which are considered to be useful for the correct understanding of its
contents. Users should therefore print this document using a colour printer.

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OPTICAL CIRCUIT BOARDS –
BASIC TEST AND MEASUREMENT PROCEDURES –

Part 2-5: Flexibility test for flexible opto-electric circuits



1 Scope
This part of IEC 62496 defines a test method for folding flexibility inspection of flexible opto-
electric circuits with a flexibility tester endurance tester and presents a guideline for a step
stress test method for finding the predetermined minimum mechanical folding radii below which
the flexible opto-electric circuits can be damaged by intended folding distortion. Here, test
samples are used instead of products for the flexibility test of their flexible opto-electric circuits,
and the test samples have the same material, layer structure, processing technology and
equipment as the products.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies.
For undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC 60068-1, Environmental testing – Part 1: General and guidance
IEC 60793-2 (all parts), Optical fibres – Part 2: Product specifications
IEC 62496-2-1, Optical circuit boards – Part 2-1: Measurements – Optical attenuation and
isolation
ISO 5626:1993, Paper – Determination of folding endurance
3 Terms and definitions
For the purposes of this document, the terms and definitions given in IEC 62496-1 and the
following apply.
ISO and IEC maintain terminology databases for use in standardization at the following
addresses:
• IEC Electropedia: available at https://www.electropedia.org/
• ISO Online browsing platform: available at https://www.iso.org/obp
3.1
flexible opto-electric circuit board
flexible circuit board that contains both optic and electric circuits integrated into a flexible sheet

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SIST EN IEC 62496-2-5:2023
IEC 62496-2-5:2022 © IEC 2022 – 7 –

Figure 1 – Schematic diagram of flexible opto-electric circuit board (top view)
Note 1 to entry: Figure 1 shows an example of the top view of a flexible opto-electric circuit board.
Note 2 to entry: There are two types of flexible opto-electric circuit board: optical fibre-types and planer optical
waveguide-types.
[SOURCE: ISO 5626:1993, Clause 1]
3.2
flexibility tester
instrument for folding endurance test of flexible sheets with interchangeable folding heads,
allowing a range of thickness up to 1,25 mm
Note 1 to entry: In general, it is called the MIT folding endurance tester.
4 Apparatus
4.1 General description
The flexibility test system for flexibility test of the flexible opto-electric circuit board (hereafter
FOECB) shall be used for finding of the minimum folding radii of both optic and electric circuits
of the FOECB before any functional damage occurs. An existing flexibility folding method has
been used for testing the folding flexibility of only electric circuits. However, in this document,
it shall be used for testing the folding flexibility of both optic and electric circuits.
Since the test sample for fibre optical type should be connected to the flexibility test system
through an optical fibre, real-time monitoring may be possible. Accordingly, the flexibility tester
shall be configured with a real-time monitoring system using a laser signal device to accurately
know the time of breakage of the optical fibres.
Generally, test samples for planar waveguide optical circuits are difficult to measure through
real-time monitoring because it is not easy to connect to a flexibility test device through an
optical fibre. Therefore, the test sample should be tested by connecting only electric circuits as
in the existing flexibility folding method. The failure time of the test sample should be measured
separately using a visual light on the planar waveguide circuits.
But, in case of that the test sample for planar waveguide optical circuits shall use optical fibres
with connector to coupling with the optical waveguide, flexibility test of the test samples can be
possible with real-time monitoring.
In addition, these tests should be measured in the process of replacing the holding jig.The test
sample shall be clamped by the folding jig within the main controller as shown in Figure 2.

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– 8 – IEC 62496-2-5:2022 © IEC 2022



a) Photograph diagram of the folding jig b) Photograph of a folding jig and test sample

Figure 2 – Overview of the folding jig
4.2 Flexibility tester for flexibility test of FOECBs
4.2.1 FOECBs test sample of fibre optical types
The flexibility test system for fibre optical circuits should be configured to stop the folding action
of the test sample if any damage starts to appear in its optical and electrical sections. Therefore,
the flexibility test system shall be composed of an optic-electric signal control source (hereafter
referred as O-E signal control source), test sample, and main controller, as shown in Figure 3.

Figure 3 – Schematic diagram of the flexibility test system for fibre optical circuits
4.2.2 FOECBs test sample of planer waveguide optical circuit types
The flexibility test system for planer waveguide optical circuits shall be constructed in the same
form as the folding flexibility test method for existing electrical circuits, as shown in Figure 4.

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SIST EN IEC 62496-2-5:2023
IEC 62496-2-5:2022 © IEC 2022 – 9 –

Figure 4 – Schematic diagram of the flexibility test system
for planar waveguide optical circuits
4.3 O-E signal control source
An O-E signal control source shall be composed of a laser source, photo detector, relay switch,
electric power source, optical fibre, and optical connectors. The O-E signal control source
supplies an optical signal to the test sample, and allows the photo detector to control the relay
switch based on detected optical signal for on-off switching of the electric signal flow (current)
within the flexibility test system.
4.4 Laser source
The optical output power of the laser source shall have enough larger of the minimum detected
power of optical detector and attenuation (optical loss) of samples. The laser source in the O-
E signal control source sends an optical signal to the test sample via its optical input terminal
connected to the protruded optical fibre. The wavelength and mode of the laser source should
be chosen according to the application to be used. The launching mode of the laser source
should be appropriate to the application of the relevant specification of O-E circuit board.
4.5 Photo detector
The minimum detected optical power of the photo detector shall be enough to detect the optical
power after attenuating the optical power by the test sample and light source power. The photo
detector detects the optic signal flow in the test sample. The photo detector output controls the
relay switch inside the O-E signal control source. Therefore, the output current of the photo
detector should be above the minimum operating voltage of the relay switch with a proper
resistance for the current output. The photo detector shall have enough response frequency to
detect the optical power change (deviation) by the attenuation change caused by the folding
distortion. At minimum, the response frequency for the photo detector should be 10 times or
more than the folding duration (0° to 90°), or kHz order will be necessary.
4.6 Folding jig
The size of the jig shall be selected according to the test samples. Several types of folding jigs
with different bending radii are required to apply various bending tests to the test sample.
Folding jigs of 6 different curvature radii (1,0 mm, 2,0 mm, 3,0 mm, 4,0 mm, 5,0 mm, and
10,0 mm) should be prepared (see Figure 5).

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Figure 5 – Flexibility folding jigs (from the left, folding radius r is
1,0 mm, 2,0 mm, 3,0 mm, 4,0 mm, 5,0 mm and 10,0 mm)
4.7 Relay switch
The switching time shall be at least one tenth of the folding speed. The relay switch plays a role
of direct on-off switching control of the electric circuit in the flexibility test system. That is, once
the photo detector detects the optic signal flow in the test sample, the relay switch stays in the
on-state. If the photo detector fails to detect the optic signal flow in the test sample, the relay
switch turns to the off-state. The relay switch operates the flexibility test system depending on
the detected optical signal output at the photo detector, which is subject to the physical state
of the test sample (e.g., either broken or non-broken state of the optic circuit).
4.8 Main controller
The main controller shall control the electrical current to fold the folding jig with enough
accuracy to test. The main controller supplies an electric current to the test sample and
mechanically controls the folding action of the test sample. The main controller may consist of
the main controller and the mechanical control means of folding, separately. Generally, the
main controller emits the electric signal by itself to perform the mechanical folding operation on
the test sample. The typical electric current flowing through the main controller ranges from
1 mA to 10 mA.
5 Test sample
5.1 FOECB test samples of optical fibre-types
Test samples of optical fibre-types shall have a pigtailed shape (see Figure 6). The optical
fibres used in the test samples may be single-mode and/or multimode fibres. Depending on
applications, glass optical fibres, polymer optical fibres, and specialty optical fibres may be
used to form the optical circuits.
The optical circuits shall be positioned at a central part of the entire FOECB test samples. The
electrical circuits shall be positioned at peripheral areas of the optical circuit in a symmetrical
structure. The symmetrical structure shall have superior characteristics in size stability from the
viewpoint of design and reliability for the FOECB test samples, as shown in Figure 6.
The test samples of the optical fibre-types shall have a protruded structure with a length of l9
at one side. The protruded length (l ) shall be maintained with sufficient length over 100 mm
9
for easy connection with other fibres (e.g., fibre fusion splicing). The other side of the test
samples shall have a continuous fibre bending area over a 6-mm diameter with a non-end state
as shown in Figure 6. The bending state over the 6-mm diameter for glass optical fibres shall
be maintained to minimize their optical bending loss.
A detail requirement for structure of FOECB test
...

SLOVENSKI STANDARD
oSIST prEN IEC 62496-2-5:2022
01-februar-2022
Plošče z optičnimi vezji - Osnovni preskusni in merilni postopki - 2-5. del:
Preskušanje upogljivosti za zvijava optoelektrična vezja
Optical circuit boards - Basic test and measurement procedures - Part 2-5: Flexibility test
for flexible opto-electric circuits
Ta slovenski standard je istoveten z: prEN IEC 62496-2-5:2021
ICS:
31.180 Tiskana vezja (TIV) in tiskane Printed circuits and boards
plošče
33.180.01 Sistemi z optičnimi vlakni na Fibre optic systems in
splošno general
oSIST prEN IEC 62496-2-5:2022 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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oSIST prEN IEC 62496-2-5:2022

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oSIST prEN IEC 62496-2-5:2022
86/591/CDV

COMMITTEE DRAFT FOR VOTE (CDV)
PROJECT NUMBER:
IEC 62496-2-5 ED1
DATE OF CIRCULATION: CLOSING DATE FOR VOTING:
2021-12-17 2022-03-11
SUPERSEDES DOCUMENTS:
86/570/CD, 86/582A/CC

IEC TC 86 : FIBRE OPTICS
SECRETARIAT: SECRETARY:
United States of America Mr Steve Swanson
OF INTEREST TO THE FOLLOWING COMMITTEES: PROPOSED HORIZONTAL STANDARD:

TC 86,SC 86B,TC 91
Other TC/SCs are requested to indicate their interest, if
any, in this CDV to the secretary.
FUNCTIONS CONCERNED:
EMC ENVIRONMENT QUALITY ASSURANCE SAFETY
SUBMITTED FOR CENELEC PARALLEL VOTING NOT SUBMITTED FOR CENELEC PARALLEL VOTING
Attention IEC-CENELEC parallel voting
The attention of IEC National Committees, members of
CENELEC, is drawn to the fact that this Committee Draft
for Vote (CDV) is submitted for parallel voting.
The CENELEC members are invited to vote through the
CENELEC online voting system.

This document is still under study and subject to change. It should not be used for reference purposes.
Recipients of this document are invited to submit, with their comments, notification of any relevant patent rights of
which they are aware and to provide supporting documentation.

TITLE:
Optical circuit boards - Basic test and measurement procedures - Part 2-5: Flexibility test for
flexible opto-electric circuits

PROPOSED STABILITY DATE: 2026

NOTE FROM TC/SC OFFICERS:
Formerly IEC 62496-2-61. Numbering change approved by Plenary decision (see 86/577/RM, Decision
2020-03).

Copyright © 2021 International Electrotechnical Commission, IEC. All rights reserved. It is permitted to download this
electronic file, to make a copy and to print out the content for the sole purpose of preparing National Committee positions.
You may not copy or "mirror" the file or printed version of the document, or any part of it, for any other purpose without
permission in writing from IEC.

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1 CONTENTS
2
3 FOREWORD . 4
4 1 Scope . 6
5 2 Normative references . 6
6 3 Terms and definitions . 6
7 4 Apparatus . 7
8 4.1 General description . 7
9 4.2 MIT tester for flexibility test of FOECBs . 7
10 4.2.1 FOECBs test sample of fibre optical types . 7
11 4.2.2 FOECBs test sample of planer waveguide optical circuit types . 8
12 4.3 O-E signal control source . 8
13 4.4 Laser source . 8
14 4.5 Photo detector. 8
15 4.6 Folding jig . 9
16 4.7 Relay switch . 9
17 4.8 Main controller . 9
18 5 Test sample . 9
19 5.1 FOECB test samples of optical fibre-types . 9
20 5.2 FOECB test samples of planar optical waveguide-types . 10
21 6 Procedures . 11
22 6.1 For test samples of optical fibre-types . 11
23 6.1.1 Preparing test samples . 11
24 6.1.2 Initial optical and electrical performance measurement . 12
25 6.1.3 Setting the test sample . 12
26 6.1.4 Flexibility measurement . 12
27 6.1.5 Final optical and electrical performance measurement . 12
28 6.1.6 Mechanical performance measurement . 13
29 6.2 For test samples of the planar optical waveguide-types . 13
30 6.2.1 Preparing test samples . 13
31 6.2.2 Initial optical and electrical performance measurement . 13
32 6.2.3 Setting the test sample . 13
33 6.2.4 Flexibility measurement . 14
34 6.2.5 Final optical and electrical performance measurement . 14
35 6.2.6 Mechanical characteristic measurement . 14
36 7 Report . 14
37 Annex A (informative) Detail requirement for structure of FOECB test samples of optical
38 fibre-types . 15
39 Annex B (normative) Requirement for structure of FOECB test samples of planar optical
40 waveguide-types . 16
41 Annex C (informative) Guideline for MIT folding jig setting conditions of FOECB test
42 samples . 17
43 Bibliography . 18
44
45 Figure 1 – Schematic diagram of flexible opto-electric circuit board (top view) . 6

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46
Figure 2 – Overview of the folding jig . 7
47 Figure 3 – Schematic diagram of the MIT test system for fibre optical circuits . 8
48 Figure 4 – Schematic diagram of the MIT test system for planar waveguide optical circuits . 8
49 Figure 5 – MIT folding jigs (from the left, folding radius r is 1,0 mm, 2,0 mm, 3,0 mm,
50 4,0 mm, 5,0 mm and 10,0 mm) . 9
51 Figure 6 – Schematic diagram of FOECB test samples of optical fibre-types . 10
52 Figure 7 – Schematic diagram of FOECB test samples of planar optical waveguide-types . 11
53 Figure B.1 – Schematic diagram of the MIT test system for planar waveguide optical
54 circuits . 16
55 Figure C.1 – An example of measurement result of optical loss versus bending diameter . 17
56
57
58

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59 INTERNATIONAL ELECTROTECHNICAL COMMISSION
60 ____________
61
62 OPTICAL CIRCUIT BOARDS – BASIC TEST AND MEASUREMENT
63 PROCEDURES
64
65 Part 2-5: Flexibility test for flexible opto-electric circuits
66
67 FOREWORD
68 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all
69 national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-
70 operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition
71 to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly
72 Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is
73 entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in
74 this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also
75 participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO)
76 in accordance with conditions determined by agreement between the two organizations.
77 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
78 consensus of opinion on the relevant subjects since each technical committee has representation from all interested
79 IEC National Committees.
80 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
81 Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
82 Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation
83 by any end user.
84 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
85 transparently to the maximum extent possible in their national and regional publications. Any divergence between any
86 IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter.
87 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
88 assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services
89 carried out by independent certification bodies.
90 6) All users should ensure that they have the latest edition of this publication.
91 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members
92 of its technical committees and IEC National Committees for any personal injury, property damage or other damage
93 of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of
94 the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications.
95 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
96 indispensable for the correct application of this publication.
97 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent
98 rights. IEC shall not be held responsible for identifying any or all such patent rights.
99 IEC 62496-2-5 has been prepared by IEC technical committee 86: FIBRE OPTICS. It is an
100 International Standard.
101 The text of this International Standard is based on the following documents:
Draft Report on voting
86/XX/FDIS 86/XX/RVD
102
103 Full information on the voting for its approval can be found in the report on voting indicated in the
104 above table.
105 The language used for the development of this International Standard is English.
106 This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
107 accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available at

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108 www.iec.ch/members_experts/refdocs. The main document types developed by IEC are described
109 in greater detail at www.iec.ch/standardsdev/publications.
110 The committee has decided that the contents of this document will remain unchanged until the
111 stability date indicated on the IEC website under webstore.iec.ch in the data related to the specific
112 document. At this date, the document will be
113 • reconfirmed,
114 • withdrawn,
115 • replaced by a revised edition, or
116 • amended.
117

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118 OPTICAL CIRCUIT BOARDS – BASIC TEST AND MEASUREMENT
119 PROCEDURES
120
121 Part 2-5: Flexibility test for flexible opto-electric circuits
122
123 1 Scope
124 This part of IEC 62496-2 defines a test method for folding flexibility inspection of flexible opto-
125 electric circuits with a MIT folding endurance tester and presents a guideline for a step stress test
126 method for finding the predetermined minimum mechanical folding radii below which the flexible
127 opto-electric circuits can be damaged by intended folding distortion. Here, test samples are used
128 instead of products for the flexibility test of their flexible opto-electric circuits, and the test samples
129 have the same layer structure as the products.
130 2 Normative references
131 The following documents are referred to in the text in such a way that some or all of their content
132 constitutes requirements of this document. For dated references, only the edition cited applies. For
133 undated references, the latest edition of the referenced document (including any amendments)
134 applies.
135 IEC 60068-1, Environmental testing – Part 1: General and guidance
136 IEC 60793-2 (all parts), Optical fibres – Part 2: Product specifications
137 IEC 62496-2-1, Optical circuit boards - Part 2-1: Measurements - Optical attenuation and isolation
138 ISO 5626:1993, Paper – Determination of folding endurance
139 3 Terms and definitions
140 For the purposes of this document, the terms and definitions defined in IEC 62496-1 and the
141 following apply.
142 ISO and IEC maintain terminological databases for use in standardization at the following
143 addresses:
144 • ISO Online browsing platform: available at https://www.iso.org/obp
145 • IEC Electropedia: available at http://www.electropedia.org/
146 3.1
147 flexible opto-electric circuit board
148 flexible circuit board that contains both optic and electric circuits integrated into a flexible sheet
149 Note 1 to entry: Figure 1 shows an example of the top view of a flexible opto-electric circuit board.
150
151 Figure 1 – Schematic diagram of flexible opto-electric circuit board (top view)

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152 3.2
153 MIT test system
154 instrument for folding endurance test of flexible sheets with interchangeable folding heads, allowing
155 a range of thickness up to 1,25 mm
156 Note 1 to entry:  The name of the MIT folding endurance tester follows the Massachusetts Institute of Technology because
157 it has been developed by the institute.
158 Note 2 to entry: There are two types of flexible opto-electric circuit board: optical fibre-types and planer optical waveguide-
159 types.
160 [SOURCE: ISO 5626:1993, Clause 1]
161 4 Apparatus
162 4.1 General description
163 The MIT test system for flexibility test of the flexible opto-electric circuit board (hereafter FOECB)
164 shall be used for finding of the minimum folding radii of both optic and electric circuits of the FOECB
165 before any functional damage occurs. An existing MIT folding method has been used for testing
166 the folding flexibility of only electric circuits. However, in this proposed standard, it shall be used
167 for testing the folding flexibility of both optic and electric circuits.
168 Since the test sample for fibre optical type should be connected to the MIT test system through an
169 optical fibre, real-time monitoring may be possible. Accordingly, the MIT tester shall be configured
170 with a real-time monitoring system using a laser signal device to accurately know the time of
171 breakage of the optical fibres.
172 Test samples for planar waveguide optical circuits are difficult to measure through real-time
173 monitoring because it is not easy to connect to an MIT test device through an optical fibre.
174 Therefore, the test sample should be tested by connecting only electric circuits as in the existing
175 MIT folding method. The failure time of the test sample should be measured separately using a
176 visual light on the planar waveguide circuits. In addition, these tests should be measured in the
177 process of replacing the holding jig.The test sample shall be clamped by the folding jig within the
178 main controller as shown in Figure 2.
179
180 a) Photograph diagram of the folding jig           b) Photograph of a folding jig and test sample
181 Figure 2 – Overview of the folding jig
182 4.2 MIT tester for flexibility test of FOECBs
183 4.2.1 FOECBs test sample of fibre optical types
184 The MIT test system for fibre optical circuits should be configured to stop the folding action of the
185 test sample if any damage starts to appear in its optical and electrical sections. Therefore, the MIT
186 test system shall be composed of an optic-electric signal control source (hereafter referred as O-E
187 signal control source), test sample, and main controller, as shown in Figure 3.

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188
189 Figure 3 – Schematic diagram of the MIT test system for fibre optical circuits
190 4.2.2 FOECBs test sample of planer waveguide optical circuit types
191 The MIT tester system for planer waveguide optical circuits shall be constructed in the same form
192 as the folding flexibility test method for existing electrical circuits, as shown in Figure 4.
193
194 Figure 4 – Schematic diagram of the MIT test system for planar waveguide optical circuits
195 4.3 O-E signal control source
196 An O-E signal control source shall be composed of a laser source, photo detector, relay switch,
197 electric power source, optical fibre, and optical connectors. The O-E signal control source supplies
198 an optical signal to the test sample, and allows the photo detector to control the relay switch based
199 on detected optical signal for on-off switching of the electric signal flow (current) within the MIT test
200 system.
201 4.4 Laser source
202 The optical output power of the laser source shall have enough larger of the minimum detected
203 power of optical detector and attenuation (optical loss) of samples. The laser source in the O-E
204 signal control source sends an optical signal to the test sample via its optical input terminal
205 connected to the protruded optical fibre. The wavelength and mode of the laser source should be
206 chosen according to the application to be used. The launching mode of the laser source should be
207 appropriate to the application of the relevant specification of O-E circuit board.
208 4.5 Photo detector
209 The minimum detected optical power of the photo detector shall be enough to detect the optical
210 power after attenuating the optical power by the test sample and light source power. The photo

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211 detector detects the optic signal flow in the test sample. The photo detector output controls the
212 relay switch inside the O-E signal control source. Therefore, the output current of the photo detector
213 should be above the minimum operating voltage of the relay switch with a proper resistance for the
214 current output. The photo detector shall have enough response frequency to detect the optical
215 power change (deviation) by the attenuation change caused by the folding distortion. At minimum,
216 the response frequency for the photo detector should be 10 times or more than the folding duration
217 (0 °to 90 °), or kHz order will be necessary.
218 4.6 Folding jig
219 The size of the jig shall be selected according to the test samples. Several types of folding jigs with
220 different bending radii are required to apply various bending tests to the test sample. Folding jigs
221 of 6 different curvature radii (1,0 mm, 2,0 mm, 3,0 mm, 4,0 mm, 5,0 mm, and 10,0 mm) should be
222 prepared (see Figure 5).
223
224 Figure 5 – MIT folding jigs (from the left, folding radius r is 1,0 mm, 2,0 mm, 3,0 mm,
225 4,0 mm, 5,0 mm and 10,0 mm)
226 4.7 Relay switch
227 The switching time shall be at least one tenth of the folding speed. The relay switch plays a role of
228 direct on-off switching control of the electric circuit in the MIT test system. That is, once the photo
229 detector detects the optic signal flow in the test sample, the relay switch stays in the on-state. If
230 the photo detector fails to detect the optic signal flow in the test sample, the relay switch turns to
231 the off-state. The relay switch operates the MIT test system depending on the detected optical
232 signal output at the photo detector, which is subject to the physical state of the test sample (e.g.,
233 either broken or non-broken state of the optic circuit).
234 4.8 Main controller
235 The main controller shall control the electrical current to fold the folding jig with enough accuracy
236 to test. The main controller supplies an electric current to the test sample and mechanically controls
237 the folding action of the test sample. The main controller may consist of the main controller and the
238 mechanical control means of folding, separately. Generally, the main controller emits the electric
239 signal by itself to perform the mechanical folding operation on the test sample. The typical electric
240 current flowing through the main controller ranges from 1 mA to 10 mA
241 5 Test sample
242 5.1 FOECB test samples of optical fibre-types
243 Test samples of optical fibre-types shall have a pigtailed shape (see Figure 6). The optical fibres
244 used in the test samples may be single-mode and/or multimode fibres. Depending on applications,
245 glass optical fibres, polymer optical fibres, and specialty optical fibres may be used to form the
246 optical circuits.
247 The optical circuits shall be positioned at a central part of the entire FOECB test samples. The
248 electrical circuits shall be positioned at peripheral areas of the optical circuit in a symmetrical
249 structure. The symmetrical structure shall have superior characteristics in size stability from the
250 viewpoint of design and reliability for the FOECB test samples, as shown in Figure 6.
251 The test samples of the optical fibre-types shall have a protruded structure with a length of l9 at
252 one side. The protruded length (l ) shall be maintained with sufficient length over 100 mm for easy
9
253 connection with other fibres (e.g., fibre fusion splicing). The other side of the test samples shall

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254 have a continuous fibre bending area over a 6-mm diameter with a non-end state as shown in
255 Figure 6. The bending state over the 6-mm diameter for glass optical fibres shall be maintained to
256 minimize their optical bending loss.
257 A detail requirement for structure of FOECB test samples of optical fibre-types is described in
258 Annex A
259 A position mark shall be assigned on the test sample for locating the folding position with a clamp
260 of the MIT test system.
261 The size of the test samples should be confirmed in accordance with the MIT folding jigs (see 4.6).
262 As illustrated in Figure 6, the nominal dimensions of the total length (l ) of the test sample shall be
1
263 130 mm within 10 % tolerance, and the nominal dimensions of the width (l ) of the test sample shall
5
264 be 2,5 mm to 50 mm within 10 % tolerance. It is recommended that the length (l ) of the test
2
265 samples from its one edge to the clamp position mark and the length (l ) from the clamp position
3
266 mark of the bending area to the other edge are chosen to be 100 mm and 30 mm, respectively. The
267 bending diameter (l ) of the optical circuit, spacing (l ) between two optical circuit lines, and the
4 8
268 number of optical circuits shall be decided in accordance with the user’s requirements. The pattern
269 width (l ) of the electrical circuit lines also shall be decided in accordance with the user’s
7
270 requirements. The thickness (l ) of the FOECB test samples is very critical because it influences
6
271 the minimum mechanical folding radius r. The thickness of the test sample shall be from 150 μm to
272 500 μm for the FOECB test samples of the general glass fibres defined in IEC 60793-2 series with
273 polymer over-clad protection. The thickness of the test samples should be same as that for products.
274 If there are any differences, the thickness of the test samples shall be decided in accordance with
275 the user’s requirements.
276
277 Key
278 1 electric circuit
279 2 optic circuit
280 3 position mark for clamp (folding)
281 a  side view of test sample
282 b  top view of test sample
283 Figure 6 – Schematic diagram of FOECB test samples of optical fibre-types
284 5.2 FOECB test samples of planar optical waveguide-types
285 The optical circuits shall be positioned at a central part of the entire FOECB test samples. The
286 electrical circuits shall be positioned at a peripheral area of the optical circuit in a symmetrical
287 structure. The symmetrical structure shall have superior characteristics in size stability from the
288 viewpoint of design and reliability for the FOECB test samples as shown in Figure 7.

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289 The test samples of the planar optical waveguide-types shall have a non-protruded structure at
290 both side (see Figure 7). The number of optical circuit lines shall be at least three for crosstalk
291 testing.
292 A requirement for structure of FOECB test samples of planar optical waveguide-types is described
293 in Annex B
294 A position mark shall be assigned on the test sample for locating the folding position with a clamp
295 of the MIT test system.
296 The size of the test samples should be confirmed in accordance with the MIT folding jigs (see 4.6).
297 As illustrated in Figure 7, the nominal dimensions of the total length (l ) of the test sample shall be
1
298 130 mm within 10 % tolerance, and the nominal dimensions of the width (l ) of the test sample shall
5
299 be 2,5 mm to 50 mm within 10 % tolerance. It is recommended that the length (l2) of test samples
300 from its one edge to the clamp position mark are chosen to be 100 mm. The optical circuits shall
301 be composed of over three optical waveguides. The spacing (l8) between two optical waveguides
302 shall be decided in accordance with the user’s requirements. The pattern width (l7) of the electrical
303 circuit lines also shall be decided in accordance with the user’s requirements. The thickness (l6) of
304 the FOECB test sample is very critical because it influences the minimum mechanical folding radius
305 r. The thickness of test samples shall be from 50 µm to 1 000 µm for FOECB test samples of the
306 planar optical waveguide-types. The thickness of the test samples should be same as that for
307 products. If there are any differences, the thickness of the test samples shall be decided in
308 accordance with the user’s requirements.
309
310 Key
311 1  electric circuit
312 2  optic circuit
313 3  position mark for clamp (folding)
314 a  side view of test sample
315 b  top view of
...

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