High-voltage switchgear and controlgear - Part 101: Synthetic testing (IEC 62271-101:2012)

This part of IEC 62271 mainly applies to a.c. circuit-breakers within the scope of IEC 62271- 100. It provides the general rules for testing a.c. circuit-breakers, for making and breaking capacities over the range of test duties described in 6.102 to 6.111 of IEC 62271-100:2008, by synthetic methods. It has been proven that synthetic testing is an economical and technically correct way to test high-voltage a.c. circuit-breakers according to the requirements of IEC 62271-100 and that it is equivalent to direct testing. The methods and techniques described are those in general use. The purpose of this standard is to establish criteria for synthetic testing and for the proper evaluation of results. Such criteria will establish the validity of the test method without imposing restraints on innovation of test circuitry.

Hochspannungs-Schaltgeräte und -Schaltanlagen - Teil 101: Synthetische Prüfung (IEC 62271-101:2012)

Appareillage à haute tension - Partie 101: Essais synthétiques (CEI 62271-101:2012)

La CEI 62271-101:2012 s'applique principalement aux disjoncteurs à courant alternatif définis dans le domaine d'application de la CEI 62271-100. Elle donne les règles générales d'essais de ces disjoncteurs, pour les pouvoirs de fermeture et de coupure dans la gamme des séquences d'essais décrites de 6.102 à 6.111 de la CEI 62271-100:2008, à l'aide de méthodes d'essais synthétiques. Cette deuxième édition annule et remplace la première édition parue en 2007 et l'Amendement 1 paru en 2011. Elle constitue une révision technique. Les principales modifications par rapport à la précédente édition sont les suivantes: - ajout des nouvelles tensions assignées 1 100 kV et 1 200 kV; - révision de l'Annexe F qui traite des disjoncteurs équipés de résistances d'ouverture; - alignement avec la deuxième édition de la CEI 62271-100:2008 et Amendement 1 (2012). Cette publication doit être lue conjointement avec la CEI 62271-100:2008.

Visokonapetostne stikalne in krmilne naprave - 101. del: Sintetično preskušanje (IEC 62271-101:2012)

Ta del standarda IEC 62271 se uporablja predvsem za izmenične odklopnike v okviru standarda IEC 62271-100. Zagotavlja splošna pravila za preskušanje izmeničnih odklopnikov, ustvarjanje in prekinjanje kapacitet v okviru preskusnih obremenitev, opisanih v točkah od 6.102 do 6.111 standarda IEC 62271-100:2008, s sintetičnimi metodami. Sintetično preskušanje je dokazano stroškovno učinkovit in tehnično ustrezen način za preskušanje visokonapetostnih izmeničnih odklopnikov v skladu z zahtevami standarda IEC 62271-100 ter je enakovredno neposrednemu preskušanju. Opisane metode in tehnike se splošno uporabljajo. Namen tega standarda je določiti merila za sintetično preskušanje in ustrezno vrednotenje rezultatov. Taka merila bodo zagotovila veljavnost preskusne metode brez omejevanja inovacij v zvezi s preskusnimi tokokrogi.

General Information

Status
Published
Publication Date
12-Feb-2013
Current Stage
6060 - National Implementation/Publication (Adopted Project)
Start Date
15-Jan-2013
Due Date
22-Mar-2013
Completion Date
13-Feb-2013

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2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.Hochspannungs-Schaltgeräte und -Schaltanlagen - Teil 101: Synthetische Prüfung (IEC 62271-101:2012)Appareillage à haute tension - Partie 101: Essais synthétiques (CEI 62271-101:2012)High-voltage switchgear and controlgear - Part 101: Synthetic testing (IEC 62271-101:2012)29.130.10Visokonapetostne stikalne in krmilne napraveHigh voltage switchgear and controlgearICS:Ta slovenski standard je istoveten z:EN 62271-101:2013SIST EN 62271-101:2013en01-marec-2013SIST EN 62271-101:2013SLOVENSKI

STANDARDSIST EN 62271-101:2006/A1:2010SIST EN 62271-101:20061DGRPHãþD
SIST EN 62271-101:2013
EUROPEAN STANDARD EN 62271-101 NORME EUROPÉENNE
EUROPÄISCHE NORM January 2013

CENELEC European Committee for Electrotechnical Standardization Comité Européen de Normalisation Electrotechnique Europäisches Komitee für Elektrotechnische Normung

Management Centre: Avenue Marnix 17, B - 1000 Brussels
© 2013 CENELEC -

All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.

Ref. No. EN 62271-101:2013 E
ICS 29.130.10 Supersedes EN 62271-101:2006 + A1:2010
English version
High-voltage switchgear and controlgear -
Part 101: Synthetic testing (IEC 62271-101:2012)
Appareillage à haute tension -
Partie 101: Essais synthétiques (CEI 62271-101:2012)
Hochspannungs-Schaltgeräte und -Schaltanlagen -
Teil 101: Synthetische Prüfung (IEC 62271-101:2012)

This European Standard was approved by CENELEC on 2012-11-16. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom.

SIST EN 62271-101:2013
EN 62271-101:2013 - 2 -

Foreword The text of document 17A/1015/FDIS, future edition 2 of IEC 62271-101, prepared by SC 17A, "High-voltage switchgear and controlgear", of IEC TC 17, "Switchgear and controlgear" was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as EN 62271-101:2013.

The following dates are fixed: • latest date by which the document has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2013-08-16 • latest date by which the national standards conflicting with the document have to be withdrawn (dow) 2015-11-16

This document supersedes EN 62271-101:2006 + A1:2010. EN 62271-101:2013 includes the following significant technical changes with respect to EN 62271-101:2006: – addition of the new rated voltages of 1 100 kV and 1 200 kV; – revision of Annex F regarding circuit-breakers with opening resistors; – alignment with the EN 62271-100:2009 + A1: 2012.

This publication shall be read in conjunction with EN 62271-100:2009, to which it refers. The numbering of the subclauses of Clause 6 is the same as in EN 62271-100. However, not all subclauses of EN 62271-100 are addressed; merely those where synthetic testing has introduced changes. Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such patent rights.

Endorsement notice The text of the International Standard IEC 62271-101:2012 was approved by CENELEC as a European Standard without any modification. SIST EN 62271-101:2013

- 3 - EN 62271-101:2013
Annex ZA
(normative)

Normative references to international publications with their corresponding European publications

The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies.

NOTE

When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies.

Publication Year Title EN/HD Year

IEC 62271-100 + A1 2008 2012 High-voltage switchgear and controlgear - Part 100: Alternating current circuit-breakers EN 62271-100 + A1 2009 2012

SIST EN 62271-101:2013
SIST EN 62271-101:2013

IEC 62271-101 Edition 2.0 2012-10 INTERNATIONAL STANDARD NORME INTERNATIONALE High-voltage switchgear and controlgear –

Part 101: Synthetic testing
Appareillage à haute tension –
Partie 101: Essais synthétiques

INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE XH ICS 29.130.10 PRICE CODE CODE PRIX ISBN 978-2-83220-421-4

® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale ®

Warning! Make sure that you obtained this publication from an authorized distributor.

Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agréé. SIST EN 62271-101:2013 colourinside

– 2 – 62271-101 © IEC:2012

CONTENTS FOREWORD ........................................................................................................................... 7 1 Scope ............................................................................................................................... 9 2 Normative references ....................................................................................................... 9 3 Terms and definitions ....................................................................................................... 9 4 Synthetic testing techniques and methods for short-circuit breaking tests ....................... 11

Basic principles and general requirements for synthetic breaking test 4.1methods ................................................................................................................ 11

General ..................................................................................................... 11 4.1.1 High-current interval .................................................................................. 12 4.1.2 Interaction interval ..................................................................................... 12 4.1.3 High-voltage interval .................................................................................. 13 4.1.4 Synthetic test circuits and related specific requirements for breaking tests ............ 14 4.2 Current injection methods .......................................................................... 14 4.2.1 Voltage injection method ........................................................................... 15 4.2.2 Duplicate circuit method (transformer or Skeats circuit) ............................. 15 4.2.3 Other synthetic test methods ..................................................................... 16 4.2.4 Three-phase synthetic test methods ...................................................................... 16 4.35 Synthetic testing techniques and methods for short-circuit making tests ......................... 19

Basic principles and general requirements for synthetic making test methods ....... 19 5.1 General ..................................................................................................... 19 5.1.1 High-voltage interval .................................................................................. 19 5.1.2 Pre-arcing interval ..................................................................................... 19 5.1.3 Latching interval and fully closed position .................................................. 20 5.1.4 Synthetic test circuit and related specific requirements for making tests ................ 20 5.2 General ..................................................................................................... 20 5.2.1 Test circuit ................................................................................................ 20 5.2.2 Specific requirements ................................................................................ 20 5.2.36 Specific requirements for synthetic tests for making and breaking performance related to the requirements of 6.102 through 6.111 of

IEC 62271-100:2008 ................... 21 Annex A (informative)

Current distortion .............................................................................. 42 Annex B (informative)

Current injection methods.................................................................. 58 Annex C (informative)

Voltage injection methods ................................................................. 62 Annex D (informative)

Skeats or duplicate transformer circuit .............................................. 65 Annex E (normative)

Information to be given and results to be recorded for synthetic tests ..................................................................................................................................... 68 Annex F (normative)

Synthetic test methods for circuit-breakers with opening resistors ....... 69 Annex G (informative)

Synthetic methods for capacitive-current switching ........................... 76 Annex H

(informative)

Re-ignition methods to prolong arcing .............................................. 88 Annex I (normative)

Reduction in di/dt and TRV for test duty T100a .................................... 91 Annex J (informative)

Three-phase synthetic test circuits ................................................... 100 Annex K (normative)

Test procedure using a three-phase current circuit and one voltage circuit ..................................................................................................................... 107 Annex L (normative)

Splitting of test duties in test series taking into account

the associated TRV for each pole-to-clear ................................................................................ 127 Annex M (normative)

Tolerances on test quantities for type tests ....................................... 147 SIST EN 62271-101:2013

62271-101 © IEC:2012 – 3 –
Annex N (informative)

Typical test circuits for metal-enclosed and dead tank circuit-breakers ............................................................................................................................. 150 Annex O (informative)

Combination of current injection and voltage injection methods ....... 160 Bibliography ........................................................................................................................ 163

Figure 1 – Interrupting process – Basic time intervals ........................................................... 33 Figure 2 – Examples of evaluation of recovery voltage .......................................................... 34 Figure 3 – Equivalent surge impedance of the voltage circuit

for the current injection method ................................................................................................................................. 35 Figure 4 – Making process – Basic time intervals .................................................................. 36 Figure 5 – Typical synthetic making circuit for single-phase tests.......................................... 37 Figure 6 – Typical synthetic making circuit for out-of-phase .................................................. 38 Figure 7 – Typical synthetic make circuit for three-phase tests (kpp = 1,5) ............................ 39 Figure 8 – Comparison of arcing time settings during three-phase direct tests (left)

and three-phase synthetic (right) for T100s with kpp = 1,5 .................................................... 40 Figure 9 – Comparison of arcing time settings during three-phase direct tests (left)

and three-phase synthetic (right) for T100a with kpp = 1,5 .................................................... 41 Figure A.1 – Direct circuit, simplified diagram ....................................................................... 49 Figure A.2 – Prospective short-circuit current ....................................................................... 49 Figure A.3 – Distortion current .............................................................................................. 49 Figure A.4 – Distortion current .............................................................................................. 50 Figure A.5 – Simplified circuit diagram .................................................................................. 51 Figure A.6 – Current and arc voltage characteristics for symmetrical current ........................ 52 Figure A.7 – Current and arc voltage characteristics for asymmetrical current ...................... 53 Figure A.8 – Reduction of amplitude and duration of final current loop of arcing ................... 54 Figure A.9 – Reduction of amplitude and duration of final current loop of arcing ................... 55 Figure A.10 – Reduction of amplitude and duration of final current loop of arcing ................. 56 Figure A.11 – Reduction of amplitude and duration of final current loop of arcing ................. 57 Figure B.1 – Typical current injection circuit with voltage circuit

in parallel with the test circuit-breaker ....................................................................................................................... 59 Figure B.2 – Injection timing for current injection scheme with circuit B.1 .............................. 60 Figure B.3 – Examples of the determination of the interval of significant change of arc voltage from the oscillograms ............................................................................................... 61 Figure C.1 – Typical voltage injection circuit diagram with voltage circuit

in parallel with the auxiliary circuit-breaker (simplified diagram) ............................................................ 63 Figure C.2 – TRV waveshapes in a voltage injection circuit with the voltage circuit in parallel with the auxiliary circuit-breaker ............................................................................... 64 Figure D.1 – Transformer or Skeats circuit ............................................................................ 66 Figure D.2 – Triggered transformer or Skeats circuit ............................................................. 67 Figure F.1 – Test circuit to verify thermal re-ignition behaviour of the main interrupter .......... 73 Figure F.2 – Test circuit to verify dielectric re-ignition behaviour of the main interrupter ....... 73 Figure F.3 – Test circuit on the resistor interrupter ................................................................ 74 Figure F.4 – Example of test circuit for capacitive current

switching tests on the main interrupter ............................................................................................................................. 75 SIST EN 62271-101:2013

– 4 – 62271-101 © IEC:2012

Figure F.5 – Example of test circuit for capacitive current switching tests on the resistor interrupter ................................................................................................................ 75 Figure G.1 – Capacitive current circuits (parallel mode) ........................................................ 79 Figure G.2 – Current injection circuit ..................................................................................... 80 Figure G.3 – LC oscillating circuit ......................................................................................... 81 Figure G.4 – Inductive current circuit in parallel with LC oscillating circuit ............................. 82 Figure G.5 – Current injection circuit, normal recovery voltage

applied to both terminals of the circuit-breaker .............................................................................................. 83 Figure G.6 – Synthetic test circuit (series circuit), normal recovery voltage applied to both sides of the test circuit breaker ..................................................................................... 84 Figure G.7 – Current injection circuit, recovery voltage

applied to both sides of the circuit-breaker ....................................................................................................................... 85 Figure G.8 – Making test circuit ............................................................................................ 86 Figure G.9 – Inrush making current test circuit ...................................................................... 87 Figure H.1 – Typical re-ignition circuit diagram for prolonging arc-duration ........................... 89 Figure H.2 – Combined Skeats and current injection circuits ................................................. 89 Figure H.3 – Typical waveforms obtained during an asymmetrical test

using the circuit in Figure H.2 ......................................................................................................................... 90 Figure J.1 – Three-phase synthetic combined circuit ........................................................... 102 Figure J.2 – Waveshapes of currents, phase-to-ground and phase-to phase voltages during a three-phase synthetic test (T100s; kpp = 1,5 ) performed

according to the three-phase synthetic combined circuit ............................................................................... 103 Figure J.3 – Three-phase synthetic circuit with injection in all phases for kpp = 1,5............. 104 Figure J.4 – Waveshapes of currents and phase-to-ground voltages

during a three-phase synthetic test (T100s; kpp =1,5) performed

according to the three-phase synthetic circuit with injection in all phases ......................................................................... 104 Figure J.5 – Three-phase synthetic circuit for terminal fault tests with kpp = 1,3 (current injection method) ................................................................................................... 105 Figure J.6 – Waveshapes of currents, phase-to-ground and phase-to-phase voltages during a three-phase synthetic test (T100s; kpp =1,3 ) performed

according to the three-phase synthetic circuit shown in Figure J.5 ................................................................ 105 Figure J.7 – TRV voltages waveshapes of the test circuit described in Figure J.5 ............... 106 Figure K.1 – Example of a three-phase current circuit

with single-phase synthetic injection .............................................................................................................................. 118 Figure K.2 – Representation of the testing conditions of Table K.1 ..................................... 119 Figure K.3 – Representation of the testing conditions of Table K.2 ..................................... 120 Figure K.4 – Representation of the testing conditions of Table K.3 ..................................... 121 Figure K.5 – Representation of the testing conditions of Table K.4 ..................................... 122 Figure K.6 – Representation of the testing conditions of Table K.5 ..................................... 123 Figure K.7 – Representation of the testing conditions of Table K.6 ..................................... 124 Figure K.8 – Representation of the testing conditions of Table K.7 ..................................... 125 Figure K.9 – Representation of the testing conditions of Table K.8 ..................................... 126 Figure L.1 – Graphical representation of the test shown in Table L.6 .................................. 137 Figure L.2 – Graphical representation of the test shown in Table L.7 .................................. 138 Figure N.1 – Test circuit for unit testing (circuit-breaker with interaction due to gas circulation) .......................................................................................................................... 151 SIST EN 62271-101:2013

62271-101 © IEC:2012 – 5 –

Figure N.2 – Half-pole testing of a circuit-breaker in test circuit given by Figure N.1 – Example of the required TRVs to be applied between the terminals of the unit(s) under test and between the live parts and the insulated enclosure ................................................ 152 Figure N.3 – Synthetic test circuit for unit testing (if unit testing is allowed as per 6.102.4.2 of IEC 62271-100:2008) ...................................................................................... 153 Figure N.4 – Half-pole testing of a circuit-breaker in the test circuit of Figure N.3 – Example of the required TRVs to be applied between the terminals of the unit(s) under test and between the live parts and the insulated enclosure ................................................ 154 Figure N.5 – Capacitive current injection circuit with enclosure of the circuit-breaker energized ............................................................................................................................ 155 Figure N.6 – Capacitive synthetic circuit using two power-frequency sources and with the enclosure of the circuit-breaker energized ..................................................................... 156 Figure N.7 – Capacitive synthetic current injection circuit – Example of unit testing on half a pole of a circuit-breaker with two units per pole – Enclosure energized with d.c. voltage source .................................................................................................................... 157 Figure N.8 – Symmetrical synthetic test circuit for out-of-phase switching tests on a complete pole of a circuit-breaker ....................................................................................... 158 Figure N.9 – Full pole test with voltage applied to both terminals and the metal enclosure ............................................................................................................................ 159 Figure O.1 – Example of combined current and voltage injection circuit with application of full test voltage to earth .................................................................................................. 161 Figure O.2 – Example of combined current and voltage injection circuit with separated application of test voltage ................................................................................................... 162

Table 1 – Test circuits for test duties T100s and T100a ........................................................ 17 Table 2 – Test parameters during three-phase interruption for test-duties T10, T30, T60 and T100s, kpp = 1,5 ..................................................................................................... 17 Table 3 – Test parameters during three-phase interruption for test-duties T10, T30, T60 and T100s, kpp = 1,3 ..................................................................................................... 18 Table 4 – Test parameters during three phase interruption for test-duties T10, T30, T60 and T100s, kpp = 1,2 ..................................................................................................... 18 Table 5 – Synthetic test methods for test duties T10, T30, T60,

T100s, T100a, SP, DEF, OP and SLF ................................................................................................................. 31 Table I.1 – Last loop di/dt reduction for 50 Hz for kpp = 1,3 and 1,5 ...................................... 91 Table I.2 – Last loop di/dt reduction for 50 Hz for kpp = 1,2 .................................................. 92 Table I.3 – Last loop di/dt reduction for 60 Hz for kpp = 1,3 and 1,5 ...................................... 93 Table I.4 – Last loop di/dt reduction for 60 Hz for kpp = 1,2 .................................................. 94 Table I.5 – Corrected TRV values for the first pole-to-clear for kpp = 1,3 and fr = 50 Hz ....... 95 Table I.6 – Corrected TRV values for the first pole-to-clear for kpp = 1,3 and fr = 60 Hz ....... 96 Table I.7 – Corrected TRV values for the first pole-to-clear for kpp = 1,5 and fr = 50 Hz ....... 97 Table I.8 – Corrected TRV values for the first pole-to-clear for kpp = 1,5 and fr = 60 Hz ....... 98 Table I.9 – Corrected TRV values for the first pole-to-clear for kpp = 1,2 and fr = 50 Hz ....... 98 Table I.10 – Corrected TRV values for the first pole-to-clear for kpp = 1,2 and fr = 60 Hz .................................................................................................................................... 99 Table K.1 – Demonstration of arcing times for kpp = 1,5 ..................................................... 108 Table K.2 – Alternative demonstration of arcing times for kpp = 1,5 .................................... 109 Table K.3 – Demonstration of arcing times for kpp = 1,3 ..................................................... 110 Table K.4 – Alternative demonstration of arcing times for kpp = 1,3 .................................... 111 SIST EN 62271-101:2013

– 6 – 62271-101 © IEC:2012

Table K.5 – Demonstration of arcing times for kpp = 1,5 ..................................................... 112 Table K.6 – Alternative demonstration of arcing times for kpp = 1,5 .................................... 113 Table K.7 – Demonstration of arcing times for kpp = 1,3 ..................................................... 114 Table K.8 – Alternative demonstration of arcing times for kpp = 1,3 .................................... 115 Table K.9 – Procedure for combining kpp = 1,5 and 1,3 during test-duties T10, T30, T60 and T100s(b) ............................................................................................................... 116 Table K.10 – Procedure for combining kpp = 1,5 and 1,3 during test-duty T100a ................ 117 Table L.1 – Test procedure for kpp = 1,5............................................................................. 129 Table L.2 – Test procedure for kpp = 1,3............................................................................. 130 Table L.3 – Simplified test procedure for kpp = 1,3 ............................................................. 131 Table L.4 – Test procedure for kpp = 1,2............................................................................. 132 Table L.5 – Simplified test procedure for kpp = 1,2 ............................................................. 133 Table L.6 – Test procedure for asymmetrical currents in the case of kpp = 1,5 .................... 134 Table L.7 – Test procedure for asymmetrical currents in the case of kpp = 1,3 .................... 135 Table L.8 – Test procedure for asymmetrical currents in the case of kpp = 1,2 .................... 136 Table L.9 – Required test parameters for different asymmetrical conditions in the case of kpp = 1,5 , fr = 50 Hz ...................................................................................................... 139 Table L.10 – Required test parameters for different asymmetrical conditions in the case of a kpp = 1,3 , fr = 50 Hz ........................................................................................... 140 Table L.11 – Required test parameters for different asymmetrical conditions in the case of kpp = 1,2 , fr = 50 Hz .............................................................................................. 141 Table L.12 – Required test parameters for different asymmetrical conditions in the case of kpp = 1,5 , fr = 60 Hz .............................................................................................. 142 Table L.13 – Required test parameters for different asymmetrical conditions in the case of kpp = 1,3 , fr = 60 Hz .............................................................................................. 143 Table L.14 – Required test parameters for different asymmetrical conditions in the case of kpp = 1,2, fr = 60 Hz ............................................................................................... 144 Table L.15 – Procedure for combining kpp = 1,5 and 1,3 during test-duties T10, T30, T60 and T100s(b) ............................................................................................................... 145 Table L.16 – Procedure for combining kpp = 1,5 and 1,3 during test-duty T100a ................. 146 Table M.1 – Tolerances on test quantities for type tests (1of 2) .......................................... 148

SIST EN 62271-101:2013
62271-101 © IEC:2012 – 7 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION ___________
HIGH-VOLTAGE SWITCHGEAR AND CONTROLGEAR –
Part 101: Synthetic testing

FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to tech

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