Fixed capacitors for use in electronic equipment - Part 1: Generic specification (IEC 60384-1:2008 (EQV) + corrigendum Nov. 2008 )

This part of IEC 60384 is a generic specification and is applicable to fixed capacitors for use in electronic equipment. It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose.

Festkondensatoren zur Verwendung in Geräten der Elektronik - Teil 1: Fachgrundspezifikation

Condensateurs fixes utilisés dans les équipements électroniques - Partie 1: Spécification générique

IEC 60384-1:2008 est une spécification générique, qui s'applique aux condensateurs fixes utilisés dans les équipements électroniques. Elle établit des définitions, des procédures de contrôle et des méthodes d'essai normalisées à utiliser dans les spécifications intermédiaires et particulières des composants électroniques, pour les systèmes d'assurance de la qualité ou pour tout autre usage. La présente édition contient les modifications techniques significatives suivantes par rapport à l'édition précédente: - mise en oeuvre de l'Annexe Q, qui remplace l'Article 3.

Fiksni kondenzatorji za elektronsko opremo - 1. del: Rodovna specifikacija (IEC 60384-1:2008 (EQV) + corrigendum Nov. 2008)

Ta del IEC 60384 je rodovna specifikacija in velja za fiksne kondenzatorje za elektronsko opremo. Vzpostavlja standardne izraze, nadzorne postopke in metode preskušanja, ki se uporabljajo za področno in podrobno specifikacijo elektronskih komponent za ocenjevanje kakovosti ali druge namene.

General Information

Status
Withdrawn
Publication Date
03-Jan-2010
Withdrawal Date
10-Oct-2019
Technical Committee
Current Stage
9900 - Withdrawal (Adopted Project)
Start Date
11-Oct-2019
Due Date
03-Nov-2019
Completion Date
11-Oct-2019

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SLOVENSKI STANDARD
SIST EN 60384-1:2010
01-marec-2010
1DGRPHãþD
SIST EN 60384-1:2002
Fiksni kondenzatorji za elektronsko opremo - 1. del: Rodovna specifikacija (IEC
60384-1:2008 (EQV) + corrigendum Nov. 2008)

Fixed capacitors for use in electronic equipment - Part 1: Generic specification (IEC

60384-1:2008 (EQV) + corrigendum Nov. 2008 )
Festkondensatoren zur Verwendung in Geräten der Elektronik - Teil 1:
Fachgrundspezifikation

Condensateurs fixes utilisés dans les équipements électroniques - Partie 1: Spécification

générique
Ta slovenski standard je istoveten z: EN 60384-1:2009
ICS:
31.060.10 Fiksni kondenzatorji Fixed capacitors
SIST EN 60384-1:2010 en

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

---------------------- Page: 1 ----------------------
SIST EN 60384-1:2010
---------------------- Page: 2 ----------------------
SIST EN 60384-1:2010
EUROPEAN STANDARD
EN 60384-1
NORME EUROPÉENNE
December 2009
EUROPÄISCHE NORM
ICS 31.060 Supersedes EN 60384-1:2001 + corr. Oct. 2001
English version
Fixed capacitors for use in electronic equipment -
Part 1: Generic specification
(IEC 60384-1:2008 + corrigendum 2008)
Condensateurs fixes utilisés Festkondensatoren zur Verwendung
dans les équipements électroniques - in Geräten der Elektronik -
Partie 1: Spécification générique Teil 1: Fachgrundspezifikation
(CEI 60384-1:2008 + (IEC 60384-1:2008 +
corrigendum 2008) Corrigendum 2008)

This European Standard was approved by CENELEC on 2009-10-01. CENELEC members are bound to comply

with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard

the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on

application to the Central Secretariat or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other

language made by translation under the responsibility of a CENELEC member into its own language and notified

to the Central Secretariat has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Cyprus, the

Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,

Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain,

Sweden, Switzerland and the United Kingdom.
CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
Central Secretariat: Avenue Marnix 17, B - 1000 Brussels

© 2009 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.

Ref. No. EN 60384-1:2009 E
---------------------- Page: 3 ----------------------
SIST EN 60384-1:2010
EN 60384-1:2009 - 2 -
Foreword

The text of document 40/1915/FDIS, future edition 4 of IEC 60384-1, prepared by IEC TC 40, Capacitors

and resistors for electronic equipment, was submitted to the IEC-CENELEC parallel vote and was

approved by CENELEC as EN 60384-1 on 2009-10-01.
This European Standard supersedes EN 60384-1:2001.

EN 60384-1:2009 constitutes a technical revision, including minor revisions related to tables, figures and

references.

It contains the following significant technical changes with respect to EN 60384-1:2001:

– implementation of Annex Q which replaces Clause 3.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
(dop) 2010-07-01
national standard or by endorsement
– latest date by which the national standards conflicting
(dow) 2012-10-01
with the EN have to be withdrawn
Annex ZA has been added by CENELEC.
__________
Endorsement notice

The text of the International Standard IEC 60384-1:2008 + corrigendum November 2008 was approved

by CENELEC as a European Standard without any modification.
__________
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SIST EN 60384-1:2010
- 3 - EN 60384-1:2009
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications

The following referenced documents are indispensable for the application of this document. For dated

references, only the edition cited applies. For undated references, the latest edition of the referenced

document (including any amendments) applies.

NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD

applies.
Publication Year Title EN/HD Year
IEC 60027 Series Letter symbols to be used in electrical EN 60027 Series
technology
IEC 60050 Series International Electrotechnical Vocabulary -
(IEV)
1) 2)
IEC 60062 - Marking codes for resistors and capacitors EN 60062 2005
+ corr. January 2007
IEC 60063 - Preferred number series for resistors and - -
capacitors
IEC 60068-1 1988 Environmental testing - EN 60068-1 1994
Part 1: General and guidance
IEC 60068-2-1 2007 Environmental testing - EN 60068-2-1 2007
Part 2-1: Tests - Test A: Cold
IEC 60068-2-2 2007 Environmental testing - EN 60068-2-2 2007
Part 2-2: Tests - Test B: Dry heat
IEC 60068-2-6 2007 Environmental testing - EN 60068-2-6 2008
Part 2-6: Tests - Test Fc: Vibration
(sinusoidal)
IEC 60068-2-13 1983 Environmental testing - EN 60068-2-13 1999
Part 2-13: Tests - Test M: Low air pressure
IEC 60068-2-14 2009 Environmental testing - EN 60068-2-14 2009
Part 2-14: Tests - Test N: Change of
temperature
IEC 60068-2-17 1994 Environmental testing - EN 60068-2-17 1994
Part 2-17: Tests - Test Q: Sealing
IEC 60068-2-20 1979 Environmental testing - HD 323.2.20 S3 1988
Part 2-20: Tests - Test T: Soldering
IEC 60068-2-21 2006 Environmental testing - EN 60068-2-21 2006
Part 2-21: Tests - Test U: Robustness of
terminations and integral mounting devices
IEC 60068-2-27 2008 Environmental testing - EN 60068-2-27 2009
Part 2-27: Tests - Test Ea and guidance:
Shock
Undated reference.
Valid edition at date of issue.
EN 60068-1 includes corrigendum October 1988 + A1:1992 to IEC 60068-1.

HD 323.2.20 S3 includes A2:1987 to IEC 60068-2-20; it is superseded by EN 60068-2-20:2008, which is based on

IEC 60068-2-20:2008.
---------------------- Page: 5 ----------------------
SIST EN 60384-1:2010
EN 60384-1:2009 - 4 -
Publication Year Title EN/HD Year
IEC 60068-2-29 1987 Environmental testing - EN 60068-2-29 1993
Part 2-29: Tests - Test Eb and guidance:
Bump
IEC 60068-2-30 2005 Environmental testing - EN 60068-2-30 2005
Part 2-30: Tests - Test Db: Damp heat, cyclic
(12 h + 12 h cycle)
IEC 60068-2-45 1980 Environmental testing - EN 60068-2-45 1992
Part 2-45: Tests - Test Xa and guidance:
Immersion in cleaning solvents
IEC 60068-2-54 2006 Environmental testing - EN 60068-2-54 2006
Part 2-54: Tests - Test Ta: Solderability
testing of electronic components by the
wetting balance method
IEC 60068-2-58 2004 Environmental testing - EN 60068-2-58 2004
Part 2-58: Tests - Test Td: Test methods for + corr. December 2004
solderability, resistance to dissolution of
metallization and to soldering heat of surface
mounting devices (SMD)
IEC 60068-2-69 2007 Environmental testing - EN 60068-2-69 2007
Part 2-69: Tests - Test Te: Solderability
testing of electronic components for surface
mounting devices (SMD) by the wetting
balance method
IEC 60068-2-78 2001 Environmental testing - EN 60068-2-78 2001
Part 2-78: Tests - Test Cab: Damp heat,
steady state
IEC 60294 - Measurement of the dimensions of a - -
cylindrical component having two axial
terminations
IEC 60410 1973 Sampling plans and procedures for inspection - -
by attributes
IEC 60617 Data- Graphical symbols for diagrams - -
base
IEC 60695-11-5 2004 Fire hazard testing - EN 60695-11-5 2005
Part 11-5: Test flames - Needle-flame test
method - Apparatus, confirmatory test
arrangement and guidance
IEC 60717 - Method for the determination of the space - -
required by capacitors and resistors with
unidirectional terminations
1) 2)
IEC 61193-2 - Quality assessment systems - EN 61193-2 2007
Part 2: Selection and use of sampling plans
for inspection of electronic components and
packages
IEC 61249-2-7 2002 Materials for printed boards and other EN 61249-2-7 2002
interconnecting structures - + corr. September 2005
Part 2-7: Reinforced base materials, clad and
unclad - Epoxide woven E-glass laminated
sheet of defined flammability (vertical burning
test), copper-clad

EN 60068-2-29 is superseded by EN 60068-2-27:2009, which is based on IEC 60068-2-27:2008.

---------------------- Page: 6 ----------------------
SIST EN 60384-1:2010
- 5 - EN 60384-1:2009
Publication Year Title EN/HD Year
IEC QC 001002-3 - IEC Quality Assessment System - -
for Electronic Components (IECQ) - Rules of
Procedure - Part 3: Approval procedures
ISO 3 - Preferred numbers - Series of preferred - -
numbers
ISO 1000 - SI units and recommendations for the use of - -
their multiples and of certain other units
1) 2)
ISO 9000 - Quality management systems - EN ISO 9000 2005
Fundamentals and vocabulary
---------------------- Page: 7 ----------------------
SIST EN 60384-1:2010
---------------------- Page: 8 ----------------------
SIST EN 60384-1:2010
IEC 60384-1
Edition 4.0 2008-07
INTERNATIONAL
STANDARD
QC 300000
Fixed capacitors for use in electronic equipment –
Part 1: Generic specification
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
PRICE CODE
ICS 31.060 ISBN 2-8318-9907-9
® Registered trademark of the International Electrotechnical Commission
---------------------- Page: 9 ----------------------
SIST EN 60384-1:2010
– 2 – 60384-1 © IEC:2008(E)
CONTENTS

FOREWORD...........................................................................................................................7

1 General ............................................................................................................................9

1.1 Scope......................................................................................................................9

1.2 Normative references ..............................................................................................9

2 Technical data................................................................................................................10

2.1 Units and symbols .................................................................................................10

2.2 Terms and definitions ............................................................................................11

2.3 Preferred values....................................................................................................17

2.3.1 General .....................................................................................................17

2.3.2 Preferred values of nominal capacitance ...................................................17

2.3.3 Preferred values of rated voltage...............................................................17

2.4 Marking .................................................................................................................17

2.4.1 General .....................................................................................................17

2.4.2 Coding.......................................................................................................17

3 Quality assessment procedures......................................................................................17

4 Tests and measurement procedures...............................................................................18

4.1 General .................................................................................................................19

4.2 Standard atmospheric conditions...........................................................................19

4.2.1 Standard atmospheric conditions for testing ..............................................19

4.2.2 Recovery conditions ..................................................................................19

4.2.3 Referee conditions ....................................................................................20

4.2.4 Reference conditions.................................................................................20

4.3 Drying ...................................................................................................................20

4.4 Visual examination and check of dimensions.........................................................20

4.4.1 Visual examination ....................................................................................20

4.4.2 Dimensions (gauging)................................................................................20

4.4.3 Dimensions (detail)....................................................................................20

4.5 Insulation resistance .............................................................................................21

4.5.1 Preconditioning..........................................................................................21

4.5.2 Measuring conditions.................................................................................21

4.5.3 Test points ................................................................................................21

4.5.4 Test methods.............................................................................................21

4.5.5 Temperature compensation .......................................................................22

4.5.6 The relevant specification shall prescribe: .................................................22

4.6 Voltage proof.........................................................................................................23

4.6.1 Test circuit (for the test between terminations) ..........................................23

4.6.2 Test...........................................................................................................24

4.6.3 Requirements ............................................................................................26

4.6.4 Conditions to be prescribed in the relevant specification............................26

4.7 Capacitance ..........................................................................................................26

4.7.1 Measuring frequency and measuring voltage .............................................26

4.7.2 Measuring equipment ................................................................................26

4.7.3 Conditions to be prescribed in the relevant specification............................26

4.8 Tangent of loss angle and equivalent series resistance (ESR)...............................27

4.8.1 Tangent of loss angle ................................................................................27

4.8.2 Equivalent series resistance (ESR)............................................................27

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SIST EN 60384-1:2010
60384-1 © IEC:2008(E) – 3 –

4.9 Leakage current ....................................................................................................27

4.9.1 Preconditioning..........................................................................................27

4.9.2 Test method ..............................................................................................28

4.9.3 Power source ............................................................................................28

4.9.4 Measuring accuracy...................................................................................28

4.9.5 Test circuit ................................................................................................28

4.9.6 Conditions to be prescribed in the relevant specification............................28

4.10 Impedance ............................................................................................................28

4.11 Self-resonant frequency and inductance................................................................29

4.11.1 Self-resonant frequency (f ) .......................................................................29

4.11.2 Inductance.................................................................................................32

4.11.3 Conditions to be prescribed in the relevant specification............................32

4.12 Outer foil termination.............................................................................................32

4.13 Robustness of terminations ...................................................................................33

4.13.1 Test Ua – Tensile.....................................................................................33

4.13.2 Test Ub – Bending (half of the sample)......................................................33

4.13.3 Test Uc – Torsion (remaining sample) .......................................................33

4.13.4 Test Ud – Torque (for terminations with threaded studs or screws

and for integral mounting devices) .............................................................33

4.13.5 Visual examination ....................................................................................34

4.14 Resistance to soldering heat .................................................................................34

4.14.1 Preconditioning..........................................................................................34

4.14.2 Test procedure ..........................................................................................34

4.14.3 Recovery ...................................................................................................34

4.14.4 Final inspection, measurement and requirements ......................................34

4.15 Solderability ..........................................................................................................34

4.15.1 Preconditioning..........................................................................................34

4.15.2 Test procedure ..........................................................................................35

4.15.3 Final inspection, measurements and requirements ....................................35

4.16 Rapid change of temperature ................................................................................35

4.16.1 Initial measurement ...................................................................................35

4.16.2 Test procedure ..........................................................................................35

4.16.3 Final inspection, measurements and requirements ....................................35

4.17 Vibration................................................................................................................36

4.17.1 Initial measurement ...................................................................................36

4.17.2 Test procedure ..........................................................................................36

4.17.3 Electrical test.............................................................................................36

4.17.4 Final inspection, measurements and requirements ....................................36

4.18 Bump ....................................................................................................................36

4.18.1 Initial measurement ...................................................................................36

4.18.2 Test procedure ..........................................................................................36

4.18.3 Final inspection, measurements and requirements ....................................36

4.19 Shock....................................................................................................................36

4.19.1 Initial measurement ...................................................................................36

4.19.2 Test procedure ..........................................................................................36

4.19.3 Final inspection, measurements and requirements ....................................37

4.20 Container sealing ..................................................................................................37

4.21 Climatic sequence .................................................................................................37

4.21.1 Initial measurements .................................................................................37

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SIST EN 60384-1:2010
– 4 – 60384-1 © IEC:2008(E)

4.21.2 Dry heat ....................................................................................................37

4.21.3 Damp heat, cyclic, test Db, first cycle ........................................................37

4.21.4 Cold ..........................................................................................................37

4.21.5 Low air pressure........................................................................................38

4.21.6 Damp heat, cyclic, test Db, remaining cycles .............................................38

4.21.7 Final measurements ..................................................................................38

4.22 Damp heat, steady state........................................................................................38

4.22.1 Initial measurement ...................................................................................38

4.22.2 Test procedure ..........................................................................................38

4.22.3 Final inspection, measurements and requirements ....................................39

4.23 Endurance.............................................................................................................39

4.23.1 Initial measurements .................................................................................39

4.23.2 Test procedure ..........................................................................................39

4.23.3 Conditions to be prescribed in the relevant specification............................39

4.23.4 Test voltage...............................................................................................39

4.23.5 Placement in the test chamber...................................................................40

4.23.6 Recovery ...................................................................................................40

4.23.7 Final inspection, measurements and requirements ....................................40

4.24 Variation of capacitance with temperature .............................................................41

4.24.1 Static method ............................................................................................41

4.24.2 Dynamic method........................................................................................41

4.24.3 Methods of calculation...............................................................................42

4.25 Storage .................................................................................................................43

4.25.1 Storage at high temperature ......................................................................43

4.25.2 Storage at low temperature........................................................................43

4.26 Surge ....................................................................................................................43

4.26.1 Initial measurement ...................................................................................43

4.26.2 Test procedure ..........................................................................................43

4.26.3 Final inspection, measurements and requirements ....................................45

4.26.4 Information to be given in the relevant detail specification .........................45

4.27 Charge and discharge tests and inrush current test ...............................................45

4.27.1 Initial measurement ...................................................................................45

4.27.2 Test procedure ..........................................................................................45

4.27.3 Charge and discharge ...............................................................................47

4.27.4 Inrush current ............................................................................................47

4.27.5 Final inspection, measurements and requirements ....................................47

4.28 Pressure relief (for aluminium electrolytic capacitors)............................................47

4.28.1 a.c. test .....................................................................................................47

4.28.2 d.c. test .....................................................................................................47

4.28.3 Pneumatic test...........................................................................................47

4.28.4 Final inspection, measurements and requirements ....................................48

4.29 Characteristics at high and low temperature ..........................................................48

4.29.1 Test procedure ..........................................................................................48

4.29.2 Requirements ............................................................................................48

4.30 Thermal stability test .............................................................................................48

4.31 Component solvent resistance...............................................................................48

4.31.1 Initial measurements .................................................................................48

4.31.2 Test procedure ..........................................................................................48

4.31.3 Final inspection, measurements and requirements ....................................49

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SIST EN 60384-1:2010
60384-1 © IEC:2008(E) – 5 –

4.32 Solvent resistance of marking................................................................................49

4.32.1 Test procedure ..........................................................................................49

4.32.2 Final inspection, measurements and requirements ....................................49

4.33 Mounting (for surface mount capacitors only) ........................................................49

4.33.1 Substrate...................................................................................................49

4.34 Shear test .............................................................................................................52

4.34.1 Test procedure ..........................................................................................52

4.34.2 Final inspection, measurements and requirements ....................................52

4.35 Substrate bending test ..........................................................................................52

4.35.1 Test procedure ..........................................................................................52

4.35.2 Recovery ...................................................................................................52

4.35.3 Final inspection and requirements .............................................................52

4.36 Dielectric absorption..............................................................................................52

4.36.1 Test procedure ..........................................................................................52

4.36.2 Requirement..............................................................................................53

4.37 Accelerated damp heat, steady state (for multilayer ceramic capacitors only)........53

4.37.1 Mounting of capacitors ..............................................................................53

4.37.2 Initial measurement ...................................................................................53

4.37.3 Test procedure ..........................................................................................53

4.37.4 Recovery ...................................................................................................54

4.37.5 Final inspection, measurements and requirements ....................................54

4.38 Passive flammability..............................................................................................54

4.38.1 Test procedure ..........................................................................................54

4.38.2 Final inspection, measurements and requirements ....................................54

4.39 High surge current test ..........................................................................................55

4.39.1 Initial measurements ...................................................................

...

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