SIST EN 61788-17:2013
(Main)Superconductivity - Part 17: Electronic characteristic measurements - Local critical current density and its distribution in large-area superconducting films
Superconductivity - Part 17: Electronic characteristic measurements - Local critical current density and its distribution in large-area superconducting films
This part of IEC 61788 describes the measurements of the local critical current density (Jc) and its distribution in large-area high-temperature superconducting (HTS) films by an inductive method using third-harmonic voltages. The most important consideration for precise measurements is to determine Jc at liquid nitrogen temperatures by an electric-field criterion
and obtain current-voltage characteristics from its frequency dependence. Although it is possible to measure Jc in applied DC magnetic fields [20, 21]2, the scope of this standard is limited to the measurement without DC magnetic fields. This technique intrinsically measures the critical sheet current that is the product of Jc and the film thickness d. The range and measurement resolution for Jcd of HTS films are as follows:
– Jcd: from 200 A/m to 32 kA/m (based on results, not limitation);
– Measurement resolution: 100 A/m (based on results, not limitation).
Supraleitfähigkeit - Teil 17: Messungen der elektronischen Charakteristik - Lokale kritische Stromdichte und deren Verteilung in großflächigen supraleitenden Schichten
Supraconductivité - Partie 17: Mesures de caractéristiques électroniques - Densité de courant critique local et sa distribution dans les films supraconducteurs de grande surface
La CEI 61788-17:2013 décrit les mesures de la densité de courant critique local (Jc) et sa distribution dans les films supraconducteurs à haute température (HTS) de grande surface par une méthode inductive utilisant les tensions de troisième harmonique. La considération la plus importante pour effectuer des mesures précises consiste à déterminer Jc aux températures de l'azote liquide au moyen d'un critère de champ électrique et obtenir des caractéristiques courant-tension d'après sa dépendance vis-à-vis de la fréquence. Bien qu'il soit possible de mesurer Jc dans des champs magnétiques en courant continu appliqués, le domaine d'application de la présente norme est limité à la mesure sans champ magnétique en courant continu. Cette technique mesure de façon intrinsèque le courant de feuille critique, qui est le produit de Jc par l'épaisseur d du film. La plage et la résolution de mesure pour Jcd des films HTS est de 200 A/m à 32 kA/m avec une résolution de mesure de 100 A/m.
Superprevodnost - 17. del: Meritve elektronskih karakteristik - Krajevno kritična tokovna gostota in njena porazdelitev po površinsko obširnih razsežnih superprevodnih plasteh
Ta del IEC 61788 opisuje meritve lokalne kritične tokovne gostote (Jc) in njene porazdelitve na obsežnih visokotemperaturnih superprevodnih (HTS) filmih z induktivno metodo s pomočjo tretje-harmonskih napetosti. Najpomembnejši del pri natančnosti meritev je določiti Jc pri temperaturah tekočega nitrogena s kriterijem električnega polja in pridobiti lastnosti trenutne napetosti iz frekvenčne odvisnosti. Čeprav je mogoče Jc izmeriti v uporabljenih enosmernih magnetnih poljih [20, 21]2, se ta standard nanaša le na meritve brez enosmernih magnetnih polj. Ta tehnika meri kritični tok plasti, ki je rezultat Jc in debeline filma d. Obseg in ločljivost meritve za Jcd filmov HTS sta naslednja:
– Jcd: od 200 A/m do 32 kA/m (glede na rezultate, ne omejitve);
– Ločljivost meritve: 100 A/m (na podlagi rezultatov, ne omejitve).
General Information
Relations
Standards Content (Sample)
SLOVENSKI STANDARD
01-julij-2013
6XSHUSUHYRGQRVWGHO 0HULWYHHOHNWURQVNLKNDUDNWHULVWLN.UDMHYQRNULWLþQD
WRNRYQDJRVWRWDLQQMHQDSRUD]GHOLWHYSRSRYUãLQVNRREãLUQLKUD]VHåQLK
VXSHUSUHYRGQLKSODVWHK
Superconductivity - Part 17: Electronic characteristic measurements - Local critical
current density and its distribution in large-area superconducting films
Supraleitfähigkeit - Teil 17: Messungen der elektronischen Charakteristik - Lokale
kritische Stromdichte und deren Verteilung in großflächigen supraleitenden Schichten
Supraconductivité - Partie 17: Mesures de caractéristiques électroniques - Densité de
courant critique local et sa distribution dans les films supraconducteurs de grande
surface
Ta slovenski standard je istoveten z: EN 61788-17:2013
ICS:
17.220.20 0HUMHQMHHOHNWULþQLKLQ Measurement of electrical
PDJQHWQLKYHOLþLQ and magnetic quantities
29.050 Superprevodnost in prevodni Superconductivity and
materiali conducting materials
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
EUROPEAN STANDARD
EN 61788-17
NORME EUROPÉENNE
April 2013
EUROPÄISCHE NORM
ICS 17.220.20; 29.050
English version
Superconductivity -
Part 17: Electronic characteristic measurements -
Local critical current density and its distribution in large-area
superconducting films
(IEC 61788-17:2013)
Supraconductivité - Supraleitfähigkeit -
Partie 17: Mesures de caractéristiques Teil 17: Messungen der elektronischen
électroniques - Charakteristik -
Densité de courant critique local et sa Lokale kritische Stromdichte und deren
distribution dans les films Verteilung in großflächigen supraleitenden
supraconducteurs de grande surface Schichten
(CEI 61788-17:2013) (IEC 61788-17:2013)
This European Standard was approved by CENELEC on 2013-02-20. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the CEN-CENELEC Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the CEN-CENELEC Management Centre has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus,
the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany,
Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland,
Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom.
CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
Management Centre: Avenue Marnix 17, B - 1000 Brussels
© 2013 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 61788-17:2013 E
Foreword
The text of document 90/310/FDIS, future edition 1 of IEC 61788-17, prepared by IEC TC 90,
"Superconductivity" was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as
The following dates are fixed:
• latest date by which the document has (dop) 2013-11-20
to be implemented at national level by
publication of an identical national
standard or by endorsement
(dow) 2016-02-20
• latest date by which the national
standards conflicting with the
document have to be withdrawn
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such patent
rights.
Endorsement notice
The text of the International Standard IEC 61788-17:2013 was approved by CENELEC as a European
Standard without any modification.
- 3 - EN 61788-17:2013
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following documents, in whole or in part, are normatively referenced in this document and are
indispensable for its application. For dated references, only the edition cited applies. For undated
references, the latest edition of the referenced document (including any amendments) applies.
NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.
Publication Year Title EN/HD Year
IEC 60050 Series International electrotechnical vocabulary - -
IEC 61788-17 ®
Edition 1.0 2013-01
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Superconductivity –
Part 17: Electronic characteristic measurements – Local critical current density
and its distribution in large-area superconducting films
Supraconductivité –
Partie 17: Mesures de caractéristiques électroniques – Densité de courant
critique local et sa distribution dans les films supraconducteurs de grande
surface
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX X
ICS 17.220.20; 29.050 ISBN 978-2-83220-583-9
– 2 – 61788-17 © IEC:2013
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 8
2 Normative reference . 8
3 Terms and definitions . 8
4 Requirements . 9
5 Apparatus . 9
5.1 Measurement equipment . 9
5.2 Components for inductive measurements . 10
5.2.1 Coils . 10
5.2.2 Spacer film . 11
5.2.3 Mechanism for the set-up of the coil . 11
5.2.4 Calibration wafer . 11
6 Measurement procedure . 12
6.1 General . 12
6.2 Determination of the experimental coil coefficient . 12
6.2.1 Calculation of the theoretical coil coefficient k . 12
6.2.2 Transport measurements of bridges in the calibration wafer . 13
6.2.3 U measurements of the calibration wafer . 13
6.2.4 Calculation of the E-J characteristics from frequency-dependent I
th
data . 13
6.2.5 Determination of the k’ from J and J values for an appropriate E . 14
ct c0
6.3 Measurement of J in sample films . 15
c
6.4 Measurement of J with only one frequency . 15
c
6.5 Examples of the theoretical and experimental coil coefficients . 16
7 Uncertainty in the test method . 17
7.1 Major sources of systematic effects that affect the U measurement . 17
7.2 Effect of deviation from the prescribed value in the coil-to-film distance . 18
7.3 Uncertainty of the experimental coil coefficient and the obtained J . 18
c
7.4 Effects of the film edge . 19
7.5 Specimen protection . 19
8 Test report . 19
8.1 Identification of test specimen . 19
8.2 Report of J values . 19
c
8.3 Report of test conditions . 19
Annex A (informative) Additional information relating to Clauses 1 to 8 . 20
Annex B (informative) Optional measurement systems . 26
Annex C (informative) Uncertainty considerations . 32
Annex D (informative) Evaluation of the uncertainty . 37
Bibliography . 43
Figure 1 – Diagram for an electric circuit used for inductive J measurement of HTS
c
films . 10
Figure 2 – Illustration showing techniques to press the sample coil to HTS films . 11
Figure 3 – Example of a calibration wafer used to determine the coil coefficient . 12
61788-17 © IEC:2013 – 3 –
Figure 4 – Illustration for the sample coil and the magnetic field during measurement . 13
Figure 5 – E-J characteristics measured by a transport method and the U inductive
method . 14
Figure 6 –Example of the normalized third-harmonic voltages (U /fI ) measured with
3 0
various frequencies . 15
Figure 7 – Illustration for coils 1 and 3 in Table 1 . 16
Figure 8 – The coil-factor function F(r) = 2H /I calculated for the three coils . 17
0 0
Figure 9 – The coil-to-film distance Z dependence of the theoretical coil coefficient k . 18
Figure A.1 – Illustration for the sample coil and the magnetic field during measurement . 22
Figure A.2 – (a) U and (b) U /I plotted against I in a YBCO thin film measured in
3 3 0 0
applied DC magnetic fields, and the scaling observed when normalized by I (insets) . 23
th
Figure B.1 – Schematic diagram for the variable-RL-cancel circuit . 27
Figure B.2 – Diagram for an electrical circuit used for the 2-coil method . 27
Figure B.3 – Harmonic noises arising from the power source . 28
Figure B.4 – Noise reduction using a cancel coil with a superconducting film . 28
Figure B.5 – Normalized harmonic noises (U /fI ) arising from the power source . 29
3 0
Figure B.6 – Normalized noise voltages after the reduction using a cancel coil with a
superconducting film . 29
Figure B.7 – Normalized noise voltages after the reduction using a cancel coil without
a superconducting film . 30
Figure B.8 – Normalized noise voltages with the 2-coil system shown in Figure B.2 . 30
Figure D.1 – Effect of the coil position against a superconducting thin film on the
measured J values . 41
c
Table 1 – Specifications and coil coefficients of typical sample coils . 16
Table C.1 – Output signals from two nominally identical extensometers . 33
Table C.2 – Mean values of two output signals . 33
Table C.3 – Experimental standard deviations of two output signals . 33
Table C.4 – Standard uncertainties of two output signals .
...
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