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ASTM E2900-12

(Practice)

Standard Practice for Spacecraft Hardware Thermal Vacuum Bakeout

Standard Practice for Spacecraft Hardware Thermal Vacuum Bakeout

SCOPE
1.1 This practice establishes methods for thermal vacuum bakeout of spacecraft and spacecraft components.  
1.2 This practice defines the equipment, environment, and certification criteria for each type of bakeout.  
1.3 The methods defined in this practice are intended to reduce component outgassing rates to levels necessary to meet mission performance requirements of the contamination sensitive hardware. Times, temperatures, and configurations contained in this document have been found to provide satisfactory results. Experienced operators may find that other, similar times, temperatures and configurations have provided satisfactory results. If deviations from these criteria are deemed appropriate, they should be detailed in the bakeout report.  
1.4 This practice describes three bakeout methods: Method A, using prescribed time and pressure criteria; Method B, using prescribed QCM stabilization rate criteria; and Method C, which measures the QCM deposition rate.  
1.5 Determination of the acceptable molecular outgassing, selection of the bakeout method, and determination of the specific test completion criteria are the responsibility of the user organization.  
1.6 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

General Information

Status
Historical
Publication Date
31-Oct-2012
ICS
49.140 - Space systems and operations
Technical Committee
E21 - Space Simulation and Applications of Space Technology
Drafting Committee
E21.05 - Contamination
Current Stage
Ref Project

Relations

Replaced By
ASTM E2900-19 - Standard Practice for Spacecraft Hardware Thermal Vacuum Bakeout
Effective Date
01-Feb-2019

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ASTM E2900-12 - Standard Practice for Spacecraft Hardware Thermal Vacuum BakeoutASTM E2900-12 - Standard Practice for Spacecraft Hardware Thermal Vacuum Bakeout
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ASTM E2900-12 - Standard Practice for Spacecraft Hardware Thermal Vacuum Bakeout
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Standards Content (Sample)

NOTICE: This standard has either been superseded and replaced by a new version or withdrawn.
Contact ASTM International (www.astm.org) for the latest information
Designation: E2900 − 12
Standard Practice for
1
Spacecraft Hardware Thermal Vacuum Bakeout
This standard is issued under the fixed designation E2900; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
1. Scope E834 Practice for Determining Vacuum Chamber Gaseous
Environment Using a Cold Finger
1.1 This practice establishes methods for thermal vacuum
E1234 Practice for Handling, Transporting, and Installing
bakeout of spacecraft and spacecraft components.
Nonvolatile Residue (NVR) Sample Plates Used in Envi-
1.2 This practice defines the equipment, environment, and
ronmentally Controlled Areas for Spacecraft
certification criteria for each type of bakeout.
E1235 Test Method for Gravimetric Determination of Non-
1.3 The methods defined in this practice are intended to volatile Residue (NVR) in Environmentally Controlled
Areas for Spacecraft
reduce component outgassing rates to levels necessary to meet
mission performance requirements of the contamination sensi- E1549 Specification for ESD Controlled Garments Required
in Cleanrooms and Controlled Environments for Space-
tive hardware. Times, temperatures, and configurations con-
tainedinthisdocumenthavebeenfoundtoprovidesatisfactory craft for Non-Hazardous and Hazardous Operations
E1559 Test Method for Contamination Outgassing Charac-
results. Experienced operators may find that other, similar
times, temperatures and configurations have provided satisfac- teristics of Spacecraft Materials
E1560 Test Method for Gravimetric Determination of Non-
tory results. If deviations from these criteria are deemed
appropriate, they should be detailed in the bakeout report. volatile Residue From Cleanroom Wipers
E1731 Test Method for Gravimetric Determination of Non-
1.4 This practice describes three bakeout methods: Method
volatile Residue from Cleanroom Gloves
A,usingprescribedtimeandpressurecriteria;MethodB,using
E2311 Practice for QCM Measurement of Spacecraft Mo-
prescribed QCM stabilization rate criteria; and Method C,
lecular Contamination in Space
which measures the QCM deposition rate.
2.2 Other Standards:
1.5 Determination of the acceptable molecular outgassing,
IEST-STD-CC1246 Product Cleanliness Levels and Con-
selection of the bakeout method, and determination of the 3
tamination Control Program
specific test completion criteria are the responsibility of the
MIL-STD-1246 Product Cleanliness Levels and Contamina-
user organization. 4,5
tion Control Program
5
1.6 This standard does not purport to address all of the
MIL-P-27401 Propellant Pressurizing Agent, Nitrogen
3
safety concerns, if any, associated with its use. It is the
ISO-14644 Cleanrooms and associated clean environments
responsibility of the user of this standard to establish appro-
FED-STD-209 Federal Standard, Airborne Particulate
5,6
priate safety and health practices and determine the applica-
Cleanliness Classes in Cleanrooms and Clean Zones
bility of regulatory limitations prior to use.
3. Terminology
2. Referenced Documents
3.1 Definitions:
2
2.1 ASTM Standards:
3.1.1 ambient conditions, n—room temperature and pres-
E1546 Guide for Development of Fire-Hazard-Assessment
sure.
Standards
3.1.2 pre-bakeout, n—to clean or condition, or both, a
E296 Practice for Ionization Gage Application to Space
vacuum chamber prior to its use for flight hardware.
Simulators
1 3
This test method is under the jurisdiction of ASTM Committee E21 on Space Available from Institute of Environmental Sciences and Technology (IEST),
Simulation andApplications of Space Technology and is the direct responsibility of Arlington Place One, 2340 S.Arlington Heights Rd., Suite 100,Arlington Heights,
Subcommittee E21.05 on Contamination. IL 60005-4516, http://www.iest.org.
4
Current edition approved Nov. 1, 2012. Published December 2012. DOI: MIL-STD-1246 may be used in lieu of IEST-STD-CC1246 by mutual agree-
10.1520/E2900-12. ment of the parties in the contract.
2 5
For referenced ASTM standards, visit the ASTM website, www.astm.org, or Available from DLA Document Services, Building 4/D, 700 Robbins Ave.,
contact ASTM Customer Service at service@astm.org. For Annual Book of ASTM Philadelphia, PA 19111-5094, https://assist.daps.dla.mil/quicksearch/
6
Standards volume information, refer to the standard’s Document Summary page on FED-STD-209 may be used in lieu of ISO-14644 by mutual agreement of the
the ASTM website. parties in the contract.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States
1

---------------------- Page: 1 ----------------------
E2900 − 12
2
3.1.3 ba
...

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SIGNIFICANCE AND USE
3.1 The tape lift provides a rapid and simple technique for removing particles from a surface and determining their number and size distribution.  
3.2 By using statistically determined sample size and locations, an estimate of the surface cleanliness level of large areas can be made. The user shall define the sampling plan.  
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3.6 T...
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1.2 This practice describes the materials and equipment required to perform sampling of surfaces for particle counting and sizing.  
1.3 The criteria for acceptance or rejection of a part for conformance to surface cleanliness level requirements shall be determined by the user and are not included in this practice.  
1.4 This practice is for use on surfaces that are not damaged by the application of adhesive tape. The use of this practice on any surface of any material not previously tested, or for which the susceptibility to damage is unknown, is not recommended. In general, metals, metal plating, and oxide coatings will not be damaged. Application to painted, vapor deposited, and optical coatings should be evaluated before implementing this test.  
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Practice  
Sections  
A—This method uses light transmitted through the tape and tape adhesive to detect particles that adhere to it.  
4 to 6  
B—This method uses light transmitted through the tape adhesive after bonding to a base microscope slide, dissolving the tape backing, and a cover slide. The particles are embedded in the adhesive, and air bubbles are eliminated with acrylic mounting media.  
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C—This method uses light reflected off the tape adhesive to detect particles that adhere to it.  
10 to 12  
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