ASTM D2520-01
(Test Method)Standard Test Methods for Complex Permittivity (Dielectric Constant) of Solid Electrical Insulating Materials at Microwave Frequencies and Temperatures to 1650oC (Withdrawn 2010)
Standard Test Methods for Complex Permittivity (Dielectric Constant) of Solid Electrical Insulating Materials at Microwave Frequencies and Temperatures to 1650<sup>o</sup>C (Withdrawn 2010)
SIGNIFICANCE AND USE
Design calculations for such components as transmission lines, antennas, radomes, resonators, phase shifters, etc., require knowledge of values of complex permittivity at operating frequencies. The related microwave measurements substitute distributed field techniques for low-frequency lumped-circuit impedance techniques.
Further information on the significance of permittivity may be found in Test Methods D 150.
These test methods are useful for specification acceptance, service evaluation, manufacturing control, and research and development of ceramics, glasses, and organic dielectric materials.
FIG. 1 Standing Wave Established Within Empty Shorted Waveguide
SCOPE
1.1 These test methods cover the determination of relative (Note 0) complex permittivity (dielectric constant and dissipation factor) of nonmagnetic solid dielectric materials. Note 0The word "relative" is often omitted.
1.1.1 Test Method A is for specimens precisely formed to the inside dimension of a waveguide.
1.1.2 Test Method B is for specimens of specified geometry that occupy a very small portion of the space inside a resonant cavity.
1.1.3 Test Method C uses a resonant cavity with fewer restrictions on specimen size, geometry, and placement than Test Methods A and B.
1.2 Although these methods are used over the microwave frequency spectrum from around 0.5 to 50.0 GHz, each octave increase usually requires a different generator and a smaller test waveguide or resonant cavity.
1.3 Tests at elevated temperatures are made using special high-temperature waveguide and resonant cavities.
1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
WITHDRAWN RATIONALE
These test methods cover the determination of relative complex permittivity (dielectric constant and dissipation factor) of nonmagnetic solid dielectric materials.
Formerly under the jurisdiction of Committee D09 on Electrical and Electronic Insulating Materials, these test methods were withdrawn in 2010 in accordance with section 10.5.3.1 of the Regulations Governing ASTM Technical Committees, which requires that standards shall be updated by the end of the eighth year since the last approval date.
General Information
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Standards Content (Sample)
NOTICE: This standard has either been superseded and replaced by a new version or withdrawn.
Contact ASTM International (www.astm.org) for the latest information.
An American National Standard
Designation: D2520 – 01
Standard Test Methods for
Complex Permittivity (Dielectric Constant) of Solid Electrical
Insulating Materials at Microwave Frequencies and
1
Temperatures to 1650°C
This standard is issued under the fixed designation D2520; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision.Anumber in parentheses indicates the year of last reapproval.A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
This standard has been approved for use by agencies of the Department of Defense.
1. Scope priate safety and health practices and determine the applica-
bility of regulatory limitations prior to use.
1.1 These test methods cover the determination of relative
(Note 1) complex permittivity (dielectric constant and dissipa-
2. Referenced Documents
tion factor) of nonmagnetic solid dielectric materials.
2
2.1 ASTM Standards:
NOTE 1—The word “relative” is often omitted.
A893/A893M Test Method for Complex Dielectric Con-
stant of Nonmetallic Magnetic Materials at Microwave
1.1.1 Test Method A is for specimens precisely formed to
the inside dimension of a waveguide. Frequencies
D150 Test Methods for AC Loss Characteristics and Per-
1.1.2 TestMethodB isforspecimensofspecifiedgeometry
that occupy a very small portion of the space inside a resonant mittivity (Dielectric Constant) of Solid Electrical Insula-
tion
cavity.
1.1.3 Test Method C uses a resonant cavity with fewer D1711 Terminology Relating to Electrical Insulation
restrictions on specimen size, geometry, and placement than
3. Terminology
Test Methods A and B.
3.1 Definitions:
1.2 Although these methods are used over the microwave
3.1.1 neper, n—a division of the logarithmic scale wherein
frequency spectrum from around 0.5 to 50.0 GHz, each octave
the number of nepers is equal to the natural logarithm of the
increaseusuallyrequiresadifferentgeneratorandasmallertest
scalar ratio of either two voltages or two currents.
waveguide or resonant cavity.
1.3 Tests at elevated temperatures are made using special
NOTE 2—The neper is a dimensionless unit. 1 neper equals 0.8686 bel.
high-temperature waveguide and resonant cavities.
With I and I denoting the scalar values of two currents and n being the
x y
1.4 This standard does not purport to address all of the
number of nepers denoted by their scalar ratio, then:
safety concerns, if any, associated with its use. It is the
n 5 ln ~l /l !
e x y
responsibility of the user of this standard to establish appro-
where:
ln = logarithm to base e.
e
1
These test methods are under the jurisdiction of ASTM Committee D09 on
Electrical and Electronic Insulating Materials and are the direct responsibility of
2
Subcommittee D09.12 on Electrical Tests. For referenced ASTM standards, visit the ASTM website, www.astm.org, or
Current edition approved May 10, 2001. Published July 2001. Originally contact ASTM Customer Service at service@astm.org. For Annual Book of ASTM
published as D2520–66T. Last previous edition D2520–95. DOI: 10.1520/ Standards volume information, refer to the standard’s Document Summary page on
D2520-01. the ASTM website.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.
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D2520 – 01
3.1.2 For other definitions used in these test methods, refer
k* = relative complex permittivity,
to Terminology D1711.
´ = (absolute) permittivity of free space, and
0
v =2pf, f being the frequency.
4. Significance and Use
The notation used will be as follows:
4.1 Design calculations for such components as transmis-
k*5k8 2jk95k8~1 2j tan d! (2)
sion lines, antennas, radomes, resonators, phase shifters, etc.,
require knowledge of values of complex permittivity at oper- where:
ating frequencies. The related microwave measurements sub- tan d = k9/k8,
k8 = real part, and
stitute distributed field techniques for low-frequency lumped-
k9 = imaginary part.
circuit impedance techniques.
The value of k* may be obtained from observations that
4.2 Further information on the significance of permittivity
evaluate the attenuation and wavelength of electromagnetic
may be found in Test Methods D150.
wave propagation in the medium.
4.3 These test methods are useful for specification accep-
6.2 The permittivity of the medium in a transmission line
tance, service evaluation, manufacturing control, and research
affects the wave propagation in that line. Thus, the dielectric
and development of ceramics, glasses, and organic dielectric
properties of a specimen may be obtained by using a suitable
materials.
FIG. 1 Standing Wave Established Within Empty Shorted Waveguide
TEST METHOD A—SHORTED TRANSMISSION line as a di
...
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