ASTM E2039-04

Standard Test Method for Determining and Reporting Dynamic Dielectric Properties (Withdrawn 2009)

SIGNIFICANCE AND USE
Dielectric measurement and testing provide a method for determining the permittivity and loss factors as a function of temperature, frequency, time, or a combination of these variables. Plots of the dielectric properties against these variables yield important information and characteristics about the specimen under test.
This procedure can be used to do the following:
5.2.1 Locate transition temperatures of polymers and other organic materials, that is, changes in molecular motion (or atomic motion in the case of ions) of the material. In temperature regions where significant changes occur, permittivity increases with increasing temperature (at a given frequency) or with decreasing frequency (at constant temperature). A maximum is observed for the loss factor in cases where dipole motions dominate over ionic movement.3  
5.2.2 Track the reaction in polymerization and curing reactions. This may be done under either isothermal or nonisothermal conditions. Increasing molecular weight or degree of crosslinking normally leads to decreases in conductivity.4  
5.2.3 Determine diffusion coefficients of polar gases or liquids into polymer films on dielectric sensors. The observed change in permittivity typically is linear with diffusant concentration, as long as the total concentration is relatively low.5  
This procedure can be used, for example, to evaluate by comparison to known reference materials:
5.3.1 The mix ratio of two different organic materials. This may be determined either through use of permittivity or loss factor values. In early studies, permittivity has been found to be linear with concentration.6  
5.3.2 The degree of phase separation in multicomponent systems.
5.3.3 The filler type, amount, pretreatment, and dispersion.
This test method can be used for observing annealing and the submelting point crystallization process.
This test method can be used for quality control, specification acceptance, and process control.
SCOPE
1.1 This test method describes the gathering and reporting of dynamic dielectric data. It incorporates laboratory test method for determining dynamic dielectric properties of specimens subjected to an oscillatory electric field using a variety of dielectric sensor/cell configurations on a variety of instruments called dielectric, microdielectric, DETA (DiElectric Thermal Analysis), or DEA (DiElectric Analysis) analyzers.
1.2 This test method determines permittivity, loss factor, ionic conductivity (or resistivity), dipole relaxation times, and transition temperatures, and is intended for materials that have a relative permittivity in the range of 1 to 105; loss factors in the range of 0 to 108; and, conductivities in the range 10 16to 1010S/cm.
1.3 The test method is primarily useful when conducted over a range of temperatures for nonreactive systems (160C to degradation) and over time (and temperature) for reactive systems and is valid for frequencies ranging from 1 mHz to 100 kHz.
1.4 Apparent discrepancies may arise in results obtained under differing experimental conditions. Without changing the observed data, completely reporting the conditions (as described in this test method) under which the data were obtained, in full, will enable apparent differences observed in another study to be reconciled.
1.5 SI units are the standard.
This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. Specific precautionary statements are given in Section 10.
WITHDRAWN RATIONALE
This test method describes the gathering and reporting of dynamic dielectric data.  
Formerly under the jurisdiction of Committee E37 on Thermal Measurements, this test method was withdrawn in September 2009 in accordance with section 10.5.3.1 of the Re...

General Information

• Status: Withdrawn
• Publication Date: 31-Jan-2004
• Withdrawal Date: 31-Aug-2009
• ICS: 17.220.20 - Measurement of electrical and magnetic quantities
• Technical Committee: E37 - Thermal Measurements
• Drafting Committee: E37.10 - Fundamental, Statistical and Mechanical Properties

Relations

• Replaces: ASTM E2039-99 - Standard Practice for Determining and Reporting Dynamic Dielectric Properties
• Effective Date: 01-Feb-2004

Standards Content (Sample)

NOTICE: This standard has either been superseded and replaced by a new version or withdrawn.
Contact ASTM International (www.astm.org) for the latest information.
Designation:E2039–04
Standard Test Method for
1
Determining and Reporting Dynamic Dielectric Properties
This standard is issued under the fixed designation E2039; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision.Anumber in parentheses indicates the year of last reapproval.A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
1. Scope D150 Test Methods for AC Loss Characteristics and Per-
mittivity (Dielectric Constant) of Solid Electrical Insula-
1.1 This test method describes the gathering and reporting
tion
of dynamic dielectric data. It incorporates laboratory test
E473 Terminology Relating to Thermal Analysis and Rhe-
method for determining dynamic dielectric properties of speci-
ology
menssubjectedtoanoscillatoryelectricfieldusingavarietyof
E1142 Terminology Relating to Thermophysical Properties
dielectricsensor/cellconfigurationsonavarietyofinstruments
E2038 Test Method for Temperature Calibration of Dielec-
called dielectric, microdielectric, DETA (DiElectric Thermal
tric Analyzers
Analysis), or DEA (DiElectric Analysis) analyzers.
1.2 This test method determines permittivity, loss factor,
3. Terminology
ionic conductivity (or resistivity), dipole relaxation times, and
3.1 Definitions:
transition temperatures, and is intended for materials that have
5 3.1.1 The following technical terms are applicable to this
a relative permittivity in the range of 1 to 10 ; loss factors in
8 16
document and are defined in Terminologies E473 and
the range of 0 to 10 ; and, conductivities in the range 10 to
10 E1142:E1142 dielectric thermal analysis, angular frequency,
10 S/cm.
capacitance, conductivity, dielectric constant, dielectric dissi-
1.3 The test method is primarily useful when conducted
pation factor, dielectric loss angle, dipole relaxation time,
over a range of temperatures for nonreactive systems (−160°C
dissipation factor, frequency, loss factor, permittivity, phase
to degradation) and over time (and temperature) for reactive
angle, and tangent delta.
systemsandisvalidforfrequenciesrangingfrom1mHzto100
3.1.2 Relative permittivity and loss factor are dimensionless
kHz.
quantitiesandarerelativetothepermittivityoffreespace(´ =
0
1.4 Apparent discrepancies may arise in results obtained
8.854 pF/m). Relative permittivity also is known as the
under differing experimental conditions. Without changing the
dielectric constant.
observed data, completely reporting the conditions (as de-
3.2 Definitions of Terms Specific to This Standard:
scribed in this test method) under which the data were
3.2.1 dielectric (or microdielectric) sensor, n—a set of at
obtained, in full, will enable apparent differences observed in
least two (perhaps three) contacting electrodes for measuring
another study to be reconciled.
the dielectric response of materials.
1.5 SI units are the standard.
3.2.1.1 Discussion—The sensor generally consists of paral-
1.6 This standard does not purport to address all of the
lel, circular, conducting (metallic) plates or discs, between
safety concerns, if any, associated with its use. It is the
which the sample is placed. The sensor also may be a set of
responsibility of the user of this standard to establish appro-
interdigitated conductors on an insulating substrate. In some
priate safety and health practices and determine the applica-
cases, the sensor may incorporate amplifying electronics or a
bility of regulatory limitations prior to use. Specific precau-
temperature sensing device (see Fig. 1), or both.
tionary statements are given in Section 10.
3.2.2 interdigitated electrode, n—anelectrodeconfiguration
2. Referenced Documents consisting of two nonconnected, interpenetrating conductors
2 firmly attached to an insulating substrate and exposed to the
2.1 ASTM Standards:
specimen on top.
3.2.2.1 Discussion—Interdigitated electrodes of different
1
ThistestmethodisunderthejurisdictionofASTMCommitteeE37onThermal
geometry are available, such as, interpenetrating “fingers” or
Measurements and is the direct responsibility of Subcommittee E37.10 on Funda-
“combs,” interpenetrating circular spirals, or interpenetrating
mental, Statistical and Mechanical Properties.
square spirals (see Fig. 1).
Current edition approved Feb. 1, 2004. Published March 2004 . Originally
approved in 1999. Last previous edition approved in 1999 as E2039–99. DOI:
Whereas parallel plate electrodes contact a specimen on a “top” and
10.1520/E2039-04.
2
“bottom” surface, the interdigitated electrodes make contact on only
For referenced ASTM standards, visit the ASTM website, www.astm.org, or
one side (single-sided contact) of the specimen.
contact ASTM Customer Service at [e-mail]. For Annual Book of ASTM
Standards volume information, refer to
...