ASTM E1504-11(2019)

Standard Practice for Reporting Mass Spectral Data in Secondary Ion Mass Spectrometry (SIMS)

SIGNIFICANCE AND USE
5.1 This practice is intended for use in reporting the experimental and data reduction procedures described in other publications.
SCOPE
1.1 This practice provides the minimum information necessary to describe the instrumental, experimental, and data reduction procedures used in acquiring and reporting secondary ion mass spectrometry (SIMS) mass spectral data.  
1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.  
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.  
1.4 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

General Information

• Status: Published
• Publication Date: 31-Oct-2019
• ICS: 71.040.50 - Physicochemical methods of analysis
• Technical Committee: E42 - Surface Analysis
• Drafting Committee: E42.06 - SIMS

Relations

• Replaces: ASTM E1504-11 - Standard Practice for Reporting Mass Spectral Data in Secondary Ion Mass Spectrometry (SIMS)
• Effective Date: 01-Nov-2019
• Refers: ASTM E673-03 - Standard Terminology Relating to Surface Analysis (Withdrawn 2012)
• Effective Date: 01-Dec-2003
• Refers: ASTM E673-02a - Standard Terminology Relating to Surface Analysis
• Effective Date: 10-Dec-2002
• Refers: ASTM E673-01 - Standard Terminology Relating to Surface Analysis
• Effective Date: 10-Nov-2001
• Refers: ASTM E673-98E1 - Standard Terminology Relating to Surface Analysis
• Effective Date: 10-Nov-2001
• Referred By: ASTM F2847-17 - Standard Practice for Reporting and Assessment of Residues on Single-Use Implants and Single-Use Sterile Instruments
• Effective Date: 01-Nov-2019
• Referred By: ASTM E1635-06(2019) - Standard Practice for Reporting Imaging Data in Secondary Ion Mass Spectrometry (SIMS)
• Effective Date: 01-Nov-2019

Overview

ASTM E1504-11(2019), Standard Practice for Reporting Mass Spectral Data in Secondary Ion Mass Spectrometry (SIMS), is an international standard developed by ASTM International. This standard outlines the minimum requirements for reporting instrumental, experimental, and data reduction procedures when publishing SIMS mass spectral data.

The primary objective of ASTM E1504 is to standardize mass spectral data reporting to promote consistency and enable accurate comparison among laboratories and analytical methods. By providing comprehensive guidelines for data documentation, the standard facilitates transparency and reproducibility in SIMS analyses across the scientific community.

Key Topics

• Instrument Specification:

  • Identification of the instrument manufacturer, model number, and analyzer type.
  • Detailed descriptions of accessory equipment and any nonstandard modifications.
  • Specification of system components for custom or home-built SIMS systems.

• Sample Description:

  • Comprehensive reporting of sample composition, preparation, history, and physical attributes.
  • Details on sample mounting methods and treatments such as conductive coatings or substrates.

• Experimental Conditions:

  • Documentation of the primary ion source, including beam energy, incident angle, current, and whether the ion beam is rastered or pulsed.
  • Description of the detection system and sample conditions prior to and during analysis, such as chamber pressure and vacuum pumping.

• Data Presentation and Results:

  • Clear definition of how the vertical and horizontal axes are displayed in mass spectra.
  • Full disclosure of any corrections applied to the data (e.g., dead time, background subtraction).
  • Calibration methods and mass resolution reporting (including calculation methods).

• Safety, Health, and Environmental Practices:

  • The standard emphasizes user responsibility for compliance with relevant safety and regulatory requirements.

Applications

ASTM E1504-11(2019) is essential for professionals and organizations involved in materials characterization and surface analysis, particularly those utilizing SIMS. Common application areas include:

• Academic and Industrial Research:
  Universities and laboratories use the standard to report SIMS data in peer-reviewed publications, ensuring clarity and uniformity.

• Quality Assurance in Manufacturing:
  Manufacturers and quality control labs apply the standard to validate materials through accurate SIMS measurement and documentation.

• Comparative Studies:
  Researchers utilize standardized reporting to compare SIMS data across different techniques, instruments, or laboratories.

• Regulatory and Compliance Reporting:
  Relevant in settings where documented analytical procedures must meet international standards and regulatory requirements.

By implementing ASTM E1504, SIMS practitioners ensure precise communication of experimental protocols, instrumental parameters, and data analysis methods, promoting methodological rigor and facilitating advancements in surface science.

Related Standards

To support thorough surface analysis and standardized reporting, the following ASTM standards and resources are relevant:

• ASTM E673: Terminology Relating to Surface Analysis (note: withdrawn in 2012, but still referenced for definitions).
• SIMS Best Practice Guides: Additional international and national guidelines on mass spectrometry data processing and reporting.
• ISO/IEC Standards: International standards on general laboratory practices and chemical analysis reporting.

For the most current documentation and additional related standards, refer to the ASTM International website (www.astm.org).

Keywords: Secondary Ion Mass Spectrometry, SIMS, ASTM E1504, mass spectral data reporting, surface analysis standards, materials characterization

Standards Content (Sample)

This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the
Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.
Designation: E1504 − 11 (Reapproved 2019)
Standard Practice for
Reporting Mass Spectral Data in Secondary Ion Mass
Spectrometry (SIMS)
This standard is issued under the fixed designation E1504; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
1. Scope standardize the reporting of such data to facilitate comparisons
with other laboratories and analytical techniques.
1.1 This practice provides the minimum information neces-
sary to describe the instrumental, experimental, and data
5. Significance and Use
reduction procedures used in acquiring and reporting second-
5.1 This practice is intended for use in reporting the
ary ion mass spectrometry (SIMS) mass spectral data.
experimental and data reduction procedures described in other
1.2 The values stated in SI units are to be regarded as
publications.
standard. No other units of measurement are included in this
standard.
6. Information to be Reported
1.3 This standard does not purport to address all of the
6.1 Instrumentation:
safety concerns, if any, associated with its use. It is the
6.1.1 If a standard commercial SIMS instrument is used,
responsibility of the user of this standard to establish appro-
specify the manufacturer, model number, and type of analyzer
priate safety, health, and environmental practices and deter-
used. Specify the manufacturer and model number of any
mine the applicability of regulatory limitations prior to use.
accessory or auxiliary equipment that would affect the data
1.4 This international standard was developed in accor-
contained within the mass spectrum (for example, additional
dance with internationally recognized principles on standard-
vacuum pumping attachments, primary ion mass filter, primary
ization established in the Decision on Principles for the
ion sources, electron flood guns, etc.). If any nonstandard
Development of International Standards, Guides and Recom-
modification has been made to the instrumentation, describe
mendations issued by the World Trade Organization Technical
the modification in detail.
Barriers to Trade (TBT) Committee.
6.1.2 If a noncommercial SIMS system is used, specify the
components composing the system (for example, ion gun,
2. Referenced Documents
pumping system, vacuum chamber, and mass filter). Specify
2.1 ASTM Standards:
the manufacturer and model number if the components are of
E673 Terminology Relating to SurfaceAnalysis (Withdrawn
commercial origin. If the components are home-built, specify
2012)
them in such detail that their potential effect on the obtained
mass spectrum may be deduced by an individual experienced
3. Terminology
in SIMS and vacuum technology.
3.1 Definitions—For definitions of terms used in this
6.2 Specimen—Describe the specimen in as much detail as
practice, refer to Terminology E673.
possible. Such factors would include, but are not limited to,
4. Summary of Practice sample preparation and handling, sample history, bulk and
trace composition, physical dimensions, sample homogeneity,
4.1 Experimental conditions and reporting procedures that
crystallinity, and any preanalysis cleaning procedure used.
affect SIMS mass spectral data are presented in order to
Describe in detail the method of sample mounting. Describe
any conductive coating or grids placed on the sample for
This practice is under the jurisdiction of ASTM Committee E42 on Surface
charge compensation. If a substrate is used, include substrate
Analysis and is the direct responsibility of Subcommittee E42.06 on SIMS.
composition, purity, and any methods of cleaning.
Current edition approved Nov. 1, 2019. Published November 2019. Originally
approved in 1992. Last previous edition approved in 2011 as E1504 – 11. DOI:
6.3 Experimental Conditions:
10.1520/E1504-11R19.
6.3.1 Primary Ion Source and Ion Optical Column—If a
For referenced ASTM standards, visit the ASTM website, www.astm.org, or
contact ASTM Customer Service at [e-mail]. For Annual Book of ASTM
commercial ion source is being used, then the manufacturer
Standards volume information, refer to the standard’s Document Summary page on
and model number should be specified. If the ion source is a
the ASTM website.
3 custom design, then it should be described in detail and
The last approved version of this historical standard is referenced on
www.astm.org. appropriate literature references given, if applicable. The
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States
E1504 − 11 (2019)
species extracted from the ion source must be specified. If the should be specified. Specify and describe the type of secondary
primary ion column provides mass filtering, then the selected ion detection system used (such as, Faraday cup, pulse-
ma
...