ASTM F1681-96
(Test Method)Standard Test Method for Determining Current Carrying Capacity of a Conductor as Part of a Membrane Switch Circuit
Standard Test Method for Determining Current Carrying Capacity of a Conductor as Part of a Membrane Switch Circuit
SCOPE
1.1 This test method covers the determination of the current carrying capacity of a conductor as part of a membrane switch.
1.2 This test method may be used to test a circuit to destruction, that is, to determine its maximum current carrying capacity, or it may be used to test the ability of a circuit to withstand a desired current level.
1.3 This test method applies only to static conditions, and does not apply to contact closure cycling of a membrane switch under current load (test method forthcoming).
1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
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Designation: F 1681 – 96
Standard Test Method for
Determining Current Carrying Capacity of a Conductor as
Part of a Membrane Switch Circuit
This standard is issued under the fixed designation F 1681; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (e) indicates an editorial change since the last revision or reapproval.
1. Scope 4. Significance and Use
1.1 This test method covers the determination of the current 4.1 Current carrying capacity is used by designers and
carrying capacity of a conductor as part of a membrane switch. manufacturers of electronic interface circuitry to ensure that
1.2 This test method may be used to test a circuit to the membrane switch can reliably handle the loads occurring in
destruction, that is, to determine its maximum current carrying normal use and under extreme circumstances. A thorough
capacity, or it may be used to test the ability of a circuit to understanding of CCC allows manufacturers to take it into
withstand a desired current level. account when developing design rules for membrane switches.
1.3 This test method applies only to static conditions, and 4.2 Failures due to exceeding the CCC of a circuit may take
does not apply to contact closure cycling of a membrane switch the form of a significant change in conductor resistance,
under current load (test method forthcoming). insulation breakdown (shorts), or conductor breakdown
1.4 This standard does not purport to address all of the (opens).
safety concerns, if any, associated with its use. It is the 4.3 Since a number of design parameters, such as trace
responsibility of the user of this standard to establish appro- width, ink film thickness, etc. affect the final test results, any
priate safety and health practices and determine the applica- conclusions should only be applied to specific designs, rather
bility of regulatory limitations prior to use. than to a general combination of materials.
4.4 Current carrying capacity tests may be destructive and
2. Referenced Documents
units that have been tested should be considered unreliable for
2.1 ASTM Standards: future use.
F 1680 Test Method for Determining the Circuit Resistance
4.5 Current carrying capacity may be significantly different
of a Membrane Switch for static loads and dynamic (that is, cycling) loads. Failure
modes are also generally different.
3. Terminology
5. Interferences
3.1 Definitions:
3.1.1 conductor resistance—the measured electrical resis-
5.1 The following parameters may affect the results of this
tance through a circuit loop between two test points. test:
3.1.2 Discussion—When a switch is included in that loop, it
5.1.1 Temperature,
shall be 88closed” in accordance with Test Method F 1680.
5.1.2 Relative humidity, and
3.1.3 current carrying capacity (CCC)—the maximum level 5.1.3 Barometric pressure.
of electrical current that a circuit can conduct without sustain-
6. Apparatus
ing damage.
3.1.4 membrane switch—a momentary switching device in 6.1 Suitable Device, providing a controlled voltage, capable
which at least one contact is on, or made of, a flexible of supplying sufficient current for the range in question.
substrate. 6.2 Suitable Meter(s), capable of measuring current and
3.1.5 power capacity—electrical power is defined as resistance (with range appropriate to the test). Do not apply a
current 3 voltage 5 V 3 I (watts). voltage greater than the intended operating range of the circuit
3.1.6 test points—two preselected conductive points in a under test.
circuit loop, possibly including a switch. 6.3 Discreet Resistors, sufficient to provide at least 2 times
the current range desired for the test (at the preselected voltage
level) if the power supply current cannot be limited and
This test method is under the jurisdiction of ASTM Committee F-1 on
measured directly. At the specified test voltage, the smallest
Electronics and is the direct responsibility of Subcommittee F01.18 on Membrane
resistor should correspond to twice the maximum current level
Switches.
Current edition approved Feb. 10, 1996. Published April 1996.
Annual Book of ASTM Standards, Vol 10.05.
Copyright © ASTM, 100 Barr Harbor Drive, West Conshohocken, PA 19428-2959, United States.
F 1681
to be tested, or the anticipated failure range (if testing to 7.2 In Process Test:
destruction).
DISCREET RESISTOR METHOD
NOTE 1—A standardized selection of resistors may be used. To deter-
7.2.1 Starting with largest resistor value (corresponding to
mine resistor values, see examples in Section 10.
the lowest current level), insert the known resistor R into the
NOTE 2—The resistors must be of sufficient wattage to handle the
x
anticipated current/power loads. circuit.
7.2.2 Turn on the power supply.
6.4 Suitable Device, to apply a predetermined, repeatable
7.2.3 Measure and record the actual current I through the
xa
force in accordance with Test Method F 1680 to close the
circuit.
switch (if a switch is part of the conductor circuit being tested).
7.2.4 After either a predetermined time has passed, or when
the current has stabilized, turn off the power supply.
7. Procedure
7.2.5 Record the length of time T for which power was
x
7.1 Pre-Test Setup:
applied.
7.2.6 Compare the actual current level I to the predicted I .
DISCREET RESISTOR METHOD xa x
If the two levels are significantly different, disconnect the
7.1.1 Measure and record the initial circuit resistance R of
i
circuit, measure and record its resistance. Significant changes
the circuit to be tested (if the circuit includes a switch, in
in resistance or observable degradation, such as burning or
accordance with Test Method F 1680).
discoloration of conductors, insulators or substrates are all
7.1.2 Based on the initial resistance R , the known resistors
i
forms of degradation occurring in the circuit, and therefore
values R , and the desired test voltage level, calculate and
x
indicate that the CCC has been reached or exceeded.
record in advance, the predicted current levels I for each test
x
7.2.7 Repeat 7.2.1 to 7.2.6 with the next lower valu
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