ASTM E883-11(2017)

Standard Guide for Reflected–Light Photomicrography

SIGNIFICANCE AND USE
4.1 This guide is useful for the photomicrography and photomacrography of metals and other materials.  
4.2 The subsequent processing of the photographic materials is also treated.
SCOPE
1.1 This guide outlines various methods which may be followed in the photography of metals and materials with the reflected-light microscope. Methods are included for preparation of prints and transparencies in black-and-white and in color, using both direct rapid and wet processes.  
1.2 Guidelines are suggested to yield photomicrographs of typical subjects and, to the extent possible, of atypical subjects as well. Information is included concerning techniques for the enhanced display of specific material features. Descriptive material is provided where necessary to clarify procedures. References are cited where detailed descriptions may be helpful.  
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory requirements prior to use. Specific precautionary statements are given in X1.7.  
1.4 The sections appear in the following order:    
Referenced documents  
2  
Terminology  
3  
Significance and use  
4  
Magnification  
5  
Reproduction of photomicrographs  
6  
Optical systems  
7  
Illumination sources  
8  
Illumination of specimens  
9  
Focusing  
10  
Filters for photomicrography  
11  
Illumination techniques  
12  
Instant-processing films  
13  
Photographic materials  
14  
Photographic exposure  
15  
Photographic processing  
16  
Keywords  
17  
Suggestions for visual use of metallographic microscopes  
Appendix X1  
Guide for metallographic photomacrography  
Appendix X2  
Electronic photography  
Appendix X3  
1.5 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

General Information

• Status: Historical
• Publication Date: 31-May-2017
• ICS: 37.080 - Document imaging applications
• Technical Committee: E04 - Metallography
• Drafting Committee: E04.03 - Light Microscopy

Relations

• Replaces: ASTM E883-11 - Standard Guide for Reflected–Light Photomicrography
• Effective Date: 01-Jun-2017
• Replaced By: ASTM E883-11(2024) - Standard Guide for Reflected–Light Photomicrography
• Effective Date: 01-Apr-2024
• Refers: ASTM E7-15 - Standard Terminology Relating to Metallography
• Effective Date: 01-Jun-2015
• Refers: ASTM E7-14 - Standard Terminology Relating to Metallography
• Effective Date: 01-Nov-2014
• Refers: ASTM E768-99(2010) - Standard Guide for Preparing and Evaluating Specimens for Automatic Inclusion Assessment of Steel
• Effective Date: 01-Nov-2010
• Refers: ASTM E175-82(2010) - Standard Terminology of Microscopy (Withdrawn 2019)
• Effective Date: 01-Jul-2010
• Refers: ASTM E7-03(2009) - Standard Terminology Relating to Metallography
• Effective Date: 01-Oct-2009
• Refers: ASTM E1951-02(2007) - Standard Guide for Calibrating Reticles and Light Microscope Magnifications
• Effective Date: 01-Oct-2007
• Refers: ASTM E175-82(2005)e1 - Standard Terminology of Microscopy
• Effective Date: 01-May-2005
• Refers: ASTM E768-99(2005) - Standard Guide for Preparing and Evaluating Specimens for Automatic Inclusion Assessment of Steel
• Effective Date: 01-May-2005
• Refers: ASTM E768-99(2004) - Standard Guide for Preparing and Evaluating Specimens for Automatic Inclusion Assessment of Steel
• Effective Date: 01-Nov-2004
• Refers: ASTM E7-03 - Standard Terminology Relating to Metallography
• Effective Date: 10-May-2003
• Refers: ASTM E1951-02 - Standard Guide for Calibrating Reticles and Light Microscope Magnifications
• Effective Date: 10-Apr-2002
• Refers: ASTM E1951-98 - Standard Guide for Calibrating Reticles and Light Microscope Magnifications
• Effective Date: 10-Dec-2001
• Refers: ASTM E7-01 - Standard Terminology Relating to Metallography
• Effective Date: 10-Dec-2001

Standards Content (Sample)

This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the
Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.
Designation:E883 −11 (Reapproved 2017)
Standard Guide for
Reflected–Light Photomicrography
This standard is issued under the fixed designation E883; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision.Anumber in parentheses indicates the year of last reapproval.A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
This standard has been approved for use by agencies of the U.S. Department of Defense.
1. Scope*
Electronic photography Appendix
X3
1.1 This guide outlines various methods which may be
1.5 This international standard was developed in accor-
followed in the photography of metals and materials with the
dance with internationally recognized principles on standard-
reflected-light microscope. Methods are included for prepara-
ization established in the Decision on Principles for the
tion of prints and transparencies in black-and-white and in
Development of International Standards, Guides and Recom-
color, using both direct rapid and wet processes.
mendations issued by the World Trade Organization Technical
1.2 Guidelines are suggested to yield photomicrographs of
Barriers to Trade (TBT) Committee.
typical subjects and, to the extent possible, of atypical subjects
as well. Information is included concerning techniques for the
2. Referenced Documents
enhanced display of specific material features. Descriptive
2.1 ASTM Standards:
material is provided where necessary to clarify procedures.
E7Terminology Relating to Metallography
References are cited where detailed descriptions may be
E175Terminology of Microscopy
helpful.
E768Guide for Preparing and Evaluating Specimens for
1.3 This standard does not purport to address all of the
Automatic Inclusion Assessment of Steel
safety concerns, if any, associated with its use. It is the
E1951Guide for Calibrating Reticles and Light Microscope
responsibility of the user of this standard to establish appro-
Magnifications
priate safety and health practices and determine the applica- 3
2.2 Other Standard:
bility of regulatory requirements prior to use. Specific precau-
MSDSMercury-Material Safety Data Sheet
tionary statements are given in X1.7.
1.4 The sections appear in the following order:
3. Terminology
Referenced documents 2
3.1 Definitions—For definitions of terms used in this guide,
Terminology 3
see Terminologies E7 and E175.
Significance and use 4
Magnification 5
Reproduction of photomicrographs 6
4. Significance and Use
Optical systems 7
Illumination sources 8
4.1 This guide is useful for the photomicrography and
Illumination of specimens 9
photomacrography of metals and other materials.
Focusing 10
Filters for photomicrography 11
4.2 The subsequent processing of the photographic materi-
Illumination techniques 12
als is also treated.
Instant-processing films 13
Photographic materials 14
Photographic exposure 15
5. Magnification
Photographic processing 16
Keywords 17
5.1 Photomicrographs shall be made at preferred
Suggestions for visual use of metallographic Appendix
magnifications, except in those special cases where details of
microscopes X1
the microstructure are best revealed by unique magnifications.
Guide for metallographic photomacrography Appendix
X2
For referenced ASTM standards, visit the ASTM website, www.astm.org, or
contact ASTM Customer Service at [e-mail]. For Annual Book of ASTM
This guide is under the jurisdiction of ASTM Committee E04 on Metallogra- Standards volume information, refer to the standard’s Document Summary page on
phyand is the direct responsibility of Subcommittee E04.03 on Light Microscopy. the ASTM website.
Current edition approved June 1, 2017. Published June 2017. Originally AvailablefromUnitedStatesEnvironmentalProtectionAgency(EPA),William
approved in 1982. Last previous edition approved in 2011 as E883–11. DOI: Jefferson Clinton Bldg., 1200 Pennsylvania Ave., NW, Washington, DC 20460,
10.1520/E0883-11R17. http://www.epa.gov.
*A Summary of Changes section appears at the end of this standard
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States
E883−11 (2017)
5.2 Thepreferredmagnificationsforphotomicrographs,are: 7.5 The resolution of the microscope depends primarily on
25×, 50×, 75×, 100×, 200×, 250×, 400×, 500×, 750×, 800×, the numerical aperture of the objective in use (1) . The term
and 1000×. empty magnification is used to describe high magnifications
(above approximately 1100 times the numerical aperture of an
5.3 Magnifications are normally calibrated using a stage
objective), which have been shown to offer no increase in
micrometer. Calibration procedures in Guide E1951 should be
image resolution. Nevertheless, some types of information,
followed.
such as the distance between two constituents, may be more
easily obtained from microstructures examined at moderate
6. Reproduction of Photomicrographs
empty magnifications.
6.1 Photomicrographs should be at one of the preferred
8. Illumination Sources
magnifications. A milli- or micrometre marker shall be super-
imposed on the photomicrograph to indicate magnification, in
8.1 MetallographicphotomicrographytypicallyusesKöhler
a contrasting tone. The published magnification, if known,
illumination. To obtain Köhler illumination, an image of the
should be stated in the caption.
fielddiaphragmisfocusedinthespecimenplane,andanimage
of the lamp filament or arc is focused in the plane of the
6.2 Photomicrograph captions should include basic back-
aperture diaphragm. Specific steps to obtain Köhler illumina-
ground information (for example, material identification,
tion vary with the microscope used. The manufacturer’s
etchant, mechanical or thermal treatment details) and should
instructions should be followed closely.
briefly describe what is illustrated so that the photomicrograph
can stand independent of the text. 8.2 For incandescent lamps, the applied voltage determines
the unit brightness and the color temperature of the source.
6.3 Arrowsorothermarkings,inacontrastingtone,shallbe
Evaporatedtungstenblackenstheenvelope,resultingindimin-
used to designate specific features in a photomicrograph. Any
ished brightness and color temperature as the lamp ages.
marking used shall be referenced in the caption.
Tungsten-halogenlampsminimizeenvelopeblackening,main-
taining constant brightness and color temperature for most of
7. Optical Systems
theirlife.Thehighbrightnessand3200Kcolortemperatureof
7.1 Microscope objectives are available in increasing order
these lamps makes them especially suitable for color photomi-
of correction as achromats, semiapochromats (fluorites) and
crography.
apochromats(seeTerminologiesE7andE175).Planobjectives
8.3 With arc sources, brightness per unit area is substan-
are recommended for photographic purposes because their
tially higher than that from any incandescent source. Their
correctionprovidesaflatterimage.Theobjectivelensformsan
spectral output contains high energy spikes superimposed on a
image of the specimen in a specific plane behind the objective
white-lightcontinuum.Theyalsocontainsignificantultraviolet
calledthebackfocalplane.(Thisisoneofseveralpossiblereal
(UV) and infrared (IR) emissions that should be removed for
image planes, called intermediary planes, where reticles may
eye safety (and for photographic consistency, with UV); see
be inserted as optical overlays on the image.)
8.4, 11.3.1, and 11.5.2.
7.2 The eyepiece magnifies the back focal plane (or other) 8.3.1 Xenonarcsproduceaspectralqualityclosetodaylight
intermediaryimageforobservationorphotomicrography.Eye- (5600K), with a strong spike at 462 nm. Strong emissions in
pieces are sometimes also used to accomplish the full correc- the IR should be removed. Xenon arcs that do not produce
tion of the objective’s spherical aberration and to improve the ozone are recommended.
flatness of field. 8.3.2 Carbon arcs have a continuous output in the visible
portion of the spectrum, with a color temperature near 3800K
7.2.1 The pupil of the observer’s eye must be brought to
and a strong emission line at 386 nm.
coincidence with the eyepoint of the visual eyepiece to view
8.3.3 Mercury arcs have strong UV and near-UV output,
the entire microscopical image. High-eyepoint eyepieces are
and are particularly useful to obtain maximum resolution with
necessary for eyeglass users to see the entire image field.
a blue filter. The color quality is deficient in red; it cannot be
7.2.2 Most microscopes have built-in photographic capa-
balancedforcolorphotomicrography. Warning—Mercuryhas
bilitiesthatuseanalternateimagepaththroughthemicroscope
been designated by EPAand many state agencies as a hazard-
leading to a camera attachment port or to a viewscreen. A
ousmaterialthatcancausecentralnervoussystem,kidney,and
projection eyepiece delivers the image to the camera port or
liver damage. Mercury, or its vapor, may be hazardous to
screen.
health and corrosive to materials. Caution should be taken
7.3 Intermediate lenses (relay or tube lenses) are often
when handling mercury and mercury-containing products. See
required to transfer the specimen image from the intermediary
the applicable product Material Safety Data Sheet (MSDS) for
plane of the objective to that of the eyepiece. They may also
details and EPA’s website (http://www.epa.gov/mercury/
add their own magnification factor, either fixed or as a zoom
faq.htm)foradditionalinformation.Usersshouldbeawarethat
system.
selling mercury or mercury-containing products, or both, in
your state may be prohibited by state law.
7.4 The objective, the eyepiece, and the compound micro-
scope (including any intermediate lenses) are designed as a
single optical unit. It is recommended to use only objectives
Theboldfacenumbersinparenthesesrefertothelistofreferencesattheendof
and eyepieces which are intended for the microscope in use. this standard.
E883−11 (2017)
8.3.4 Zirconiumarcshavestrongspectraloutputlinesinthe diameter. This can be observed by removing the eyepiece and
near IR, requiring filtration.Within the visible region, they are inspecting the back of the objective, either directly or with a
rated at 3200K color temperature. pinhole eyepiece. The aperture diaphragm should never be
used as a light intensity control.
8.4 Arc lamps require heat protection for filters and other
optical components, and certainly for eye safety. Infrared 9.5 See Fig. 1 for an illustration of a typical vertical
removal may be obtained by: “hot” mirrors in the illumination illumination system.
beam to reflect IR while transmitting visible light; heat-
absorbing filters to transmit visible light while absorbing IR, 10. Focusing
for example, solid glass filters or liquid-filled cells.
10.1 Sharp focus is necessary to obtain good photomicro-
8.5 A detailed discussion of illumination sources and the graphs.
quality of illuminants is given by Loveland (2).
10.2 There are two systems for obtaining sharp focus:
8.6 Some advice on using metallographic microscopes for ground-glass focusing and aerial image focusing.
visual observation has been compiled in Appendix X1.
10.2.1 For ground-glass focusing, relatively glare-free sur-
roundings and a magnifier up to about 3× are required. To
9. Illumination of Specimens
focus, the focusing knob is oscillated between underfocus and
9.1 Photomicrographs are made with a compound micro- overfocusinsucceedinglysmallerincrementsuntiltheimageis
scope comprised at least of an objective lens and an eyepiece sharp.
with a vertical illuminator between them. Field and aperture 10.2.2 There are four possible variations for focusing an
diaphragms, with a lamp and lamp condenser lenses, are aerial image.
integral parts of the system. The microscope should allow 10.2.2.1 The simplest case is a transparent spot on a
sufficient adjustment to illuminate the field of view evenly and ground-glasscontainingafiduciarymarkinthefilmplane.The
to completely fill the back aperture of the objective lens with specimenimageisfocusedtocoincidewiththefiduciarymark,
light. usingamagnifyingloupeofabout3×to5×.Whenthefocusis
correct, the specimen image and the fiduciary mark will not
9.2 Theverticalilluminatorisathin-film-coatedplaneglass
move with respect to each other when the operator’s head is
reflector set at 45° to the optical axis behind the objective. It
moved.
reflects the illumination beam into the objective and transmits
10.2.2.2 Asecondcaseusesareticlefixedwithintheoptical
the image beam from the objective to the eyepiece. In some
system at an intermediary plane. Focusing is a two-step
microscopes prism systems are used to perform this function.
process: focus the eyepiece on the reticle; bring the image into
9.3 The field diaphragm is an adjustable aperture which
focus against the reticle figure.
restrictstheilluminatedareaofthespecimentothatwhichisto
10.2.2.3 Inthethirdcase,areticleisinsertedintoafocusing
be photographed. It eliminates contrast-reducing stray light.
eyepiece. Depending on equipment used, this can be either a
The field diaphragm is also a useful target when focusing a
twoorthree-stepprocess:focusthereticlewithintheeyepiece;
low-contrast specimen.
next, set the proper interpupiliary distance, if required (some
9.4 The aperture diaphragm establishes the optimum bal- equipment requires a specific interpupiliary distance for eye-
ance between contrast, resolution, and depth of field. It should piece focus to coincide with camera focus); then focus the
be set to illuminate about 70% of the objective’s aperture image coincident with the reticle.
FIG. 1 Vertical Illuminating System for a Metallurgical Microscope
E883−11 (2017)
10.2.2.4 The fourth case uses a single-lens reflex camera filter is used with a color complementary to that of the feature
body, where the camera focusing screen is the plane of (forexample,acyanfilterforreddishcopperplating;abluefor
reference. An eyepiece magnifier for the camera is an impor- yellow carbonitride particles). When maximum detail in a
tant accessory for this case.An aerial image focusing screen is colored phase must be shown, choose a filter with the same
preferred. color as the phase.
10.3 Thecriticalfocuspointisaffectedbyboththeprincipal 11.5 Filters for Color Photomicrography:
illumination wavelength in use and the size of the aperture 11.5.1 Color photomicrography generally requires filtration
diaphragm. Final focusing should be checked with all filters, to balance the light at the image pla
...

NOTICE: This standard has either been superseded and replaced by a new version or withdrawn.
Contact ASTM International (www.astm.org) for the latest information
Designation: E883 − 11 (Reapproved 2017)
Standard Guide for
Reflected–Light Photomicrography
This standard is issued under the fixed designation E883; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
This standard has been approved for use by agencies of the U.S. Department of Defense.
1. Scope*
Electronic photography Appendix
X3
1.1 This guide outlines various methods which may be
1.5 This international standard was developed in accor-
followed in the photography of metals and materials with the
dance with internationally recognized principles on standard-
reflected-light microscope. Methods are included for prepara-
ization established in the Decision on Principles for the
tion of prints and transparencies in black-and-white and in
Development of International Standards, Guides and Recom-
color, using both direct rapid and wet processes.
mendations issued by the World Trade Organization Technical
1.2 Guidelines are suggested to yield photomicrographs of
Barriers to Trade (TBT) Committee.
typical subjects and, to the extent possible, of atypical subjects
as well. Information is included concerning techniques for the
2. Referenced Documents
enhanced display of specific material features. Descriptive
2.1 ASTM Standards:
material is provided where necessary to clarify procedures.
E7 Terminology Relating to Metallography
References are cited where detailed descriptions may be
E175 Terminology of Microscopy
helpful.
E768 Guide for Preparing and Evaluating Specimens for
1.3 This standard does not purport to address all of the
Automatic Inclusion Assessment of Steel
safety concerns, if any, associated with its use. It is the
E1951 Guide for Calibrating Reticles and Light Microscope
responsibility of the user of this standard to establish appro-
Magnifications
priate safety and health practices and determine the applica- 3
2.2 Other Standard:
bility of regulatory requirements prior to use. Specific precau-
MSDS Mercury-Material Safety Data Sheet
tionary statements are given in X1.7.
1.4 The sections appear in the following order:
3. Terminology
Referenced documents 2
3.1 Definitions—For definitions of terms used in this guide,
Terminology 3
Significance and use 4 see Terminologies E7 and E175.
Magnification 5
Reproduction of photomicrographs 6
4. Significance and Use
Optical systems 7
Illumination sources 8
4.1 This guide is useful for the photomicrography and
Illumination of specimens 9
photomacrography of metals and other materials.
Focusing 10
Filters for photomicrography 11
4.2 The subsequent processing of the photographic materi-
Illumination techniques 12
als is also treated.
Instant-processing films 13
Photographic materials 14
Photographic exposure 15
5. Magnification
Photographic processing 16
Keywords 17
5.1 Photomicrographs shall be made at preferred
Suggestions for visual use of metallographic Appendix
magnifications, except in those special cases where details of
microscopes X1
the microstructure are best revealed by unique magnifications.
Guide for metallographic photomacrography Appendix
X2
For referenced ASTM standards, visit the ASTM website, www.astm.org, or
contact ASTM Customer Service at [e-mail]. For Annual Book of ASTM
This guide is under the jurisdiction of ASTM Committee E04 on Metallogra- Standards volume information, refer to the standard’s Document Summary page on
phyand is the direct responsibility of Subcommittee E04.03 on Light Microscopy. the ASTM website.
Current edition approved June 1, 2017. Published June 2017. Originally Available from United States Environmental Protection Agency (EPA), William
approved in 1982. Last previous edition approved in 2011 as E883 – 11. DOI: Jefferson Clinton Bldg., 1200 Pennsylvania Ave., NW, Washington, DC 20460,
10.1520/E0883-11R17. http://www.epa.gov.
*A Summary of Changes section appears at the end of this standard
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States
E883 − 11 (2017)
5.2 The preferred magnifications for photomicrographs, are: 7.5 The resolution of the microscope depends primarily on
25×, 50×, 75×, 100×, 200×, 250×, 400×, 500×, 750×, 800×, the numerical aperture of the objective in use (1) . The term
and 1000×. empty magnification is used to describe high magnifications
(above approximately 1100 times the numerical aperture of an
5.3 Magnifications are normally calibrated using a stage
objective), which have been shown to offer no increase in
micrometer. Calibration procedures in Guide E1951 should be
image resolution. Nevertheless, some types of information,
followed.
such as the distance between two constituents, may be more
easily obtained from microstructures examined at moderate
6. Reproduction of Photomicrographs
empty magnifications.
6.1 Photomicrographs should be at one of the preferred
8. Illumination Sources
magnifications. A milli- or micrometre marker shall be super-
imposed on the photomicrograph to indicate magnification, in
8.1 Metallographic photomicrography typically uses Köhler
a contrasting tone. The published magnification, if known,
illumination. To obtain Köhler illumination, an image of the
should be stated in the caption.
field diaphragm is focused in the specimen plane, and an image
of the lamp filament or arc is focused in the plane of the
6.2 Photomicrograph captions should include basic back-
aperture diaphragm. Specific steps to obtain Köhler illumina-
ground information (for example, material identification,
tion vary with the microscope used. The manufacturer’s
etchant, mechanical or thermal treatment details) and should
instructions should be followed closely.
briefly describe what is illustrated so that the photomicrograph
can stand independent of the text. 8.2 For incandescent lamps, the applied voltage determines
the unit brightness and the color temperature of the source.
6.3 Arrows or other markings, in a contrasting tone, shall be
Evaporated tungsten blackens the envelope, resulting in dimin-
used to designate specific features in a photomicrograph. Any
ished brightness and color temperature as the lamp ages.
marking used shall be referenced in the caption.
Tungsten-halogen lamps minimize envelope blackening, main-
taining constant brightness and color temperature for most of
7. Optical Systems
their life. The high brightness and 3200 K color temperature of
7.1 Microscope objectives are available in increasing order
these lamps makes them especially suitable for color photomi-
of correction as achromats, semiapochromats (fluorites) and
crography.
apochromats (see Terminologies E7 and E175). Plan objectives
8.3 With arc sources, brightness per unit area is substan-
are recommended for photographic purposes because their
tially higher than that from any incandescent source. Their
correction provides a flatter image. The objective lens forms an
spectral output contains high energy spikes superimposed on a
image of the specimen in a specific plane behind the objective
white-light continuum. They also contain significant ultraviolet
called the back focal plane. (This is one of several possible real
(UV) and infrared (IR) emissions that should be removed for
image planes, called intermediary planes, where reticles may
eye safety (and for photographic consistency, with UV); see
be inserted as optical overlays on the image.)
8.4, 11.3.1, and 11.5.2.
7.2 The eyepiece magnifies the back focal plane (or other) 8.3.1 Xenon arcs produce a spectral quality close to daylight
intermediary image for observation or photomicrography. Eye- (5600K), with a strong spike at 462 nm. Strong emissions in
pieces are sometimes also used to accomplish the full correc- the IR should be removed. Xenon arcs that do not produce
tion of the objective’s spherical aberration and to improve the ozone are recommended.
flatness of field. 8.3.2 Carbon arcs have a continuous output in the visible
portion of the spectrum, with a color temperature near 3800K
7.2.1 The pupil of the observer’s eye must be brought to
and a strong emission line at 386 nm.
coincidence with the eyepoint of the visual eyepiece to view
8.3.3 Mercury arcs have strong UV and near-UV output,
the entire microscopical image. High-eyepoint eyepieces are
and are particularly useful to obtain maximum resolution with
necessary for eyeglass users to see the entire image field.
a blue filter. The color quality is deficient in red; it cannot be
7.2.2 Most microscopes have built-in photographic capa-
balanced for color photomicrography. Warning—Mercury has
bilities that use an alternate image path through the microscope
been designated by EPA and many state agencies as a hazard-
leading to a camera attachment port or to a viewscreen. A
ous material that can cause central nervous system, kidney, and
projection eyepiece delivers the image to the camera port or
liver damage. Mercury, or its vapor, may be hazardous to
screen.
health and corrosive to materials. Caution should be taken
7.3 Intermediate lenses (relay or tube lenses) are often
when handling mercury and mercury-containing products. See
required to transfer the specimen image from the intermediary
the applicable product Material Safety Data Sheet (MSDS) for
plane of the objective to that of the eyepiece. They may also
details and EPA’s website (http://www.epa.gov/mercury/
add their own magnification factor, either fixed or as a zoom
faq.htm) for additional information. Users should be aware that
system.
selling mercury or mercury-containing products, or both, in
your state may be prohibited by state law.
7.4 The objective, the eyepiece, and the compound micro-
scope (including any intermediate lenses) are designed as a
single optical unit. It is recommended to use only objectives 4
The boldface numbers in parentheses refer to the list of references at the end of
and eyepieces which are intended for the microscope in use. this standard.
E883 − 11 (2017)
8.3.4 Zirconium arcs have strong spectral output lines in the diameter. This can be observed by removing the eyepiece and
near IR, requiring filtration. Within the visible region, they are inspecting the back of the objective, either directly or with a
rated at 3200K color temperature. pinhole eyepiece. The aperture diaphragm should never be
used as a light intensity control.
8.4 Arc lamps require heat protection for filters and other
optical components, and certainly for eye safety. Infrared 9.5 See Fig. 1 for an illustration of a typical vertical
removal may be obtained by: “hot” mirrors in the illumination illumination system.
beam to reflect IR while transmitting visible light; heat-
absorbing filters to transmit visible light while absorbing IR,
10. Focusing
for example, solid glass filters or liquid-filled cells.
10.1 Sharp focus is necessary to obtain good photomicro-
8.5 A detailed discussion of illumination sources and the
graphs.
quality of illuminants is given by Loveland (2).
10.2 There are two systems for obtaining sharp focus:
8.6 Some advice on using metallographic microscopes for
ground-glass focusing and aerial image focusing.
visual observation has been compiled in Appendix X1.
10.2.1 For ground-glass focusing, relatively glare-free sur-
roundings and a magnifier up to about 3× are required. To
9. Illumination of Specimens
focus, the focusing knob is oscillated between underfocus and
9.1 Photomicrographs are made with a compound micro- overfocus in succeedingly smaller increments until the image is
scope comprised at least of an objective lens and an eyepiece sharp.
with a vertical illuminator between them. Field and aperture 10.2.2 There are four possible variations for focusing an
diaphragms, with a lamp and lamp condenser lenses, are aerial image.
integral parts of the system. The microscope should allow 10.2.2.1 The simplest case is a transparent spot on a
sufficient adjustment to illuminate the field of view evenly and ground-glass containing a fiduciary mark in the film plane. The
to completely fill the back aperture of the objective lens with specimen image is focused to coincide with the fiduciary mark,
light. using a magnifying loupe of about 3× to 5×. When the focus is
correct, the specimen image and the fiduciary mark will not
9.2 The vertical illuminator is a thin-film-coated plane glass
move with respect to each other when the operator’s head is
reflector set at 45° to the optical axis behind the objective. It
moved.
reflects the illumination beam into the objective and transmits
10.2.2.2 A second case uses a reticle fixed within the optical
the image beam from the objective to the eyepiece. In some
system at an intermediary plane. Focusing is a two-step
microscopes prism systems are used to perform this function.
process: focus the eyepiece on the reticle; bring the image into
9.3 The field diaphragm is an adjustable aperture which
focus against the reticle figure.
restricts the illuminated area of the specimen to that which is to
10.2.2.3 In the third case, a reticle is inserted into a focusing
be photographed. It eliminates contrast-reducing stray light.
eyepiece. Depending on equipment used, this can be either a
The field diaphragm is also a useful target when focusing a
two or three-step process: focus the reticle within the eyepiece;
low-contrast specimen.
next, set the proper interpupiliary distance, if required (some
9.4 The aperture diaphragm establishes the optimum bal- equipment requires a specific interpupiliary distance for eye-
ance between contrast, resolution, and depth of field. It should piece focus to coincide with camera focus); then focus the
be set to illuminate about 70 % of the objective’s aperture image coincident with the reticle.
FIG. 1 Vertical Illuminating System for a Metallurgical Microscope
E883 − 11 (2017)
10.2.2.4 The fourth case uses a single-lens reflex camera filter is used with a color complementary to that of the feature
body, where the camera focusing screen is the plane of (for example, a cyan filter for reddish copper plating; a blue for
reference. An eyepiece magnifier for the camera is an impor- yellow carbonitride particles). When maximum detail in a
tant accessory for this case. An aerial image focusing screen is colored phase must be shown, choose a filter with the same
preferred. color as the phase.
10.3 The critical focus point is affected by both the principal 11.5 Filters for Color Photomicrography:
illumination wavelength
...

This document is not an ASTM standard and is intended only to provide the user of an ASTM standard an indication of what changes have been made to the previous version. Because
it may not be technically possible to adequately depict all changes accurately, ASTM recommends that users consult prior editions as appropriate. In all cases only the current version
of the standard as published by ASTM is to be considered the official document.
Designation: E883 − 11 E883 − 11 (Reapproved 2017)
Standard Guide for
Reflected–Light Photomicrography
This standard is issued under the fixed designation E883; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
This standard has been approved for use by agencies of the U.S. Department of Defense.
1. Scope*
1.1 This guide outlines various methods which may be followed in the photography of metals and materials with the
reflected-light microscope. Methods are included for preparation of prints and transparencies in black-and-white and in color, using
both direct rapid and wet processes.
1.2 Guidelines are suggested to yield photomicrographs of typical subjects and, to the extent possible, of atypical subjects as
well. Information is included concerning techniques for the enhanced display of specific material features. Descriptive material is
provided where necessary to clarify procedures. References are cited where detailed descriptions may be helpful.
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility
of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory
requirements prior to use. Specific precautionary statements are given in X1.7.
1.4 The sections appear in the following order:
Referenced documents 2
Terminology 3
Significance and use 4
Magnification 5
Reproduction of photomicrographs 6
Optical systems 7
Illumination sources 8
Illumination of specimens 9
Focusing 10
Filters for photomicrography 11
Illumination techniques 12
Instant-processing films 13
Photographic materials 14
Photographic exposure 15
Photographic processing 16
Keywords 17
Suggestions for visual use of metallographic Appendix
microscopes X1
Guide for metallographic photomacrography Appendix
X2
Electronic photography Appendix
X3
1.5 This international standard was developed in accordance with internationally recognized principles on standardization
established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued
by the World Trade Organization Technical Barriers to Trade (TBT) Committee.
2. Referenced Documents
2.1 ASTM Standards:
E7 Terminology Relating to Metallography
E175 Terminology of Microscopy
E768 Guide for Preparing and Evaluating Specimens for Automatic Inclusion Assessment of Steel
This guide is under the jurisdiction of ASTM Committee E04 on Metallographyand is the direct responsibility of Subcommittee E04.03 on Light Microscopy.
Current edition approved May 1, 2011June 1, 2017. Published May 2011June 2017. Originally approved in 1982. Last previous edition approved in 20072011 as
E883 – 02E883 – 11.(2007). DOI: 10.1520/E0883-11.10.1520/E0883-11R17.
For referenced ASTM standards, visit the ASTM website, www.astm.org, or contact ASTM Customer Service at [e-mail]. For Annual Book of ASTM Standards
volume information, refer to the standard’s Document Summary page on the ASTM website.
*A Summary of Changes section appears at the end of this standard
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States
E883 − 11 (2017)
E1951 Guide for Calibrating Reticles and Light Microscope Magnifications
2.2 Other Standard:
MSDS Mercury-Material Safety Data Sheet
3. Terminology
3.1 Definitions—For definitions of terms used in this guide, see Terminologies E7 and E175.
4. Significance and Use
4.1 This guide is useful for the photomicrography and photomacrography of metals and other materials.
4.2 The subsequent processing of the photographic materials is also treated.
5. Magnification
5.1 Photomicrographs shall be made at preferred magnifications, except in those special cases where details of the
microstructure are best revealed by unique magnifications.
5.2 The preferred magnifications for photomicrographs, are: 25×, 50×, 75×, 100×, 200×, 250×, 400×, 500×, 750×, 800×, and
1000×.
5.3 Magnifications are normally calibrated using a stage micrometer. Calibration procedures in Guide E1951 should be
followed.
6. Reproduction of Photomicrographs
6.1 Photomicrographs should be at one of the preferred magnifications. A milli- or micrometre marker shall be superimposed
on the photomicrograph to indicate magnification, in a contrasting tone. The published magnification, if known, should be stated
in the caption.
6.2 Photomicrograph captions should include basic background information (for example, material identification, etchant,
mechanical or thermal treatment details) and should briefly describe what is illustrated so that the photomicrograph can stand
independent of the text.
6.3 Arrows or other markings, in a contrasting tone, shall be used to designate specific features in a photomicrograph. Any
marking used shall be referenced in the caption.
7. Optical Systems
7.1 Microscope objectives are available in increasing order of correction as achromats, semiapochromats (fluorites) and
apochromats (see Terminologies E7 and E175). Plan objectives are recommended for photographic purposes because their
correction provides a flatter image. The objective lens forms an image of the specimen in a specific plane behind the objective
called the back focal plane. (This is one of several possible real image planes, called intermediary planes, where reticles may be
inserted as optical overlays on the image.)
7.2 The eyepiece magnifies the back focal plane (or other) intermediary image for observation or photomicrography. Eyepieces
are sometimes also used to accomplish the full correction of the objective’s spherical aberration and to improve the flatness of field.
7.2.1 The pupil of the observer’s eye must be brought to coincidence with the eyepoint of the visual eyepiece to view the entire
microscopical image. High-eyepoint eyepieces are necessary for eyeglass users to see the entire image field.
7.2.2 Most microscopes have built-in photographic capabilities that use an alternate image path through the microscope leading
to a camera attachment port or to a viewscreen. A projection eyepiece delivers the image to the camera port or screen.
7.3 Intermediate lenses (relay or tube lenses) are often required to transfer the specimen image from the intermediary plane of
the objective to that of the eyepiece. They may also add their own magnification factor, either fixed or as a zoom system.
7.4 The objective, the eyepiece, and the compound microscope (including any intermediate lenses) are designed as a single
optical unit. It is recommended to use only objectives and eyepieces which are intended for the microscope in use.
7.5 The resolution of the microscope depends primarily on the numerical aperture of the objective in use (1) . The term empty
magnification is used to describe high magnifications (above approximately 1100 times the numerical aperture of an objective),
which have been shown to offer no increase in image resolution. Nevertheless, some types of information, such as the distance
between two constituents, may be more easily obtained from microstructures examined at moderate empty magnifications.
Available from United States Environmental Protection Agency (EPA), Ariel Rios William Jefferson Clinton Bldg., 1200 Pennsylvania Ave., NW, Washington, DC
20004,20460, http://www.epa.gov.
The boldface numbers in parentheses refer to the list of references at the end of this standard.
E883 − 11 (2017)
8. Illumination Sources
8.1 Metallographic photomicrography typically uses Köhler illumination. To obtain Köhler illumination, an image of the field
diaphragm is focused in the specimen plane, and an image of the lamp filament or arc is focused in the plane of the aperture
diaphragm. Specific steps to obtain Köhler illumination vary with the microscope used. The manufacturer’s instructions should be
followed closely.
8.2 For incandescent lamps, the applied voltage determines the unit brightness and the color temperature of the source.
Evaporated tungsten blackens the envelope, resulting in diminished brightness and color temperature as the lamp ages.
Tungsten-halogen lamps minimize envelope blackening, maintaining constant brightness and color temperature for most of their
life. The high brightness and 3200 K color temperature of these lamps makes them especially suitable for color photomicrography.
8.3 With arc sources, brightness per unit area is substantially higher than that from any incandescent source. Their spectral
output contains high energy spikes superimposed on a white-light continuum. They also contain significant ultraviolet (UV) and
infrared (IR) emissions that should be removed for eye safety (and for photographic consistency, with UV); see 8.4, 11.3.1, and
11.5.2.
8.3.1 Xenon arcs produce a spectral quality close to daylight (5600K), with a strong spike at 462 nm. Strong emissions in the
IR should be removed. Xenon arcs that do not produce ozone are recommended.
8.3.2 Carbon arcs have a continuous output in the visible portion of the spectrum, with a color temperature near 3800K and a
strong emission line at 386 nm.
8.3.3 Mercury arcs have strong UV and near-UV output, and are particularly useful to obtain maximum resolution with a blue
filter. The color quality is deficient in red; it cannot be balanced for color photomicrography. Warning—Mercury has been
designated by EPA and many state agencies as a hazardous material that can cause central nervous system, kidney, and liver
damage. Mercury, or its vapor, may be hazardous to health and corrosive to materials. Caution should be taken when handling
mercury and mercury-containing products. See the applicable product Material Safety Data Sheet (MSDS) for details and EPA’s
website (http://www.epa.gov/mercury/faq.htm) for additional information. Users should be aware that selling mercury or
mercury-containing products, or both, in your state may be prohibited by state law.
8.3.4 Zirconium arcs have strong spectral output lines in the near IR, requiring filtration. Within the visible region, they are rated
at 3200K color temperature.
8.4 Arc lamps require heat protection for filters and other optical components, and certainly for eye safety. Infrared removal may
be obtained by: “hot” mirrors in the illumination beam to reflect IR while transmitting visible light; heat-absorbing filters to
transmit visible light while absorbing IR, for example, solid glass filters or liquid-filled cells.
8.5 A detailed discussion of illumination sources and the quality of illuminants is given by Loveland (2).
8.6 Some advice on using metallographic microscopes for visual observation has been compiled in Appendix X1.
9. Illumination of Specimens
9.1 Photomicrographs are made with a compound microscope comprised at least of an objective lens and an eyepiece with a
vertical illuminator between them. Field and aperture diaphragms, with a lamp and lamp condenser lenses, are integral parts of the
system. The microscope should allow sufficient adjustment to illuminate the field of view evenly and to completely fill the back
aperture of the objective lens with light.
9.2 The vertical illuminator is a thin-film-coated plane glass reflector set at 45° to the optical axis behind the objective. It reflects
the illumination beam into the objective and transmits the image beam from the objective to the eyepiece. In some microscopes
prism systems are used to perform this function.
9.3 The field diaphragm is an adjustable aperture which restricts the illuminated area of the specimen to that which is to be
photographed. It eliminates contrast-reducing stray light. The field diaphragm is also a useful target when focusing a low-contrast
specimen.
9.4 The aperture diaphragm establishes the optimum balance between contrast, resolution, and depth of field. It should be set
to illuminate about 70 % of the objective’s aperture diameter. This can be observed by removing the eyepiece and inspecting the
back of the objective, either directly or with a pinhole eyepiece. The aperture diaphragm should never be used as a light intensity
control.
9.5 See Fig. 1 for an illustration of a typical vertical illumination system.
10. Focusing
10.1 Sharp focus is necessary to obtain good photomicrographs.
10.2 There are two systems for obtaining sharp focus: ground-glass focusing and aerial image focusing.
10.2.1 For ground-glass focusing, relatively glare-free surroundings and a magnifier up to about 3× are required. To focus, the
focusing knob is oscillated between underfocus and overfocus in succeedingly smaller increments until the image is sharp.
10.2.2 There are four possible variations for focusing an aerial image.
E883 − 11 (2017)
FIG. 1 Vertical Illuminating System for a Metallurgical Microscope
10.2.2.1 The simplest case is a transparent spot on a ground-glass containing a fiduciary mark in the film plane. The specimen
image is focused to coincide with the fiduciary mark, using a magnifying loupe of about 3× to 5×. When the focus is correct, the
specimen image and the fiduciary mark will not move with respect to each other when the operator’s head is moved.
10.2.2.2 A second case uses a reticle fixed within the optical system at an intermediary plane. Focusing is a two-step process:
focus the eyepiece on the reticle; bring the image into focus against the reticle figure.
10.2.2.3 In the third case, a reticle is inserted into a focusing eyepiece. Depending on equipment used, this can be either a two
or three-step process: focus the reticle within the eyepiece; next, set the proper interpupiliary distance, if required (some equipment
requires a specific interpupiliary distance for eyepiece focus to coincide with camera focus); then focus the image coincident with
the reticle.
10.2.2.4 The fourth case uses a single-lens reflex camera body, where the camera focusing screen is the plane of reference. An
eyepiece magnifier for the camera is an important accessory for this case. An aerial image focusing screen is preferred.
10.3 The critical focus point is affected by both the principal illumination wavelength in use and the size of the aperture
diaphragm. Final focusing shoul
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