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ASTM F1996-06

(Test Method)

Standard Test Method for Silver Migration for Membrane Switch Circuitry

Standard Test Method for Silver Migration for Membrane Switch Circuitry

SIGNIFICANCE AND USE
The effects of silver migration are short circuiting or reduction in insulation resistance. It is evidenced by staining or dicoloration between the cathode and anode conductive traces.
Accelerated testing may be accomplished by increasing the voltage over the specified voltages. (A typical starting point would be 5Vdc 50mA).
SCOPE
1.1 This test method is used to determine the susceptibility of a membrane switch to the migration of the silver between circuit traces under dc voltage potential.
1.2 Silver migration will occur when special conditions of moisture and electrical energy are present.

General Information

Status
Historical
Publication Date
30-Jun-2006
ICS
77.120.99 - Other non-ferrous metals and their alloys
Technical Committee
F01 - Electronics
Drafting Committee
F01.18 - Printed Electronics
Current Stage
Ref Project

Relations

Replaces
ASTM F1996-01 - Standard Test Method for Silver Migration for Membrane Switch Circuitry
Effective Date
01-Jul-2006
Referred By
ASTM F3147-15 - Standard Test Method for Evaluating the Reliability of Surface Mounted Device (SMD) Joints on a Flexible Circuit by a Rolling Mandrel Bend
Effective Date
01-Jul-2006

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ASTM F1996-06 - Standard Test Method for Silver Migration for Membrane Switch Circuitry
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NOTICE: This standard has either been superseded and replaced by a new version or withdrawn.
Contact ASTM International (www.astm.org) for the latest information
Designation: F1996 − 06
StandardTest Method for
1
Silver Migration for Membrane Switch Circuitry
This standard is issued under the fixed designation F1996; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
1. Scope 5.1.2 Relative Humidity.
5.1.3 Electrical Load (that is, current and voltage).
1.1 This test method is used to determine the susceptibility
5.1.4 Test surface.
of a membrane switch to the migration of the silver between
5.1.5 Flex tail connector area may be susceptible to silver
circuit traces under dc voltage potential.
migration which may or may not be a part of the scope of this
1.2 Silver migration will occur when special conditions of
test. If the flex tail is to be excluded from the test it should be
moisture and electrical energy are present.
sealed with an inert compound that has no influence on the test
or switch materials.
2. Referenced Documents
5.1.6 Post test handling may damage or destroy silver
2
2.1 ASTM Standards:
dendrites.
F1596 Test Method for Exposure of Membrane Switches to
5.1.7 Dendrites normally grow from the cathode conductor
Temperature and Relative Humidity
to the anode.To test both electrodes of a switch design connect
F1689 Test Method for Determining the Insulation Resis-
replicate specimens so that current flows through them in
tance of a Membrane Switch
opposite directions.
5.1.8 Without limited current, the migration could occur,
3. Terminology
causing a short and a dramatic current surge, which then
3.1 Definitions:
destroys the short and returns the circuit to a nonstandard, but
3.1.1 silver migration—A process by which silver, when in functional condition. If an observer was not present (or the
contact with insulating materials under electrical potential, is
details were not continuously recorded) this most dramatic
removed ionically from its original location, and is redeposit as failure might go unnoticed.
a metal (silver dendrite) at some other location.
6. Apparatus
4. Significance and Use
6.1 Closed Environmental System , with temperature and
4.1 The effects of silver migration are short circuiting or
humidity control (see Practice F1596).
reduction in insulation resistance. It is evidenced by staining or
6.2 Current-Limiting DC Power Source. (Series current
dicoloration between the cathode and anode conductive traces.
limiting resistor may be used with dc power supply).
4.2 Accelerated testing may be accomplished by increasing
6.3 Milliamp Meter (see Test Method F1689).
the voltage over the specified voltages. (Atypical starting point
6.4 Megohm Meter.
would be 5Vdc 50mA).
6.5 Test Surface, flat, smooth, unyielding, nonporous, and
5. Interferences
larger than switch under test.
5.1 The following parameters may affect the results of this
test: 7. Procedure
5.1.1 Temperature.
7.1 Pretest Setup:
7.1.1 Testspecimen(s)shallbepermittedtostabilizeat20to
25°C and 40 to 60 % relative humidity (RH) for a minimum of
1
This test method is under the jurisdiction of ASTM Committee F01 on
24 h.
Electronics, and is the direct responsibility of Subcommittee F01.18 on Membrane
Switches.
7.2 Test Setup (Fig. 1):
Current edition approved July 1, 2006. Published July 2006. Originally approved
7.2.1 Secure switch on test surface and measure initial
in1999.Lastpreviouseditionapprovedin2001asF1996–01.DOI:10.1520/F1996-
06.
insulation resistance between test points and record results.
2
For referenced ASTM standards, visit the ASTM website, www.astm.org, or
Protect connector as necessary (see 5.1.5).
contact ASTM Customer Service at service@astm.org. For Annual Book of ASTM
7.2.2 Orient switch and flex tail in positions that simulate
Standards volume information, refer to the standard’s Document Summary page on
the ASTM website. the end use application positions unless otherwise specified.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States
1

---------------------- Page: 1 ----------------------
F1996 − 06
FIG. 1 Test Setup
The flex tail orientation (bent down, up or back) may differ 7.4.3 If a failure, inspect visually (without magnification)
from the orientation of the switch (horizontal, vertical or for staining or discoloration.
angled).
8. Report
7.2.3 Connect power supply leads to test points.
8.1 Report the following information:
7.3 In Process Test:
8.1.1 Humidity,
7.3.1 Apply voltage to the test points. Limit the current to
8.1.2 Temperature,
prevent high current from disintegrating the dendrites caused
8.1.3 Voltage,
by silver migration. Use a current limiting resistor to limit the
8.1.4 Current limit valu
...

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