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ASTM

ASTM F1996-00

(Test Method)

Standard Test Method for Silver Migration for Membrane Switch Circuitry

Standard Test Method for Silver Migration for Membrane Switch Circuitry

SCOPE
1.1 This test method is used to determine the susceptibility of a membrane switch to the migration of the silver between circuit traces under dc voltage potential.
1.2 Silver migration will occur when special conditions of moisture and electrical energy are present.

General Information

Status
Historical
Publication Date
09-Jun-2001
ICS
77.120.99 - Other non-ferrous metals and their alloys
Technical Committee
F01 - Electronics
Drafting Committee
F01.18 - Printed Electronics
Current Stage
Ref Project

Relations

Replaced By
ASTM F1996-01 - Standard Test Method for Silver Migration for Membrane Switch Circuitry
Effective Date
10-Jun-2001
Referred By
ASTM F3147-15 - Standard Test Method for Evaluating the Reliability of Surface Mounted Device (SMD) Joints on a Flexible Circuit by a Rolling Mandrel Bend (Withdrawn 2024)
Effective Date
10-Jun-2001

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ASTM F1996-00 - Standard Test Method for Silver Migration for Membrane Switch CircuitryASTM F1996-00 - Standard Test Method for Silver Migration for Membrane Switch Circuitry
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ASTM F1996-00 - Standard Test Method for Silver Migration for Membrane Switch Circuitry
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NOTICE: This standard has either been superseded and replaced by a new version or discontinued.
Contact ASTM International (www.astm.org) for the latest information.
Designation: F 1996 – 00
Standard Test Method for
Silver Migration for Membrane Switch Circuitry
This standard is issued under the fixed designation F 1996; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (e) indicates an editorial change since the last revision or reapproval.
1. Scope 5.1.7 Dendrites normally grow from the cathode conductor
to the anode. To test both electrodes of a switch design connect
1.1 This test method is used to determine the susceptibility
replicate specimen so that current flows through them in
of a membrane switch to the migration of the silver between
opposite directions.
circuit traces under dc voltage potential.
5.1.8 Without limited current, the migration could occur,
1.2 Silver migration will occur when special conditions of
causing a short and a dramatic current surge, which then
moisture and electrical energy are present.
destroys the short and returns the circuit to a nonstandard, but
2. Referenced Documents
functional condition. If an observer was not present (or the
details were not continuously recorded) this most dramatic
2.1 ASTM Standards:
failure might go unnoticed.
F 1596 Practice for Exposure of Membrane Switches to
Temperature and Relative Humidity
6. Apparatus
F 1689 Test Method for Determining the Insulation Resis-
6.1 Closed Environmental System, with temperature and
tance of a Membrane Switch
humidity control (see Practice F 1596).
3. Terminology
6.2 Current-Limiting DC Power Source. (Series current
limiting resistor may be used with dc power supply).
3.1 Definitions:
6.3 Milliamp Meter (see Test Method F 1689).
3.1.1 silver migration—A process by which silver, when in
6.4 Megohm Meter.
contact with insulating materials under electrical potential, is
6.5 Test Surface, flat, smooth, unyielding, nonporous, and
removed ionically from its original location, and is redeposit as
larger than switch under test.
a metal (silver dendrite) at some other location.
7. Procedure
4. Significance and Use
7.1 Pretest Setup:
4.1 The effects of silver migration are short circuiting or
7.1.1 Test specimen(s) shall be permitted to stabilize at 20 to
reduction in insulation resistance. It is evidenced by staining or
25°C and 40 to 60 % relative humidity (RH) for a minimum of
dicoloration between the cathode and anode conductive traces.
24 h.
4.2 Accelerated testing may be accomplished by increasing
7.2 Test Setup (Fig. 1):
the voltage over the specified voltages. (A typical starting point
7.2.1 Secure switch on test surface and measure initial
would be 5Vdc 50mA).
insulation resistance between test points and record results.
5. Interferences
7.2.2 Place switch at a 90 6 15° to horizontal (unless
otherwise specified) in the test chamber to prevent condensate
5.1 The following parameters may affect the results of this
accumulation.
test:
7.2.3 Connect power supply leads to test points.
5.1.1 Temperature.
7.3 In Process Test:
5.1.2 Relative Humidity.
7.3.1 Apply voltage to th
...

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