EN 61280-1-3:1999
(Main)Fibre optic communication subsystem basic test procedures - Part 1-3: Test procedures for general communication subsystems - Central wavelength and spectral width measurement
Fibre optic communication subsystem basic test procedures - Part 1-3: Test procedures for general communication subsystems - Central wavelength and spectral width measurement
Measures several wavelength and spectral width properties of an optical spectrum associated with a fibre optic communication subsystem. The measurement is done for the purpose of system construction and/or maintenance. The optical transmitter is typically under modulation.
Lichtwellenleiter-Kommunikationsuntersysteme - Grundlegende Prüfverfahren - Teil 1-3: Prüfverfahren für allgemeine Kommunikationsuntersysteme - Messung von Mittelwellenlänge und Spektralbreite
Procédures d'essai de base des sous-systèmes de télécommunication à fibres optiques - Partie 1-3: Procédures d'essai des sous-systèmes généraux de télécommunication - Mesure de la longueur d'onde centrale et de la largeur spectrale
Mesure certaines propriétés de longueur d'onde et de largeur d'un spectre optique associé à un sous-système de communication à fibres optiques. Le mesurage est effectué dans le but de la construction d'un système et/ou de la maintenance. L'émetteur optique fonctionne en modulation.
Fibre optic communication subsystem basic test procedures - Part 1-3: Test procedures for general communication subsystems - Central wavelenght and spectral width measurement (IEC 61280-1-3:1998)
General Information
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Standards Content (Sample)
SLOVENSKI STANDARD
01-februar-2001
Fibre optic communication subsystem basic test procedures - Part 1-3: Test
procedures for general communication subsystems - Central wavelenght and
spectral width measurement (IEC 61280-1-3:1998)
Fibre optic communication subsystem basic test procedures -- Part 1-3: Test procedures
for general communication subsystems - Central wavelength and spectral width
measurement
Lichtwellenleiter-Kommunikationsuntersysteme - Grundlegende Prüfverfahren -- Teil 1-3:
Prüfverfahren für allgemeine Kommunikationsuntersysteme - Messung von
Mittelwellenlänge und Spektralbreite
Procédures d'essai de base des sous-systèmes de télécommunication à fibres optiques -
- Partie 1-3: Procédures d'essai des sous-systèmes généraux de télécommunication -
Mesure de la longueur d'onde centrale et de la largeur spectrale
Ta slovenski standard je istoveten z: EN 61280-1-3:1999
ICS:
33.180.01 6LVWHPL]RSWLþQLPLYODNQLQD Fibre optic systems in
VSORãQR general
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
NORME
CEI
INTERNATIONALE
IEC
61280-1-3
INTERNATIONAL
Première édition
STANDARD
First edition
1998-12
Procédures d'essai de base des sous-systèmes
de télécommunication à fibres optiques –
Partie 1-3:
Procédures d'essai des sous-systèmes généraux
de télécommunication –
Mesure de la longueur d'onde centrale
et de la largeur spectrale
Fibre optic communication subsystem
basic test procedures –
Part 1-3:
Test procedures for general communication
subsystems –
Central wavelength and spectral width
measurement
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61280-1-3 © IEC:1998 – 3 –
CONTENTS
Page
FOREWORD . 5
Clause
1 Scope and object . 7
2 Definitions. 7
3 Apparatus. 9
3.1 Calibrated optical spectrum analyzer . 9
3.2 Power supplies. 9
3.3 Input signal source or modulator . 9
3.4 Jumper cable. 9
4 Test sample. 9
5 Procedure. 11
6 Calculation. 15
6.1 Centre wavelength. 15
6.2 Centroidal wavelength. 15
6.3 Peak wavelength. 15
6.4 Δλ spectral width . 17
rms
6.5 Δλ spectral width . 17
n
6.6 Δλ spectral width . 17
fwhm
6.7 Side-mode suppression ratio (SSR). 17
7 Test results. 17
7.1 Required information. 17
7.2 Available information. 19
Figures. 19
Annex A (informative) Bibliography . 29
61280-1-3 © IEC:1998 – 5 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
_________
FIBRE OPTIC COMMUNICATION SUBSYSTEM
BASIC TEST PROCEDURES –
Part 1-3: Test procedures for general communication subsystems –
Central wavelength and spectral width measurement
FOREWORD
1) The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of the IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, the IEC publishes International Standards. Their preparation is
entrusted to technical committees; any IEC National Committee interested in the subject dealt with may
participate in this preparatory work. International, governmental and non-governmental organizations liaising
with the IEC also participate in this preparation. The IEC collaborates closely with the International Organization
for Standardization (ISO) in accordance with conditions determined by agreement between the two
organizations.
2) The formal decisions or agreements of the IEC on technical matters express, as nearly as possible, an
international consensus of opinion on the relevant subjects since each technical committee has representation
from all interested National Committees.
3) The documents produced have the form of recommendations for international use and are published in the form
of standards, technical reports or guides and they are accepted by the National Committees in that sense.
4) In order to promote international unification, IEC National Committees undertake to apply IEC International
Standards transparently to the maximum extent possible in their national and regional standards. Any
divergence between the IEC Standard and the corresponding national or regional standard shall be clearly
indicated in the latter.
5) The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with one of its standards.
6) Attention is drawn to the possibility that some of the elements of this International Standard may be the subject
of patent rights. The IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61280-1-3 has been prepared by subcommittee 86C: Fibre optic
systems and active devices, of IEC technical committee 86: Fibre optics.
The text of this standard is based on the following documents:
FDIS Report on voting
86C/223/FDIS 86C/231/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
Annex A is for information only.
61280-1-3 © IEC:1998 – 7 –
FIBRE OPTIC COMMUNICATION SUBSYSTEM
BASIC TEST PROCEDURES –
Part 1-3: Test procedures for general communication subsystems –
Central wavelength and spectral width measurement
1 Scope and object
The object of this test procedure is to measure several wavelength and spectral width
properties of an optical spectrum associated with a fibre optic communication subsystem.
The measurement is done for the purpose of system construction and/or maintenance. The
optical transmitter is typically under modulation.
NOTE – Different properties may be appropriate to different spectral types, such as continuous spectra
characteristic of light-emitting diodes (LEDs), and multilongitudinal mode (MLM) spectra and single-longitudinal
mode (SLM) spectra, both characteristic of laser diodes (LDs).
WARNING – Exercise care to avoid possible eye damage from looking into the end of an
energized fibre from any light source. Most importantly, personnel should avoid looking into any
energized fibre using any type of magnification device.
The requirements in IEC 60825-1 should be followed.
2 Definitions
For the purpose of this standard, the following definitions apply:
2.1 The wavelength types are:
2.1.1
centre wavelength (λλ )
centre
the mean of the closest spaced half-power wavelengths in an optical spectrum, one above and
one below the peak wavelength
2.1.2
half-power wavelength (λλ )
a wavelength corresponding to a half peak power value of the optical spectrum
2.1.3
peak wavelength (λλ )
p
the wavelength corresponding to the maximum power value of the optical spectrum
2.1.4
centroidal wavelength (λλ )
avg
the mean or average wavelength of an optical spectrum
61280-1-3 © IEC:1998 – 9 –
2.2 The spectral widths are:
2.2.1
root-mean square width (Δλλ )
rms
2.2.2
N-dB-down width (Δλλ )
n
the positive difference of the closest spaced wavelengths, one above and one below the peak
wavelength λ , at which the spectral power density is N dB down from its peak value
p
2.2.3
full-width at half-maximum (Δλλ )
fwhm
a special case of the above with n = 3
2.3 Side-mode suppression ratio (SSR) (see 6.7)
3 Apparatus
3.1 Calibrated optical spectrum analyzer
This special-purpose test equipment uses a dispersive spectrophotometric method to resolve
the optical spectral distribution. The spectral distribution resolved periodically is displayed on
the CRT display section of the optical spectrum analyzer. The resolution and range shall,
respectively, be at least 1 nm and 200 nm for LEDs, and 0,1 nm and 50 nm for LDs. The
resolution for MLM-LDs is at least 0,2 nm, and 0,1 nm for SLM-LDs, with a 50 nm range for
both types of LDs.
3.2 Power supplies
3.3 Input signal source or modulator
The input signal source is a single generator or modulator with the appropriate digital or
analogue signal of the system.
3.4 Jumper cable
Unless otherwise specified, the test jumpers shall have physical and optical properties
nominally equal to the cable plant with which the equipment is intended to operate. The
jumpers shall be 2 m to 5 m long, and shall contain fibres with coatings which remove cladding
light. Appropriate connectors shall be used. Single-mode jumpers shall be deployed with two
90 mm diameter loops. If the equipment is intended for multimode operation and the intended
cable plant is unknown, the fibre size shall be 62,5/125.
4 Test sample
The test sample shall be a specified fibre optic transmitter. The system inputs and outputs
shall be those normally seen by the user.
61280-1-3 © IEC:1998 – 11 –
5 Procedure
5.1 Use appropriate handling procedures to prevent damage from electrostatic discharge
(ESD), which can cause opto-electronic devices to fail.
5.2 With the exception of ambient temperature, standard ambient conditions shall be used,
unless otherwise specified. The ambient or reference point temperature shall be 23 °C ± 2 °C,
unless otherwise specified.
5.3 Unless otherwise specified, apply a modulated input signal to the optical source. Allow
sufficient time (per manufacturer’s recommendation or as specified in the detail specification)
for the optical source/transmitter to reach a steady-state temperature.
5.4 Turn the optical spectrum analyzer on, and allow the recommended warm-up and settling
time to achieve rated measurement performance level.
5.5 Connect the optical output of the optical source under test to the optical input connector
of the optical spectrum analyzer.
5.6 Adjustment of spectrum analyzer controls
5.6.1 Using the resolution control, select an appropriate resolution (see 3.1).
5.6.2 Using the span control, select an appropriate span of wavelength range on the display
section of the spectrum analyzer. Initially select the maximum span to obtain the appropriate
position of the peak wavelength; then adjust the span again so that, at the selected gain, the
smallest detectable output power level occupies the extreme edges of the screen horizontal
scale. For SLM lasers, the span may need to be changed, typically from 2 nm to 20 nm full
scale, to determine the spectral width and SSR.
5.6.3 Using the gain or reference level control, select a gain or reference level so that the
amplitude of the peak output extends over the entire screen vertical scale.
5.6.4 If available, use the spectrum analyzer log-scale for amplitude measurement, to achieve
the maximum dynamic range.
5.7 Continuous LED and SLM spectra
Refer to figures 1 and 5 for samples of LED and SLM-LD spectrum analyzer outputs. At the
end of several single measurement sweeps, ensure that the output spectrum is stable (power
variation at any wavelength is ≤10 % or ~0,5 dB between sweeps).
5.7.1 Determine the peak wavelength, λ . (Most optical spectrum analyzers have a peak-
p
search button that automatically performs this function.)
61280-1-3 © IEC:1998 – 13 –
5.7.2 For LEDs, record the two half-power wavelengths, on both sides of the peak
wavelength, that are 3 dB down from the peak amplitude.
Determine the number of points to record (minimum 11), and the wavelength λ and the
i
amplitude p for each point i in the displayed spectrum as follows.
i
5.7.3 On both sides of the peak, find the wavelengths closest to the peak, corresponding to
the two points n dB down from the peak (see example in figure 1), where n is typically 20.
5.7.4 To find 11 equally spaced points, subtract these two wavelengths and divide the result
by 10. This gives the spacing between points.
5.7.5 Starting wit
...
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