prEN IEC 61000-4-29:2026

Electromagnetic compatibility (EMC) - Part 4-29: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests

Elektromagnetische Verträglichkeit (EMV) - Teil 4-29: Prüf- und Messverfahren - Prüfungen der Störfestigkeit gegen Spannungseinbrüche, Kurzzeitunterbrechungen und Spannungsschwankungen an Gleichstrom-Netzeingängen

Compatibilité électromagnétique (CEM) - Partie 4-29: Techniques d'essai et de mesure - Essais d'immunité aux creux de tension, coupures brèves et varations de tension sur les accès d'alimentation en courant continu

Elektromagnetna združljivost (EMC) - 4-29. del: Preskusne in merilne tehnike - Preskusi odpornosti proti upadom napetosti, kratkotrajnim prekinitvam in odklonom napetosti za enosmerni (DC) napajalni priključek

General Information

• Status: Not Published
• Publication Date: 09-Aug-2027
• ICS: 33.100.20 - Immunity
• Technical Committee: CLC/TC 210 - Electromagnetic Compatibility (EMC)
• Drafting Committee: IEC/SC 77A - IEC_SC_77A
• Current Stage: 4060 - Enquiry results established and sent to TC, SR, BTTF - Enquiry
• Start Date: 10-Apr-2026
• Completion Date: 10-Apr-2026
• Directive: Harmonized Standard2014/30/EU - Directive 2014/30/EU of the European Parliament and of the Council of 26 February 2014 on the harmonisation of the laws of the Member States relating to electromagnetic compatibility (recast)
• Mandate: M/490 - Standardisation mandate to the European Standardisation Organisations (ESOs) to support European Smart Grid deployment
• Ref Project: oSIST prEN IEC 61000-4-29:2026 - Electromagnetic compatibility (EMC) - Part 4-29: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests

Relations

• Revises: EN 61000-4-29:2000 - Electromagnetic compatibility (EMC) - Part 4-29: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests
• Effective Date: 23-Jan-2023

Overview

prEN IEC 61000-4-29:2025 (IEC 61000-4-29 ED2) is a dedicated electromagnetic compatibility (EMC) standard that defines reproducible test methods for immunity to voltage dips, short interruptions and voltage variations at the d.c. input power port of electrical and electronic equipment. Applicable to low-voltage d.c. power ports supplied by external d.c. networks, the document provides a common, repeatable basis for laboratory testing to assess how Equipment Under Test (EUT) responds to sudden or gradual changes in d.c. supply voltage. Note: d.c. input ripple is excluded (see IEC 61000-4-17).

Key Topics and Requirements

• Scope and objectives - establishes test coverage for low-voltage d.c. input ports and guidance for product committees and manufacturers on selecting appropriate test severity.
• Test levels - defines preferred ranges and durations for voltage dips, short interruptions and voltage variations (see included tables for levels and durations).
• Test generator - requirements and performance characteristics for generating test conditions, including distinctions between low‑impedance and high‑impedance (short interruption) operating modes.
• Verification - procedures to verify output voltage, switching characteristics, output impedance and peak inrush current drive capability of the test generator.
• Test set-up and procedure - standardized wiring, laboratory reference conditions (climatic and electromagnetic) and the sequence for executing tests on the EUT.
• Evaluation and reporting - criteria for assessing EUT performance, documenting malfunctions and producing a comprehensive test report.
• Annexes - informative examples of test generators and set-ups, normative inrush current measurement methods (Annex B), and a description of the d.c. environment.

Practical Applications

This standard is used to:

• Provide repeatable immunity testing for devices that rely on low-voltage d.c. feeds.
• Help manufacturers and test laboratories validate robustness against supply disturbances (voltage dips, interruptions, variations).
• Support product committees in defining appropriate test severity for particular product types and end‑use scenarios. Typical stakeholders: EMC test laboratories, product design and validation teams, manufacturers of d.c.-powered equipment and modules, and conformity assessment bodies.

Related Standards

• IEC 61000-4-11 - AC voltage dips, short interruptions and variations (complementary guidance)
• IEC 61000-4-17 - D.C. input ripple (scope excluded from 4-29)
• IEC 60050(161) - EMC vocabulary and terms

Keywords: EMC, IEC 61000-4-29, prEN IEC 61000-4-29:2025, voltage dips, short interruptions, voltage variations, d.c. input power port, immunity testing, test generator, inrush current, EUT.

Standards Content (Sample)

SLOVENSKI STANDARD
01-april-2026
Elektromagnetna združljivost (EMC) - 4-29. del: Preskusne in merilne tehnike -
Preskusi odpornosti proti upadom napetosti, kratkotrajnim prekinitvam in
odklonom napetosti za enosmerni (DC) napajalni priključek
Electromagnetic compatibility (EMC) - Part 4-29: Testing and measurement techniques -
Voltage dips, short interruptions and voltage variations on d.c. input power port immunity
tests
Elektromagnetische Verträglichkeit (EMV) - Teil 4-29: Prüf- und Messverfahren -
Prüfungen der Störfestigkeit gegen Spannungseinbrüche, Kurzzeitunterbrechungen und
Spannungsschwankungen an Gleichstrom-Netzeingängen
Compatibilité électromagnétique (CEM) - Partie 4-29: Techniques d'essai et de mesure -
Essais d'immunité aux creux de tension, coupures brèves et varations de tension sur les
accès d'alimentation en courant continu
Ta slovenski standard je istoveten z: prEN IEC 61000-4-29:2026
ICS:
33.100.20 Imunost Immunity
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

77A/1276/CDV
COMMITTEE DRAFT FOR VOTE (CDV)
PROJECT NUMBER:
IEC 61000-4-29 ED2
DATE OF CIRCULATION: CLOSING DATE FOR VOTING:
2026-02-13 2026-04-10
SUPERSEDES DOCUMENTS:
77A/1231/CDV, 77A/1264/RVC
SC 77A : EMC - LOW FREQUENCY PHENOMENA
IEC
SECRETARIAT: SECRETARY:
France Mr Cédric LAVENU
OF INTEREST TO THE FOLLOWING COMMITTEES: HORIZONTAL FUNCTION(S):

ASPECTS CONCERNED:
Electromagnetic Compatibility
SUBMITTED FOR CENELEC PARALLEL VOTING NOT SUBMITTED FOR CENELEC PARALLEL VOTING
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The attention of IEC National Committees, members of
CENELEC, is d rawn to the f act that this Co mmittee Draft
for Vote (CDV) is submitted for parallel voting.
The CENELEC memb ers are invited to vo te thro ug h the
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This document is still under study and subject to change. It should not be used for reference purposes.
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Countries” clauses to be included should this proposal proceed. Recipients are reminded that the CDV stage is
the final stage for submitting ISC clauses. (SEE AC/22/2007 OR NEW GUIDANCE DOC).

TITLE:
Electromagnetic compatibility (EMC) - Part 4-29: Testing and measurement techniques -
Voltage dips, short interruptions and voltage variations on d.c. input power port immunity
tests
PROPOSED STABILITY DATE: 2027
NOTE FROM TC/SC OFFICERS:
electronic file, to make a copy and to print out the content for the sole purpose of preparing National Committee positions.
You may not copy or "mirror" the f ile or printed version of the document, or any part of it, f or any other purpose without
permission in writing from IEC.

IEC CDV 61000-4-29 © IEC 2025
1 CONTENTS
3 FOREWORD.4
4 INTRODUCTION .6
5 1 Scope .7
6 2 Normative references .7
7 3 Terms and definitions .7
8 4 General .8
9 5 Test levels .9
10 6 Test generator . 14
11 6.1 General . 14
12 6.2 Characteristics and performances of the generator . 14
13 6.2.1 General . 14
14 6.2.2 Specific characteristics for the generator operating in "low impedance"
15 conditions . 14
16 6.2.3 Specific characteristics for the generator operating in "high impedance"
17 conditions (short interruption) . 15
18 6.3 Verification of the characteristics of the generator . 15
19 6.3.1 General . 15
20 6.3.2 Output voltage and voltage change . 15
21 6.3.3 Switching characteristics. 16
22 6.3.4 Peak inrush current drive capability. 16
23 6.3.5 Output impedance . 16
24 6.3.6 Test level duration . 17
25 7 Test set-up . 17
26 8 Test procedure . 17
27 8.1 General . 17
28 8.2 Laboratory reference conditions. 17
29 8.2.1 General . 17
30 8.2.2 Climatic conditions . 17
31 8.2.3 Electromagnetic conditions . 17
32 8.3 Execution of the test. 18
33 8.3.1 General . 18
34 8.3.2 Voltage dips and short interruptions . 18
35 8.3.3 Voltage variations . 18
36 9 Evaluation of test results . 18
37 10 Test report . 19
38 Annex A (informative) Example of test generators and test set-up . 20
39 Annex B (normative) Inrush current measurement . 22
40 B.1 Test generator peak inrush current drive capability . 22
41 B.2 EUT peak inrush current . 22
42 Annex C (informative) Description of the DC network . 24
43 Bibliography . 25
45 Figure A.1 – Example of test generator based on two power sources with internal
46 switching . 20
47 Figure A.2 – Example of test generator based on a programmable power supply. 21
IEC CDV 61000-4-29 © IEC 2025
48 Figure B.1 – Circuit for measuring the peak inrush current drive capability of a test
49 generator . 23
50 Figure B.2 – Circuit for measuring the peak inrush current of an EUT . 23
52 Table 1 – Preferred test levels and durations for voltage dips– .9
53 Table 2 – Preferred test levels and durations for short interruptions. 10
54 Table 3 – Preferred test levels and durations for voltage variations . 10
IEC CDV 61000-4-29 © IEC 2025
58 INTERNATIONAL ELECTROTECHNICAL COMMISSION
59 ____________
61 ELECTROMAGNETIC COMPATIBILITY (EMC) –
63 Part 4-29: Testing and measurement techniques –
64 Voltage dips, short interruptions and voltage variations
65 on DC input power port immunity tests
67 FOREWORD
68 1) The Internatio nal Electro technical Co mmission (IEC) is a wo rld wid e o rg anization f or stand ardization co mprising
69 all natio nal electro technical committees (IEC Natio nal Co mmittees). The o b ject of IEC is to p ro mote international
70 co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and
71 in ad d ition to o ther activities, IEC p ub lishes Internatio nal Standards, Technical Specifications, Technical Reports,
72 Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their
73 p rep aratio n is entrusted to technical committees; any IEC Natio nal Co mmittee interested in the sub ject d ealt with
74 may p articipate in this preparatory wo rk. International, g overnmental and no n-governmental org anizations liaising
75 with the IEC also p articipate in this p rep aratio n. IEC co llab orates clo sely with the Internatio nal Org anization for
76 Stand ard izatio n (ISO) in acco rd ance with co nd itio ns d etermined b y ag reement b etween the two o rg anizatio ns.
77 2) The f o rmal d ecisions o r ag reements o f IEC o n technical matters exp ress, as nearly as p o ssib le, an international
78 consensus of opinion on the relevant subjects since each technical committee has representation from all
79 interested IEC National Committees.
80 3) IEC Publications have the f orm of recommendations f or international use and are accepted by IEC National
81 Committees in that sense. While all reasonable ef f orts are made to ensure that the technical content of IEC
82 Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
83 misinterpretation by any end user.
84 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
85 transp arently to the maximum extent p ossible in their national and reg ional p ublications. Any diverg ence b etween
86 any IEC Pub lication and the co rrespo nding natio nal o r reg ional p ublication shall b e clearly ind icated in the latter.
87 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conf ormity
88 assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible f or any
89 services carried out by independent certification bodies.
90 6) All users should ensure that they have the latest edition of this publication.
91 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
92 memb ers o f its technical co mmittees and IEC Natio nal Co mmittees f or any p erso nal injury, p ro p erty d amage or
93 other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
94 expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
95 Publications.
96 8) Attention is drawn to the Normative ref erences cited in this publication. Use of the ref erenced publications is
97 indispensable for the correct application of this publication.
98 9) IEC draws attention to the possibility that the implementation of this document may involve the use of (a)
99 p atent(s). IEC takes no p o sition co ncerning the evid ence, validity o r ap p licability o f any claimed p atent rig hts in
100 resp ect thereof. As o f the d ate of p ublication of this do cument, IEC had no t received no tice of (a) p atent(s), which
101 may b e req uired to imp lement this d o cument. Ho wever, imp lementers are cautio ned that this may not represent
102 the latest inf ormation, which may be obtained from the patent database available at https://patents.iec.ch. IEC
103 shall not be held responsible for identifying any or all such patent rights.
104 IEC 61000-4-29 has been prepared by subcommittee 77A: EMC – Low frequency phenomena,
105 of IEC technical committee 77: Electromagnetic compatibility. It is an International Standard.
106 It forms part 4-29 of IEC 61000. It has the status of a basic EMC publication in accordance with
107 IEC Guide 107.
108 This second edition cancels and replaces the first edition published in 2000. This edition
109 constitutes a technical revision.
110 This edition includes the following significant technical changes with respect to the previous
111 edition:
112 a) Increase the output voltage of the test generator to take into account new DC networks
113 voltages;
IEC CDV 61000-4-29 © IEC 2025
114 b) Provision of tolerances for the duration of the voltage changes
115 c) Limitation of the current when applying short interruptions in low impedance condition
116 d) General technical clarifications for the specifications of the test generator and their
117 verification
118 e) Clarifications regarding the loads used to verify the switching characteristics and the peak
119 inrush current drive capability of the test generator
120 f) Clarifications regarding the evaluation of test results and test reports
121 g) Description of the DC environment
122 The text of this International Standard is based on the following documents:
Draf t Report on voting
XX/XX/FDIS XX/XX/RVD
124 Full information on the voting for its approval can be found in the report on voting indicated in
125 the above table.
126 The language used for the development of this International Standard is English.
127 This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
128 accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
129 at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are
130 described in greater detail at www.iec.ch/publications.
131 A list of all parts in the IEC 61000 series, published under the general title Electromagnetic
132 compatibility (EMC), can be found on the IEC website.
133 The committee has decided that the contents of this document will remain unchanged until the
134 stability date indicated on the IEC website under webstore.iec.ch in the data related to the
135 specific document. At this date, the document will be
136 • reconfirmed,
137 • withdrawn, or
138 • revised.
IEC CDV 61000-4-29 © IEC 2025
142 INTRODUCTION
143 IEC 61000 is published in separate parts according to the following structure:
144 Part 1: General
145 General considerations (introduction, fundamental principles)
146 Definitions, terminology
147 Part 2: Environment
148 Description of the environment
149 Classification of the environment
150 Compatibility levels
151 Part 3: Limits
152 Emission limits
153 Immunity limits (in so far as they do not fall under the responsibility of the product
154 committees)
155 Part 4: Testing and measurement techniques
156 Measurement techniques
157 Testing techniques
158 Part 5: Installation and mitigation guidelines
159 Installation guidelines
160 Mitigation methods and devices
161 Part 6: Generic standards
162 Part 9: Miscellaneous
163 Each part is further subdivided into several parts, published either as international standards
164 or as technical specifications or technical reports, some of which have already been published
165 as sections. Others will be published with the part number followed by a dash and a second
166 number identifying the subdivision (example: IEC 61000-6-1).
167 This part is an international standard which gives immunity requirements for testing DC
168 equipment and systems with voltage dips, interruptions and variations on the DC input power
169 port.
IEC CDV 61000-4-29 © IEC 2025
173 ELECTROMAGNETIC COMPATIBILITY (EMC) –
175 Part 4-29: Testing and measurement techniques –
176 Voltage dips, short interruptions and voltage variations
177 on DC input power port immunity tests
181 1 Scope
182 This part of IEC 61000 defines test methods for immunity to voltage dips, short interruptions
183 and voltage variations at the DC input power port of electrical or electronic equipment.
185 This document is applicable to equipment and systems whose DC input power ports are
186 intended to be connected to low voltage DC networks external to the equipment and systems.
187 The object of this document is to establish a common and reproducible basis for testing
188 electrical and electronic equipment when subjected to voltage dips, short interruptions or
189 voltage variations on DC input power ports.
190 This document defines:
191 – the range of test levels;
192 – the test generator;
193 – the test set-up;
194 – the test procedure.
195 The test described hereinafter applies to electrical and electronic equipment and systems. It
196 also applies to modules or subsystems whenever the equipment under test (EUT) rated power
197 is greater than the test generator capacity specified in Clause 6.
198 T he ripple at the DC input power port is not included in the scope of this document. It is covered
199 by IEC 61000-4-17.
200 This document does not specify the tests to be applied to particular apparatus or systems. Its
201 main aim is to give a general basic reference to IEC product committees. These product
202 committees (or users and manufacturers of equipment) remain responsible for the appropriate
203 choice of the tests and the severity level to be applied to their equipment.
204 2 Normative references
205 There are no normative references in this document.
206 3 Terms and definitions
207 For the purposes of this document, the following terms and definitions apply.
208 ISO and IEC maintain terminology databases for use in standardization at the following
209 addresses:
IEC CDV 61000-4-29 © IEC 2025
• IEC Electropedia: available at https://www.electropedia.org/
211 • ISO Online browsing platform: available at https://www.iso.org/obp
212 3.1
213 immunity (to a disturbance)
214 ability of a device, equipment or system to perform without degradation in the presence of an
215 electromagnetic disturbance
216 [SOURCE: IEC 60050-161:1990, 161-01-20]
217 3.2
218 voltage dip
219 a sudden reduction of the voltage at a point in the low voltage DC distribution system, followed
220 by voltage recovery after a short period of time, from a few milliseconds up to a few seconds
221 3.3
222 short interruption
223 change of the supply voltage at a point of the low voltage d.c. distributed system below 20 %
224 of the nominal voltage for a time interval which typically does not exceed 1 min
225 No te 1 to entry: A sho rt interrup tion d o es no t necessarily result in a co mp lete d isappearance o f the sup p ly vo ltag e.
226 3.4
227 voltage variation
228 gradual change of the supply voltage from the rated voltage to a lower voltage and then from
229 the rated voltage to a higher voltage
230 3.5
231 malfunction
232 termination of the ability of an equipment to carry out intended functions, or the execution of
233 unintended functions by the equipment.
234 3.6 acronyms
235 DC Direct Current
236 EUT Equipment Under Test
237 4 General
238 The operation of electrical or electronic equipment can be affected by voltage dips, short
239 interruptions or voltage variations of the power supply.
240 Voltage dips and short interruptions are mainly caused by faults in the DC distribution system,
241 or by sudden large changes of load. Two or more consecutive dips or interruptions can also
242 occur.
243 Faults in the DC distribution system can inject transient overvoltages into the distribution
244 network; this particular phenomenon is not covered by this document.
245 Voltag e interruptions are primarily caused by the switching of mechanical relays when changing
246 from one source to another (e.g. from generator set to battery).
247 During a short interruption, the DC supply network can present either a "high impedance" or
248 "low impedance" condition. The first condition can be due to switching from one source to
249 another; the second condition can be due to the clearing of an overload or fault condition on
250 the supply bus. The latter can cause reverse current (negative peak inrush current) from the
251 load.
IEC CDV 61000-4-29 © IEC 2025
252 These phenomena are random in nature and can be characterised in terms of their duration
253 and the deviation from the nominal voltage. Voltage dips and short interruptions are not always
254 abrupt.
255 The primary cause of voltage variations is the discharging and recharging of battery systems;
256 however, they are also created when there are significant changes to the load condition of the
257 DC network.
258 5 Test levels
259 The rated voltage for the equipment (U ) shall be used as a reference for the specification of
T
260 the voltage test level.
261 If the EUT has a rated voltag e rang e, the rated voltage UT to be used as reference voltage shall
262 be determined as follows:
263 – if the upper limit of the voltage range does not exceed 20 % of the lower limit of the voltage
264 range, a single voltage within the voltage range may be used as rated voltage U ;
T
265 – in all other cases, the test procedure shall be applied for both the lower and upper limits of
266 the rated voltage range.
267 The preferred voltage test levels (in % of U ) and durations are given in Table 1, Table 2 and
T
268 Table 3 as follows:
269 – Table 1 corresponding to interruptions;
270 – Table 2 corresponding to dips;
271 – Table 3 corresponding to variations;
272 The change of the voltage for dips and interruptions is abrupt, in the range of microseconds
273 (see the test generator specifications in Clause 6, Fig. 1 and Fig. 2.
274 The test conditions of high impedance (see 6.2.3) and low impedance (see 6.2.2) reported in
275 Table 2 refer to the output impedance of the test generator as seen by the EUT during the
276 voltage interruption.
277 Table 1 – Preferred test levels and durations for voltage dips
Duration
Test Test level
% U s
T
0,01
0,03
40 and 70
0,1
Voltage dips or
0,3
x
x
IEC CDV 61000-4-29 © IEC 2025
279 Table 2 – Preferred test levels and durations for short interruptions
Test Test condition Test level Duration
% U s
T
0,001
0,003
0,01
High impedance
0,03
Short interruptions or 0
0,1
low impedance,
0,3
x
Note For certain types of equipment it is appropriate to repeat the test in
...