EN 62496-2:2017

Optical circuit boards - Basic test and measurement procedures - Part 2: General guidance for definition of measurement conditions for optical characteristics of optical circuit boards

IEC 62496-2:2017(E) specifies a method of defining the conditions for measurements of optical characteristics of optical circuit boards. The method comprises the use of code reference look-up tables to identify different critical aspects of the measurement environment. The values extracted from the tables are used to construct a measurement identification code, which, in itself, captures sufficient information about the measurement conditions, so as to ensure consistency of independently measured results within an acceptable margin. Recommended measurement conditions are specified to minimise further variation in independently measured results. Keywords: bandwidth density, optical characteristics of optical circuit boards

Optische Leiterplatten - Grundlegende Prüf- und Messverfahren - Teil 2: Allgemeiner Leitfaden zur Festlegung der Bedingungen für die Messung der optischen Eigenschaften von optischen Leiterplatten

Cartes à circuits optiques - Procédures fondamentales d'essais et de mesures - Partie 2: Recommandations générales relatives à la détermination des conditions de mesure des caractéristiques optiques des cartes à circuits optiques

IEC 62496-2:2017 spécifie une méthode pour définir les conditions de mesure des caractéristiques optiques des cartes à circuits optiques. La méthode inclut l'utilisation de tableaux présentant des références à des codes pour identifier différents aspects critiques de l'environnement de mesure. Les valeurs extraites des tableaux sont utilisées pour construire un code d'identification des mesures qui contient suffisamment d'informations sur les conditions de mesure, afin d'assurer la cohérence des résultats mesurés de manière indépendante avec une marge acceptable. Des conditions de mesure recommandées sont spécifiées pour réduire le plus possible les variations des résultats mesurés de manière indépendante. Mots clés: densités de largeur de bande, caractéristiques optiques des cartes à circuits optiques

Plošče z optičnimi vezji - Osnovni preskusni in merilni postopki - 2. del: Splošno navodilo za definiranje pogojev za določanje optičnih značilnosti plošč z optičnimi vezji (IEC 62496-2:2017)

Ta del standarda IEC 62496 določa metodo za definiranje pogojev za določanje optičnih značilnosti plošč z optičnimi vezji. Metoda vključuje uporabo referenčnih tabel za iskanje kode za identifikacijo različnih kritičnih vidikov merilnega okolja.
Vrednosti, pridobljene iz tabel, se uporabljajo za izdelavo merilne identifikacijske kode, ki sama po sebi zajema zadostne informacije o pogojih merjenja, da se zagotovi skladnost neodvisno izmerjenih rezultatov znotraj sprejemljivih omejitev. Priporočeni pogoji merjenja so določeni, da se zmanjšajo nadaljnje razlike v neodvisno izmerjenih rezultatih.

General Information

• Status: Published
• Publication Date: 21-Sep-2017
• Withdrawal Date: 27-Jun-2020
• ICS: 33.180.01 - Fibre optic systems in general
• Technical Committee: CLC/SR 86 - Fibre optics
• Drafting Committee: IEC/TC 86 - IEC_TC_86
• Current Stage: 6060 - Document made available - Publishing
• Start Date: 22-Sep-2017
• Completion Date: 22-Sep-2017
• Ref Project: SIST EN 62496-2:2017 - Optical circuit boards - Basic test and measurement procedures - Part 2: General guidance for definition of measurement conditions for optical characteristics of optical circuit boards (IEC 62496-2:2017)

Standards Content (Sample)

SLOVENSKI STANDARD
SIST EN 62496-2:2017
01-november-2017
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Optical circuit boards - Basic test and measurement procedures - Part 2: General
guidance for definition of measurement conditions for optical characteristics of optical
circuit boards (IEC 62496-2:2017)
Ta slovenski standard je istoveten z: EN 62496-2:2017
ICS:
33.180.01 6LVWHPL]RSWLþQLPLYODNQLQD Fibre optic systems in
VSORãQR general
SIST EN 62496-2:2017 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST EN 62496-2:2017

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SIST EN 62496-2:2017


EUROPEAN STANDARD EN 62496-2

NORME EUROPÉENNE

EUROPÄISCHE NORM
September 2017
ICS 33.180.01

English Version
Optical circuit boards -
Basic test and measurement procedures -
Part 2: General guidance for definition of measurement
conditions for optical characteristics of optical circuit boards
(IEC 62496-2:2017)
Cartes à circuits optiques -  Optische Leiterplatten -
Procédures fondamentales d'essais et de mesures - Grundlegende Prüf- und Messverfahren -
Partie 2: Recommandations générales relatives à la Teil 2: Allgemeiner Leitfaden zur Festlegung der
détermination des conditions de mesure des Bedingungen für die Messung der optischen Eigenschaften
caractéristiques optiques des cartes à circuits optiques von optischen Leiterplatten
(IEC 62496-2:2017) (IEC 62496-2:2017)
This European Standard was approved by CENELEC on 2017-06-28. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden,
Switzerland, Turkey and the United Kingdom.


European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels
© 2017 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
 Ref. No. EN 62496-2:2017 E

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SIST EN 62496-2:2017
EN 62496-2:2017
European foreword
The text of document 86/509/CDV, future edition 1 of IEC 62496-2, prepared by IEC/TC 86 "Fibre
optics" was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as
EN 62496-2:2017.
The following dates are fixed:
• latest date by which the document has to be implemented at (dop) 2018-03-28
national level by publication of an identical national
standard or by endorsement
• latest date by which the national standards conflicting with (dow) 2020-06-28
the document have to be withdrawn

Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.
Endorsement notice
The text of the International Standard IEC 62496-2:2017 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following notes have to be added for the standards indicated:
IEC 60793-2 NOTE Harmonized as EN 60793-2.
IEC 60793-1-43 NOTE Harmonized as EN 60793-1-43.
IEC 60825-1 NOTE Harmonized as EN 60825-1.
IEC 61280-4-1 NOTE Harmonized as EN 61280-4-1.
IEC 61745 NOTE Harmonized as EN 61745.
IEC 62496-1 NOTE Harmonized as EN 62496-1.
IEC 62496-2-4 NOTE Harmonized as EN 62496-2-4.
1) 2)
IEC 62496-4-1 NOTE Harmonized as EN 62496-4-1 .

1) Under preparation. Stage at the time of publication: IEC PCC 62496-4-1:2017.
2) Under preparation. Stage at the time of publication: prEN 62496-4-1.
2

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