EN 61967-6:2002

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method

Specifies a method for evaluating RF currents on the pins of an integrated circuit (IC) by means of non-contact current measurement using a miniature magnetic probe. This method is capable of measuring the RF currents generated by the IC over a frequency range of 0,15 MHz to 1 000 MHz.

Integrierte Schaltungen - Messung von elektromagnetischen Aussendungen im Frequenzbereich von 150 kHz bis 1 GHz - Teil 6: Messung der leitungsgeführten Aussendungen - Magnetsondenverfahren

Circuits intégrés - Mesure des émissions électromagnétiques, 150 kHz à 1 GHz - Partie 6: Mesure des émissions conduites - Méthode de la sonde magnétique

Spécifie une méthode pour l'évaluation des courants RF sur les broches d'un circuit intégré par la mesure du courant sans contact en utilisant une sonde magnétique miniature. Cette méthode permet de mesurer les courants RF générés par le circuit intégré (CI) dans une plage de fréquences allant de 0,15 MHz à 1 000 MHz.

Integrirana vezja – Meritve elektromagnetnega sevanja, od 150 kHz do 1 GHz – 6. del: Meritve prevajanega sevanja – Metoda z magnetno sondo (IEC 61967-6:2002)

General Information

• Status: Published
• Publication Date: 07-Oct-2002
• Withdrawal Date: 31-Aug-2005
• ICS: 31.200 - Integrated circuits. Microelectronics
• Technical Committee: CLC/TC 47X - Semiconductor devices and trusted chips
• Drafting Committee: IEC/SC 47A - IEC_SC_47A
• Parallel Committee: IEC/SC 47A - IEC_SC_47A
• Current Stage: 6060 - Document made available - Publishing
• Start Date: 08-Oct-2002
• Completion Date: 08-Oct-2002
• Ref Project: SIST EN 61967-6:2005 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 6: Measurement of conducted emissions - Magnetic probe method

Relations

• Amended By: EN 61967-6:2002/A1:2008 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
• Effective Date: 29-Jan-2023

Standards Content (Sample)

SLOVENSKI SIST EN 61967-6:2005

STANDARD
december 2005
Integrirana vezja – Meritve elektromagnetnega sevanja, od 150 kHz do 1 GHz –
6. del: Meritve prevajanega sevanja – Metoda z magnetno sondo (IEC 61967-
6:2002)
Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz
– Part 6: Measurement of conducted emissions – Magnetic probe method (IEC
61967-6:2002)
ICS 31.200 Referenčna številka
©  Standard je založil in izdal Slovenski inštitut za standardizacijo. Razmnoževanje ali kopiranje celote ali delov tega dokumenta ni dovoljeno

EUROPEAN STANDARD EN 61967-6
NORME EUROPÉENNE
EUROPÄISCHE NORM October 2002

ICS 31.200
English version
Integrated circuits -
Measurement of electromagnetic emissions,
150 kHz to 1 GHz
Part 6: Measurement of conducted emissions -
Magnetic probe method
(IEC 61967-6:2002)
Circuits intégrés -  Integrierte Schaltungen -
Mesure des émissions Messung von elektromagnetischen
électromagnétiques, 150 kHz à 1 GHz Aussendungen im Frequenzbereich
Partie 6: Mesure des émissions von 150 kHz bis 1 GHz
conduites - Teil 6: Messung der leitungsgeführten
Méthode de la sonde magnétique Aussendungen -
(CEI 61967-6:2002) Magnetsondenverfahren
(IEC 61967-6:2002)
This European Standard was approved by CENELEC on 2002-09-01. CENELEC members are bound to
comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European
Standard the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and
notified to the Central Secretariat has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic,
Denmark, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Luxembourg, Malta,
Netherlands, Norway, Portugal, Slovakia, Spain, Sweden, Switzerland and United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Central Secretariat: rue de Stassart 35, B - 1050 Brussels

© 2002 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.

Ref. No. EN 61967-6:2002 E
Foreword
The text of document 47A/645/FDIS, future edition 1 of IEC 61967-6, prepared by SC 47A, Integrated
circuits, of IEC TC 47, Semiconductor devices, was submitted to the IEC-CENELEC parallel vote and
was approved by CENELEC as EN 61967-6 on 2002-09-01.

This European Standard should be read in conjunction with EN 61967-1:2002.

The following dates were fixed:

– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2003-06-01

– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2005-09-01

Annexes designated "normative" are part of the body of the standard.
Annexes designated "informative" are given for information only.
In this standard, annexes A and ZA are normative and annexes B, C and D are informative.
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 61967-6:2002 was approved by CENELEC as a European
Standard without any modification.
__________
- 3 - EN 61967-6:2002
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
This European Standard incorporates by dated or undated reference, provisions from other
publications. These normative references are cited at the appropriate places in the text and the
publications are listed hereafter. For dated references, subsequent amendments to or revisions of any
of these publications apply to this European Standard only when incorporated in it by amendment or
revision. For undated references the latest edition of the publication referred to applies (including
amendments).
NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant
EN/HD applies.
Publication Year Title EN/HD Year
1) 2)
IEC 61967-1 - Integrated circuits - Measurement of EN 61967-1 2002
electromagnetic emissions, 150 kHz to
1 GHz
Part 1: General conditions and
definitions
1) 2)
IEC 61967-4 - Part 4: Measurement of conducted EN 61967-4 2002
emissions - 1 ohm/150 ohm direct
coupling method
1)
Undated reference.
2)
Valid edition at date of issue.

NORME CEI
INTERNATIONALE IEC
61967-6
INTERNATIONAL
Première édition
STANDARD
First edition
2002-06
Circuits intégrés –
Mesure des émissions électromagnétiques,
150 kHz à 1 GHz –
Partie 6:
Mesure des émissions conduites –
Méthode de la sonde magnétique
Integrated circuits –
Measurement of electromagnetic emissions,
150 kHz to 1 GHz –
Part 6:
Measurement of conducted emissions –
Magnetic probe method
© IEC 2002 Droits de reproduction réservés ⎯ Copyright - all rights reserved
Aucune partie de cette publication ne peut être reproduite ni No part of this publication may be reproduced or utilized in any
utilisée sous quelque forme que ce soit et par aucun procédé, form or by any means, electronic or mechanical, including
électronique ou mécanique, y compris la photocopie et les photocopying and microfilm, without permission in writing from
microfilms, sans l'accord écrit de l'éditeur. the publisher.
International Electrotechnical Commission, 3, rue de Varembé, PO Box 131, CH-1211 Geneva 20, Switzerland
Telephone: [phone] Telefax: [phone] E-mail: [e-mail]  Web: www.iec.ch
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Pour prix, voir catalogue en vigueur
For price, see current catalogue

61967-6 © IEC:2002 – 3 –
CONTENTS
FOREWORD.7
1 Scope.11
2 Normative references .11
3 Definitions .11
4 General .11
4.1 Measurement philosophy.11
4.2 Measurement principle .13
5 Test conditions .13
5.1 General .13
5.2 Frequency range .13
6 Test equipment.13
6.1 General .13
6.2 Magnetic probe .13
6.3 Probe spacing fixture and placement.13
7 Test set-up .19
7.1 General .19
7.2 Probe calibration .19
7.3 Modifications to standardized IC test board .19
7.3.1 Layer arrangement .19
7.3.2 Layer thickness .19
7.3.3 Decoupling capacitors .19
7.3.4 I/O pin loading .21
8 Test procedure .29
8.1 General .29
8.2 Test technique.29
9 Test report.29
9.1 General .29
9.2 Documentation .29
Annex A (normative) Probe calibration procedure – Microstrip line method .33
Annex B (informative) Measurement principle and calibration factor.39
Annex C (informative) Spatial resolution of magnetic probe .47
Annex D (informative) Angle pattern of probe placement.49
Bibliography.51
Figure 1 – Magnetic probe .15
Figure 2 – Magnetic probe 1st and 3rd layers .15
Figure 3 – Magnetic probe 2nd layer.17
Figure 4 – Magnetic probe – layer construction.17
Figure 5 – Standardized IC test board (sectional view 1).21
Figure 6 – Standardized IC test board (sectional view 2 – measurement line) .21

61967-6 © IEC:2002 – 5 –
Figure 7 – Power line pattern on the standardized IC test board – Bottom layer .23
Figure 8 – I/O signal line pattern on the standardized IC test board – Bottom layer .25
Figure 9 – Multi-power lines on the standardized IC test board – Bottom layer .25
Figure 10 – Measurement set-up .27
Figure 11 – Measurement circuit schematic .27
Figure 12 – Transfer constant for current calculation as a function of insulator
thickness of microstrip board. .31
Figure A.1 – Cross-sectional view of a microstrip line for calibration .33
Figure A.2 – Measurement set-up for probe calibration .37
Figure B.1 – Cross-sectional view of a microstrip line .39
Figure B.2 – Measurement of magnetic probe output .43
Figure B.3 – Example of calibration factor for the magnetic probe
specified in figures 1, 2, 3, and 4 .45
Figure C.1 – Diagram for measuring a magnetic field distribution.47
Figure C.2 – Magnetic field distribution across the microstrip line (800 MHz) .47
Figure D.1 – Diagram for measuring an angle pattern of probe placement .49
Figure D.2 – Probe output to angle ϕ .49

61967-6 © IEC:2002 – 7 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
___________
INTEGRATED CIRCUITS –
MEASUREMENT OF ELECTROMAGNETIC EMISSIONS,
150 kHz TO 1 GHz –
Part 6: Measurement of conducted emissions –
Magnetic probe method
FOREWORD
1) The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of the IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, the IEC publishes International Standards. Their preparation is
entrusted to technical committees; any IEC National Committee interested in the subject dealt with may
participate in this preparatory work. International, governmental and non-governmental organizations liaising
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Organization for Standardization (ISO) in accordance with conditions determined by agreement between the
two organizations.
2) The formal decisions or agreements of the IEC on technical matters express, as nearly as possible, an
international consensus of opinion on the relevant subjects since each technical committee has representation
from all interested National Committees.
3) The documents produced have the form of recommendations for international use and are published in the form
of standards, technical specifications, technica
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