EN IEC 62433-6:2020

EMC IC modelling - Part 6: Models of integrated circuits for pulse immunity behavioural simulation - Conducted pulse immunity modelling (ICIM-CPI)

IEC 62433-6:2020 describes the extraction flow for deriving an immunity macro-model of an Integrated Circuit (IC) against conducted Electrostatic Discharge (ESD) according to IEC 61000-4-2 and Electrical Fast Transients (EFT) according to IEC 61000-4-4. The model addresses physical damages due to overvoltage, thermal damage and other failure modes. Functional failures can also be addressed. This model allows the immunity simulation of the IC in an application. This model is commonly called "Integrated Circuit Immunity Model Conducted Pulse Immunity", ICIM-CPI. This document provides: - the description of ICIM-CPI macro-model elements representing electrical, thermal or logical behaviour of the IC. - a universal data exchange format based on XML.

EMV-IC-Modellierung - Teil 6: Modelle integrierter Schaltungen für die Simulation des Verhaltens bei Störfestigkeit gegen Impulse - Modellierung der Störfestigkeit gegen leitungsgeführte Impulse (ICIM-CPI)

Modèles de circuits intégrés pour la CEM - Partie 6: Modèles de circuits intégrés pour la simulation du comportement d'immunité aux impulsions - Modélisation de l'immunité aux impulsions conduite (ICIM-CPI)

L'IEC 62433-6:2020 a pour objet de décrire la méthode d'extraction d’un macromodèle d'immunité d'un circuit intégré aux décharges électrostatiques (DES) conduites selon l'IEC 61000-4-2 et aux transitoires électriques rapides (TER) selon l'IEC 61000‑4‑4. Le modèle couvre les dommages physiques dus à la surtension, les dommages thermiques et d’autres modes de défaillance. Les défaillances fonctionnelles peuvent également être traitées par ce modèle. Ce modèle permet de simuler l'immunité du circuit intégré dans une application. Ce modèle est communément appelé "modèle d'immunité des circuits intégrés – immunité aux impulsions conduites" (ICIM-CPI – integrated circuit immunity model conducted pulse immunity). Le présent document fournit: - la description des éléments de macromodèle ICIM-CPI représentant le comportement électrique, thermique ou logique du circuit intégré; - un format universel d'échange de données fondé sur le langage XML.

Modeliranje integriranih vezij (IC) za elektromagnetno združljivost (EMC) - 6. del: Modeli integriranih vezij za simulacijo impulzno odpornega obnašanja - Modeliranje impulzne odpornosti (ICIM-CPI) (IEC 62433-6:2020)

General Information

• Status: Published
• Publication Date: 05-Nov-2020
• ICS: 31.200 - Integrated circuits. Microelectronics
• Technical Committee: CLC/TC 47X - Semiconductor devices and trusted chips
• Drafting Committee: IEC/SC 47A - IEC_SC_47A
• Current Stage: 6060 - Document made available - Publishing
• Start Date: 06-Nov-2020
• Completion Date: 06-Nov-2020
• Ref Project: SIST EN IEC 62433-6:2021 - EMC IC modelling - Part 6: Models of integrated circuits for pulse immunity behavioural simulation - Conducted pulse immunity modelling (ICIM-CPI) (IEC 62433-6:2020)

Standards Content (Sample)

SLOVENSKI STANDARD
01-januar-2021
Modeliranje integriranih vezij (IC) za elektromagnetno združljivost (EMC) - 6. del:
Modeli integriranih vezij za simulacijo impulzno odpornega obnašanja -
Modeliranje impulzne odpornosti (ICIM-CPI) (IEC 62433-6:2020)
EMC IC modelling - Part 6: Models of integrated circuits for pulse immunity behavioural
simulation - Conducted pulse immunity modelling (ICIM-CPI) (IEC 62433-6:2020)
EMV-IC-Modellierung - Teil 6: Modelle integrierter Schaltungen für die Simulation des
Verhaltens bei Störfestigkeit gegen Impulse - Modellierung der Störfestigkeit gegen
leitungsgeführte Impulse (ICIM-CPI) (IEC 62433-6:2020)
Modèles de circuits intégrés pour la CEM - Partie 6: Modèles de circuits intégrés pour la
simulation du comportement d'immunité aux impulsions - Modélisation de l'immunité aux
impulsions conduite (ICIM-CPI) (IEC 62433-6:2020)
Ta slovenski standard je istoveten z: EN IEC 62433-6:2020
ICS:
31.200 Integrirana vezja, Integrated circuits.
mikroelektronika Microelectronics
33.100.20 Imunost Immunity
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD EN IEC 62433-6

NORME EUROPÉENNE
EUROPÄISCHE NORM
November 2020
ICS 31.200
English Version
EMC IC modelling - Part 6: Models of integrated circuits for
Pulse immunity behavioural simulation - Conducted Pulse
Immunity (ICIM-CPI)
(IEC 62433-6:2020)
Modèles de circuits intégrés pour la CEM - Partie 6: EMV-IC-Modellierung - Teil 6: Modelle integrierter
Modèles de circuits intégrés pour la simulation du Schaltungen für die Simulation des Verhaltens bei
comportement d'immunité aux impulsions - Modélisation de Störfestigkeit gegen Impulse - Modellierung der
l'immunité aux impulsions conduites (ICIM-CPI) Störfestigkeit gegen leitungsgeführte Impulse (ICIM-CPI)
(IEC 62433-6:2020) (IEC 62433-6:2020)
This European Standard was approved by CENELEC on 2020-10-27. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the
Netherlands, Norway, Poland, Portugal, Republic of North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland,
Turkey and the United Kingdom.

European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels
© 2020 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN IEC 62433-6:2020 E

European foreword
The text of document 47A/1090/CDV, future edition 1 of IEC 62433-6, prepared by SC 47A "Integrated
circuits" of IEC/TC 47 "Semiconductor devices" was submitted to the IEC-CENELEC parallel vote and
approved by CENELEC as EN IEC 62433-6:2020.
The following dates are fixed:
• latest date by which the document has to be implemented at national (dop) 2021-07-27
level by publication of an identical national standard or by endorsement
• latest date by which the national standards conflicting with the (dow) 2023-10-27
document have to be withdrawn
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.
Endorsement notice
The text of the International Standard IEC 62433-6:2020 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following notes have to be added for the standards
indicated:
IEC 62433-2:2017 NOTE Harmonized as EN 62433-2:2017 (not modified)
CISPR 16-1-4:2019 NOTE Harmonized as EN IEC 55016-1-4:2019 (not modified)
CISPR 17 NOTE Harmonized as EN 55017
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments)
applies.
NOTE 1 Where an International Publication has been modified by common modifications, indicated by (mod), the
relevant EN/HD applies.
NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available
here: www.cenelec.eu.
Publication Year Title EN/HD Year
IEC 61000-4-2 - Electromagnetic compatibility (EMC) - EN 61000-4-2 -
Part 4-2: Testing and measurement
techniques - Electrostatic discharge
immunity test
IEC 61000-4-4 - Electromagnetic compatibility (EMC) - EN 61000-4-4 -
Part 4-4: Testing and measurement
techniques - Electrical fast transient/burst
immunity test
IEC 62215-3 - Integrated circuits - Measurement of EN 62215-3 -
impulse immunity - Part 3: Non-
synchronous transient injection method
IEC 62433-1 - EMC IC modelling - Part 1: General EN IEC 62433-1 -
modelling framework
IEC 62433-4 - EMC IC modelling - Part 4: Models of EN 62433-4 -
integrated circuits for RF immunity
behavioural simulation - Conducted
immunity modelling (ICIM-CI)
IEC 62615 - Electrostatic discharge sensitivity testing - - -
Transmission line pulse (TLP) -
Component level
IEC 62433-6 ®
Edition 1.0 2020-09
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
EMC IC modelling –
Part 6: Models of integrated circuits for pulse immunity behavioural simulation –

Conducted pulse immunity modelling (ICIM-CPI)

Modèles de circuits intégrés pour la CEM –

Partie 6: Modèles de circuits intégrés pour la simulation du comportement

d'immunité aux impulsions – Modélisation de l'immunité aux impulsions

conduites (ICIM-CPI)
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.200 ISBN 978-2-8322-8813-9

– 2 – IEC 62433-6:2020 © IEC 2020
CONTENTS
FOREWORD . 5
1 Scope . 7
2 Normative references . 7
3 Terms, definitions, abbreviated terms and conventions . 8
3.1 Terms and definitions . 8
3.2 Abbreviated terms . 11
3.3 Conventions . 11
4 Philosophy . 11
5 ICIM-CPI model structure . 12
5.1 General . 12
5.2 PPN . 14
5.2.1 Typical structure of a PPN . 14
5.2.2 PDN description . 15
5.2.3 NLB description . 16
5.3 FB description . 16
6 CPIML format . 18
6.1 General . 18
6.2 CPIML structure . 19
6.3 Global elements . 20
6.4 Header section . 20
6.5 Lead_definitions section . 20
6.6 Macromodels section . 21
6.7 Validity section . 22
6.8 PDN . 22
6.9 NLB . 22
6.9.1 General . 22
6.9.2 Attribute definitions . 23
6.9.3 Data description . 24
6.10 FB . 25
6.10.1 General . 25
6.10.2 Attribute definitions . 26
6.10.3 Data description . 30
Annex A (informative) Extraction of model components . 34
A.1 General . 34
A.2 PPN description . 34
A.3 PDN Extraction . 34
A.3.1 General . 34
A.3.2 S/Z/Y-parameter measurement . 34
A.3.3 Conventional one-port method . 35
A.3.4 Two-port method for low impedance measurement . 35
A.3.5 Two-port method for high impedance measurement . 36
A.4 NLB extraction . 36
A.4.1 General . 36
A.4.2 TLP test method . 37
A.5 FB extraction . 39
A.5.1 General . 39

IEC 62433-6:2020 © IEC 2020 – 3 –
A.5.2 Example of FB data in case of test criteria type = Class E_IC . 39
A.5.3 Example of FB data in case of test criteria type = Class C_IC . 41
Annex B (informative)  NLB implementation techniques in a circuit simulator . 42
B.1 General . 42
B.2 NLB modelling based on a R/I table . 42
B.3 NLB modelling based on a switch based model . 42
B.4 NLB modelling based on physical device model . 43
Annex C (informative)  Example of ICIM-CPI model . 45
C.1 General . 45
C.2 Example of Power switch ICIM-CPI model. 45
C.2.1 General .
...