EN 60749-8:2003

Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing

Applicable to semiconductor devices (discrete devices and integrated circuits), it determines the leak rate of semiconductor devices.

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 8: Dichtheit

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 8: Etanchéité

Applicable aux dispositifs à semiconducteurs (dispositifs discrets et circuits intégrés), détermine le taux de fuite des dispositifs à semiconducteurs.

Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing (IEC 60749-8:2002 + corrigendum 2003)

General Information

• Status: Published
• Publication Date: 19-Jun-2003
• Withdrawal Date: 30-Sep-2005
• ICS: 31.080.01 - Semiconductor devices in general
• Technical Committee: CLC/SR 47 - Semiconductor devices
• Drafting Committee: IEC/TC 47 - IEC_TC_47
• Parallel Committee: IEC/TC 47 - IEC_TC_47
• Current Stage: 6060 - Document made available - Publishing
• Start Date: 20-Jun-2003
• Completion Date: 20-Jun-2003
• Ref Project: SIST EN 60749-8:2004 - Semiconductor devices - Mechanical and climatic test methods -- Part 8: Sealing

Standards Content (Sample)

SLOVENSKI SIST EN 60749-8:2004

STANDARD
julij 2004
Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
(IEC 60749-8:2002 + corrigendum 2003)
ICS 31.080.01 Referenčna številka
SIST EN 60749-8:2004(en)
©  Standard je založil in izdal Slovenski inštitut za standardizacijo. Razmnoževanje ali kopiranje celote ali delov tega dokumenta ni dovoljeno

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EUROPEAN STANDARD EN 60749-8
NORME EUROPÉENNE
EUROPÄISCHE NORM June 2003

ICS 31.080.01


English version


Semiconductor devices -
Mechanical and climatic test methods
Part 8: Sealing
(IEC 60749-8:2002 + corrigendum 2003)


Dispositifs à semiconducteurs -  Halbleiterbauelemente -
Méthodes d'essais mécaniques Mechanische und klimatische Prüfverfahren
et climatiques Teil 8: Dichtheit
Partie 8: Etanchéité (IEC 60749-8:2002 + Corrigendum 2003)
(CEI 60749-8:2002 + corrigendum 2003)






This European Standard was approved by CENELEC on 2002-09-24. CENELEC members are bound to
comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European
Standard the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and
notified to the Central Secretariat has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic,
Denmark, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Luxembourg, Malta,
Netherlands, Norway, Portugal, Slovakia, Spain, Sweden, Switzerland and United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Central Secretariat: rue de Stassart 35, B - 1050 Brussels


© 2003 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.

Ref. No. EN 60749-8:2003 E

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EN 60749-8:2003 - 2 -
Foreword
The text of the International Standard IEC 60749-8:2002 was approved by CENELEC as EN 60749-8
on 2002-09-24.
The text of this International Standard was reproduced from IEC 60749:1996, chapter 3, clause 5
without change. Therefore, it has not been submitted to vote a second time and is still based on
document 47/1574/FDIS.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2004-01-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2005-10-01
Each test method governed by this standard and which is part of the series is a stand-alone
document, numbered EN 60749-2, EN 60749-3, etc. The numbering of these test methods is
sequential, and there is no relationship between the number and the test method (i.e. no grouping of
test methods). The list of these tests will be available in the CENELEC internet site and in the
catalogue.
Updating of any of the individual test methods is independent of any other part.
Annexes designated "normative" are part of the body of the standard.
In this standard, annex ZA is normative.
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 60749-8:2002 and its corrigendum April 2003 was approved
by CENELEC as a European Standard without any modification.
__________

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- 3 - EN 60749-8:2003
Annex ZA
(normative)

Normative references to international publications
with their corresponding European publications
This European Standard incorporates by dated or undated reference, provisions from other
publications. These normative references are cited at the appropriate places in the text and the
publications are listed hereafter. For dated references, subsequent amendments to or revisions of any
of these publications apply to this European Standard only when incorporated in it by amendment or
revision. For undated references the latest edition of the publication referred to applies (including
amendments).
NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant
EN/HD applies.
Publication Year Title EN/HD Year
IEC 60068-2-17 1994 Environmental testing EN 60068-2-17 1994
Part 2: Tests - Test Q: Sealing

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NORME CEI
INTERNATIONALE IEC
60749-8
INTERNAT
...