EN 60444-8:2017
(Main)Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
IEC 60444-8:2016(E) describes test fixtures suitable for leadless surface mounted quartz crystal units in enclosures as defined in IEC 61837 (all parts). These fixtures allow the measurement of (series) resonance frequency, (series) resonance resistance, and equivalent electrical circuit parameters L1, C1 and C0 using the measurement techniques specified in IEC 60444-5 and for the determination of load resonance frequency and load resonance resistance according to IEC TR 60444-4 and IEC 60444-11. Two test fixtures are described in this document: 1) A fixture using the p-network circuit with electrical values as described in IEC 60444-1 for measurements in transmission mode up to 500 MHz. This fixture includes optional means to add physical load capacitors for the measurement of load resonance parameters up to 30 MHz in accordance with IEC 60444-4. The range of load capacitance is 10 pF or more. Calibration of the measurement system and CL adapter board is explained hereinafter. 2) A fixture based on the reflection method, suitable for a frequency range up to 1 200 MHz. No provisions for adding a physical load capacitance are anticipated. Load resonance parameters can be measured by using the method of IEC 60444-11. This edition includes the following significant technical changes with respect to the previous edition: a) modification of Clause 1; b) modification of 5.2; c) modification of 5.3; d) modification of 5.4; e) 6.3 Calibration of the reflection measurement system.
Messung von Schwingquarz-Parametern - Teil 8: Prüfaufbau für oberflächenmontierbare Schwingquarze
Mesure des paramètres des résonateurs à quartz - Partie 8: Dispositif d'essai pour les résonateurs à quartz montés en surface
L'IEC 60444-8:2016 spécifie les dispositifs d'essai appropriés aux résonateurs à quartz sans sorties montés en surface dans des enveloppes tels que définis dans l'IEC 61837 (toutes les parties). Ces dispositifs permettent de mesurer les paramètres de fréquence de résonance (en série), de résistance de résonance (en série) et de circuit électrique équivalents L1, C1 et C0 à l'aide des techniques de mesure spécifiées dans l'IEC 60444-5. Ils permettent également de déterminer la fréquence de résonance à la charge et la résistance de résonance à la charge selon l'IEC TR 60444-4 et l'IEC 60444-11. Deux dispositifs d'essai sont spécifiés dans le présent document: 1) Un dispositif utilisant le circuit en p avec des valeurs électriques telles que décrites dans l'IEC 60444-1 pour les mesurages en mode de transmission jusqu'à 500 MHz. Ce dispositif comprend des moyens facultatifs permettant d’ajouter des condensateurs de charge physique pour le mesurage des paramètres de résonance à la charge jusqu'à 30 MHz conformément à l'IEC 60444-4. La plage de la capacité de charge est de 10 pF ou plus. L'étalonnage du système de mesure et de la carte d'adaptateur CL est décrit ci-après. 2) Un dispositif fonctionnant selon la méthode de réflexion, approprié pour une plage de fréquences jusqu'à 1 200 MHz. Aucune disposition concernant l'ajout d'une capacité de charge physique n'est prévue. Les paramètres de résonance à la charge peuvent être mesurés en utilisant la méthode spécifiée dans l'IEC 60444-11. Cette édition inclut les modifications techniques majeures suivantes par rapport à l'édition précédente: a) modification de l'Article 1; b) modification du 5.2; c) modification du 5.3; d) modification du 5.4; e) 6.3 Étalonnage du système de mesure de réflexion.
Merjenje parametrov kvarčnih kristalov - 8. del: Preskusna pritrditev za enoto kvarčnih kristalov za površinsko montažo (IEC 60444-8:2016)
Ta del standarda IEC 60444 opisuje preskusne pritrditve, primerne za enote kvarčnih kristalov za površinsko montažo v ohišja, kot je opredeljeno v standardu IEC 61837 (vsi deli). Te pritrditve omogočajo merjenje (serijske) resonančne frekvence, (serijskega) resonančnega upora ter enakovrednih parametrov električnega tokokroga L1, C1 in C0 z merilnimi tehnikami, določenimi v standardu IEC 60444-5, ter ugotavljanje resonančne frekvence obremenitve in resonančnega upora obremenitve v skladu s standardoma IEC TR 60444-4 in IEC 60444-11.
V tem dokumentu sta opisani dve preskusni pritrditvi:
1) Pritrditev s π-omrežnim tokokrogom z električnimi vrednostmi, kot je opisano v standardu IEC 60444-1, za meritve in način prenosa do vključno 500 MHz. Te pritrditve vključujejo izbirna sredstva za dodajanje fizičnih kondenzatorjev bremena za merjenje resonančnih parametrov obremenitve do vključno 30 MHz v skladu s standardom IEC 60444-4. Razpon kapacitivnosti obremenitve je 10 pF ali več. Umerjanje merilnega sistema in vmesniških plošč CL je razloženo v nadaljevanju. 2) Pritrditev, ki temelji na odbojni metodi, primerna za frekvenčni razpon do vključno 1200 MHz. Ukrepi za dodajanje fizične kapacitivnosti obremenitve niso predvideni. Parametre resonančne obremenitve je mogoče izmeriti z uporabo metode iz standarda IEC 60444-11.
General Information
Relations
Standards Content (Sample)
SLOVENSKI STANDARD
01-junij-2017
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SIST EN 60444-8:2004
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Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted
quartz crystal units (IEC 60444-8:2016)
Ta slovenski standard je istoveten z: EN 60444-8:2017
ICS:
31.140 3LH]RHOHNWULþQHQDSUDYH Piezoelectric devices
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
EUROPEAN STANDARD EN 60444-8
NORME EUROPÉENNE
EUROPÄISCHE NORM
April 2017
ICS 31.140 Supersedes EN 60444-8:2003
English Version
Measurement of quartz crystal unit parameters -
Part 8 : Test fixture for surface mounted quartz crystal units
(IEC 60444-8:2016)
Mesure des paramètres des résonateurs à quartz - Messung von Schwingquarz-Parametern -
Partie 8: Dispositif d'essai pour les résonateurs Teil 8: Prüfaufbau für oberflächenmontierbare
à quartz montés en surface Schwingquarze
(IEC 60444-8:2016) (IEC 60444-8:2016)
This European Standard was approved by CENELEC on 2017-01-19. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden,
Switzerland, Turkey and the United Kingdom.
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels
© 2017 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN 60444-8:2017 E
European foreword
The text of document 49/1126/CDV, future edition 2 of IEC 60444-8, prepared by IEC/TC 49
"Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control,
selection and detection" was submitted to the IEC-CENELEC parallel vote and approved by
CENELEC as EN 60444-8:2017.
The following dates are fixed:
• latest date by which the document has to be implemented at (dop) 2017-10-19
national level by publication of an identical national
standard or by endorsement
(dow) 2020-01-19
• latest date by which the national standards conflicting with
the document have to be withdrawn
This document supersedes EN 60444-8:2003.
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such
patent rights.
This document has been prepared under a mandate given to CENELEC by the European Commission
and the European Free Trade Association.
Endorsement notice
The text of the International Standard IEC 60444-8:2016 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following notes have to be added for the standards indicated:
IEC 60122-1 NOTE Harmonized as EN 60122-1.
IEC 60444-1:1986 NOTE Harmonized as EN 60444-1:1997 (not modified).
IEC 60444-2 NOTE Harmonized as EN 60444-2.
IEC 60444-6 NOTE Harmonized as EN 60444-6.
IEC 60444-7 NOTE Harmonized as EN 60444-7.
IEC 60444-9 NOTE Harmonized as EN 60444-9.
IEC 61837-1 NOTE Harmonized as EN 61837-1.
IEC 61837-2 NOTE Harmonized as EN 61837-2.
IEC 61837-3 NOTE Harmonized as EN 61837-3.
IEC 61837 NOTE Harmonized in EN 61837 series.
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following documents, in whole or in part, are normatively referenced in this document and are
indispensable for its application. For dated references, only the edition cited applies. For undated
references, the latest edition of the referenced document (including any amendments) applies.
NOTE 1 When an International Publication has been modified by common modifications, indicated by (mod),
the relevant EN/HD applies.
NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is
available here: www.cenelec.eu.
Publication Year Title EN/HD Year
IEC 60444-5 - Measurement of quartz crystal unit EN 60444-5 -
parameters - Part 5: Methods for the
determination of equivalent electrical
parameters using automatic network
analyzer techniques and error correction
IEC 60444-8 ®
Edition 2.0 2016-12
INTERNATIONAL
STANDARD
colour
inside
Measurement of quartz crystal unit parameters –
Part 8: Test fixture for surface mounted quartz crystal units
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 31.140 ISBN 978-2-8322-3718-2
– 2 – IEC 60444-8:2016 © IEC 2016
CONTENTS
FOREWORD . 3
INTRODUCTION . 5
1 Scope . 6
2 Normative references . 6
3 Specifications . 6
4 Leadless surface mounted quartz crystal units . 6
4.1 Enclosure . 6
4.2 Overtone and frequency range . 7
5 Specifications of measurement method, test fixture . 7
5.1 Specifications of measurement method . 7
5.2 Specifications of transmission test fixture . 7
5.3 Specifications of reflection test fixture . 10
5.4 Measuring equipment . 13
6 Calibration . 13
6.1 Calibration of the transmission test system . 13
6.2 Additional calibration of the transmission test system with C adapter board . 13
L
6.3 Calibration of the reflection measurement system . 13
Bibliography . 15
Figure 1 – Transmission π-network test fixture: Simplified equivalent circuit diagram,
frequency range from 1 MHz to 500 MHz . 7
Figure 2 – Transmission π-network test Fixture with physical load capacitors: simplified
equivalent circuit, frequency range from 1 MHz to 30 MHz . 7
Figure 3 – Transmission π-network test fixture: Three-dimensional projection for the test
fixture . 8
Figure 4 – Transmission π-network test fixture: Mechanical design of the test fixture . 9
Figure 5 – Transmission π-network test fixture with physical load capacitors: Structure
of the test fixture . 10
Figure 6 – Design of the reflection test fixture . 11
Figure 7 – Mechanical details of the reflection test fixture . 13
Figure 8 – Calibration technique for the reflection test fixture . 14
IEC 60444-8:2016 © IEC 2016 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
______________
MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS –
Part 8: Test fixture for surface mounted quartz crystal units
FOREWORD
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all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60444-8 has been prepared by IEC technical committee 49:
Piezoelectric, dielectric and electrostatic devices and associated materials for frequency
control, selection and detection.
This second edition cancels and replaces the first edition published in 2003. This edition
constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
a) modification of Clause 1;
b) modification of 5.2;
c) modification of 5.3;
d) modification of 5.4;
– 4 – IEC 60444-8:2016 © IEC 2016
e) 6.3 Calibration of the reflection measurement system.
The text of this standard is based on the following documents:
CDV Report on voting
49/1126/CDV 49/1175/RVC
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts in the IEC 60444 series, published under the general title Measurement of
quartz crystal unit parameters, can be found on the IEC website.
The committee has decided that the contents
...
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