EN IEC 60444-6:2021
(Main)Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
This part of IEC 60444 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods (A and C) and one referential method (B) are described. "Method A", based on the π-network according to IEC 60444-5, can be used in the complete frequency range covered by this part of IEC 60444. “Reference Method B”, based on the π-network or reflection method according to IEC 60444-5 or IEC 60444-8 can be used in the complete frequency range covered by this part of IEC 60444. “Method C”, an oscillator method, is suitable for measurements of fundamental mode crystal units in larger quantities with fixed conditions. NOTE The measurement methods specified in this document are not only applicable to AT-cut, but also to other crystal cuts and vibration modes, such as doubly rotated cuts (IT,SC) and to tuning fork crystal units (by using a high impedance test fixture).
Messung von Schwingquarz-Parametern - Teil 6: Messung der Belastungsabhängigkeit (DLD)
Mesure des paramètres des résonateurs à quartz - Partie 6: Mesure de la dépendance du niveau d’excitation (DNE)
IEC 60444-6:2021 est disponible sous forme de IEC 60444-6:2021 RLV qui contient la Norme internationale et sa version Redline, illustrant les modifications du contenu technique depuis l'édition précédente.L’IEC 60444-6:2021 s’applique aux mesures de la dépendance du niveau d’excitation (DNE) des résonateurs à quartz. Deux méthodes d’essai (A et C) et une méthode de référence (B) sont décrites. La méthode A, basée sur le réseau en p conformément à l’IEC 60444-5, peut être utilisée dans la plage de fréquences complète couverte par la présente partie de l’IEC 60444. La méthode de référence B, basée sur le réseau en p ou sur la méthode de réflexion conformément à l’IEC 60444-5 ou à l’IEC 60444-8, peut être utilisée dans la plage de fréquences complète couverte par la présente partie de l’IEC 60444. La méthode C, une méthode avec un oscillateur, est adaptée pour les mesures de résonateurs sur le mode fondamental en plus grandes quantités avec des conditions fixes. Cette édition inclut les modifications techniques majeures suivantes par rapport à l’édition précédente: - certaines équations ont été supprimées ou corrigées; - il est spécifié dans la note du Domaine d’application que les méthodes de mesure spécifiées dans le présent document ne s’appliquent pas uniquement à la coupe AT, mais aussi à d’autres coupes de cristaux et à d’autres modes de vibration.
Merjenje parametrov kvarčnih kristalov - 6. del: Merjenje odvisnosti od ravni napajanja (DLD) (IEC 60444-6:2021)
General Information
Relations
Standards Content (Sample)
SLOVENSKI STANDARD
01-december-2021
Nadomešča:
SIST EN 60444-6:2014
Merjenje parametrov kvarčnih kristalov - 6. del: Merjenje odvisnosti od ravni
napajanja (DLD) (IEC 60444-6:2021)
Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level
dependence (DLD) (IEC 60444-6:2021)
Messung von Schwingquarz-Parametern - Teil 6: Messung der Belastungsabhängigkeit
(DLD) (IEC 60444-6:2021)
Mesure des paramètres des résonateurs à quartz - Partie 6: Mesure de la dépendance
du niveau d'excitation (DNE) (IEC 60444-6:2021)
Ta slovenski standard je istoveten z: EN IEC 60444-6:2021
ICS:
31.140 Piezoelektrične naprave Piezoelectric devices
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
EUROPEAN STANDARD EN IEC 60444-6
NORME EUROPÉENNE
EUROPÄISCHE NORM
October 2021
ICS 31.140 Supersedes EN 60444-6:2013 and all of its amendments
and corrigenda (if any)
English Version
Measurement of quartz crystal unit parameters - Part 6:
Measurement of drive level dependence (DLD)
(IEC 60444-6:2021)
Mesure des paramètres des résonateurs à quartz - Partie 6: Messung von Schwingquarz-Parametern - Teil 6: Messung
Mesure de la dépendance du niveau d'excitation (DNE) der Belastungsabhängigkeit (DLD)
(IEC 60444-6:2021) (IEC 60444-6:2021)
This European Standard was approved by CENELEC on 2021-10-06. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the
Netherlands, Norway, Poland, Portugal, Republic of North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland,
Turkey and the United Kingdom.
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels
© 2021 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN IEC 60444-6:2021 E
European foreword
The text of document 49/1374/FDIS, future edition 3 of IEC 60444-6, prepared by IEC/TC 49
“Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control,
selection and detection” was submitted to the IEC-CENELEC parallel vote and approved by
CENELEC as EN IEC 60444-6:2021.
The following dates are fixed:
• latest date by which the document has to be implemented at national (dop) 2022–07–06
level by publication of an identical national standard or by endorsement
• latest date by which the national standards conflicting with the (dow) 2024–10–06
document have to be withdrawn
This document supersedes EN 60444-6:2013 and all of its amendments and corrigenda (if any).
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.
Any feedback and questions on this document should be directed to the users’ national committee. A
complete listing of these bodies can be found on the CENELEC website.
Endorsement notice
The text of the International Standard IEC 60444-6:2021 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following note has to be added for the standard indicated:
IEC 60444-1 NOTE Harmonized as EN 60444-1
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments)
applies.
NOTE 1 Where an International Publication has been modified by common modifications, indicated by (mod), the
relevant EN/HD applies.
NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available
here: www.cenelec.eu.
Publication Year Title EN/HD Year
IEC 60444-5 - Measurement of quartz crystal units EN 60444-5 -
parameters - Part 5: Methods for the
determination of equivalent electrical
parameters using automatic network
analyser techniques and error correction
IEC 60444-8 - Measurement of quartz crystal unit EN 60444-8 -
parameters - Part 8: Test fixture for surface
mounted quartz crystal units
IEC 60444-6 ®
Edition 3.0 2021-09
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Measurement of quartz crystal unit parameters –
Part 6: Measurement of drive level dependence (DLD)
Mesure des paramètres des résonateurs à quartz –
Partie 6: Mesure de la dépendance du niveau d’excitation (DNE)
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.140 ISBN 978-2-8322-1014-4
– 2 – IEC 60444-6:2021 © IEC 2021
CONTENTS
FOREWORD . 3
INTRODUCTION . 5
1 Scope . 6
2 Normative references. 6
3 Terms and definitions . 6
4 DLD effects . 6
4.1 Reversible changes in frequency and resistance . 6
4.2 Irreversible changes in frequency and resistance . 7
4.3 Causes of DLD effects . 7
5 Drive levels for DLD measurement . 7
6 Test methods . 8
6.1 Method A (fast standard measurement method) . 8
6.1.1 Testing at two drive levels . 8
6.1.2 Testing according to specification . 9
6.2 Method B (Multi-level reference measurement method) . 10
Annex A (normative) Relationship between electrical drive level and mechanical
displacement of quartz crystal units . 12
Annex B (normative) Method C: DLD measurement with oscillation circuit . 15
Bibliography . 20
γ
Figure 1 – Maximum tolerable resistance ratio for the drive level dependence as a
function of the resistances R or R . 9
12 13
Figure B.1 – Insertion of a quartz crystal unit in an oscillator . 15
Figure B.2 – Crystal unit loss resistance as a function of dissipated power . 16
Figure B.3 – Behaviour of the R of a quartz crystal unit . 17
r
Figure B.4 – Block diagram of circuit system . 17
Figure B.5 – Installed −R in scanned drive level range . 18
osc
Figure B.6 – Drive level behaviour of a quartz crystal unit if −R = 70 Ω is used as
osc
test limit in the Annex B test . 18
Figure B.7 – Principal schematic diagram of the go/no-go test circuit . 19
IEC 60444-6:2021 © IEC 2021 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS –
Part 6: Measurement of drive level dependence (DLD)
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international
co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and
in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports,
Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their
preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with
may participate in this preparatory work. International, governmental and non-governmental organizations liaising
with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for
Standardization (ISO) in accordance with conditions determined by agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence between
any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent
rights. IEC shall not be held responsible for identifying any or all such patent rights.
IEC 60444-6 has been prepared by IEC technical committee 49: Piezoelectric, dielectric and
electrostatic devices and associated materials for frequency control, selection and detection. It
is an International Standard.
This third edition cancels and replaces the second edition published in 2013. This edition
constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
a) some equations have been removed and corrected;
b) it has been specified in the note of the Scope that the measurement methods specified in
this document are not only applicable to AT-cut but also to other crystal cuts and vibration
modes.
– 4 – IEC 60444-6:2021 © IEC 2021
The text of this International Standard is based on the following documents:
FDIS Report on voting
49/1374/FDIS 49/1377/RVD
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
The
...
Questions, Comments and Discussion
Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.