EN 61788-7:2006
(Main)Superconductivity - Part 7: Electronic characteristic measurements - Surface resistance of superconductors at microwave frequencies
Superconductivity - Part 7: Electronic characteristic measurements - Surface resistance of superconductors at microwave frequencies
This part of IEC 61788 describes measurement of the surface resistance of superconductors at microwave frequencies by the standard two-resonator method. The object of measurement is the temperature dependence of Rs at the resonant frequency. The applicable measurement range of surface resistances for this method is as follows: - Frequency: 8 GHz < f < 30 GHz - Measurement resolution: 0,01 milliohm at 10 GHz.
Supraleitfähigkeit - Teil 7: Charakteristische elektronische Messungen - Oberflächenwiderstand von Supraleitern bei Frequenzen im Mikrowellenbereich
Supraconductivité - Partie 7: Mesures des caractéristiques électroniques - Résistance de surface des supraconducteurs aux hyperfréquences
Superprevodnost - 7. del: Meritve elektronskih lastnosti - Površinska upornost superprevodnikov pri mikrovalovnih frekvencah (IEC 61788-7:2006)
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SLOVENSKI SIST EN 61788-7:2007
STANDARD
marec 2007
Superprevodnost – 7. del: Meritve elektronskih lastnosti – Površinska
upornost superprevodnikov pri mikrovalovnih frekvencah (IEC 61788-7:2006)
Superconductivity - Part 7: Electronic characteristic measurements - Surface
resistance of superconductors at microwave frequencies (IEC 61788-7:2006)
ICS 17.220.20; 29.050 Referenčna številka
© Standard je založil in izdal Slovenski inštitut za standardizacijo. Razmnoževanje ali kopiranje celote ali delov tega dokumenta ni dovoljeno
EUROPEAN STANDARD
EN 61788-7
NORME EUROPÉENNE
December 2006
EUROPÄISCHE NORM
ICS 17.220; 29.050 Supersedes EN 61788-7:2002
English version
Superconductivity
Part 7: Electronic characteristic measurements -
Surface resistance of superconductors at microwave frequencies
(IEC 61788-7:2006)
Supraconductivité Supraleitfähigkeit
Partie 7: Mesures des caractéristiques Teil 7: Charakteristische elektronische
électroniques - Messungen -
Résistance de surface des Oberflächenwiderstand von Supraleitern
supraconducteurs aux hyperfréquences bei Frequenzen im Mikrowellenbereich
(CEI 61788-7:2006) (IEC 61788-7:2006)
This European Standard was approved by CENELEC on 2006-11-01. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the Central Secretariat has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Cyprus, the Czech
Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain,
Sweden, Switzerland and the United Kingdom.
CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
Central Secretariat: rue de Stassart 35, B - 1050 Brussels
© 2006 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 61788-7:2006 E
Foreword
The text of document 90/193/FDIS, future edition 2 of IEC 61788-7, prepared by IEC TC 90,
Superconductivity, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as
EN 61788-7 on 2006-11-01.
This European Standard supersedes EN 61788-7:2002.
Examples of technical changes made are:
– closed type resonators are recommended from the viewpoint of the stable measurements;
– uniaxial-anisotropic characteristics of sapphire rods are taken into consideration for designing the size
of the sapphire rods;
– recommended measurement frequency of 18 GHz and 22 GHz are added to 12 GHz described in
EN 61788-7:2002.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
(dop) 2007-08-01
national standard or by endorsement
– latest date by which the national standards conflicting
(dow) 2009-11-01
with the EN have to be withdrawn
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 61788-7:2006 was approved by CENELEC as a European
Standard without any modification.
__________
- 3 - EN 61788-7:2006
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.
NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.
Publication Year Title EN/HD Year
1)
IEC 60050-815 - International Electrotechnical Vocabulary - -
(IEV)
Part 815: Superconductivity
1)
Undated reference.
INTERNATIONAL IEC
STANDARD 61788-7
Second edition
2006-10
Superconductivity –
Part 7:
Electronic characteristic measurements –
Surface resistance of superconductors at
microwave frequencies
© IEC 2006 ⎯ Copyright - all rights reserved
No part of this publication may be reproduced or utilized in any form or by any means, electronic or
mechanical, including photocopying and microfilm, without permission in writing from the publisher.
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For price, see current catalogue
– 2 – 61788-7 © IEC:2006(E)
CONTENTS
FOREWORD.4
INTRODUCTION.6
1 Scope.7
2 Normative references .7
3 Terms and definitions .7
4 Requirements .7
5 Apparatus.8
5.1 Measurement system .8
5.2 Measurement apparatus for R .9
s
5.3 Dielectric rods .11
6 Measurement procedure.12
6.1 Specimen preparation .12
6.2 Set-up .12
6.3 Measurement of reference level .12
6.4 Measurement of the frequency response of resonators.13
6.5 Determination of surface resistance of the superconductor and ε’ and tan δ
of the standard sapphire rods .15
7 Precision and accuracy of the test method.16
7.1 Surface resistance .16
7.2 Temperature.17
7.3 Specimen and holder support structure .17
7.4 Specimen protection.18
8 Test report.18
8.1 Identification of test specimen .18
8.2 Report of R values .18
s
8.3 Report of test conditions.18
Annex A (informative) Additional information relating to Clauses 1 to 8.19
Bibliography.32
Figure 1 – Schematic diagram of measurement system for temperature dependence of
R using a cryocooler .8
s
Figure 2 – Typical measurement apparatus for R .10
s
Figure 3 – Insertion attenuation IA, resonant frequency f and half power bandwidth Δf,
measured at T Kelvin .13
Figure 4 – Reflection scattering parameters (S and S ) .15
11 22
Figure 5 – Term definitions in Table 4.17
Figure A.1 – Schematic configuration of several measurement methods for the surface
resistance .20
Figure A.2 – Configuration of a cylindrical dielectric rod resonator short-circuited at
both ends by two parallel superconductor films deposited on dielectric substrates .22
Figure A.3 – Computed results of the u-v and W-v relations for TE mode.23
01p
Figure A.4 – Configuration of standard dielectric rods for measurement of R and tan δ .24
s
61788-7 © IEC:2006(E) – 3 –
Figure A.5 – Three types of dielectric resonators .24
Figure A.6 – Mode chart to design TE resonator short-circuited at both ends by
parallel superconductor films [11] .27
Figure A.7 – Mode chart to design TE resonator short-circuited at both ends by
parallel superconductor films [11] .28
Figure A.8 – Mode chart for TE closed-type resonator.29
Figure A.9 – Mode chart for TE closed-type resonator.30
Table 1 – Typical dimensions of pairs of standard sapphire rods for 12 GHz, 18 GHz
and 22 GHz .11
Table 2 – Dimensions of superconductor film for 12 GHz, 18 GHz, and 22 GHz .12
Table 3 – Specifications on vector network analyzer .16
Table 4 – Specifications on sapphire rods.16
– 4 – 61788-7 © IEC:2006(E)
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
SUPERCONDUCTIVITY –
Part 7: Electronic characteristic measurements –
Surface resistance of superconductors
at microwave frequencies
FOREWORD
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