Superconductivity - Part 17: Electronic characteristic measurements - Local critical current density and its distribution in large-area superconducting films

IEC 61788-17:2013 describes the measurements of the local critical current density (Jc) and its distribution in large-area high-temperature superconducting (HTS) films by an inductive method using third-harmonic voltages. The most important consideration for precise measurements is to determine Jc at liquid nitrogen temperatures by an electric-field criterion and obtain current-voltage characteristics from its frequency dependence. Although it is possible to measure Jc in applied DC magnetic fields, the scope of this standard is limited to the measurement without DC magnetic fields. This technique intrinsically measures the critical sheet current that is the product of Jc and the film thickness d. The range and measurement resolution for Jcd of HTS films are from 200 A/m to 32 kA/m, with a measurement resolution of 100 A/m.

Supraleitfähigkeit - Teil 17: Messungen der elektronischen Charakteristik - Lokale kritische Stromdichte und deren Verteilung in großflächigen supraleitenden Schichten

Supraconductivité - Partie 17: Mesures de caractéristiques électroniques - Densité de courant critique local et sa distribution dans les films supraconducteurs de grande surface

La CEI 61788-17:2013 décrit les mesures de la densité de courant critique local (Jc) et sa distribution dans les films supraconducteurs à haute température (HTS) de grande surface par une méthode inductive utilisant les tensions de troisième harmonique. La considération la plus importante pour effectuer des mesures précises consiste à déterminer Jc aux températures de l'azote liquide au moyen d'un critère de champ électrique et obtenir des caractéristiques courant-tension d'après sa dépendance vis-à-vis de la fréquence. Bien qu'il soit possible de mesurer Jc dans des champs magnétiques en courant continu appliqués, le domaine d'application de la présente norme est limité à la mesure sans champ magnétique en courant continu. Cette technique mesure de façon intrinsèque le courant de feuille critique, qui est le produit de Jc par l'épaisseur d du film. La plage et la résolution de mesure pour Jcd des films HTS est de 200 A/m à 32 kA/m avec une résolution de mesure de 100 A/m.

Superprevodnost - 17. del: Meritve elektronskih karakteristik - Krajevno kritična tokovna gostota in njena porazdelitev po površinsko obširnih razsežnih superprevodnih plasteh

Ta del IEC 61788 opisuje meritve lokalne kritične tokovne gostote (Jc) in njene porazdelitve na obsežnih visokotemperaturnih superprevodnih (HTS) filmih z induktivno metodo s pomočjo tretje-harmonskih napetosti. Najpomembnejši del pri natančnosti meritev je določiti Jc pri temperaturah tekočega nitrogena s kriterijem električnega polja in pridobiti lastnosti trenutne napetosti iz frekvenčne odvisnosti. Čeprav je mogoče Jc izmeriti v uporabljenih enosmernih magnetnih poljih [20, 21]2, se ta standard nanaša le na meritve brez enosmernih magnetnih polj. Ta tehnika meri kritični tok plasti, ki je rezultat Jc in debeline filma d. Obseg in ločljivost meritve za Jcd filmov HTS sta naslednja:
– Jcd: od 200 A/m do 32 kA/m (glede na rezultate, ne omejitve);
– Ločljivost meritve: 100 A/m (na podlagi rezultatov, ne omejitve).

General Information

Status
Withdrawn
Publication Date
04-Apr-2013
Withdrawal Date
19-Feb-2016
Technical Committee
Drafting Committee
Current Stage
9960 - Withdrawal effective - Withdrawal
Start Date
02-Jun-2024
Completion Date
02-Jun-2024

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Standards Content (Sample)

SLOVENSKI STANDARD
SIST EN 61788-17:2013
01-julij-2013
6XSHUSUHYRGQRVWGHO0HULWYHHOHNWURQVNLKNDUDNWHULVWLN.UDMHYQRNULWLþQD
WRNRYQDJRVWRWDLQQMHQDSRUD]GHOLWHYSRSRYUãLQVNRREãLUQLKUD]VHåQLK
VXSHUSUHYRGQLKSODVWHK
Superconductivity - Part 17: Electronic characteristic measurements - Local critical
current density and its distribution in large-area superconducting films
Supraleitfähigkeit - Teil 17: Messungen der elektronischen Charakteristik - Lokale
kritische Stromdichte und deren Verteilung in großflächigen supraleitenden Schichten
Supraconductivité - Partie 17: Mesures de caractéristiques électroniques - Densité de
courant critique local et sa distribution dans les films supraconducteurs de grande
surface
Ta slovenski standard je istoveten z: EN 61788-17:2013
ICS:
17.220.20 0HUMHQMHHOHNWULþQLKLQ Measurement of electrical
PDJQHWQLKYHOLþLQ and magnetic quantities
29.050 Superprevodnost in prevodni Superconductivity and
materiali conducting materials
SIST EN 61788-17:2013 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST EN 61788-17:2013

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SIST EN 61788-17:2013

EUROPEAN STANDARD
EN 61788-17

NORME EUROPÉENNE
April 2013
EUROPÄISCHE NORM

ICS 17.220.20; 29.050


English version


Superconductivity -
Part 17: Electronic characteristic measurements -
Local critical current density and its distribution in large-area
superconducting films
(IEC 61788-17:2013)


Supraconductivité -  Supraleitfähigkeit -
Partie 17: Mesures de caractéristiques Teil 17: Messungen der elektronischen
électroniques - Charakteristik -
Densité de courant critique local et sa Lokale kritische Stromdichte und deren
distribution dans les films Verteilung in großflächigen supraleitenden
supraconducteurs de grande surface Schichten
(CEI 61788-17:2013) (IEC 61788-17:2013)





This European Standard was approved by CENELEC on 2013-02-20. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
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© 2013 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 61788-17:2013 E

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SIST EN 61788-17:2013
EN 61788-17:2013 - 2 -

Foreword
The text of document 90/310/FDIS, future edition 1 of IEC 61788-17, prepared by IEC TC 90,
"Superconductivity" was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as
EN 61788-17:2013.

The following dates are fixed:
• latest date by which the document has (dop) 2013-11-20
to be implemented at national level by
publication of an identical national
standard or by endorsement
(dow) 2016-02-20
• latest date by which the national
standards conflicting with the

document have to be withdrawn

Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such patent
rights.
Endorsement notice
The text of the International Standard IEC 61788-17:2013 was approved by CENELEC as a European
Standard without any modification.

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SIST EN 61788-17:2013
- 3 - EN 61788-17:2013
Annex ZA
(normative)

Normative references to international publications
with their corresponding European publications

The following documents, in whole or in part, are normatively referenced in this document and are
indispensable for its application. For dated references, only the
...

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