EN 60512-25-7:2005

Connectors for electronic equipment - Tests and measurements - Part 25-7: Test 25g - Impedance, reflection coefficient and voltage standing wave ratio (VSWR)

Describes test methods to measure impedance, reflection coefficient, and voltage standing wave ratio in the time and frequency domains. Applies to interconnect assemblies, such as electrical connectors and cable assemblies, within the scope of IEC technical committee 48.

Steckverbinder für elektronische Einrichtungen - Mess- und Prüfverfahren - Teil 25-7: Prüfung 25g - Impedanz, Reflexionskoeffizient und Spannungsstehwellenverhältnis

Connecteurs pour équipements électroniques - Essais et mesures - Partie 25-7: Essai 25g - Impédance, coefficient de réflexion et rapport d'ondes stationnaires en tension (VSWR)

Décrit les méthodes d'essai pour mesurer l'impédance, le coefficient de réflexion, et le rapport d'ondes stationnaires en tension dans les domaines temporel et fréquentiel. S'applique aux ensembles d'interconnexion, tels que les connecteurs électriques, et aux câbles équipés, dans le domaine d'application du comité d'études 48 de la CEI.

Konektorji za elektronsko opremo – Preskusi in meritve – 25-7. del: Preskus 25g – Impedanca, odbojni koeficient in razmerje napetostnega stojnega vala (IEC 60512-25-7:2004)

General Information

• Status: Published
• Publication Date: 21-Mar-2005
• Withdrawal Date: 29-Feb-2008
• ICS: 31.220.10 - Plug-and-socket devices. Connectors
• Technical Committee: CLC/SR 48B - Connectors
• Drafting Committee: IEC/SC 48B - IEC_SC_48B
• Parallel Committee: IEC/SC 48B - IEC_SC_48B
• Current Stage: 6060 - Document made available - Publishing
• Start Date: 22-Mar-2005
• Completion Date: 22-Mar-2005
• Ref Project: SIST EN 60512-25-7:2005 - Connectors for electronic equipment - Tests and measurements -- Part 25-7: Test 25g - Impedance, reflection coefficient and voltage standing wave ratio (VSWR)

Standards Content (Sample)

SLOVENSKI SIST EN 60512-25-7:2005

STANDARD
december 2005
Konektorji za elektronsko opremo – Preskusi in meritve – 25-7. del: Preskus
25g – Impedanca, odbojni koeficient in razmerje napetostnega stojnega vala
(IEC 60512-25-7:2004)
Connectors for electronic equipment – Tests and measurements – Part 25-7: Test
25g – Impedance, reflection coefficient and voltage standing wave ratio (VSWR)
(IEC 60512-25-7:2004)
ICS 31.220.10 Referenčna številka
©  Standard je založil in izdal Slovenski inštitut za standardizacijo. Razmnoževanje ali kopiranje celote ali delov tega dokumenta ni dovoljeno

EUROPEAN STANDARD EN 60512-25-7
NORME EUROPÉENNE
EUROPÄISCHE NORM March 2005
ICS 31.220.10
English version
Connectors for electronic equipment –
Tests and measurements
Part 25-7: Test 25g –
Impedance, reflection coefficient
and voltage standing wave ratio (VSWR)
(IEC 60512-25-7:2004)
Connecteurs pour équipements Steckverbinder für elektronische
électroniques – Einrichtungen -
Essais et mesures Mess- und Prüfverfahren
Partie 25-7: Essai 25g – Teil 25-7: Prüfung 25g –
Impédance, coefficient de réflexion Impedanz, Reflexionskoeffizient und
et rapport d'ondes stationnaires Spannungsstehwellenverhältnis
en tension (VSWR) (IEC 60512-25-7:2004)
(CEI 60512-25-7:2004)
This European Standard was approved by CENELEC on 2005-03-01. CENELEC members are bound to
comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European
Standard the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and
notified to the Central Secretariat has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Cyprus, Czech
Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Slovakia, Slovenia, Spain, Sweden,
Switzerland and United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Central Secretariat: rue de Stassart 35, B - 1050 Brussels

© 2005 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.

Ref. No. EN 60512-25-7:2005 E
Foreword
The text of document 48B/1479/FDIS, future edition 1 of IEC 60512-25-7, prepared by SC 48B,
Connectors, of IEC TC 48, Electromechanical components and mechanical structures for electronic
equipment, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as
EN 60512-25-7 on 2005-03-01.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2005-12-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2008-03-01
__________
Endorsement notice
The text of the International Standard IEC 60512-25-7:2004 approved by CENELEC as a European
Standard without any modification.
__________
NORME CEI
INTERNATIONALE
IEC
60512-25-7
INTERNATIONAL
Première édition
STANDARD
First edition
2004-12
Connecteurs pour équipements électroniques –
Essais et mesures –
Partie 25-7:
Essai 25g – Impédance, coefficient de réflexion,
et rapport d'ondes stationnaires en tension
(VSWR)
Connectors for electronic equipment –
Tests and measurements –
Part 25-7:
Test 25g – Impedance, reflection coefficient,
and voltage standing wave ratio (VSWR)

 IEC 2004 Droits de reproduction réservés  Copyright - all rights reserved
Aucune partie de cette publication ne peut être reproduite ni No part of this publication may be reproduced or utilized in any
utilisée sous quelque forme que ce soit et par aucun procédé, form or by any means, electronic or mechanical, including
électronique ou mécanique, y compris la photocopie et les photocopying and microfilm, without permission in writing from
microfilms, sans l'accord écrit de l'éditeur. the publisher.
International Electrotechnical Commission, 3, rue de Varembé, PO Box 131, CH-1211 Geneva 20, Switzerland
Telephone: [phone] Telefax: [phone] E-mail: [e-mail] Web: www.iec.ch
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International Electrotechnical Commission
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Pour prix, voir catalogue en vigueur
For price, see current catalogue

60512-25-7  IEC:2004 – 3 –
CONTENTS
FOREWORD.5
1 Scope and object .9
2 Terms and definitions .9
3 Test resources.11
3.1 Equipment .13
3.2 Fixture.13
4 Test specimen .17
4.1 Description .17
5 Test procedure .17
5.1 Time domain .17
5.2 Frequency domain .21
6 Details to be specified.23
7 Test documentation .25

Annex A (normative) Measurement system rise time.27
Annex B (informative) Determination of the near end and far end of the specimen .33
Annex C (informative) Calibration standards and test board reference traces .35
Annex D (informative) Interpreting TDR impedance graphs.45
Annex E (informative) Terminations – Electrical.51
Annex F (informative) Practical guidance – variable rise time.57
Annex G (informative) Printed circuit board design considerations for electronics
measurements .59
Annex H (informative) Test signal launch hardware .67

Figure A.1 – Example of rise-time measurement points .27
Figure A.2 – Example of TDR output; 2 curves (different rise times) and start and stop
specimen points .29
Figure A.3 – Example of analyzer output, impedance versus log frequency plot.31
Figure C.1 – Typical mother-board test fixture .37
Figure C.2 – Typical daughter-board test fixture .37
Figure C.3 – Example of near-end reference trace.43
Figure D.1 – Example of an impedance profile of connector using a measurement
system rise time of 35 ps.47
Figure D.2 – Example of impedance profiles of cable at the rise time of 35 ps and 1 ns .49
Figure E.1 – Single-ended terminations .53
Figure E.2 – Differential (balanced) terminations .55
Figure G.1 – Microstrip (a) and stripline (b) geometries .59
Figure G.2 – Buried microstrip geometry.61

Table 1 – Additional measurement system rise time (including fixture and filtering) .19

60512-25-7  IEC:2004 – 5 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
___________
CONNECTORS FOR ELECTRONIC EQUIPMENT –
TESTS AND MEASUREMENTS –
Part 25-7: Test 25g – Impedance, reflection coefficient,
and voltage standing wave ratio (VSWR)

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with an IEC Publication.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60512-25-7 has been prepared by subcommittee 48B: Connectors,
of IEC technical committee 48: Electromechanical components and mechanical structures for
electronic equipment.
The text of this standard is based on the following documents:
FDIS Report on voting
48B/1479/FDIS 48B/1506/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.

60512-25-7  IEC:2004 – 7 –
IEC 60512-25 consists of the following parts, under the general title Connectors for electronic
equipment – Tests and measurements:
Part 25-1: Test 25a – Crosstalk ratio
Part 25-2: Test 25b – Attenuation (insertion loss)
Part 25-3: Test 25c – Rise time degradation
Part 25-4: Test 25d – Propagation delay
Part 25-5: Test 25e – Return loss
Part 25-6: Test 25f – Eye pattern and jitter
Part 25-7: Test 25g – Impedance, reflection coefficient, and voltage standing wave ratio
(VSWR)
The committee has decided that the contents of this publication will remain unchanged until the
maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be
• reconfirmed;
• withdrawn;
• replaced by a revised edition, or
• amended.
60512-25-7  IEC:2004 – 9 –
CONNECTORS FOR ELECTRONIC EQUIPMENT –
TESTS AND MEASUREMENTS –
Part 25-7: Test 25g – Impedance, reflection coefficient,
and voltage standing wave ratio (VSWR)

1 Scope and object
This part of IEC 60512 applies to interconnect assemblies, such as electrical connectors and
cable assembl
...