EN IEC 60512-28-100:2024
(Main)Connectors for electrical and electronic equipment - Tests and measurements - Part 28-100: Signal integrity tests up to 2 000 MHz - Tests 28a to 28g
Connectors for electrical and electronic equipment - Tests and measurements - Part 28-100: Signal integrity tests up to 2 000 MHz - Tests 28a to 28g
IEC 60512-28-100:2024 specifies the test methods for signal integrity and transmission performance for connectors specified in respective parts of IEC 60603-7, IEC61076-1, IEC 61076-2, IEC 61076-3 and IEC 63171 series of standards for connecting hardware applications from 0,1 MHz up to 2 000 MHz, with reference to this document. Note: This document is also suitable for testing signal integrity and transmission performance of connectors up to a lower value of maximum frequency; however, the test methodology specified in the detail specification for any given connector remains the reference conformance test for that connector. The list of connector series of standards does not preclude referencing this document in other connector manufacturer’s specifications or published standards. Test procedures provided herein are: - insertion loss, test 28a; - return loss, test 28b; - near-end crosstalk (NEXT) test 28c; - far-end crosstalk (FEXT), test 28d; - transverse conversion loss (TCL), test 28f; - transverse conversion transfer loss (TCTL), test 28g. Other test procedures referenced herein are: - shield transfer impedance (ZT), see IEC 60512‑26‑100, test 26e. - coupling attenuation (aC), see IEC 62153-4-7 and IEC 62153‑4‑12. - low frequency coupling attenuation (aCLF) see IEC 62153-4-7 and IEC 62153-4-15 This edition includes the following significant technical changes with respect to the previous edition: -The frequency range has been modified to start at 0,1 MHz instead of 1 MHz, to include single-pair connectors. -All tables and requirements have been revised down to 0,1 MHz, and partially improved to reduce the impact of the test fixture. -Formulae to calculate the S-parameters from single-ended parameters have been added. -A note was added for those parameters which are not applicable to single-pair connectors.
Steckverbinder für elektrische und elektronische Einrichtungen - Mess- und Prüfverfahren - Teil 28-100: Signalintegritätsprüfungen bis 2 000 MHz - Prüfungen 28a bis 28g
Connecteurs pour équipements électriques et électroniques - Essais et mesures - Partie 28-100: Essais d’intégrité des signaux jusqu’à 2 000 MHz - Essais 28a à 28g
L'IEC 60512-28-100:2024 spécifie les méthodes d’essai pour l’intégrité du signal et les performances de transmission pour les connecteurs spécifiés dans les parties respectives de l'IEC 60603-7, l'IEC 61076-1, l'IEC 61076-2, l'IEC 61076-3 et de la série de normes IEC 63171 pour connecter les applications matérielles de 0,1 MHz à 2 000 MHz, en référence au présent document. NOTE Le présent document convient également pour soumettre à essai l’intégrité des signaux et les performances de transmission des connecteurs jusqu’à une valeur inférieure de fréquence maximale; toutefois, la méthodologie d’essai spécifiée dans la spécification particulière pour un connecteur donné reste l’essai de conformité de référence pour ce connecteur. La liste de séries de normes concernant les connecteurs n’exclut pas le fait de faire référence au présent document dans d’autres normes publiées ou spécifications des fabricants de connecteurs. Les procédures d’essai spécifiées ici sont les suivantes: - perte d’insertion, essai 28a; - affaiblissement de réflexion, essai 28b; - paradiaphonie (NEXT), essai 28c; - télédiaphonie (FEXT), essai 28d; - perte de conversion transverse (TCL), essai 28f; - perte de transfert de conversion transverse (TCTL), essai 28g. Les autres procédures d’essai citées ici en référence sont: - impédance de transfert, (ZT), voir l’IEC 60512‑26‑100, essai 26e; - affaiblissement de couplage (aC), voir l’IEC 62153-4-7 et l’IEC 62153‑4‑12; - affaiblissement de couplage basse fréquence (aCLF), voir l’IEC 62153-4-7 et l’IEC 62153-4-15.
Konektorji za električno in elektronsko opremo - Preskusi in meritve - 28-100. del: Preskusi signalne celovitosti do 2000 MHz - Preskusi od 28a do 28g
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Standards Content (Sample)
SLOVENSKI STANDARD
oSIST prEN IEC 60512-28-100:2023
01-november-2023
Konektorji za električno in elektronsko opremo - Preskusi in meritve - 28-100. del:
Preskusi signalne celovitosti do 2000 MHz - Preskusi od 28a do 28g
Connectors for electrical and electronic equipment - Tests and measurements - Part 28-
100: Signal integrity tests up to 2 000 MHz - Tests 28a to 28g
Steckverbinder für elektrische und elektronische Einrichtungen - Mess- und
Prüfverfahren - Teil 28-100: Signalintegritätsprüfungen bis 2 000 MHz - Prüfungen 28a
bis 28g
Connecteurs pour équipements électriques et électroniques - Essais et mesures - Partie
28-100: Essais d'intégrité des signaux jusqu'à 2 000 MHz - Essais 28a à 28g
Ta slovenski standard je istoveten z: prEN IEC 60512-28-100:2023
ICS:
31.220.10 Vtiči in vtičnice, konektorji Plug-and-socket devices.
Connectors
oSIST prEN IEC 60512-28-100:2023 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
oSIST prEN IEC 60512-28-100:2023
oSIST prEN IEC 60512-28-100:2023
48B/3060/CDV
COMMITTEE DRAFT FOR VOTE (CDV)
PROJECT NUMBER:
IEC 60512-28-100 ED3
DATE OF CIRCULATION: CLOSING DATE FOR VOTING:
2023-09-15 2023-12-08
SUPERSEDES DOCUMENTS:
48B/3032/CD, 48B/3057/CC
IEC SC 48B : ELECTRICAL CONNECTORS
SECRETARIAT: SECRETARY:
United States of America Mr Jeffrey Toran
OF INTEREST TO THE FOLLOWING COMMITTEES: PROPOSED HORIZONTAL STANDARD:
TC 25,SC 46C,SC 65C,ISO/IEC JTC 1/SC 25
Other TC/SCs are requested to indicate their interest, if
any, in this CDV to the secretary.
FUNCTIONS CONCERNED:
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TITLE:
Connectors for electrical and electronic equipment - Tests and measurements - Part 28-100:
Signal integrity tests up to 2 000 MHz - Tests 28a to 28g
PROPOSED STABILITY DATE: 2026
NOTE FROM TC/SC OFFICERS:
electronic file, to make a copy and to print out the content for the sole purpose of preparing National Committee positions.
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