IEC 60749-28:2017

Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level

IEC 60749-28:2017(E) establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field-induced charged device model (CDM) electrostatic discharge (ESD). All packaged semiconductor devices, thin film circuits, surface acoustic wave (SAW) devices, opto-electronic devices, hybrid integrated circuits (HICs), and multi-chip modules (MCMs) containing any of these devices are to be evaluated according to this document. To perform the tests, the devices are assembled into a package similar to that expected in the final application. This CDM document does not apply to socketed discharge model testers. This document describes the field-induced (FI) method. An alternative, the direct contact (DC) method, is described in Annex I.
The purpose of this document is to establish a test method that will replicate CDM failures and provide reliable, repeatable CDM ESD test results from tester to tester, regardless of device type. Repeatable data will allow accurate classifications and comparisons of CDM ESD sensitivity levels.

Dispositifs à semiconducteurs - Méthodes d’essais mécaniques et climatiques - Partie 28: Essai de sensibilité aux décharges électrostatiques (DES) - Modèle du composant chargé (CDM) au niveau du dispositif

General Information

• Status: Published
• Publication Date: 27-Mar-2017
• ICS: 01 - GENERALITIES. TERMINOLOGY. STANDARDIZATION. DOCUMENTATION
• ICS: 31.080.01 - Semiconductor devices in general
• Technical Committee: TC 47 - Semiconductor devices
• Drafting Committee: WG 2 - TC 47/WG 2
• Current Stage: DELPUB - Deleted Publication
• Start Date: 01-Jul-2020
• Completion Date: 01-Mar-2022

Relations

• Revised: IEC 60749-28:2022 - Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level
• Effective Date: 05-Sep-2023

Standards Content (Sample)

IEC 60749-28
®

Edition 1.0 2017-03
INTERNATIONAL
STANDARD

colour
inside


Semiconductor devices – Mechanical and climatic test methods –
Part 28: Electrostatic discharge (ESD) sensitivity testing – Charged device
model (CDM) – device level

IEC 60749-28:2017-03(en)

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IEC 60749-28

®


Edition 1.0 2017-03




INTERNATIONAL



STANDARD








colour

inside










Semiconductor devices – Mechanical and climatic test methods –

Part 28: Electrostatic discharge (ESD) sensitivity testing – Charged device

model (CDM) – device level


























INTERNATIONAL

ELECTROTECHNICAL


COMMISSION





ICS 31.080.01 ISBN 978-2-8322-4139-4



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® Registered trademark of the International Electrotechnical Commission

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– 2 – IEC 60749-28:2017 © IEC 2017
CONTENTS
FOREWORD . 5
INTRODUCTION . 7
1 Scope . 8
2 Normative references . 8
3 Terms and definitions . 8
4 Required equipment . 9
4.1 CDM ESD tester . 9
4.1.1 General . 9
4.1.2 Current-sensing element .
...