IEC 61788-7:2006
(Main)Superconductivity - Part 7: Electronic characteristic measurements - Surface resistance of superconductors at microwave frequencies
Superconductivity - Part 7: Electronic characteristic measurements - Surface resistance of superconductors at microwave frequencies
IEC 61788-7:2006 describes measurement of the surface resistance of superconductors at microwave frequencies by the standard two-resonator method. The object of measurement is the temperature dependence of Rs at the resonant frequency. The applicable measurement range of surface resistances for this method is as follows:
- Frequency: 8 GHz - Measurement resolution: 0,01 milliohm at 10 GHz.
Supraconductivité - Partie 7 : Mesures des caractéristiques électroniques - Résistance superficielle des supraconducteurs à des hyperfréquences
L'IEC 61788-7:2006 décrit la mesure de la résistance de surface des supraconducteurs à des hyperfréquences au moyen de la méthode normalisée à deux résonateurs. La dépendance à la température de Rs à la fréquence résonante constitue l'objet de la mesure.
L'étendue de mesure applicable des résistances superficielles pour cette méthode est la suivante:
– Fréquence: 8 GHz – Résolution de mesure: 0,01 m à 10 GHz
Les données relatives à la résistance de surface à la fréquence mesurée, et à la fréquence établie à 10 GHz, en posant l'hypothèse de la règle de comparaison f 2, sont consignées dans le rapport d'essai.
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INTERNATIONAL IEC
STANDARD 61788-7
Second edition
2006-10
Superconductivity –
Part 7:
Electronic characteristic measurements –
Surface resistance of superconductors at
microwave frequencies
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INTERNATIONAL IEC
STANDARD 61788-7
Second edition
2006-10
Superconductivity –
Part 7:
Electronic characteristic measurements –
Surface resistance of superconductors at
microwave frequencies
© IEC 2006 ⎯ Copyright - all rights reserved
No part of this publication may be reproduced or utilized in any form or by any means, electronic or
mechanical, including photocopying and microfilm, without permission in writing from the publisher.
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International Electrotechnical Commission
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– 2 – 61788-7 © IEC:2006(E)
CONTENTS
FOREWORD.4
INTRODUCTION.6
1 Scope.7
2 Normative references .7
3 Terms and definitions .7
4 Requirements .7
5 Apparatus.8
5.1 Measurement system .8
5.2 Measurement apparatus for R .9
s
5.3 Dielectric rods .11
6 Measurement procedure.12
6.1 Specimen preparation .12
6.2 Set-up .12
6.3 Measurement of reference level .12
6.4 Measurement of the frequency response of resonators.13
6.5 Determination of surface resistance of the superconductor and ε’ and tan δ
of the standard sapphire rods .15
7 Precision and accuracy of the test method.16
7.1 Surface resistance .16
7.2 Temperature.17
7.3 Specimen and holder support structure .17
7.4 Specimen protection.18
8 Test report.18
8.1 Identification of test specimen .18
8.2 Report of R values .18
s
8.3 Report of test conditions.18
Annex A (informative) Additional information relating to Clauses 1 to 8.19
Bibliography.32
Figure 1 – Schematic diagram of measurement system for temperature dependence of
R using a cryocooler .8
s
Figure 2 – Typical measurement apparatus for R .10
s
Figure 3 – Insertion attenuation IA, resonant frequency f and half power bandwidth Δf,
measured at T Kelvin .13
Figure 4 – Reflection scattering parameters (S and S ) .15
11 22
Figure 5 – Term definitions in Table 4.17
Figure A.1 – Schematic configuration of several measurement methods for the surface
resistance .20
Figure A.2 – Configuration of a cylindrical dielectric rod resonator short-circuited at
both ends by two parallel superconductor films deposited on dielectric substrates .22
Figure A.3 – Computed results of the u-v and W-v relations for TE mode.23
01p
Figure A.4 – Configuration of standard dielectric rods for measurement of R and tan δ .24
s
61788-7 © IEC:2006(E) – 3 –
Figure A.5 – Three types of dielectric resonators .24
Figure A.6 – Mode chart to design TE resonator short-circuited at both ends by
parallel superconductor films [11] .27
Figure A.7 – Mode chart to design TE resonator short-circuited at both ends by
parallel superconductor films [11] .28
Figure A.8 – Mode chart for TE closed-type resonator.29
Figure A.9 – Mode chart for TE closed-type resonator.30
Table 1 – Typical dimensions of pairs of standard sapphire rods for 12 GHz, 18 GHz
and 22 GHz .11
Table 2 – Dimensions of superconductor film for 12 GHz, 18 GHz, and 22 GHz .12
Table 3 – Specifications on vector network analyzer .16
Table 4 – Specifications on sapphire rods.16
– 4 – 61788-7 © IEC:2006(E)
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
SUPERCONDUCTIVITY –
Part 7: Electronic characteristic measurements –
Surface resistance of superconductors
at microwave frequencies
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
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International Standard IEC 61788-7 has been prepared by IEC technical committee 90:
Superconductivity.
This second edition cancels and replaces the first edition, published in 2002, of which it
constitutes a technical revision. Examples of technical changes made are: 1) closed type
resonators are recommended from the viewpoint of the stable measurements, 2) uniaxial-
anisotropic characteristics of sapphire rods are taken into consideration for designing the size
of the sapphire rods, and 3) recommended measurement frequency of 18 GHz and 22 GHz
are added to 12 GHz described in the first edition.
The text of this standard is based on the following documents:
FDIS Report on voting
90/193/FDIS 90/198/RVD
61788-7 © IEC:2006(E) – 5 –
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
IEC 61788 consists of the following parts, under the general title Superconductivity:
Part 1: Critical current measurement – DC critical current of Cu/Nb-Ti composite super-
conductors
Part 2: Critical current measurement – DC critical current of Nb Sn composite super-
conductors
Part 3: Critical current measurement – DC critical current of Ag- and/or Ag alloy-sheathed
Bi-2212 and Bi-2223 oxide superconductors
Part 4: Residual resistance ratio measurement – Residual resistance ratio of Nb-Ti
composite superconductors
Part 5: Matrix to superconductor volume ratio measurement – Copper to superconductor
volume ratio of Cu/Nb-Ti composite superconductors
Part 6: Mechanical properties measurement – Room temperature tensile test of Cu/Nb-Ti
composite superconductors
Part 7: Electronic characteristic measurements – Surface resistance of superconductors at
microwave frequencies
Part 8: AC loss measurements – Total AC loss measurement of
...
IEC 61788-7 ®
Edition 2.0 2006-10
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Superconductivity –
Part 7: Electronic characteristic measurements – Surface resistance of
superconductors at microwave frequencies
Supraconductivité –
Partie 7: Mesures des caractéristiques électroniques – Résistance de surface
des supraconducteurs à des hyperfréquences
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IEC 61788-7 ®
Edition 2.0 2006-10
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Superconductivity –
Part 7: Electronic characteristic measurements – Surface resistance of
superconductors at microwave frequencies
Supraconductivité –
Partie 7: Mesures des caractéristiques électroniques – Résistance de surface
des supraconducteurs à des hyperfréquences
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 17.220.20; 29.050 ISBN 978-2-8322-8658-6
– 2 – IEC 61788-7:2006 IEC 2006
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 7
2 Normative references . 7
3 Terms and definitions . 7
4 Requirements . 7
5 Apparatus . 8
5.1 Measurement system . 8
5.2 Measurement apparatus for R . 9
s
5.3 Dielectric rods . 11
6 Measurement procedure . 12
6.1 Specimen preparation . 12
6.2 Set-up . 12
6.3 Measurement of reference level . 12
6.4 Measurement of the frequency response of resonators . 13
6.5 Determination of surface resistance of the superconductor and ε’ and tan δ
of the standard sapphire rods . 15
7 Precision and accuracy of the test method. 16
7.1 Surface resistance . 16
7.2 Temperature . 17
7.3 Specimen and holder support structure . 17
7.4 Specimen protection . 18
8 Test report. 18
8.1 Identification of test specimen . 18
8.2 Report of R values . 18
s
8.3 Report of test conditions . 18
Annex A (informative) Additional information relating to Clauses 1 to 8 . 19
Bibliography . 32
Figure 1 – Schematic diagram of measurement system for temperature dependence of
R using a cryocooler . 8
s
Figure 2 – Typical measurement apparatus for R . 10
s
Figure 3 – Insertion attenuation IA, resonant frequency f and half power bandwidth ∆f,
measured at T Kelvin . 13
Figure 4 – Reflection scattering parameters (S and S ) . 15
11 22
Figure 5 – Term definitions in Table 4 . 17
Figure A.1 – Schematic configuration of several measurement methods for the surface
resistance . 20
Figure A.2 – Configuration of a cylindrical dielectric rod resonator short-circuited at
both ends by two parallel superconductor films deposited on dielectric substrates . 22
Figure A.3 – Computed results of the u-v and W-v relations for TE mode . 23
01p
Figure A.4 – Configuration of standard dielectric rods for measurement of R and tan δ . 24
s
Figure A.5 – Three types of dielectric resonators . 24
Figure A.6 – Mode chart to design TE resonator short-circuited at both ends by
parallel superconductor films [11] . 27
Figure A.7 – Mode chart to design TE resonator short-circuited at both ends by
parallel superconductor films [11] . 28
Figure A.8 – Mode chart for TE closed-type resonator . 29
Figure A.9 – Mode chart for TE closed-type resonator . 30
Table 1 – Typical dimensions of pairs of standard sapphire rods for 12 GHz, 18 GHz
and 22 GHz . 11
Table 2 – Dimensions of superconductor film for 12 GHz, 18 GHz, and 22 GHz . 12
Table 3 – Specifications on vector network analyzer . 16
Table 4 – Specifications on sapphire rods . 16
– 4 – IEC 61788-7:2006 IEC 2006
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
SUPERCONDUCTIVITY –
Part 7: Electronic characteristic measurements –
Surface resistance of superconductors
at microwave frequencies
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be
...
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