IEC TS 62607-6-19:2021

Nanomanufacturing - Key control characteristics - Part 6-19: Graphene-based material - Elemental composition: CS analyser, ONH analyser

IEC TS 62607-6-19:2021(E) establishes a standardized method to determine the chemical key control characteristic
• elemental composition
for powder consisting of graphene-based material by
• CS analyser and ONH analyser.
The method as described in this document determines the content of carbon (C), sulfur (S), oxygen (O), nitrogen (N) and hydrogen (H).
The carbon (C) and sulfur (S) content in graphene powder is derived by the content of converted CO, CO2 and SO2, which is determined by infrared gas detector (IGD) using a non-dispersive infrared adsorption method in CS analyser.
The content of oxygen (O), nitrogen (N) and hydrogen (H) in graphene powder is derived by ONH analyser using pyrolysis method. The O content is obtained according to the content of converted CO and CO2, which is determined by IGD using a non-dispersive infrared adsorption method. The N content is obtained according to the content of converted N2, which is determined by a thermal conductivity detector (TCD) method. The H content is obtained by measuring converted H2 or H2O, corresponding to TCD or IGD method.
• The method is applicable for graphene, graphene oxide (GO) and reduced graphene oxide (rGO) in powder form.

General Information

• Status: Published
• Publication Date: 13-Oct-2021
• ICS: 07.120 - Nanotechnologies
• Technical Committee: TC 113 - Nanotechnology for electrotechnical products and systems
• Drafting Committee: WG 8 - TC 113/WG 8
• Current Stage: PPUB - Publication issued
• Start Date: 01-Nov-2021
• Completion Date: 14-Oct-2021

Standards Content (Sample)

IEC TS 62607-6-19 ®
Edition 1.0 2021-10
TECHNICAL
SPECIFICATION
colour
inside
Nanomanufacturing – Key control characteristics –
Part 6-19: Graphene-based material – Elemental composition: CS analyser,
ONH analyser
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IEC TS 62607-6-19 ®
Edition 1.0 2021-10
TECHNICAL
SPECIFICATION
colour
inside
Nanomanufacturing – Key control characteristics –

Part 6-19: Graphene-based material – Elemental composition: CS analyser,

ONH analyser
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 07.120 ISBN 978-2-8322-1033-0

– 2 – IEC TS 62607-6-19:2021 © IEC 2021
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 7
2 Normative references . 7
3 Terms and definitions . 7
3.1 General terms . 7
3.2 Key control characteristics measured according to this document . 9
3.3 Terms related to the measurement method . 10
4 General . 10
4.1 Measurement principle . 10
4.2 Sample preparation method . 11
4.3 Description of measurement equipment / apparatus . 11
4.4 Supporting materials . 11
4.5 Ambient conditions during measurement . 12
5 Measurement procedure . 12
5.1 Calibration of measurement equipment . 12
5.2 Detailed protocol of the measurement procedure . 12
5.3 Measurement accuracy . 13
6 Data analysis / interpretation of results . 13
7 Results to be reported . 13
7.1 General . 13
7.2 Product / sample identification . 13
7.3 Test conditions . 13
7.4 Measurement specific information . 13
7.5 Test results . 13
Annex A (informative) Test report . 14
A.1 Recommended format of the test report . 14
Annex B (informative) Case study: Comparative results between CS/ONH analyser
and EA . 16
B.1 Measurement sample . 16
B.2 Measurement equipment . 16
B.3 Measurement results . 16
B.3.1 General . 16
B.3.2 Measuring samples with low C content (mass fraction (%)): . 16
B.3.3 Measuring samples with high C content (mass fraction (%)): . 17
B.3.4 Measuring samples with low S content (mass fraction (%)): . 17
B.3.5 Measuring samples with high S content (mass fraction (%)): . 18
B.3.6 Measuring samples with low O content (mass fraction (%)): . 18
B.3.7 Measuring samples with high O content (mass fraction (%)): . 19
B.3.8 Measuring samples with low N content (mass fraction (%)): . 20
B.3.9 Measuring samples with high N content (mass fraction (%)): . 20
Bibliography . 23

Figure B.1 – Measurement results of samples with low C content . 16
Figure B.2 – Measurement results of samples with high C content . 17

Figure B.3 – Measurement results of samples with low S content. 18
Figure B.4 – Measurement results of samples with high S content . 18
Figure B.5 – Measurement results of samples with low O content . 19
Figure B.6 – Measurement results of samples with high O content . 20
Figure B.7 – Measurement results of samples with low N content . 20
Figure B.8 – Measurement results of samples with high N content . 21
Figure B.9 – A summary of SD of all measurements . 22

Table A.1 – Product identification . 14
Table A.2 – General material description . 14
Table A.3 – Information relating to test . 15
Table A.4 – Measurement results . 15
Table B.1 – Measurement results of samples with low C content. 16
Table B.2 – Measurement results of samples with high C content . 17
Table B.3 – Measurement results of samples with low S content . 17
Table B.4 – Measurement results of samples with high S content . 18
Table B.5 – Measurement results of samples with low O content . 19
Table B.6 – Measurement results of samples with high O content . 19
Table B.7 – Measurement results of samples with low N content. 20
Table B.8 – Measurement results of samples with high N content . 21

– 4 – IEC TS 62607-6-19:2021 © IEC 2021
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
NANOMANUFACTURING – KEY CONTROL CHARACTERISTICS –

Part 6-19: Graphene-based material –
Elemental composition: CS analyser, ONH analyser

FOREWORD
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IEC 62607-6-19 has been prepared by IEC technical committee 113: Nanotechnology for
electrotechnical products and systems. It is a Technical Specification.
The text of this Technical Specification is based on the following documents:
Draft Report on voting
113/557/DTS 113/599/RVDTS
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
The language used for the development of this Technical Specification is English.
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, avai
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