This document defines terms related to the characterization of nano-objects in the field of nanotechnologies.
It is intended to facilitate communication between organizations and individuals in research, industry and other interested parties and those who interact with them.

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IEC TR 63258:2021 is a Technical Report focused on the practical protocol of ellipsometry to evaluate the thickness of nanoscale films. This document does not include any specification of the ellipsometers, but suggests how to minimize the data variation to improve data reproducibility.

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This document specifies the sequence of methods for characterizing the structural properties of graphene, bilayer graphene and graphene nanoplatelets from powders and liquid dispersions using a range of measurement techniques typically after the isolation of individual flakes on a substrate. The properties covered are the number of layers/thickness, the lateral flake size, the level of disorder, layer alignment and the specific surface area. Suggested measurement protocols, sample preparation routines and data analysis for the characterization of graphene from powders and dispersions are given.

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IEC TS 62607-8-2:2021 There are two types of thermally stimulated current (TSC) measurement methods, classified by the origin of the current. One is generated by the detrapping of charges. The other one is generated by depolarization. The latter is frequently called thermally stimulated depolarization current (TSDC). This part of IEC 62607 focuses on the latter method, and specifies the measurement procedures to be developed for determining polarization properties of metal-oxide interfacial devices.
IEC TS 62607-8-2:2021 includes:
- outlines of the experimental procedures used to measure TSDC,
- methods of interpretation of results and discussion of data analysis, and
- case studies.

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This document defines terms related to carbon nano-objects in the field of nanotechnologies.
It is intended to facilitate communication between organizations' and individuals' research, industry and other interested parties and those who interact with them. Additional terms and definitions for graphene and two-dimensional materials (2D) materials are provided in ISO/TS 80004-13.
Related carbon nanoscale materials are given in Annex A.

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This document defines terms related to nanomanufacturing processes in the field of nanotechnologies.
All the process terms in this document are relevant to nanomanufacturing, however, many of the listed processes are not exclusively relevant to the nanoscale. Terms that are not exclusive are noted within the definitions. Depending on controllable conditions, such processes can result in material features at the nanoscale or, alternatively, at larger scales.
There are many other terms that name tools, components, materials, systems control methods or metrology methods associated with nanomanufacturing that are beyond the scope of this document.
Terms and definitions from other parts of the ISO/TS 80004 series are reproduced in Clause 3 for context and better understanding.

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IEC TS 62607:2020 establishes a standardized method to determine the structural key control characteristic
– domain size
for films consisting of graphene grown by chemical vapour deposition (CVD) on copper by
– substrate oxidation.
It provides a fast, facile and reliable method to evaluate graphene domains formed on copper foil or copper film for understanding the effect of the graphene domain size on properties of graphene and enhancing the performance of high speed, flexible, and transparent devices using CVD graphene.
– The domain size determined in accordance with this document will be listed as a key control characteristic in the blank detail specification for graphene IEC 62565-3-1. Domain density is an equivalent measure.
– The domain size as derived by this method is defined as the mean value of size of the domains in the observed area specified by supplier in terms of cm2 or µm2.
– The method is applicable for graphene grown on copper by CVD. The characterization is done on the copper foil before transfer to the final substrate.
– As the method is destructive, the samples cannot be re-launched into the fabrication process.

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IEC TS 62607-6-14:2020 establishes a standardized method to determine the structural key control characteristic
• defect level
for powders consisting of graphene-based material by
• Raman spectroscopy.
The defect level is derived by the intensity ratio of the D+D′ band and 2D band in Raman spectrum, ID+D′/I2D.
• The defect level determined in accordance with this document will be listed as a key control characteristic in the blank detail specification for graphene IEC 62565-3-1 for graphene powder.
• The method is applicable for graphene powder or graphene-based material, e.g. reduced graphene oxide (rGO), bilayer graphene, trilayer graphene and few-layer graphene.
• Typical application areas are quality control and classification for graphene manufacturers, and product selection for downstream users.
• The method described in this document is appropriate if the physical form of graphene is powder.

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IEC 62607:2020, a Technical Specification, provides a method for determining the fluorescence lifetime of semiconductor quantum dots (QDs) using the time correlated single photon counting (TCSPC) technique. TCSPC is suitable for testing fluorescence lifetime in the range from picoseconds to nanoseconds. This document is only applicable to liquid samples that are stable dispersions of QDs. It is not applicable to solid samples.
This document includes:
– outlines of the experimental procedures,
– data processing, and
– case study.

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IEC TS 62607-6-13:2020 establishes a standardized method to determine the chemical key control characteristic
• oxygen functional group content
on graphite oxide, graphene oxide, reduced graphene oxide and other types of functionalized graphene by
• Boehm titration method.
In this document, the measured functional groups are carboxyl groups (also in the form of their cyclic anhydrides), lactone groups, hydroxyl groups and reactive carbonyl groups. Oxygen functional groups that exhibit no reactivity such as epoxides cannot be measured
The contents of the corrigendum 1 of October 2020 have been included in this copy.

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IEC TS 62607-6-1:2020 establishes a standardized method to determine the electrical key control characteristic
– volume resistivity
for powder consisting of graphene-based material like flakes of graphene, few layer graphene and/or reduced graphene oxide after preparation of a sample in pellet form by
– four probe method
using powder resistivity measurement system.
The volume resistivity is a measure of the quality of powder-type graphene products in terms of electrical property and reflects the density-dependency shown in a pellet of powder-type graphene.
The volume conductivity can directly be derived from the volume resistivity.
Typical application areas are industries that use powder-type graphene products for graphene manufacture, potential developers, and users who produce graphene-based products. As the volume resistivity measured according to this document requires the preparation of a sample in the form of a pellet, this document describes in detail
– an apparatus to prepare consistently a test sample, the pellet,
– the preparation of the pellet starting from powder-type graphene,
– the measurement procedure to measure the volume resistivity (or volume conductivity) of the pellet, and
– the data analysis, the interpretation and reporting of the results.

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IEC TS 62607-5-3:2020 specifies sample structures for evaluating a wide range of charge carrier concentration in organic/nano materials. This specification is provided for both capacitance-voltage (C-V) measurements in metal/insulator/semiconductor stacking structures and Hall-effect measurements with the van der Pauw configuration. Criteria for choosing measurement methods of charge carrier concentration in organic semiconductor layers are also given in this document.

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IEC TS 62607-8-1:2020 There are two types of thermally stimulated current (TSC) measurement methods, classified by the origin of the current. One is generated by the detrapping of charges. The other one is generated by depolarization. IEC TS 62607-8-1:2020 focuses on the former method, and specifies the measurement method to be developed for determining defect states of nano-enabled metal-oxide interfacial devices.
IEC TS 62607-8-1:2020 includes:
– outlines of the experimental procedures used to measure TSC,
– methods of interpretation of results and discussion of data analysis, and
– case studies.

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IEC TS 62607-2-4:2020 specifies the test method for determining the resistivity and the contact resistance of an individual CNT and the dependability of the measurement.
This document includes:
– outlines of the experimental procedures used to measure resistance of carbon nanotubes,
– methods of interpretation of results and discussion of data analysis, and
– case studies.

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IEC TS 62607-4-8:2020 specifies a test method for the determination of water content in electrode nanomaterials for nano-enabled electrical energy storage devices, using the Karl Fischer coulometric titration method.
This document includes:
- recommendations for sample preparation,
- outlines of the experimental procedures used to measure electrode nanomaterial properties, and
- methods of interpretation of results and discussion of data analysis.
IEC TS 62607-4-8:2020 is not applicable for samples that can react with the main components of Karl Fischer reagent and produce water, or samples that can react with iodine or iodide ion.

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IEC TS 62565-4-1:2019 establishes a blank detail specification and format for listing essential optical and certain other characteristics of monodisperse luminescent nanomaterials. This document does not address mixtures or agglomerations of luminescent nanomaterials.
In addition, this document enables the customer to specify requirements in a standardized manner and to verify through standardized methods that the luminescent nanomaterial meets the required properties.
Numeric values to be specified for the properties and characteristics in this document are intentionally left blank and are determined by agreement between customer and material supplier. Properties and characteristics deemed by the customer or supplier as not relevant to a specific application are classified as “not applicable” or “not specified”.

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ISO TR 19733:2019 This document provides a matrix which links key properties of graphene and related two-dimensional (2D) materials to commercially available measurement techniques. The matrix includes measurement techniques to characterize chemical, physical, electrical, optical, thermal and mechanical properties of graphene and related 2D materials.

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IEC TS 62876-2-1:2018 establishes a general stability testing programme to verify the stability of the performance of nanomaterials and nano-enabled photovoltaic devices (NePV) devices. These devices are used as subassemblies for the fabrication of photovoltaic modules through a combination with other components. This testing programme defines standardized degradation conditions, methodologies and data assessment for technologies. The results of these tests define a stability under standardized degradation conditions for quantitative evaluation of the stability of a new technology. The procedures outlined in this document were designed for NePV, but can be extended to serve as a guideline for other photovoltaic technologies as well.

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IEC TS 62607-4-7:2018 provides a method for the determination of magnetic impurities in anode nanomaterials for energy storage devices using an Inductively Coupled Plasma Optical Emission Spectrometer (ICP-OES), including test overview, reagents, apparatus, test procedures, test results and test report.
IEC TS 62607-4-7:2018 applies to the determination of the total content of magnetic impurities (iron, cobalt, chromium, and nickel) ≥ 0,02 mg/kg which can be attracted by magnet.

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IEC TS 62565-4-2:2018 specifies the essential general and optical requirements of monodisperse luminescent nanomaterials used in general lighting and display products to enable their reliable mass production and quality control during the manufacturing process. This document does not address mixtures or agglomerations of luminescent nanomaterials.
In addition, this document enables the customer to specify requirements in a standardized manner and to verify through standardized methods that the luminescent nanomaterial meets the required properties.

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IEC TS 62607-4-6:2018(E) provides a method for determination of carbon content of nano electrode materials by infrared absorption spectroscopy method. The method is applicable to carbon contents of mass fraction between 0,001 % and 100 %.
This method will enable customers to:
a) decide whether or not a nano electrode material is usable, and
b) select a nano electrode material with suitable carbon content for its application.
This document includes:
- recommendations for sample preparation,
- outlines of the experimental procedures used to measure electrode nanomaterial properties,
- methods of interpretation of results and discussion of data analysis, and
- case studies.

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ISO/TS 80004-13:2017 lists terms and definitions for graphene and related two-dimensional (2D) materials, and includes related terms naming production methods, properties and their characterization.
It is intended to facilitate communication between organizations and individuals in research, industry and other interested parties and those who interact with them.

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ISO/TS 80004-11:2017 lists terms and definitions, and specifies an extensible taxonomic terminology framework for nanolayers, nanocoatings, nanofilms, and related terms in the field of nanotechnologies.

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IEC TS 62607-4-5:2017(E) provides a standardized method for the determination of electrochemical properties of cathode nanomaterials such as lithium iron phosphate (LFP) for electrical energy storage devices. This method will enable the industry to:  
decide whether or not a cathode nanomaterial is usable, and
select a cathode nanomaterial suitable for their application.  This document includes:
recommendations for sample preparation,
outlines of the experimental procedures used to measure cathode nanomaterial properties,
methods of interpretation of results and discussion of data analysis, and
case studies.  NOTE The very purpose of this method is to arrive at a detailed characterization of the electrodes so that individual contribution of the anode and cathode for performance and degradation could be predicted. The method can be applied for characterization of the electrode working as cathode or/and as anode.

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IEC TS 62607-3-2:2017(E) specifies a method for determining the mass of a sample of QD dispersion after the removal of impurities and surfactant ligands through heating at high temperatures.

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IEC TS 80004-9: 2017(E) specifies terms and definitions for electrotechnical products and systems reliant on nanomaterials for their essential functionalities. It is intended to facilitate communications between organizations and individuals in industry and those who interact with them.

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IEC TS 62844:2016(E) provides a recommended methodology for identifying relevant parameters of nanomaterials as well as providing generic guidelines on implementation of quality assessment and environment/health/safety assessment for nano-enabled/nano-enhanced electrotechnical products.

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IEC TS 62607-4-4:2016(E), which is a Technical Specification, provides a measurement method for thermal runaway quality level test for nano-enabled energy storage devices. This method uses comparative measurement to enable a manufacturer to decide whether or not the nanomaterial additives used in energy storage devices are resilient against the thermal runaway caused by a faulty or accidental low resistance connection between two or several internal points depending on the number of stacking electrode layers of the test sample. The nanomaterial additives may mix with the materials of positive and negative electrodes, electrolyte, coated on electrodes or separator. This document includes definitions of terminology, test sample, puncture nail requirements, test procedures, data analysis and methods of interpretation of results and a case study. This document does not apply directly to the safety testing for energy storage device products due to complex safety design schemes embedded in these products.

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IEC TS 62607-4-2:2016(E), which is a Technical Specification, provides a standardized method for the determination of the density of cathode nanomaterials in powder form used for electrical energy storage devices. This method provides users with a key control characteristic to decide whether or not a cathode nanomaterial is usable, or suitable for their application. This document includes definitions of terminology used in this document, recommendations for sample preparation, outlines of the experimental procedures used to measure cathode nanomaterial properties, methods of interpretation of results and discussion of data analysis, case studies, and references.

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ISO/TS 80004-12:2016 lists terms and definitions relevant to quantum phenomena in nanotechnologies.
All of these terms are important for nanotechnologies, but it is to be noted that many of them are not exclusively relevant to the nanoscale and can also be used to some extent to refer to larger scales.
The list of terms presented does not claim to provide exhaustive coverage of the whole spectrum of quantum concepts and phenomena in nanotechnology. It covers important phenomena as acknowledged by many stakeholders from academia, industry, etc.
ISO/TS 80004-12:2016 is intended to facilitate communication between organizations and individuals in industry and those who interact with them.

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ISO TS 80004-1:2015 lists terms and definitions related to core terms in the field of nanotechnologies. It is intended to facilitate communications between organizations and individuals in industry and those who interact with them.

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IEC/IEEE 62659:2015(E) provides a framework for introducing nanoelectronics into large scale, high volume production in semiconductor manufacturing facilities through the incorporation of nanomaterials (e.g. carbon nanotubes, graphene, quantum dots, etc.). Since semiconductor manufacturing facilities need to incorporate practices that maintain high yields, there are very strict requirements for how manufacturing is performed. Nanomaterials represent a potential contaminant in semiconductor manufacturing facilities and need to be introduced in a structured and methodical way.

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IEC TS 62607-4-3:2015(E) provides a standardized test method for the measurement of contact and coating resistivity of nano-enabled electrode materials. This method will enable a customer to decide whether or not a coating composite material is usable, and select best combinations of coating composite material with fabrication technologies suitable for their application.

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IEC TS 62607-4-1:2015(E) provides a standardized method for the determination of electrochemical properties of cathode nanomaterials of, for example, lithium-ion batteries utilizing lithium iron phosphate to enable customers to decide whether or not a cathode nanomaterial is usable, and select a cathode nanomaterial suitable for their application. This second edition cancels and replaces the first edition published in 2014. This edition constitutes a technical revision.

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ISO/TS 80004-2:2015 lists terms and definitions related to particles in the field of nanotechnologies.

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IEC TS 62607-5-1:2014(E) provides a standardized sample structure for characterizing charge transport properties in thin-film organic/nano electronic devices and a format to report details of the structure which shall be provided with the measurement results. The standardized OTFT testing structure with a contact-area-limited doping can mitigate contact resistance and enable reliable measurement of the charge carrier mobility. The purpose of this Technical Specification is to provide test sample structures for determining the intrinsic charge transport properties of organic thin-film devices. The intention is to provide reliable materials information for OTFTs and to set guidelines for making test sample structures so that materials information is clear and consistent throughout the research community and industry.

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IEC 62607-3-1:2014 describes the procedures to be followed and precautions to be observed when performing reproducible measurements of the quantum efficiency of luminescent nanomaterials. Luminescent nanomaterials covered by this method include nano-objects such as quantum dots, nanophosphors, nanoparticles, nanofibers, nanocrystals, nanoplates, and structures containing these materials. The nanomaterials may be dispersed in either a liquid state (e.g., colloidal dispersion of quantum dots) or solid-state (e.g., nanofibers containing luminescent nanoparticles). This standard covers both relative measurements of liquid state luminescent nanomaterials and absolute measurements of both solid and liquid state nanomaterials. Key words: nanotechnology, nano, naloleds

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ISO TS 80004-8:2013 gives terms and definitions related to nanomanufacturing processes in the field of nanotechnologies. It forms one part of multi-part terminology and definitions documentation covering the different aspects of nanotechnologies.

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ISO/TS 80004-6:2013 lists terms and definitions relevant to the characterization of nano-objects.

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IEC/TR 62632:2013(E), which is a technical report, describes a variety of nanoscale contacts and nano-interconnects used in research and development and in present-day products. The intent of this technical report is to identify nanoscale contacts and nano-interconnects that will be common in products, to describe the state-of-the-art and to describe some key features and issues related to these contacts. In particular, the following aspects are discussed for each of the nanoscale contacts or nano-interconnects listed:
- type and configuration of the nanoscale contacts and interconnects formed;
- requirements of the nanoscale contacts and interconnects in products;
- fabrication technologies, processes, and process controls used to make the nanoscale contacts and interconnects;
- characterization techniques used to quantify nanoscale contacts and nano-interconnects;
- functionality and performance of nanoscale contacts and interconnects;
- reliability of the nanoscale contacts and interconnects in products;
- and expectations of when the product and the associated nanoscale contacts will reach the market. This technical report points out the positive and negative characteristics of the nanoscale contacts and interconnects in each technology or nanomaterial discussed. This information may be helpful to product designers and researchers in their efforts to bring other nano-enabled products to the market. Recommendations for the formation and use of nanoscale contacts and interconnects are also indicated. Key words: nanotechnology, nanocontact, nano-contact

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IEC/TR 62834:2013(E), which is a technical report, describes the "IEC nanoelectronics standardization roadmap". It intends to establish a common standardization strategy in the area of nano-electrotechnology. It covers the standardization plan from 2009 to 2020 for nanomaterials, nanoscale devices, and nanofabrication processes. The report starts with a situation assessment of the market, the actual technology status, and future evolution. It provides later the list of potential standards to be developed within the concerned timeframe. The goal of this technical report is to build a consensus among members of the nano-electrotechnology community on a framework leading to inputs for consideration in standards development.

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IEC 62860-1:2013(E) covers recommended methods and standardized reporting practices for electrical characterization of printed and organic ring oscillators. Due to the nature of printed and organic circuits, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic ring oscillators. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic ring oscillators. Keywords: electrical characterization, high-impedance printing, organic transistor, printed electronics, ring oscillator

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IEC 62860:2013(E) covers recommended methods and standardized reporting practices for electrical characterization of printed and organic transistors. Due to the nature of printed and organic electronics, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic transistors. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic transistors. Keywords: electrical characterization, FET, flexible electronics, high impedance, nanocomposite, nanotechnology, OFET, organic electronics, organic transistor, printed electronics, printing, transistor

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IEC/TS 62622:2012(E), which is a technical specification, specifies the generic terminology for the global and local quality parameters of artificial gratings, interpreted in terms of deviations from nominal positions of grating features, and provides guidance on the categorization of measurement and evaluation methods for their determination. This specification is intended to facilitate communication among manufacturers, users and calibration laboratories dealing with the characterization of the dimensional quality parameters of artificial gratings used in nanotechnology. This specification supports quality assurance in the production and use of artificial gratings in different areas of application in nanotechnology. Whilst the definitions and described methods are universal to a large variety of different gratings, the focus is on one-dimensional (1D) and two-dimensional (2D) gratings.

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IEC/TS 62607-2-1:2012(E) which is a technical specification, provides a standardized method for categorizing a grade of commercial carbon nanotubes in terms of their electrical properties to enable a user to select a carbon nanotube material suitable for his application. The method is intended to assess whether the delivered materials from different production batches of the same production process are comparable regarding electrical properties of the final product which are related to electrical conductivity. The correlation between the measured parameters by the proposed method and a relevant product performance parameter has to be established for every application. This specification includes:
- definitions of terminology used in this document,
- recommendations for sample preparation,
- outlines of the experimental procedures to measure sheet resistance of carbon nanotubes in thin films,
- methods of interpretation of results and discussion of data analysis,
- case studies and,
- references.

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ISO/TS 10797:2012 establishes methods for characterizing the morphology of single-wall carbon nanotubes (SWCNTs) and identifying the elemental composition of other materials in SWCNT samples, using transmission electron microscopy and chemical analysis by energy dispersive X-ray spectrometry.

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ISO/TS 80004-4:2011 gives terms and definitions for materials in the field of nanotechnologies where one or more components are nanoscale regions and the materials exhibit properties attributable to the presence of those nanoscale regions. It is intended to facilitate communications between organizations and individuals in industry and those who interact with them. Materials classified as nanostructured have an internal or surface structure with a significant fraction of features, grains, voids or precipitates in the nanoscale. Articles that contain nano-objects or nanostructured materials are not necessarily nanostructured materials themselves. ISO/TS 80004-4:2011 includes nanodispersion.

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ISO/TS 80004-5:2011 lists terms and definitions related to the interface between nanomaterials and biology. It is intended to facilitate communications between scientists, engineers, technologists, designers, manufacturers, regulators, NGOs, consumer organizations, members of the public and others with an interest in: - the application or use of nanotechnologies in biology or biotechnology; - the use of biological matter or principles in nanotechnology.

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ISO/TS 80004-7:2011 is applicable to the use of nanotechnologies in medical diagnostics and therapeutics. Terms relating to the applications of nanotechnology in healthcare might also be addressed in other parts of ISO/TS 80004 and in other documents. Terms relating to the exploitation of material features at the nanoscale for diagnostic or therapeutic purposes in relation to human disease come within the scope of ISO/TS 80004-7:2011. Nanoscale properties can be embodied in materials that contain nanoscale elements, or are themselves of nanoscale dimensions. ISO/TS 80004-7:2011 provides consistent and unambiguous use of terms for healthcare professionals, manufacturers, consumers, technologists, patent agents, regulators, NGOs, and researchers, etc.

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