IEC 60679-6:2011

Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines

IEC 60679-6:2011 applies to the phase jitter measurement of quartz crystal oscillators and SAW oscillators used for electronic devices and gives guidance for phase jitter that allows the accurate measurement of r.m.s. jitter. In the measurement method, phase noise measurement equipment or a phase noise measurement system is used. The measuring frequency range is from 10 MHz to 1 000 MHz. This standard applies to quartz crystal oscillators and SAW oscillators used in electronic devices and modules that have the multiplication or division functions based on these oscillators. The type of phase jitter applied to these oscillators is the r.m.s. jitter. This standard cancels and replaces IEC/PAS 60679-6 published in 2008. This first edition constitutes a technical revision.

Oscillateurs pilotés par quartz sous assurance de la qualité - Partie 6: Méthode de mesure de la gigue de phase pour les oscillateurs à quartz et les oscillateurs SAW - Lignes directrices pour l'application

La CEI 60679-6:2011 s'applique à la mesure de la gigue de phase des oscillateurs à quartz et des oscillateurs SAW utilisés sur des appareils électroniques. Elle fournit également des lignes directrices sur la gigue de phase qui permet de mesurer précisément une gigue en valeurs efficaces. Dans la méthode de mesure, un appareil de mesure des bruits de phase ou un système de mesure des bruits de phase est utilisé. La gamme de fréquences mesurées s'étend de 10 MHz à 1 000 MHz. La présente norme concerne les oscillateurs à quartz et les oscillateurs SAW utilisés sur des appareils électroniques et des modules dont les fonctions de multiplication ou de division sont basées sur ces oscillateurs. Le type de gigue de phase qui s'applique à ces oscillateurs est la gigue en valeur efficace. Cette norme annule et remplace l'IEC/PAS 60679-6 publié en 2008. Cette première édition constitue une révision technique.

General Information

• Status: Withdrawn
• Publication Date: 13-Mar-2011
• Withdrawal Date: 07-Feb-2018
• ICS: 31.140 - Piezoelectric devices
• Technical Committee: TC 49 - Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
• Drafting Committee: WG 11 - TC 49/WG 11
• Current Stage: WPUB - Publication withdrawn
• Start Date: 09-Feb-2018
• Completion Date: 14-Feb-2018

Relations

• Replaces: IEC PAS 60679-6:2008 - Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guide
• Effective Date: 05-Sep-2023

Standards Content (Sample)

IEC 60679-6 ®
Edition 1.0 2011-03
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Quartz crystal controlled oscillators of assessed quality –
Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW
oscillators – Application guidelines

Oscillateurs pilotés par quartz sous assurance de la qualité –
Partie 6: Méthode de mesure de la gigue de phase pour les oscillateurs à quartz
et les oscillateurs SAW – Lignes directrices pour l'application

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IEC 60679-6 ®
Edition 1.0 2011-03
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Quartz crystal controlled oscillators of assessed quality –
Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW
oscillators – Application guidelines

Oscillateurs pilotés par quartz sous assurance de la qualité –
Partie 6: Méthode de mesure de la gigue de phase pour les oscillateurs à quartz
et les oscillateurs SAW – Lignes directrices pour l'application

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX S
ICS 31.140 ISBN 978-2-88912-403-9

– 2 – 60679-6 © IEC:2011
CONTENTS
FOREWORD . 4

INTRODUCTION . 6

1 Scope . 8

2 Normative references . 8

3 Terms, definitions and general concepts . 8

3.1 Terms and definitions . 8

3.2 General concepts . 8

3.2.1 Phase jitter . 8
3.2.2 r.m.s jitter . 9
3.2.3 Peak-to-peak jitter . 10
3.2.4 Random jitter . 10
3.2.5 Deterministic jitter . 11
3.2.6 Period (periodic) jitter . 11
3.2.7 Data-dependent jitter . 11
3.2.8 Total jitter . 11
3.3 Points to be considered for measurement . 12
3.3.1 Measurement equipment . 12
3.3.2 Factors of measurement errors . 12
4 Measurement method . 13
4.1 General . 13
4.2 Frequency range and the measurement method . 13
4.3 Method using the phase noise measurement value . 13
4.3.1 Overview . 13
4.3.2 Measurement equipment and system . 13
4.3.3 Measurement item . 13
4.3.4 Range of detuning frequency . 14
4.3.5 Phase noise measurement method . 14
4.4 Measurement method using the specially designed measurement equipment . 14
4.4.1 Overview . 14
4.4.2 Measurement equipment and system . 14
4.4.3 Measurement items . 14
4.4.4 Number of measurements . 14
4.5 Block diagram of the measurement. 14

4.6 Input and output impedance of the measurement system. 15
4.7 Measurement equipment . 15
4.7.1 General . 15
4.7.2 Jitter floor . 15
4.7.3 Frequency range . 15
4.7.4 Output waveform . 15
4.7.5 Output voltage . 16
4.8 Test fixture . 16
4.9 Cable, tools and instruments . 16
5 Measurement and the measurement environment . 16
5.1 Set-up before taking measurements . 16
5.2 Points to be considered and noted at the time of measurement . 16
5.3 Treatment after the measurement . 17

60679-6 © IEC:2011 – 3 –
6 Measurement . 17

6.1 Reference temperature . 17

6.2 Measurement of temperature characteristics . 17

6.3 Measurement under vibration . 17

6.4 Measurement at the time of impact . 17

6.5 Measurement in accelerated ageing . 17

7 Other points to be noted . 17

8 Miscellaneous . 17

Annex A (normative) Calculation method for the amount of phase jitter . 18

Bibliography . 21

Figure 1 – Voltage versus time . 9
Figure 2 – Explanatory diagram of the amount of jitter applied to r.m.s. jitter . 10
Figure 3 – Explanatory diagram of random jitter, deterministic jitter, and total jitter . 11
Figure 4 – Equivalent block diagram . 15
Figure A.1 – Concept diagram of SSB phase noise . 19

– 4 – 60679-6 © IEC:2011
INTERNATIONAL ELECTROTECHNICAL COMMISSION

____________
QUARTZ CRYSTAL CONTROLLED OSCILLATORS

OF ASSESSED QUALITY –
Part 6: Phase jitter measurement method

for quartz crystal oscillators and SAW oscillators –

Application guidelines
FOREWORD
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