IEC PAS 60679-6:2008

Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guide

IEC/PAS 60679-6 applies to the phase jitter measurement of quartz crystal oscillators and SAW oscillators used for electronic devices and gives guidance for phase jitter that allows the accurate measurement of r.m.s. jitter.

General Information

• Status: Replaced
• Publication Date: 26-Feb-2008
• ICS: 31.140 - Piezoelectric devices
• Technical Committee: TC 49 - Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
• Drafting Committee: WG 6 - TC 49/WG 6
• Current Stage: DELPUB - Deleted Publication
• Completion Date: 14-Mar-2011

Relations

• Replaced By: IEC 60679-6:2011 - Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
• Effective Date: 05-Sep-2023

Standards Content (Sample)

IEC/PAS 60679-6
Edition 1.0 2008-02
PUBLICLY AVAILABLE
SPECIFICATION
PRE-STANDARD
Quartz crystal controlled oscillators of assessed quality –

Part 6: Phase jitter measurement method for quartz crystal oscillators
and SAW oscillators – Application guide

IEC/PAS 60679-6:2008(E)
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IEC/PAS 60679-6
Edition 1.0 2008-02
PUBLICLY AVAILABLE
SPECIFICATION
PRE-STANDARD
Quartz crystal controlled oscillators of assessed quality –

Part 6: Phase jitter measurement method for quartz crystal oscillators
and SAW oscillators – Application guide

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
PRICE CODE
S
ICS 31.140 ISBN 2-8318-9627-4
– 2 – PAS 60679-6 © IEC:2008(E)

CONTENTS
FOREWORD.4
INTRODUCTION.6
1 Scope.7
2 Normative references .7
3 Terms, definitions, glossary and general terms.7
4 Measurement method .7
4.1 Frequency range and the measurement method .8
4.2 Method of using the phase noise measurement value.8
4.3 Measurement method for the use of the specially designed measurement
equipment .8
4.4 Block diagram of the measurement.9
4.5 Input and output impedance of the measurement system.9
4.6 Measurement equipment .10
4.7 Test fixture .10
4.8 Cable, tools and instruments, etc. .10
5 Measurement and the measurement environment.10
5.1 Set-up before taking measurements. .10
5.2 Points to be considered and noted at the time of measurement .11
5.3 Treatment after the measurement.11
6 Measurement .11
6.1 Reference temperature.11
6.2 Measurement of temperature characteristics .11
6.3 Measurement under vibration .11
6.4 Measurement at the time of impact.11
6.5 Measurement in accelerated ageing .11
7 Other points to be noted .11
8 Miscellaneous .12
Bibliography.21
Annex A (normative) Calculation method for the amount of phase jitter.13
A.1 Explanation .13
A.2 Relations between phase noise and phase jitter .13
A.3 Commentary.15
A.3.1 History of establishment and points to note .15
A.3.2 Theoretical positioning of phase jitter .15
A.4 Description .16
A.4.1 RMS jitter .17
A.4.2 Peak-to-peak jitter .17
A.4.3 Random jitter.17
A.4.4 Deterministic jitter .17
A.4.5 Period (periodic) jitter.18
A.4.6 Data-dependent jitter.18
A.4.7 Total jitter.18
A.5 Points to be considered for measurement.18
A.5.1 Measurement equipment .18
A.5.2 Factors of measurement errors.19

PAS 60679-6 © IEC:2008(E) – 3 –

Figure 1 – Equivalent block diagram .9
Figure A.1 – Concept diagram of SSB phase noise .14
Figure A.2 – Voltage versus time .16
Figure A.3 – Explanatory diagram of the amount of jitter applied to r.m.s. jitter .18
Figure A.4 – Explanatory diagrams of random jitter, deterministic jitter, and total jitter .19

– 4 – PAS 60679-6 © IEC:2008(E)

INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
QUARTZ CRYSTAL CONTROLLED OSCILLATORS
OF ASSESSED QUALITY –
Part 6: Phase jitter measurement method for quartz crystal oscillators
and SAW oscillators – Application guide

FOREWORD
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A PAS is a technical specification not fulfilling the requirements for a standard but made
available to the public.
IEC-PAS 60679-6 was submitted by the Japanese Institute of Electronics, Information and
Communication Engineers and has been processed by IEC technical committee 49:
Piezoelectric and dielectric devices for frequency control and selection.
The text of this PAS is based on the This PAS was approved for
following document: publication by the P-members of the
committee concerned as indicated in
the following document
Draft PAS Report on voting
49/784/NP 49/793A/RVN
Following publication of this PAS, which is a pre-standard publication, the technical committee
or subcommittee concerned will transform it into an International Standard.

PAS 60679-6 © IEC:2008(E) – 5 –
This PAS shall remain valid for an initial maximum period of three years starting from the
publication date. The validity may be extended for a single three-year period, following which
it shall be revised to become another type of normative document or shall be withdrawn.

– 6 – PAS 60679-6 © IEC:2008(E)

INTRODUCTION
With the advance of information and telecommunication technologies, such information and
telecommunication devices as measuring instruments and computers have played important
roles in society. Recently, these devices have been digitized and proliferated on a worldwide
basis. For these devices, crystal oscillators with low phase noise are necessary. This
standard deals with the phase jitter measurement method.
International standardization of industrial standards regarding electronic devices is conducted
by many technical committees in the International Electrotechnical Commission (IEC), located
in Geneva. TC 49 works on standardization of international trade regarding piezoelectric and
dielectric devices for frequency control and selection. There are 10 working groups (WG) in
TC49, and WG6 formulates and deliberates international standards regarding measurement
methods.
The special committee for piezoelectric and dielectric devices for frequency control and
selection in the standard investigatory panel of the electronic information communication
society has been working as a domestic deliberative body of IEC/TC49. The activities of the
domestic committee
...