IEC TS 61169-1-7:2025
(Main)Radio-frequency connectors - Part 1-7: Electrical test methods - Uncertainty specification of frequency domain test for insertion loss
Radio-frequency connectors - Part 1-7: Electrical test methods - Uncertainty specification of frequency domain test for insertion loss
IEC TS 61169-1-7:2025 relates to radio frequency connectors for RF transmission lines for use in telecommunications, electronics and similar equipment.
This document sets out the provisions for a report on the uncertainty specifications for insertion loss measurements, which apply to individual connector types, by vector network analyzers (VNAs). It is intended to establish concepts and procedures considering
– testing and measuring procedures concerning frequency domain electrical properties, and
– uncertainty specifications of VNAs measurements for insertion loss of RF connectors.
The test methods and procedures of this document are intended for acceptance and type approval testing.
General Information
- Status
- Published
- Publication Date
- 26-Aug-2025
- Technical Committee
- SC 46F - RF and microwave passive components
- Drafting Committee
- WG 1 - TC 46/SC 46F/WG 1
- Current Stage
- PPUB - Publication issued
- Start Date
- 27-Aug-2025
- Completion Date
- 03-Oct-2025
Overview
IEC TS 61169-1-7:2025 is a Technical Specification for radio‑frequency connectors that defines how to report and quantify measurement uncertainty of insertion loss in frequency‑domain tests performed with vector network analyzers (VNAs). It complements the IEC 61169 series by focusing specifically on uncertainty specification for insertion loss measurements used in acceptance and type‑approval testing of RF connectors in telecommunications and electronic equipment.
Key topics
- Scope and purpose: Procedures and concepts for uncertainty reporting of insertion loss measurements on individual connector types using VNAs.
- Parameter definitions: Transmission coefficient representation T = a + jb and insertion loss formula: Insertion loss = −20 log(|T|) (dB).
- VNA calibration uncertainty: Identification of residual error terms (directivity, match, tracking, isolation) and how calibration standards and methods affect measurement uncertainty.
- Report characteristics: What to include in a connector‑type insertion loss report (frequency dependence, grades, and applicable conditions).
- Uncertainty contributors:
- Calibration residual errors (e.g., match error, directivity)
- Instrumentation sources (linearity, isolation, random errors)
- Measurement conditions (noise floor/trace noise, mating interface defects such as pin recession or scratches)
- Uncertainty evaluation: Use of ISO/IEC Guide 98‑1 principles to calculate expanded uncertainty (≈95 % confidence), and guidance on estimating VNA uncertainty from manufacturer data or higher‑level calibration laboratories.
- Informative annex: Practical method to estimate uncertainty from commercial VNA data sheets and calibration certificates.
Applications
This Technical Specification is directly useful for:
- Test and calibration laboratories preparing insertion loss reports and uncertainty budgets for RF connectors.
- Connector manufacturers performing type‑approval and production acceptance testing.
- Procurement and QA teams defining acceptance criteria tied to measured values plus uncertainty.
- R&D and design engineers who need realistic measurement uncertainty to validate connector performance.
- Certification bodies and compliance engineers assessing conformance to RF connector electrical requirements.
Practical benefits include improved comparability of insertion loss data, robust acceptance criteria that account for measurement uncertainty, and clearer requirements for VNA calibration and test setup.
Related standards
- IEC 61169‑1:2013 (generic RF connector requirements)
- ISO/IEC Guide 98‑1 (evaluation of measurement uncertainty)
- IEC 60027, IEC 60050, IEC 60617, ISO 80000‑1 (units, symbols, terminology)
Keywords: IEC TS 61169-1-7:2025, insertion loss, VNA calibration uncertainty, radio-frequency connectors, RF connectors, frequency domain test, measurement uncertainty, acceptance testing.
Frequently Asked Questions
IEC TS 61169-1-7:2025 is a technical specification published by the International Electrotechnical Commission (IEC). Its full title is "Radio-frequency connectors - Part 1-7: Electrical test methods - Uncertainty specification of frequency domain test for insertion loss". This standard covers: IEC TS 61169-1-7:2025 relates to radio frequency connectors for RF transmission lines for use in telecommunications, electronics and similar equipment. This document sets out the provisions for a report on the uncertainty specifications for insertion loss measurements, which apply to individual connector types, by vector network analyzers (VNAs). It is intended to establish concepts and procedures considering – testing and measuring procedures concerning frequency domain electrical properties, and – uncertainty specifications of VNAs measurements for insertion loss of RF connectors. The test methods and procedures of this document are intended for acceptance and type approval testing.
IEC TS 61169-1-7:2025 relates to radio frequency connectors for RF transmission lines for use in telecommunications, electronics and similar equipment. This document sets out the provisions for a report on the uncertainty specifications for insertion loss measurements, which apply to individual connector types, by vector network analyzers (VNAs). It is intended to establish concepts and procedures considering – testing and measuring procedures concerning frequency domain electrical properties, and – uncertainty specifications of VNAs measurements for insertion loss of RF connectors. The test methods and procedures of this document are intended for acceptance and type approval testing.
IEC TS 61169-1-7:2025 is classified under the following ICS (International Classification for Standards) categories: 33.120.30 - RF connectors. The ICS classification helps identify the subject area and facilitates finding related standards.
You can purchase IEC TS 61169-1-7:2025 directly from iTeh Standards. The document is available in PDF format and is delivered instantly after payment. Add the standard to your cart and complete the secure checkout process. iTeh Standards is an authorized distributor of IEC standards.
Standards Content (Sample)
IEC TS 61169-1-7 ®
Edition 1.0 2025-08
TECHNICAL
SPECIFICATION
Radio-frequency connectors -
Part 1-7: Electrical test methods - Uncertainty specification of frequency domain
test for insertion loss
ICS 33.120.30 ISBN 978-2-8327-0683-1
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CONTENTS
FOREWORD . 2
INTRODUCTION . 4
1 Scope . 5
2 Normative references . 5
3 Terms and definitions . 5
4 Units, symbols and dimensions . 5
5 Report characteristics . 6
6 Insertion loss in frequency domain tests . 6
6.1 Parameters . 6
6.2 General considerations . 6
6.3 Test equipment. 6
6.3.1 General requirement . 6
6.3.2 VNA calibration uncertainty . 6
6.3.3 Other test conditions . 9
6.3.4 Total test uncertainty . 9
Annex A (informative) Estimation of VNA uncertainty specifications from commercial
vector network analyzer – Data and specification sheet . 10
Bibliography . 11
Figure 1 – Graphical symbols . 7
Figure 2 – Graphical principle . 7
Figure 3 – VNA measurement model . 7
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
Radio-frequency connectors -
Part 1-7: Electrical test methods - Uncertainty specification
of frequency domain test for insertion loss
FOREWORD
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IEC TS 61169-1 has been prepared by subcommittee 46F: RF and microwave passive
components, of IEC technical committee TC 46: Cables, wires, waveguides, RF connectors, RF
and microwave passive components and accessories. It is a Technical Specification.
The text of this Technical Specification is based on the following documents:
Draft Report on voting
46F/714/DTS 46F/723/RVDTS
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
The language used for the development of this Technical Specification is English.
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are
described in greater detail at www.iec.ch/publications.
A list of all parts in the IEC 61169 series, published under the general title Radio-frequency
connectors, can be found on the IEC website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under webstore.iec.ch in the data related to the
specific document. At this date, the document will be
– reconfirmed,
– withdrawn, or
– revised.
INTRODUCTION
This document relates to technical requirements for electrical test for radio-frequency
connectors. In IEC 61169-2:2007, a frequency domain test method is described. However, the
document does not contain the quantitative uncertainty
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